Professional Documents
Culture Documents
Dongjin Kwon, Il Dong Yun† , Duck Hoon Kim‡ , and Sang Uk Lee
School of EECS, Seoul Nat’l Univ., Seoul, 151-742, Korea
†
School of EIE, Hankuk Univ. of F. S., Yongin, 449-791, Korea
‡
Institute for RIS, Univ. of Southern California, Los Angeles, CA 90089, USA
djk@cvl.snu.ac.kr, yun@hufs.ac.kr, duckkim@usc.edu, sanguk@ipl.snu.ac.kr
matched minutiae is small and the count of cluster is below 0.00001 0.0001 0.001 0.01 0.1 1
We have presented a new minutia-based fingerprint [4] A. K. Jain, L. Hong, and R. Bolle. On-line fingerprint
matching method that incorporates three new ideas. Firstly verification. IEEE Trans. Pattern Anal. Machine Intell.,
the new representation named k-DNN is defined to encode 19(4):302–314, 1997.
the local neighborhood of each minutia. Next, the clustered [5] D. Maio, D. Maltoni, R. Cappelli, J. L. Wayman, and A. K.
Jain. FVC2000: Fingerprint Verification Competition. IEEE
matching method is presented which finds local invariant
Trans. Pattern Anal. Machine Intell., 24(3):402–412, 2002.
structures the warping is used to describe entire surface de- [6] D. Maio, D. Maltoni, R. Cappelli, J. L. Wayman, and A. K.
formation. Lastly the new score computation method is pro- Jain. FVC2002: Second Fingerprint Verification Competi-
posed which uses the overlapped region of two bounding tion. In Proc. Int’l Conf. Pattern Recognition, volume 3,
boxes. We showed that the proposed algorithm performed 2002.
better than rigid transformation based fingerprint matching [7] D. Maltoni, D. Maio, A. K. Jain, and S. Prabhakar. Hand-
methods as well as NIST BOZORTH3 algorithm in exper- book of Fingerprint Recognition. Springer-Verlag, 2003.
imental results. The proposed score computation method [8] R. M. McCabe. Data format for the interchange of finger-
provides substantial performance improvement. print information: ANSI/NIST-CSL-1-1993. American Na-
tional Standard Institute, 1993.
[9] N. K. Ratha, K. Karu, S. Chen, and A. K. Jain. A real-
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[10] K. Rohr, M. Fornefett, and H. S. Stiehl. Approximating thin-
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in Pattern Recognition, 2001.