MAN-22060-US001 Rev D00

E1 Module for the MTT and xDSL Family of Products

Users Manual SSMTT-27LM

E1 Module

302 Enzo Drive San Jose, CA 95138 Tel: 1-408-363-8000 Fax: 1-408-363-8313

WARNING Using the supplied equipment in a manner not specied by Sunrise Telecom may impair the protection provided by the equipment. CAUTIONS Do not remove or insert the module while the test set is on. Inserting or removing a module with the power on may damage the module. Do not remove or insert the software cartridge while the test set is on. Otherwise, damage could occur to the cartridge.

End of Life Recycling and Disposal Information DO NOT dispose of Waste Electrical and Electronic Equipment (WEEE) as unsorted municipal waste. For proper disposal return the product to Sunrise Telecom. Please contact our local ofces or service centers for information on how to arrange the return and recycling of any of our products. EC Directive on Waste Electrical and Electronic Equipment (WEEE) The Waste Electrical and Electronic Equipment Directive aims to minimize the impact of the disposal of electrical and electronic equipment on the environment. It encourages and sets criteria for the collection, treatment, recycling, recovery, and disposal of waste electrical and electronic equipment.

2010 Sunrise Telecom Incorporated. All rights reserved. Disclaimer: Contents subject to change without notice and are not guaranteed for accuracy.
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E1 Single Module
1 E1 Single Module. ...............................................5
1.1 E1 LEDs.............................................................................5 1.2 E1 Connector Panels. .........................................................6 1.3 Status Key..........................................................................7 1.4 Storage Allocation..............................................................8

2 Menus..................................................................9
2.1 Test Conguration. ............................................................10 2.2 Test Pattern. ......................................................................14 2.3 Measurement Result........................................................18 2.3.1 General Denitions and Result Screens. .......................19 2.4 Other Measurement.........................................................25 2.4.1 View Received Data......................................................25 2.4.2 View Current Event. ......................................................26 2.4.3 View FAS Words............................................................26 2.4.4 View MFAS Words.........................................................27 2.4.5 Pulse Mask Analysis. .....................................................28 2.4.5.1 Start New Analysis.....................................................28 2.4.5.2 View Last Pulse Shape. .............................................29 2.4.6 C-Bit Analysis................................................................29 2.4.7 Histogram Analysis........................................................31 2.4.7.1 Format SRAM. ............................................................31 2.4.7.2 Current Histogram......................................................31 2.4.7.3 Saved Histogram........................................................33 2.4.8 Propagation Delay.........................................................34 2.4.9 Channel Loopback. ........................................................34 2.5 VF Channel Access..........................................................35 2.5.1 VF & Noise Measurement. .............................................35 2.5.2 View Line CAS. .............................................................38 2.5.3 Call Emulator.................................................................39 2.5.3.1 Standard Emulations..................................................39 2.5.3.2 Place a Call................................................................40 2.5.3.3 Receive a Call............................................................41 2.5.3.4 User Emulation...........................................................42 2.5.4 Dial Parameters.............................................................45 2.6 Other Features.................................................................46 2.6.1 Error Injection................................................................46 2.6.2 Alarm Generation..........................................................48 2.6.3 Send Frame Words. ......................................................49 2.7 System Parameters..........................................................51 2.7.1 Measurement Conguration..........................................51
E1 Module 3

2.8 View/Store/Print................................................................55 2.8.1 Saving a Test.................................................................56 2.8.2 Viewing a Stored Test....................................................56 2.8.3 Printing a Stored Test....................................................56 2.8.4 Deleting a Stored Test...................................................56 2.8.5 Locking and Unlocking a Stored Test............................56 2.8.6 Renaming a Stored Test................................................57 2.9 Proles. .............................................................................58

3 Applications......................................................59
3.1 Connecting the Cords. ......................................................59 3.2 Accept a New Circuit........................................................60 3.3 In-Service Circuit Monitoring............................................61 3.4 Checking for Frequency Synchronization.........................62 3.5 Measuring Signal Level....................................................63 3.6 V.54 Channel Loopback Test............................................64 3.7 Running a Timed Test.......................................................65 3.7.1 Manual Start..................................................................65 3.7.2 Auto Start......................................................................65 3.8 Observing Network Codes or Channel Data....................66 3.9 Monitoring a Voice Frequency Channel............................67 3.10 Simple Talk/Listen. .........................................................68 3.11 Send a Tone. ...................................................................69 3.12 Nx64 kbit/s Testing.........................................................70

4 Reference..........................................................73
4.1 E1 Technology Overview..................................................73 4.1.1 Technical Standards......................................................73 4.1.2 Basic Denitions............................................................73 4.1.3 Converting a Voice Signal. .............................................73 4.1.4 2.048 Mbit/s Data Rate. ................................................74 4.1.5 Line Coding...................................................................75 4.1.6 Signal Levels.................................................................76 4.1.7 2.048 Mbit/s Framing.....................................................77 4.2 MFR2/DTMF/DP Technology. ..........................................81

5 General Information.........................................83
5.1 Testing and Calibration Statement. ...................................83 5.2 Offices..............................................................................83 5.3 Express Limited Warranty. ...............................................85

Index.......................................................................87
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1 E1 Single Module
1.1 E1 LEDs The LEDs provide information on the test sets current test status.

SSMTT-ACM and -ACM+

Figure 1 Test Set LED Panels

SSMTT-B, -C

The described LEDs here are used by the module: MODULE Green: The test set is in module mode. SIGNAL Active when in E1 mode. Green: Receiving an E1 signal as expected. Red: Not receiving an E1 signal as expected. FRAME This LED is active when in a framed test mode. Green: Frame synchronization has been achieved and the framing found on the received signal of the selected line matches the framing set in TEST CONFIGURATION-FRAMING. Red: The configured framing type is not found on the received signal on the line selected in TEST CONFIGURATIONFRAMING. This could indicate either a loss of framing on the received signal or a framing mismatch. PAT SYNC Active when performing a BERT test with a known test pattern. Red: No pattern synchronization, or synchronization is lost. Green: Pattern synchronization has been achieved. Pattern synchronization occurs when the test set is receiving the same pattern as the one transmitted by the test set. Inactive: The test set is in VF Channel Testing. BIT ERR Active when performing a BERT with a known test pattern. Red: Currently detecting a bit error. Blinking Red: Previously detected bit errors, but currently, there are none. Press HISTORY to clear.
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AIS Red: Currently detecting an AIS (all 1, no framing). Blinking Red: Previously detected an AIS, but currently none are detected. Press HISTORY to clear. ALARM Red: Currently detecting an alarm condition. Blinking Red: Previously detected an alarm condition, but currently none are detected. Press HISTORY to clear. ERRORS Red: Currently detecting an error. This can be a framing bit, CRC-6 or other errors other than BPV or bit error. Blinking Red: Previously detected errors, but currently none are detected. Press HISTORY to clear. BPV/CODE Red: Currently detecting a Bipolar Violation or Code error. Blinking Red: Previously detected a Bipolar Violation or Code error, but currently none are detected. Press HISTORY to clear. 1.2 E1 Connector Panels The E1 module connector panels are shown in Figure 2.
HEAD PHONE TX RX EXT CLOCK

SSMTT-27L with RJ-11 ports

HEAD PHONE TX RX EXT CLOCK

Figure 2 E1 Connector Panels HEADPHONE Use a stereo head set with a 3 conductor mini connector. TX and RX An RJ-11 or BNC for TX (Transmit) RX (Recieve) connector method is used to connect to an E1 line. RJ-11 Port Pinout Pin 1,2: E1-Rx Pin 4,5: E1-Tx EXT CLOCK External clock signal input, using RJ-11 or BNC connectors.
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SSMTT-27L with BNC ports

1.3 Status Key The STATUS key is used to display a graphic of the current circuit conguration and status. The graphic may be invoked during basic menu setups and basic operations, such as: TEST CONFIGURATION, SEND TEST PATTERN, and VF CHANNEL ACCESS. Press STATUS upon completing a TEST CONFIGURATION setup to see if the proper settings are selected. The graphics will update based on the TEST CONFIGURATION settings. Meas E1SINGL Line 1 T R FRAMING : PCM30C CODING : HDB3 PAT: 2e15 TEST RATE: 2048 Kbps Figure 3 Status Screen The following is a description of some of the elements common to a graphic display. R: This is where the test set performs its received measurement results. T: This is where the test set transmits a test pattern. - Arrows denote the direction the signal is travelling. Boxed words, or abbreviations, provide additional information: Tx: The transmit port of the noted line (1 or 2). Rx: The receive port of the noted line. FRAMING reports the framing type, and if CRC checking is present. CODING: Transmitted coding type. PAT: Test pattern. TEST RATE: Full or fractional test rate. BRDG, TERM, or MON: TERM is reported. Tx Rx TERM 8:21:36

E1 Module

1.4 Storage Allocation Depending on the feature, some results are stored on the MMC card while others are stored on the SRAM card. Table 1 shows where the results from each feature are stored
Feature E1 BERT Pulse Mask Analysis Histogram Jitter Measurement Jitter Tolerance Jitter Transfer Wander Measurement GPRS Abis Statistics GPRS Gb Analysis ISDN Protocol Analysis GSM Protocol Analysis V5 VF Call Analysis VF Call Emulation Location MMC SRAM SRAM SRAM MMC MMC MMC > TIE SRAM > Histogram MMC MMC SRAM SRAM SRAM MMC MMC

Table 1 Storage Allocation

SSMTT-27L

2 Menus
Figure 4 outlines the major functions of the E1 module.
MODULE Key

E1 MAIN MENU 2.1 TEST CONFIGURATION 2.2 TEST PATTERN 2.3 MEASUREMENT RESULT 2.4 OTHER MEASUREMENT See Separate Option Users Manuals PROTOCOLS 2.5 VF CHANNEL ACCESS 2.6 OTHER FEATURES 2.7 SYSTEM PARAMETERS 2.8 VIEW/STORE/PRINT 2.9 PROFILES 2.4.1

OTHER MEASUREMENTS VIEW RECEIVED DATA 2.4.2 VIEW CURRENT EVENT 2.4.3 VIEW FAS WORDS 2.4.4 VIEW MFAS WORDS 2.4.5 PULSE MASK ANALYSIS 2.4.6 C-BIT ANALYSIS 2.4.7 HISTOGRAM ANALYSIS 2.4.8 PROPAGATION DELAY 2.4.9 CHANNEL LOOBACK

VF CHANNEL ACCESS SYSTEM PARAMETERS 2.7.1 MEAS CONFIGURATION 2.5.1 VF & NOISE MEASUREMENTS 2.5.2 VIEW LINE CAS 2.5.3 CALL EMULATOR 2.5.4 DIAL PARAMETERS 2.8 VIEW/STORE/PRINT

OTHER FEATURES 2.6.1 ERROR INJECTION 2.6.2 ALARM GENERATION 2.6.3 SEND FRAME WORDS

Figure 4 Menu Tree

E1 Module

2.1 Test Conguration A circuit is accessed by: 1. Configuring the TEST CONFIGURATION menu to correspond to the circuit under test. 2. Connecting the test set to the circuit. The module can be congured to automatically detect incoming framing and test pattern by pressing AUTO. Note: Conguration is the most important part of the entire test procedure. If the test configuration items are configured incorrectly, all measurement results will be meaningless. To configure the test set, use the following procedure: 1. From the E1 MAIN MENU, select TEST CONFIGURATION. 2. Refer to the following two sections for configuration details. 08:21:36 TEST CONFIGURATION Tx SOURCE FRAMING CRC-4 TEST RATE Rx PORT Tx CLOCK : : : : : : TESTPAT PCM-30 NO 2.048M TERM Rx

LOOP

TESTPAT

Figure 5 E1 Test Conguration Screen Tx SOURCE Options: LOOP (F1), TESTPAT (F2) LOOP: The signal received on the RX jack will be transmitted out the TX jack of the test set. TESTPAT: A test pattern is transmitted by the test set. During Nx64 or VF testing, an idle code is inserted on unused channels. FRAMING Options: PCM-30 (F1), PCM-31 (F2), UNFRAME (F3) Choose the appropriate framing for the circuit. PCM-30: The test set will synchronize on both FAS (Frame Alignment Signal) and MFAS (MultiFrame Alignment Signal). PCM-31: The test set will synchronize only on FAS.
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Notes: If unsure of the proper framing, push AUTO. Use the combination which synchronizes properly and/or allows error free measurement results. If the received signal framing and CRC-4 status dont match the framing and CRC-4 settings, the test set will display Loss of Frame condition and may display loss of CRC DET. AMI is the default line code. The line code can be configured for AMI or HDB3 in: E1 MAIN MENU > SYSTEM PARAMETERS > MEAS CONFIGURATION. CRC-4 Options: YES (F1), NO (F2) YES: Allows measurement of CRC-4 errors on an incoming signal and also transmits the CRC-4 bits on the outgoing signal. CRC-4 only works with PCM-31 and PCM-30 framing. If UNFRAME has been selected for framing, the test set will force the CRC-4 configuration to NO. TEST RATE Options: 2.048M (F1), Nx64K (F2) 2.048M: Used for full rate testing. If uncertain about which one to choose, select this for full rate testing. Nx64: Use for fractional testing. Upon pressing, the SELECT TIMESLOT screen to the right is displayed. In it select each timeslot to test, these can be selected automatically, or manually. Figure 6 Select Timeslot Screen Manual Selection of Timeslots 1. Use to choose a timeslot, then press SELECT (F2). 2. Repeat until all the necessary timeslots have been selected. Selected timeslots remain highlighted, as in Figure 6. Press UN-SEL (F3) to deselect a timeslot. Press CLR-ALL (F4) to clear all selections and to start over. Automatic Selection of Timeslots 1. Press AUTO (F1). If receiving a signal which is already formatted in the N (or M) x64 kbit/s fractional E1 format, the quickest method for selecting timeslots is to press AUTO (F1).
E1 Module 11

2. Press ENTER to set the choices, and return to the TEST CONFIGURATION screen. In AUTO, the test set will automatically configure the timeslots by looking for active data. It will configure the transmit side to be the same as the active timeslots on the receive side. The test set determines which timeslots are active by first determining which timeslots are idle. Any timeslot that is not idle is assumed to be active. The test set determines that a timeslot is idle when it finds the lines idle code. This is set in SYSTEM PARAMETERS > MEAS CONFIGURATION-CODE CONFIGUR. Notes: In PCM-31 framing, timeslots 1-31 correspond to channels 1-31. In PCM-30 framing, timeslots 1-15 correspond to channels 1-15, and timeslots 17-31 correspond to channels 16-30. In PCM-30, timeslot 16 is used for the multiframe alignment signal. Fractional E1 is not offered with unframed signals, because framing is required to determine the location of timeslots. The timeslots specified for transmit/receive need not be the same. The number of selected timeslots can differ from the Tx side to the Rx side. The test set will assume that all incoming data is received byte by byte in ascending channel order. Rx PORT Options: TERM (F1), BRIDGE (F2), MONITOR (F3) Configures the Line 1 2.048 Mbit/s receiver. These settings let the test set electrically decode a 2.048 Mbit/s signal under a wide range of resistive cable losses. They also determine which electrical load will be placed on the circuit by the test set. These settings have no effect on the transmitters. On a 2.048 Mbit/s circuit, there must always be exactly one receiver that applies the low impedance (75/120) termination. There should never be two or more receivers applying a low impedance termination. CAUTION: If uncertain, select BRIDGE, this will protect the 2.048 Mbit/s signal. TERM mode terminates the received signal with a 75 or 120 impedance termination.The tested signal has been transmitted over real cable at a level between approximately +6 and -43 dB. Using TERM mode will disrupt the circuit. In BRIDGE mode, the test set applies high-impedance isolation resistors to the circuit. This isolation circuit will protect the signal from any possible disruption. The tested signal has been transmitted over regular cable at a approximate level of
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+6 and -43 dB. MONITOR mode should be used when a measurement is made at a protected monitoring point, at a level between -15 and -30 dB. The signal is provided from the protected MONITOR jack of a network equipment. In MONITOR mode, if a 0 dB signal is received, the CODE ERR LED will light red. This often happens when the test set is plugged into an OUT jack. In this case, choose TERM instead. If you are uncertain if a jack is bridged or protected, try BRIDGE first. TX CLOCK Options: RX (F1), INTERN (F2), EXT CLK (F3), OFFSET (more, F1), TTL (more, F2) This is used to time the transmit signal. Rx: Use the timing from the signal received on the selected line as the clock source. INTERN: Use the internal timing of the test set. This timing is not synchronized to the network.You should use internal timing in loopback testing where synchronization is not required. EXT CLK: A signal received on EXT CLOCK provides timing. OFFSET: The test set uses a digital synthesizer to shift the transmit frequency in 1, 10, 100, or 1000 Hz steps. Shift up to +/- 50,000 Hz (25K ppm). The screen to the right is displayed. Figure 7 DDS Shift Screen 1. Set DDS SHIFT from 0 and 50,000 Hz by using INC (F1) or DEC (F2). 2. Set the SCALE of the shift by using INC (F1) and DEC (F2). Choose among 1, 10, 100, and 1000 (i.e., a shift of 3 Hz with a SCALE of 10 would shift the frequency 13 Hz). TTL: The test set uses a G.703 sinusoidal clock plugged into EXT CLOCK as the timing source.

E1 Module

13

2.2 Test Pattern

Figure 8 Send Test Pattern

Standard Test Patterns To send one of the standard patterns: 1. Use to select a pattern. As each pattern is selected, the test set begins transmitting that pattern. 2. Press INVERT (F2) to send the pattern with an inverted polarity (1s and 0s reversed). Press NORMAL (F2) to send the pattern with a normal polarity. 3. At the MEASURE MODE line in SYSTEM PARAMETERS > MEAS CONFIGURATION, select BER or LIVE. In BER, the test set looks for a BERT pattern. In LIVE, the test set does not look for a pattern, it tests live traffic. If LIVE is selected, the PAT SYNC LED is off. The long patterns are written in hexadecimal notation, also known as hex. A pattern written in hex will be written with pairs of numbers separated by commas. Hex is a 16 digit number system consisting of the digits 0, 1, 2, 3, 4, 5, 6, 7, 8, 9, A, B, C, D, E, and F. The hex pattern 15 FA translates to the binary pattern 0001 0101 1111 1010, where the left most bit is transmitted first. The following test patterns are available: 2e23: Industry-standard 2e23-1 pseudo random bit sequence and is formed from a 23 stage shift register, and is not zero-constrained. It contains up to 22 zeros in a row and violates standards for consecutive zeros in AMI-coded transmission. 2e20: Industry-standard 2e20-1 pseudo random bit sequence is formed from a 20 stage shift register and is not zero-constrained. It contains up to 19 zeros in a row and violates standards for
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consecutive zeros in AMI-coded transmission. The QRS pattern is derived from the 2e20 pattern. 2e15: Industry-standard 2e15-1 pseudo random bit sequence is formed from a 15 stage shift register and is not zero-constrained. It contains up to 14 zeros in a row and does not violate standards for consecutive zeros in AMI-coded transmission. 20ITU: This is the 2e20-1 pseudo random bit sequence and is formed from a 20 stage shift register and is not zero-constrained. It conforms to the ITU O.153 technical standard. It is not identical to 2e20, because different feedback mechanisms are used when the patterns are produced by means of shift registers. 20ITU suppresses consecutive sequences of more than 18 zeros, as opposed to 14 zeros in 2e20. 2047: Industry-standard bit code used for DDS applications. 511, 127, 63: Industry-standard bit codes used for DDS. 1111: Industry-standard all ones pattern is used for stress testing E1 AMI, and B8ZS lines. If it is sent unframed, it will be interpreted as an AIS (Alarm Indication Signal). This is the pattern in its binary form: 1111. 1010: Industry-standard alternating ones and zeros pattern. It is frame aligned with f showing the location of the framing bit. The pattern is: f 0101 0101. 0000: Industry-standard all zeros pattern is often used to make sure that clear-channel lines have been properly provisioned for B8ZS during circuit turn-up. If a portion of the circuit is AMI, then pattern synch and/or signal will be lost. The pattern is: 0000. FOX: Industry-standard pattern is used in data communications applications. The ASCII translation of the pattern is the Quick brown fox .... sentence. The pattern is frame aligned to ensure proper ASCII translation of the bits. It is recommended that the pattern be sent with framed signals, otherwise ASCII translation is not possible. This is the pattern: 2A, 12, A2, 04, 8A, AA, 92, C2, D2, 04, 42, 4A, F2, EA, 72, 04, 62, F2, 1A, 04, 52, AA, B2, 0A, CA, 04, F2, 6A, A2, 4A, 04, 2A, 12, A2, 04, 32, 82, 5A, 9A, 04, 22, F2, E2, 04, 8C, 4C, CC, 2C, AC, 6C, EC, 1C, 9C, 0C, B0, 50. QRSS: Industry-standard Quasi Random Signal is formed from a 20 stage shift register and is zero-constrained for a maximum of 14 consecutive zeros. When transmitted in a framed signal, up to 15 consecutive zeros will occur in accordance with AMI minimum density requirements. 1-4: The one-in-four pattern is used for stress testing circuits. It is frame aligned. The pattern is 0100.
E1 Module 15

1-8: Industry-standard 1 in 8 pattern used for stress testing AMI and B8ZS lines. It is also called 1:7. The pattern is frame aligned (f is the framing bit) as shown in its binary form: f 0100 0000. 3-24: Industry-standard 3 in 24 pattern used for stress testing AMI lines. The pattern is frame aligned (f is the framing bit) as shown in its binary form: f 0100 0100 0000 0000 0000 0100. User Test Patterns In addition to the standard patterns, a custom pattern can be setup by pressing USER (F1) in the TEST PATTERN screen (Figure 9). The screen to the right is displayed listing any stored patterns. Use this screen to create, edit, view, send, or delete a pattern.

Figure 9 User Test Pattern Selection Screen

Sending a User Test Pattern 1. In TEST PATTERN, press USER (F1). 2. The test set will present a list of stored USER patterns. Use the up/down arrow keys to select the desired pattern. 3. Press ENTER to send the selected pattern. Viewing a User Test Pattern 1. From USER TEST PATTERN, move the cursor to the desired pattern and press VIEW (F1). 2. You will see your selected pattern on the screen (in binary). 3. When finished, press ESC. Creating User-Dened Patterns 1. In USER TEST PATTERN selection screen, select a blank line, and press CREATE (F1). A screen like the one to the right will be displayed with the cursor at LABEL. 2. Press TOGGLE (F3) and the A will be selected as in the screen to the right. Figure 10 User Test Pattern Character Screen
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3. Use to select the desired character, then press SELECT (F4). The character appears next to LABEL. Repeat until nished. 4. Press TOGGLE (F3) and press to move to No. 5. Press SHIFT and use the numeric keypad to enter the pattern up to 24 bits long. When finished, press SHIFT. If a mistake is made, use INSERT (F1) or DELETE (F2). 6. Press ENTER to store the pattern and to return to the TEST PATTERN screen with the new pattern label displayed. Editing a User Test Pattern Label 1. From the TEST PATTERN screen, press USER (F1) to move into USER TEST PATTERN. 2. Select the desired pattern label and press EDIT (F2). 3. With cursor on LABEL, use to select a character and press: DELETE (F2), then press TOGGLE (F3) and select the desired character; the character will be inserted in place of the deleted character in the label, or INSERT (F1), then press TOGGLE (F3) and select the desired character; the character will be inserted to the left of selected character in the label, or TYPOVER, then press TOGGLE (F3) and select the desired character; the character will be inserted in place of the selected character in the label. Correcting a Mistake in the Pattern 1. While entering the 1s and 0s, an incorrect digit is noticed. Press SHIFT to remove the SHFT indicator. 2. Select the incorrect digit with and press SHIFT to display the SHFT indicator. 3. Enter the correct digit. 4. Press the SHIFT key to remove the SHFT indicator. 5. Move the cursor with to the end of the line. 6. Press SHIFT again to display the SHFT indicator. 7. Enter in the rest of the digits. 8. Press ENTER to store the pattern. Edit the codes label using the same procedure. Deleting a User Test Pattern 1. From the TEST PATTERN screen, press USER (F1) to enter the USER TEST PATTERN screen. 2. Select the entry to delete and press DELETE (F3). 3. Press ESC to return to the TEST PATTERN screen.
E1 Module 17

2.3 Measurement Result To observe results: 1. Select MEASUREMENT RESULT from the E1 MAIN MENU and press START (F3). 2. Scroll through screens via PAGE-UP (F1) or PAGE-DN (F2). 3. Press ESC when finished. The test set continuously performs measurements on a received signal. While a measurement is being made, a MEAS status indicator is displayed. When the measurement is stopped, the indicator will no longer be displayed. Results are stored when STOP (F3) is pressed and PRINT RESULT is set to LAST in SYSTEM PARAMETERS > MEAS CONFIGURATION, or when a TIMED measurement finishes. They are also stored when PRINT EVENT is ENABLED, in MEAS CONFIGURATION. The screens do not need to be accessed for results to be compiled. Measurements are automatically restarted every time the configuration is significantly changed. The screens allow for viewing the accumulated measurements and restarting the measurement process. Measurements often have a count number displayed on the left hand side, and the corresponding rate or percentage displayed on the right hand side of the same line. For example, in Figure 11, CODE appears on the left and RATE on the right. A key concept is availability. A circuit is available for use only when the bit error rate is low enough that the signal can get through and be understood. A circuit is said to be unavailable at the beginning of 10 consecutive severely errored seconds. Errors, errored seconds, and severely errored seconds are not accumulated when the circuit is unavailable. Therefore, if you start continuously injecting errors from the test set at a 2x10-3 error rate, you will see increasing bit errors, errored seconds, and severely errored seconds for the rst 9 seconds. At the tenth second, all the counts will decrease back to the values they had before the error injection was started, and the unavailable counter will increase by 10. Once a circuit is unavailable, it becomes available only after 10 consecutive seconds without severe errors. To continue the previous example, if you turn the severe error injection off, and then insert 1 or 2 errors during the next 5 seconds, you will observe that the unavailable second counter continues to increase for the rst 9 seconds while the error counter does not change. Then at the tenth second, the unavailable second counter suddenly decreases by 10 and the
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error counter increases by the 1 or 2 errors that you inserted. Measurement Result screen F-key PAGE-UP (F1), PAGE-DN (F2): Use to view all screens. STOP/START (F3): Use to stop and start the measurement. HOLDSCR/CONTINU (more, F1): Hold Screen freezes all of the measurement displays so they may be easily observed. The measurement count is still proceeding, but the counts are updated only in memory. You may now read the previous counts clearly. When finished, press CONTINU to view updated measurement results. LOCK/UNLOCK (more, F2): Press LOCK to disable the keypad. The measurement process continues as usual, but keypad strokes have no effect on the test set. This is useful if you are running a long-term test and dont wish to have the test disturbed. Press UNLOCK to enable the test sets keypad. Using this feature will not disturb any measurement results. In addition to the actual measurement data, the following information is displayed in the upper portion of these screens: Current Time: The time of day is displayed in the upper right-hand corner of the screen (for the SSxDSL, on the left for the SSMTT. ET: Elapsed Time is the time that has passed since the test was started or restarted. RT: Remaining Time is the time that remains until the end of testing. The factory default condition is that the test runs continuously until you stop it. CONTINU is displayed in the RT field to denote a continuous test. However, in SYSTEM PARAMETERS > MEAS CONFIGURATION, you may specify the length of test time. In this case, the remaining time will count down to zero during the measurement. FRM: Transmitted framing TxCK: Transmit clock source PATT: Transmitted test pattern RATE: Test rate 2.3.1 General Denitions and Result Screens These screens contain several pages of data. Screen 1, which appears when first selecting MEASUREMENT RESULT, is the STATUS screen. It displays the status of the E1 Line. In large font, a status message is displayed for the line. These messages (eg, NO ERRORS, FRM LOSS, SIG LOSS, ERROR DET) represent the condition of the line during testing. Remember to press START (F3) to begin taking measurements.
E1 Module 19

20

Measurement Result Denitions The following measurements are displayed within the results screens. The denitions are listed in alphabetical order. Note: Each measurement is proprietary to its screen; i.e., error refers to E-Bit errors in the E-BIT screen, and to all Summary errors in the SUMMARY screen, etcetera. AISS: Count of the number of Alarm Indication Signal Seconds. AS: Count of Available Seconds since the start of the test. It equals the length of the total test time minus any Unavailable Seconds. %AS: Percentage of Available Seconds since the start of the test. BIT: Count of Bit errors since the start of the test. Bit errors are not counted during unavailable time. BER: Bit Error Rate is the total number of bit errors divided by the total number of bits during available time since the start of the test. CLK SLIP: Number of Clock Slips since the start of the test. CODE: Count of the number of line Code errors (Bipolar Violations that violate the coding rules) since the start of the test. In HDB3 coding, a Code Error is a bipolar violation that is not part of a valid HDB3 substitution. (CODE) RATE: Average Bipolar Violation error rate since the start of the test CRC: Count of the number of CRC-4 block errors since the start of the test. This measurement is reported as N/A when the test set is not synchronized on a received CRC-4 check sequence. (CRC) RATE: Average CRC-4 block error rate since the start of the test. This measurement is reported as N/A when the test set is not synchronized on a received FAS or MFAS signal. DGRM: Count of Degraded Minutes since the start of the test. A DGRM occurs when there is a 10-6 bit error rate during 60 available, non-severely bit errored seconds. %DGRM: Percentage of summary Degraded Minutes since the start of the test. EBIT: Number of E-bit errors since the start of the test. EBER: Average E-bit error rate since the start of the test. EFS: Number of Error Free Seconds since the start of the test. %EFS: Percentage of summary Error Free Seconds since the start of the test. A summary Error Free Second is a second in which the signal is properly synchronized and no errors or defects occur. ES: Count of the number of Errored Seconds since the start of the test. An ES is any second with at least one BPV, bit error, FBE, errored block, or CRC-4 error. An ES is not counted during an Unavailable Second. %ES: Percentage of errored seconds since the start of the test.
SSMTT-27L

FALM: Frame Alarm seconds is a count of seconds that have had far end frame alarm (FAS Remote Alarm Indication, RAI) since the start of the test. FE: Count of the number of Frame bit Errors since the start of the test. This measurement is reported as N/A when the test set has not synchronized on a known framing pattern within the received signal. Hz/PPM: The Hertz/Part Per Million count records any variance from 2.048 Mbit/s in the received frequency. LOFS: Loss Of Frame Seconds is a count of seconds since the start of the test that have experienced a loss of frame. LOSS: Loss Of Signal Seconds is a count of the number of seconds during which the signal has been lost during the test. +LVL: Positive Level is the level of positive pulses being received by the test set. Measurements are displayed in decibels variance from G.703 specified level (dB). -LVL: Negative Level is the level of negative pulses being received by the test set. Measurements are displayed in decibels variance from G.703 specified level (dB). Lpp: Level Peak-to-Peak is the peak-to-peak level of negative and positive pulses being received by the test set. Measurements are displayed in decibels variance from DSX level (dB). MAX Hz: Maximum frequency since the start of the test. MIN Hz: Minimum frequency since the start of the test. MFAL: Multiframe Alarm seconds is a count of seconds that have had far end multiframe alarm (MFAS Remote Alarm Indication, RAI) since the start of the test. RxCLK: Received clocking frequency. +/- RxLVL: Positive or negative level of pulses received. RCV Hz: Frequency measured during the last second. SES: Count of Severely Errored Seconds since the start of the test. A severely errored second has an error rate of >10-3. SES is not counted during unavailable time. %SES: Percentage of seconds since the start of the test that are Severely Errored Seconds. SLIP: Count of Bit Slips that occur when the synchronized pattern either loses a bit or has an extra bit stuffed into it. UAS: Count of Unavailable Seconds that have occurred since the start of the test. Unavailable time begins at the onset of 10 consecutive severely errored seconds. The displayed value of UAS updates after the tenth consecutive severely errored second occurs. Unavailable time also begins at a LOS or LOF.
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%UAS: Percentage of unavailable seconds since start of test. +WANDR: Total positive phase difference between the measured frequency and the reference frequency since the start of the test. The +WANDR value increases whenever the measured frequency is larger than the reference frequency. -WANDR: Total negative phase difference between the measured frequency and the reference frequency since the start of the test. The -WANDR increases whenever the measured frequency is less than the reference frequency. The following subsections describe the results screens. Line Summary Screen This SUMMARY screen contains Meas 8:21:36 summary results for the E1 Line. It ET : 000:24:37 RT : CONTINU FRM : PCM-30/C TxCk: INTERN presents the most significant PATT: 2e23 RATE: 2.048M SUMMARY measurement results. It contains CODE: 0 RATE: 0.00E-09 RATE: 0.00E-09 data related to the specific types BIT : 0 CRC : 0 RATE: 0.00E-06 of impairments, like code errors, EBIT: 0 RATE: 0.00E-06 FE : 0 RATE: 0.00E-06 CRC-4 block errors, framing, and RxCLK: 2048000 +RxLVL:-0.22 dB HZ/PPM:-0.488 -RXLVL:-0.22 dB multiframe bit errors. See PAGE-UP PAGE-DN STOP MORE Measurement Result Definitions in Figure 11 Summary Screen this section for screen definitions. Frequency Screen Meas 8:21:36 The FREQUENCY screen reports relevant line frequency information ET : 000:24:37 RT : CONTINU FRM : PCM-30/C TxCk: INTERN via a bar graph to indicate how PATT: 2e23 RATE: 2.048M FREQUENCY fast the signal is slipping in NEG 0 POS relation to the reference clock. 051 <<<<< The bar graph slips most rapidly RCV/Hz: 2047999 CKSLIP: 51 at the center position and then MAX/Hz: 2047999 +WANDR: 0 MIN/Hz: 2047999 -WANDR: 51 gradually slows down as the PAGE-UP PAGE-DN STOP MORE length of the bar increases. Figure 12 Frequency Screen A count of the number of slips is kept at the end of the bar and at 256 clock slips it resets itself. One clock slip occurs when the measured frequency deviates from the reference frequency by one unit interval. A unit interval is equal to 488 nano seconds, for E1 lines. The bar graph is only valid when the EXT CLOCK and RX input has valid signals. If no signal is present, NO REF SIGNAL is displayed in place of the graph.
22 SSMTT-27L

A reference clock is selected via TEST CONFIGURATION-Tx CLOCK. It is important to know the source of the reference clock, to meaningfully interpret the graph results. Note: When no reference clock signal is present, the test set will default to its internal clock, for the measurement of MAX, MIN, and current RCV bit rates of the signal. G.821 Screen Meas 08:21:36 The G.821 screen reports the : 000:50:21 RT : CONTINU measurement parameters speci- ET FRM : PCM-30/C TxCK: INTERN RATE: 2.048M fied in ITU G.821. This screen will PATT: 2e23 G.821 BIT : 0 BER : 0.0e-10 only be displayed if the G.821 is ES : 0 %ES : 00.00 %SES : 00.00 ON in SYSTEM PARAMETERS > SES : 0 EFS : 3021 %EFS : 100.00 MEAS CONFIG. The same applies AS : 3021 %AS : 100.00 UAS : 0 %UAS : 00.00 specifically to the DGRM SLIP: 0 DGRM: 0 %DGRM : 0.00 measurement. See Measurement PAGE-UP PAGE-DN STOP MORE Result Definitions in this section Figure 13 G.821 Logical for screen definitions. Screen Alarm/Signal Screen The ALM/SIG screen reports alarm and measurement parameters relating to the E1 signal. See Measurement Result Definitions in this section for screen definitions.
Meas 8:21:36

ET : 000:24:37 RT : CONTINU FRM : PCM-30/C TxCk: INTERN PATT: 2e23 RATE: 2.048M ALM/SIG LOSS: AISS: LOFS: FALM: MFAL: 0 0 0 0 0 +LVL : -0.59 dB -LVL : -0.59 dB +Lpp : 4.73 dB

PAGE-UP PAGE-DN

STOP

MORE

Figure 14 ALM/SIG Screen M.2100/550 Screen The M2100/550 screen provides Meas 8:21:36 pass/fail measurements in ET : 000:24:37 RT : CONTINU : PCM-30/C TxCk: INTERN accordance with ITU M.2100/550 FRM PATT: 2e23 RATE: 2.048M M2100/550 specifications. The specification is PERIOD P/F %ES %SES used where a 2.048 Mbit/s circuit 01-01 00:27/00:29 P 0.0 0.0 01-01 00:29/00:31 P 0.0 0.0 crosses international boundaries. 01-01 00:31/00:33 P 0.0 0.0 01-01 00:33/00:35 P 0.0 0.0 It allocates a certain allowable error rate for each boundary that PAGE-UP PAGE-DN STOP MORE carries the circuit. You need only Figure 15 M.2100/550 Screen enter the appropriate percentage that is to be allowed for the line under test. The test set makes calculation and reports whether the line passed or failed.

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The following definitions pertain to the M.2100/550 screen: PERIOD: Identifies the date and time interval of each of the reported pass or fail results. The period interval used in Figure 15 is 2 minutes. Change this interval in the SYSTEM PARAMETERS > MEAS CONFIGURATION, screen 2. Valid entries may range from 00 to 99 minutes. P/F: Indicates whether the test result Passed or Failed. %ES: Percentage of M.2100 Errored Seconds since the start of the test. An errored second is any second with a Code, Bit, Frame, Multiframe or CRC errors. %SES: Percentage of M.2100 Severely Errored Seconds since the start of the test. An M.2100 Severely Errored Second is any second with >10-3 bit error rate, 10-3 code error, excessive frame, multiframe or CRC bit errors, loss of frame, loss of pattern, synchronization, or loss of signal. See Measurement Result Denitions in this section for screen denitions not mentioned. G.826 Screen Meas 08:21:36 The ITU standard specifies RT : CONTINU required performance character- ET : 000:50:21 FRM : PCM-30/C TxCK: INTERN istics of 2.048 Mbit/s lines. The PATT: 2e23 RATE: 2.048M G.821 parameter definitions given in EB : 4 %EB : 01.11 BBE : 4 %BBE : 00.04 G.826 are block-based. This ES : 4 %ES : 00.04 SES : 0 %SES : 00.00 allows for convenient in-service UAS : 0 %UAS : 00.00 %EFS : 99.93 measurement. The G.826 screen EFS : 1001 is displayed only if G.826 is ON PAGE-UP PAGE-DN STOP MORE in SYSTEM PARAMETERS > Figure 16 G.826 Screen MEAS CONFIGURATION. The following definitions are specific to the G.826 screen: BBE: A Background Block Error is an errored block not occurring as part of a SES (Severely Errored Second). %BBE: Percentage of Background Block Errors since the start of the test, excluding all blocks during SES and unavailable time. EB: Errored Block is a block containing 1 or more bit errors. %EB: Percentage of Errored Blocks since the start of the test. SES: Severely Errored Second is a 1 second period which contains greater or equal to 30% errored blocks. %SES: Percentage of Severely Errored Seconds since the start of the test. See Measurement Result Denitions in this section for screen denitions not mentioned.
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2.4 Other Measurement This menu can contain the following, depending on ordered options: VIEW RECEIVED DATA VIEW CURRENT EVENT VIEW FAS WORDS VIEW MFAS WORDS PULSE MASK ANALYSIS C-BIT ANALYSIS HISTOGRAM ANALYSIS PROPAGATION DELAY CHANNEL LOOPBACK 2.4.1 View Received Data VIEW RECEIVED DATA F-keys PAGE-UP (F1), PAGE-DN (F2): Use to view all data. Note the PAGE number in the upper left-hand portion of the screen. 64 pages of data are available; which is equal to 16 frames or one multiframe. PAUSE (F3): Trap the current Figure 17 View Received data on the E1 line. Data Screen PRINT (F4): Send the data to the serial port for printing. The following is reported: PAGE: Indicates which of the available 64 pages of data is currently being displayed. T/S: Specifies the Time Slot being viewed. BINARY: This column shows the binary data actually being received on the line. Each line represents the 8-bit timeslot. HEX: This column shows the hexadecimal representation of the 8 bits being transmitted in each timeslot. ASCII: Displays the ASCII representation of the 8-bit binary framing word which has been received. The character displayed to the left of the parentheses represents the 8-bit framing words translated in order. The character displayed within the parentheses represents the 8 bits translated in reverse order.

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2.4.2 View Current Event The EVENT RECORD screen Meas 8:21:36 EVENT RECORD reports on all events; date, time, 1. 2007-04-03 09:29:38 type, and count of events that MEASUREMENT START occur during measurements. 2. 2007-04-03 09:29:48 BERT BIT: 1 This screen can also be 3. 2007-04-03 10:10:51 accessed by pressing EVENT BERT BIT: 2 (more, F3) in the Measurement 4. Results screens. PAGE-UP PAGE-DN REFRESH more This feature is active when Figure 18 Event Record PRINT EVENT is enabled in Screen SYSTEM PARAMETERS > MEAS CONFIGURATION. EVENT RECORD F-keys PAGE-UP (F1), PAGE-DN (F2): Use to view all records REFRESH (F3): Use to refresh the screen. PRINT (more, F1): Send the data to the serial port for printing. SAVE (F4): Save the report records. See Section 2.8. 2.4.3 View FAS Words View the live presentation of E1 framing binary words. Timeslots 0 of frames 0-15 are displayed in Figure 19. FAS FRAME WORDS F-keys PAUSE/RESUME (F1): Press to freeze the presentation of data; press again to return to a live FAS word display. PRINT (F2): This is available when this screen is paused; press to send the screen to the serial port for printing. PCM-31 PCM-30

Figure 19 FAS Frame Words Screens The even frames, 0-14, contain the FAS in bits 2-8. In the left screen of Figure 19, FAS is represented by 0011011.
26 SSMTT-27L

The odd frames do not contain FAS. The top row of these frames shown in the left screen of Figure 19 show the allocation of bits 1-8 in these frames. The gure represents an undisturbed condition. When the framing is set for PCM-30 Multiframe (right screen in Figure 19), there is a slight variation in the odd framing bits, those not containing the frame alignment signal. Bit 1 is used to transmit the 6-Bit CRC-4 multiframe alignment signal and 2 CRC-4 error indication bits. The CRC-4 multiframe alignment signal has the form of 001011. The screen shows the FAS frame words when framing is set for PCM-30. The first bits of frames 1-11 (odd) send the pattern 001011, the CRC-4 multiframe alignment signal. 2.4.4 View MFAS Words The screen to the right allows viewing of the live presentation of Timeslot 16, Frames 0-15. Select PCM-30 framing in TEST CONFIGURATION to access this screen.

Figure 20 MFAS Frame Words Screen MFAS FRAME WORDS F-keys PAUSE/RESUME (F1): Press to freeze the presentation of data; press again to return o a live MFAS word display. PRINT (F2): This is available when this screen is paused; press to send the screen to the serial port for printing. In the Multiframe, timeslot 16 is used for either common channel or channel associated signalling, as required. Note that in Figure 20, the template for the even frames (0000xyxx) applies only to Frame 0. All other frames follow the template shown above the odd frames (ABCDabcd). As seen in Figure 20, in frame 0, MFAS is 0000. The rest of the frames contain signalling channels designated a, b, c, and d. Frame 1 contains channels 1 and 16, frame 2 contains channels 2 and 17, and so forth until frame 15, which contains channels 15 and 30.

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2.4.5 Pulse Mask Analysis This option enables you to measure the quality of an E1 waveform. The results compare favorably with pulse shape measurements obtained from testing with a digital oscilloscope. The analysis is performed for any received test pattern or live signal, and line interface mode. The signal shape is displayed on the test sets screen. The ITU G.703 pulse mask can be superimposed for fast inspection. The test set will store the current pulse for later viewing. Note that if you start analysis while measurements are running, the test set will stop the measurements. When the analysis is complete, the test set will restart the measurements. The menu contains: START NEW ANALYSIS VIEW LAST PULSE SHAPE 2.4.5.1 Start New Analysis In a few seconds, the captured pulse shape is displayed. A PASS/FAIL message will be displayed, when a G.703 mask has been imposed on the received pulse. If the pulse meets the G.703 criteria, it passes. Otherwise, it fails. Figure 21 Pulse Shape Analysis Screen Pulse Shape Analysis F-keys G.703/NO-MASK (F1): Displays the ITU G.703 mask with the captured signal; press again to remove the G.703 mask. RESTART (F2): Starts a new pulse shape capture and analysis. PRINT (F3): Press to print the screen. Denitions for this screen are: Width: Pulse Width, in nanoseconds Rise Time: in nano seconds Fall Time: in nano seconds Ovr Shoot: Percentage of overshoot Und Shoot: Percentage of undershoot Level: Signal level, in dB
28 SSMTT-27L

2.4.5.2 View Last Pulse Shape View the last pulse shape captured by the test set. The pulse shape can be viewed at any time, even after the test set has been turned off. The last pulse shape will be displayed on the screen, along with the G.703 and PRINT F-keys. See Section 2.4.5.1 for the results denitions. 2.4.6 C-Bit Analysis Send and receive C-Bit frames with this screen. Note: The test set will transmit an IDLE pattern upon entering this screen.

Figure 22 C-Bit Analysis Screen Configure the following: Tx T/S Options: 1-15, 17-31 Select the transmit timeslot on which to send C-bits by pressing NEXT (F1) or PREVIUS (F2). Since PCM-30 framing is required for this C-bit analysis, timeslot 16 cant be selected. TRANSMIT Options; USER (F1), IDLE (F2) This setting determines bit 2. USER: This activates the C-bit framing and sets the programmable bits. To program the bits: 1. Select SEND bits. 2. At each bit, press SHIFT and use the numeric keypad to enter either 0 or 1. The cursor automatically moves one spot to the right once a bit is entered. When the cursor highlights a specific bit, information about this C-bit is displayed. Rx Options: 1-15, 17-31 Select the Line receive timeslot on which to receive C-bits by pressing NEXT (F1), or PREVIUS (F2). Since PCM-30, MFAS, framing is required, timeslot 16 cant be selected.
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This screen also shows the received C-bits for Lines 1 and 2. If C-bits are not found on a line, C-BIT NOT FOUND is displayed for that line. Definitions of C-bits 2-15 are shown in Table 2. Bit # 2 ESCAPE 3 2 Mb Loops 4 Loop 2 or Loop 3 5 Loop 2 Instruction 6 Loop 3 Instruction 7 HDB3 Command 8 Loop Acknowledge 9 Not Dened 10 Local Fault 11 Remote/Line Fault 12 C Frame Loss 13-15 Spare Table 2 C-bit Denitions 0-Active 1-Non-active 0-Active 1-Non-active 0-Active 1-Non-active Assignment 0-C-Frame Active 1-C-Frame Ignored 0-Subscriber 1-Network 0-Subscriber 1-Network 0-Active 1-Non-active 0-Active 1-Non-active 0-Active 1-Non-active 0-Acknowledge 1-No Acknowledgement

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2.4.7 Histogram Analysis This menu screen contains the following: CURRENT HISTOGRAM SAVED HISTOGRAM FORMAT SRAM Notes Histogram analysis automaticity starts when E1 measurement starts. A SRAM memory card must be installed in the test set. Interrupting a timed measurement to view results will cause a new analysis to start when returning to measuring. 2.4.7.1 Format SRAM Before using a new SRAM memory card, it must be formatted for use with the test set. To do so, follow the on-screen instructions. Press ESC to cancel the formatting. Note: SRAM cards have mechanical erase protection; turn the protection off to erase and format the card. 2.4.7.2 Current Histogram This screen contains the following: The start and stop date and time is displayed. The CURRENT date and time correspond to the last time MEASUREMENT RESULTS was entered. Figure 23 Current Histogram Selection Screen Press VIEW (F1) to view the current histogram. Figure 24 shows a sample screen. Pressing STORE (F2) will erase any previously stored data. The CURRENT histogram data is also stored, but it will be erased the next time MEASUREMENT RESULTS is entered. If you do not want to save the current file and erase the one already saved, press ESC instead of ENTER at the warning message screen.

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Figure 24 Current Histogram Screen CURRENT HISTOGRAM F-keys TYPE (F1): Press to select a measurement type. The following error types are available: - EBIT, CRC, FAS, MFAS, CODE: See Section 2.3.1. - LOS: Loss of Signal - LOF: Loss of Frame - AIS: Alarm Indication Signal - FASRAI: FAS Remote Alarm Indication - MFASRAI: MFAS Remote Alarm Indication - BERT_LOPS: Loss of Pattern Synchronization - BERT_BIT: Bit errors For all error types: - The history of each error type is displayed individually. - The error type is specied in the upper portion of the screen. - Pressing TYPE automatically changes the type options displayed. In Figure 24, BERT_BIT error was selected. LINE 1/2 (F2): Selects the parameters of either E1 Line 1 or E1 Line 2, depending on the setup. ZOOM (F3): Changes the resolution to the next lower time period at the cursor location. Select the error before pressing ZOOM. Select a minute, hour, or day interval as your time period JUMP (MORE, F1): Moves the display cursor 10 steps. Use to move the cursor one step at a time. PRINT (MORE, F2): Press to print the results.

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Notes: The screen will display either the current or saved results. Each time MEASUREMENTS RESULT is selected, the test set will replace the file in the CURRENT HISTOGRAM data. For each file, the feature will store the most recent 24 hours of data with a display resolution (PERIOD) of 1 minute. For each file, the screen will store both the present 60 hours and the previous 60 days of histogram data with a resolution (PERIOD) of one hour. 2.4.7.3 Saved Histogram Select this screen to view, print, or give a label to a saved analysis. See Section 2.4.7.2 for an explanation of the data.

Figure 25 Saved Histogram Selection Screen SAVED HISTOGRAM F-keys VIEW (F1): Press to enter the selected record. PAGE-UP/PAGE-DN (F2): Press to view the available histograms. DELETE (MORE, F1): Press to delete a selected histogram. LOCK/UNLOCK (MORE, F2): Press to lock the record, so that it may not be deleted. Press again to unlock it. LABEL (MORE, F3): Press rename, and use the character entry screen with this procedure: 1. Press TOGGLE (F3), then select the characters by using . Press SELECT (F4) to enter the character into the LABEL line. Use INSERT (F1) and DELETE (F2) to add or remove a character. 2. Press TOGGLE (F3) when done. 3. Press ENTER, and you will return to the SAVED HISTOGRAM screen, where the new label will be displayed. CLR-ALL (MORE, F1): Press to delete all unlocked records.

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2.4.8 Propagation Delay This screen allows for viewing the propagation delay of a loop back signal at a full or Nx64 rate. The test set measures the number of unit intervals it takes for the signal to return. A unit interval is the amount of time it takes to transmit one bit (488 ns for a E1 signal). This number is Figure 26 Propagation Detranslated into the number of lay Screen microseconds of round trip delay. PROPAGATION DELAY F-keys CALIB (F2): Press if more than one piece of looped equipment is on the line, and the test set will recalibrate to allow viewing the propagation delay between two devices, without including the test set. OFFSET indicates the delay between the two pieces of equipment (removing the test set to Equipment 1 measurement). Press again to take measurements further down the line. RESTART (F1): Press to stop and restart the test. 2.4.9 Channel Loopback Use this screen to set up a far end loop to perform measurements of V.54 datacom circuits. A loopback can locate the faults in the circuit by setting the far end modem to loop, that allows for measurements. The test set can activate or deactivate the near end device by sending the proper Figure 27 V.54 Channel standard T1 E1.2/94-003 code. Loopback Screen

Figure 28 V.54 Setup Use LOOP-UP (F1) or LOOP-DN (F2) to send codes.
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2.5 VF Channel Access Access a variety of talk/listen functions. Note: Do not attempt to enter this menu if the FRAME LED is not green. A green LED indicates that the framing found on the received signal matches the framing selected in TEST CONFIGURATION. It is impossible to talk, listen, or perform other channelized functions in the absence of frame synchronization, since channels can be identified only within a framed signal. This menu contains the following: VF & NOISE MEASUREMENT VIEW LINE CAS CALL EMULATOR DIAL PARAMETERS VIEW/STORE/PRINT (see Section 2.8) Note: During VF CHANNEL ACCESS, when TEST CONFIGURATION-TxSOURCE is set to TESTPAT, idle channel code and signalling (A/B/C/D bits) will be inserted into the unselected channels. The idle channel code and signal can be programmed from: E1 MAIN MENU > SYSTEM PARAMETERS > MEAS CONFIGURATION-IDLE CHNL CODE and IDLE CHNL A/B/C/D lines. 2.5.1 VF & Noise Measurement This screen lets you choose: which channel to test for both transmitting and receiving. whether to talk, send a tone, or place quiet termination on the transmit signal. the transmitted frequency and level. which signalling bits to send. to listen to the line. It also tells you: the received signalling bits. the received 8-bit data. the received frequency and level. noise measurements on the received frequency. The screen to the right is an Meas 8:21:36 configuration example. Tx-T/S VF & NOISE MEASUREMENTS MEASUREMENT SETUP is set for timeslot 01. Rx-T/S Tx-T/S: 01 TxMODE :TONE Rx-T/S: 01 TxFREQ :1020 shows the selected receive TxABCD: 1001 TxLVL(dBm):3 timeslot. MEASUREMENT RESULTS
RxFREQ =800 Rx(dBm)=01 RxABCD =0101 S/N(dB)=-9.5 3K(dBm)=-9.5 NEXT OFFSET=+10 PEAK =+127/-127 RxDATA=10011001 PSOP(dBm)=-33.5 1010(dBm)=-68.9

PREVIUS

Figure 29 VF Measurements Setup Screen

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Tx-T/S Options: 1-31 Choose a transmit timeslot by pressing NEXT (F1) or PREVIUS (F2). Tx-T/S normally should be the same as the Rx-T/S, but they can be set for different channels. Upon selecting a timeslot, approximately three seconds pass before the signal is actually inserted into the timeslot. Rx-T/S Options: 1-31 Select the receive timeslot via NEXT (F1) or PREVIUS (F2). TxABCD Options: IDLE (F1), SEIZE (F2), manually set Change the signalling bits transmitted with the associated transmit channel. These bits will be transmitted only if the test set is using MFAS (PCM-30) framing. Pressing IDLE (F1) or SEIZE (F2) will place that signal onto the A/B/C/D position. Program the IDLE or SEIZE signal in VF CHANNEL ACCESS > SUPERVISION SETUP. To change these bits manually: 1. Press SHIFT and use 1 and 0 to enter the signalling bits. 2. Press ENTER to send the ABCD bits. TxMODE Options: THRU (F1), TALK (F2), QUIET (F3), TONE (F4) THRU passes all received channels onto the transmit signal. TALK puts speech on the selected transmit channel; the test set will transmit speech from the microphone. QUIET places a quiet termination on the transmit signal. TONE inserts a tone on the selected transmit channel. If selected, use the next two settings: TxFREQ Options: 50 Hz-3950 Hz If TONE is selected for TxMODE, choose the tone frequency by pressing SHIFT and entering the value from the keypad. TxLVL Options: -60 to 3 dBm If TONE is selected for TxMode, choose the transmit tone level by pressing SHIFT and entering the value from the keypad. You may select any value from -60 to +3 dBm. Press MINUS (F1) to achieve negative values.

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Measurement Results The rest is received data. As the equals sign indicates, they are for viewing only, and may not be edited or changed. RxFREQ View the received frequency of the selected channel in Hz. Rx(dBm) View the received level in dBm. RxABCD View the received CAS bits. These bits are meaningful only if the FRAME LED is green. Ignore these bits if the LED is not green. S/N (dB) Observe the Signal-to-Noise measurement, in decibels. This measurement is updated every second. 3K (dBm) Observe the Noise 3-K Flat measurement, in dBm. This measurement is updated every second. OFFSET Observe the coder offset. PEAK Observe the coder peak from +127 to -127, using A-law. RxDATA View live 8-bit channel data received from the selected line. PSOP (dBm) Observe the Noise Psophometric* measurement in dBm. This measurement is updated every second. *A noise weighting method established by the ITU-T, designated as CCIF-1951 weighting, for use in a noise measuring set or psophometer. 1010 (dBm) Observe the Noise 1010 Hz measurement, in dBm. This measurement is updated every second.

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2.5.2 View Line CAS This screen allows viewing of the signalling bits for all 30 channels of a line. In order to do this: Select PCM-30 framing in TEST CONFIGURATION. The FRAMING LED must be green in order for the signalling bits to be displayed. Timeslots 1-5 are shown on the first line, 6-10 are shown in the second line, etc. Figure 30 is a sample screen.

Figure 30 View Line CAS Screen Press STATUS (F1) to see a decode of each ABCD state. Information will be displayed when a match of state for forward/backward conditions are met, as specified in the SUPERVISION SETUP screen. Here are the denitions: IDLE= IDLE SEIZ= SEIZE ACKW= SEIZE ACKNOWLEDGMENT ANSW= ANSWER CLRB= CLEAR BACK CLFR= CLEAR FORWARD BLCK= BLOCK ????= UNKNOWN; no state or no match detected Note: Some states will change too quickly for the test set to display and detect. Therefore, only constant states which are detected when the screen is refreshed will be displayed. Press ABCD (F1) to return to the ABCD information.

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2.5.3 Call Emulator Use this feature to place and receive calls. Select one of the 10 predened sequences, or input a user dened sequence. Notes: To run the user call emulator, press START (F4) in USER CALL EMULATOR. If you escape from the menu to CALL EMULATOR, then press START (F4), you will be running the Q.441 specication instead of the one you dened. When you edit your own sequence, no default Q.441 timer value will be provided for PERD (periodic timer). You need to enter a value according to the Q.441 specification or any other desired value to make the sequence work. 2.5.3.1 Standard Emulations Use the CALL EMULATOR screen to select a standard emulation to place a call.

Figure 31 Call Emulator List Screen CALL EMULATOR F-keys USER (F1): Select the USER CALL EMULATOR screen to create, edit, or use a User emulation sequence. See Section 2.5.4.4. VIEW (F2): View a screen that shows a sample sequence of the selected emulation. Figure 45 shows a DTMF sequence. Note that for DTMF RECEIVE, the RECEIVE side is only emulated. START (F4): Start the selected emulation as shown in the Figure 32 DTMF Receive screen to the right. Sequence Screen

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2.5.3.2 Place a Call For call emulation, use the screen shown to the right to setup and place a call.

Figure 33 Q.441 MFCR2 Call Setup Screen Use this procedure to setup the call: 1. CHANNEL: Choose a timeslot to place the call on. Select from 1-15, 17-31 by using NEXT (F1) and PREVIUS (F2). 2. CALL NUMBER: Press SHIFT and use the numeric keypad to enter the digits for the number to call. The A-F keys, corresponding to the digits, are also available. For some emulation sequences the following items will also be available to congure: 3. CALLING NUMBER: This is the number you are dialing from. Use the SHIFT and number keys to enter the digits. 4. CALLING PARTYS CATEGORY: This deals with the category of the calling party as defined by Q.441 (or user defined by the Signal Meanings) Forward Group II, i.e. the user can be a subscriber without priority II-1, subscriber with priority II-2, etc. Use SHIFT and keypad number keys to enter the digits. 5. Press CALL (F4) when ready to place the call. The appropriate CALL screen is then displayed as in Figure 34. The following is reported: Time/s: Time sent; the time the digits were sent. Send: The CAS or Register signalling sent. Recv: The CAS or Register signalling received. Label: Sent or received CAS or Register signalling meanings, Figure 34 Q.441 MFCR2 as defined by Supervision Call Emulation Screen Setup or Signal Meanings. Q.441 MFCR2 Call F-keys STOP/RESTART (F1): Stop or restart the CALL or RECEIVE. ABSOLUT (F2): Display the time stamp in absolute mode.
40 SSMTT-27L

RELATIVE (F3): Display the time stamp relative to initial event. HANG-UP (F4): Release the call in progress. Keypad Functionality When a MFCR2 or MFR2 call has been established, enable keypad DTMF dialing by pressing SHIFT. DTMF tones will then be sent when you press the 0-9 digits. This is especially useful for verifying credit card functionality. 2.5.3.3 Receive a Call Use this setup screen to receive a call.

Figure 35 Q.441 MFCR2 Receive Setup Screen Configure the following: CHANNEL Press NEXT (F1) and PREVIUS (F2) to select from 1-15, 17-31 for the receive channel. No. DIGITS EXPECTED Press SHIFT and use the numeric keypad to enter the number of digits you expect the test set to see and capture. The range is from 1-20 digits. Some receive emulations will include the following items: REQUEST CALLER ID Options; NO (F1), YES (F2) NO: Caller ID will not be sent to the test set. YES: Caller ID will not sent to the test set. When received, the CALLER ID will show up in the messages. REQUEST CATEGORY Options; NO (F1), YES (F2) NO: REQUEST CATEGORY (such as 2, Subscriber with Priority, or 6, Data Transmission) will not be sent to the test set. YES: REQUEST CATEGORY will be sent to the test set. When received, the category will show up in the receive messages.

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Press RECEIVE (F4) when ready to receive a call. The test set will display the RECEIVE screens, where the call trace can be viewed, as in the screen to the right.

Figure 36 Q.441 MFCR2 Receive Screen The information presented and F-keys available are the same as that for the CALL screen in Section 2.5.3.2. 2.5.3.4 User Emulation Use this screen to create, edit, or use a user emulation sequence using this procedure: 1. In the CALL EMULATION screen, press USER (F1) and the USER CALL EMULATOR screen is displayed. This screen features a list of stored emulations and allows for creating new sequences. Figure 37 User Call Emulator Screen The following F-keys are available: EDIT (F1): Edit a sequence. DELETE (F2): Delete a selected sequence. RENAME (F3): Display the CALL EMULATOR PROFILES screen, where the selected sequence may be renamed. Use the Label procedure further in this section. START (F4): Start a selected emulator sequence. 2. Press EDIT (F1) and the Edit Emulator screen is displayed. The cursor will be on the first line; LABEL.

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3. Press EDIT (F1) again to display the CALL EMULATOR PROFILE screen, where you give your call sequence a label (name). 4 Follow this procedure to give the sequence a label: Figure 38 Call Emulator Proles Screen A. Press TOGGLE (F3) to display the character screen. B. Use to move the cursor to the desired character, and press SELECT (F4). C. Continue steps A and B until the label is completed. When finished, press TOGGLE (F3) to escape. If a mistake is made while entering characters, select the character with the cursor, then press DELETE (F2). D. When the label is complete, press ENTER to return to the EDIT EMULATOR screen. 5. Use to select CHANNEL and press NEXT (F1) or PREVIUS (F2) to select the timeslot to use (both Rx and Tx) during emulation, in Figure 39 Edit Emulator the 1-15, 17-31 range. Screen SEND Side The Send side refers to the Line or Register signalling which is sent by the test set on whichever line has been selected as Tx/ INSERT in TEST CONFIGURATION. Three items are available: TYPE Options: NONE (F1), CAS (F2), DTMF (F3), MF-F (more, F1), MF-B (more, F2), DP (more, F3) Determines the type of signalling used. NONE: No signalling CAS: Channel Associated Signalling DTMF: Dual Tone Multi-Frequency MF-F: Multi-frequency-forward MF-B: Multi-frequency-backward DP: Dial Pulse
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CODE Options: Any keypad alphanumeric digits; four digits maximum for CAS. 20 digits maximum for all other types. These bits will be transmitted by the test set. Press SHIFT and use the numeric keypad enter the desired signalling bits. PERD Options: up to 999 ms PERD determines the elapsed time before proceeding to the next step in the emulation. RECEIVE Side The receive side refers to the Line or Register signalling which you require to be received by the test set, before progressing to the next step. Three items are available for the receive side. Note that TYPE and CODE work in the same manner as in the send side. TOUT Options: NONE (F1), up to 999 ms TOUT refers to Time Out. This determines the length of time which the test set will wait for its received digits/CAS before aborting the signalling sequence. To select a time limit: A. Press SHIFT and enter the desired number digits up to 999 (ms). Press SHIFT when done. B. Press ENTER to exit and save the settings. 6. To begin an emulation sequence, select the sequence you want to use in the USER CALL EMULATOR Screen and press START (F4). The screen shown in Figure 40 is displayed. 7 Observe the time digits are sent or received, and their label. The following F-keys are available in the screen to the right: STOP/RESTART (F1): Stops and restarts the CALL or RECEIVE. ABSOLUT (F2): Presents time stamps in absolute mode (view at Time/s line). RELATIV (F3): Presents time stamps in relative mode (view at Figure 40 Start User Emulation Screen Time/s line).

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2.5.4 Dial Parameters Use the DIAL PARAMETERS screen to setup the following VF dialing parameters. Note: To enter number in this screen, press SHIFT and use the numeric keypad.

Figure 41 Dial Parameters Screen DIAL PERIOD Options: 1 ms to 999 ms (default is 100 ms) Set the dial period in milliseconds used for DTMF and MF dialing. SILENT PERIOD Options: 1 ms to 999 ms (default is 100 ms) Set the silent period in milliseconds used for MFR2, DTMF and MF dialing. INTERDIGIT PRD Options: 1 ms to 999 ms Set the interdigit period for pulse dialing. TONE LEVEL dbm Options: -20 to -5 dbm Set the tone level. Press MINUS (F1) to attain a negative value. B-BIT Options: YES (F1), NO (F2) B-Bit dialing applies to pulse calls. When B-bit dialing is enabled and a call is placed, the B supervision bit of the selected timeslot toggles between 0 and 1. Before calling, change the transmit CAS bits to the seizure condition. When dialing, the test set will pulse the B-bit according to the timing selected in %BREAK and INTERDIGIT period. When the dialing is complete, the test set remains in the seizure condition. PULSE (10pps) Dial pulse is set to 10 pps and cannot be changed. % BREAK Options: 40% (F1), 50% (F2), 60% (F3) Set the desired BREAK percentage used for pulse dialing. Percent break is the ratio of the break (IDLE) interval to the total pulse cycle interval.
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2.6 Other Features This menu contains the following: ERROR INJECTION ALARM GENERATION SEND FRAME WORDS 2.6.1 Error Injection To start error injection, press ERR INJ. The test set will insert errors as specified. If the error injection is set to RATE mode, an ERR-INJ indicator will be displayed. Configure the following: Figure 42 Error Injection Screen TYPE Options: CODE (F1), BIT (F2), BIT + CODE (F3), CRC-4 (MORE, F2), FRAME (MORE, F2), E-BIT (MORE, F3) Specify the type of errors to be inserted. MODE Options: BURST (F1), RATE (F2) Specify the mode of error injection. RATE: Applies only to CODE and BIT errors. Errors are injected at a constant rate. BURST: Inject a set number of errors in a burst. COUNT/RATE Options: 1 to 9999 or 1e-9 to 2e-3 For BURST MODE, choose the COUNT of errors to be inserted. For RATE MODE, choose the error RATE number and exponent. For BURST, press SHIFT, then use the numeric keypad to enter any number between 1 and 9999. The errors will be inserted in approximately 1 second or less, and will cause from 1 to 3 errored seconds. Applies only to BIT and CODE errors. All other errors will be injected singly. For RATE, the errors will be inserted at a continuous rate as specified in this entry. ERR-INJ also be displayed.
46 SSMTT-27L

Programming a Burst of 10 Errors 1. Select ERROR INJECTION. 2. Press CODE (F1) to select the error type and the cursor automatically moves to MODE. 3. Press BURST (F1) and the cursor automatically moves to COUNT 4. Press SHIFT and use the numeric keypad to enter 10. COUNT should show 10. 5. When finished, press SHIFT. 6. Press ENTER; you have just programmed the test set to inject 10 CODE errors each time ERR INJ is pressed. Programming a 10-6 Bit Error Rate 1. Select ERROR INJECTION. 2. Press BIT (F2) to select the error type. The cursor automatically moves to MODE. 3. Press RATE (F2) and the cursor automatically moves to COUNT 4. Press SHIFT and use the numeric keypad to enter 1. The multiplier position shows 1. The cursor moves to the exponent position. 5. Press 6. 6. When finished, press SHIFT. 7. Press ENTER and the test set is programmed to inject Bit errors at 1x10-6 rate each time ERR INJ is pressed. To turn off the error rate injection, press ERR INJ once, then verify that the ERR INJ indicator has turned off.

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2.6.2 Alarm Generation This screen presents a list of the alarms that can be transmitted. Send alarms to test various network equipment, and thus ensure that the network is performing as expected. Figure 43 Alarm Generation Screen To Invoke an Alarm Select the desired alarm and press ENABLE (F1) and the test set will transmit the enabled alarm after exiting ALARM GENERATION. To stop transmitting press DISABLE (F2). Some alarms conflict with the transmission of other alarms or selected framing. Alarms can be transmitted while making measurements, viewing data, performing talk/listen, etc. The following alarms are available: FAS DISTANT: The test set transmits a 1 in every third bit of each timeslot 0 frame that does not contain frame alignment signal. This alarm may be transmitted only with PCM 30 or PCM 31 framing. MFAS DISTANT: The test set transmits a 1 in the sixth bit of each time slot 16 in the zero frame. This alarm may be transmitted only with PCM framing. AIS: The test set transmits all ones in an unframed signal. This alarm overrides the framing set in TEST CONFIGURATION. For instance, even though MFAS framing was selected, generating an AIS alarm will cause the test set to transmit an unframed signal. T/S-16 AIS: The test set transmits all ones in timeslot 16 of all frames. T/S-16 AIS overwrites the MFAS (Multi Frame Alignment Signal). A test set or network equipment that receives this alarm will lose PCM-30 framing. This alarm should only be used when the test set is configured for FAS framing. Voice frequency signalling bits cant be transmitted while sending this alarm, because the T/S-16 AIS signal overwrites all the channel associated signalling (CAS) information.
48 SSMTT-27L

2.6.3 Send Frame Words Use this screen to manually specify the E and Sa bit states, and the MFAS ABCD. Then use it to transmit the desired FAS and MFAS framing information.

Figure 44 Send Frame Words Screen Items that can be selected can be changed. Use to move the cursor to the desired location. Reenter the left-hand side of the screen by pressing . DEFAULT (F3) sets the bits to the default settings. AUTO (F4) is only displayed for E-bit selections. The bits are sent as soon as a F-key is pressed. The following information is shown: CRC View the CRC option chosen in TEST CONFIGURATION. Change the CRC option in the TEST CONFIGURATION screen. E-BIT Options: SET=0 (F1), SET=1 (F2), DEFAULT (F3), AUTO (F4) E-bit may be changed only if CRC is activated in TEST CONFIGURATION, and consequently, YES is displayed in the CRC slot in this screen. If E-bit is set to AUTO, the E-bits will be transmitted on the Tx/INSERT side anytime a CRC error is received on the Tx/ INSERT side Rx as in Figure 45. If E-bit is set to AUTO, the E-bits will be transmitted on the TX (Transmit) side anytime a CRC error is received on the RX (Receive) side, as in Figure 48.

Figure 45 Automatic E-Bit Transmission Setup

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To Manually Transmit the E-bits Use SET=0 (F1) and SET=1 (F2) to enter the two bits. 11 is used for no E-bit errors, this is the default setting. 10 or 01 for 500 E-bit errors per second. 00 for 1000 E-bit errors per second. FAS WORD Displays the FAS (Frame Alignment Signal-0011011) Words. MFAS WORD Set bits 5-8 to any combination. Bits 5-8 have the pattern xyxx, where x represents spare bits; they should be set to 1 when not used. Y is used for the MFAS remote alarm; it should be set to 1 if MFAS synchronization is lost. MFAS ABCD These are the default ABCD bits used for channels 1-30 in PCM30 Framing. ABCD bits are transmitted in timeslot 16 of frames 2-16 of the MFAS. Avoid using 0000 which causes false framing for PCM-30. NFAS WORDS These are the Non Frame Alignment Signal words. When ready, press ENTER to send the selections.

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2.7 System Parameters This menu screen contains the following: MEAS CONFIGURATION 2.7.1 Measurement Conguration
12:01:09 MEAS CONFIGURATION MEAS DURATION START PROG DATE YMD PROG TIME HMS PRINT RESULT PRINT EVENT CODE CONFIGUR MEASURE MODE AUDIBLE ALARM TIMED CONTINU : : : : : : : : : CONTINU MANUAL ----:--:---:--:-LAST DISABLE HDB3 BER DISABLE more 12:01:09 MEAS CONFIGURATION G.821 : ON DGRM : ON G.826 : ON M.2100 : ON M.2100/550 PARAMETERS MEAS PERIOD : 15 min HRP MODEL % : 040.0 IDLE CHNL CODE : 11010101 IDLE CHNL A/B/C/D: 1001 more ON OFF

Figure 46 Measurement Conguration Screens Configure the following from the left screen in Figure 46: MEAS DURATION Options: TIMED (F1), CONTINU (F2) Set the Measurement Duration. A timed measurement will stop when the specified amount of time has elapsed. This is useful for making measurements of a specified length. When a timed test is in progress, the Remaining Time (RT) counter shows how much time is left before the end of the test. If TIMED was selected, press SHIFT and use the numeric keypad to enter a number between 1 minute to 999 hour. A continuous test will run indefinitely until RESTART is pressed, or a setting is changed that restarts the test. START Options: PROGRAM (F1), MANUAL (F2) Select the method to begin a test. PROGRAM: This allows you to program a specified time in the future to begin taking measurements. Once you have selected PROGRAM, enter the desired time in the next two items. MANUAL: In this mode you must manually begin the test measurements at the desired time. PROG DATE YMD Applies if PROGRAM for START was selected. Press SHIFT and use the numeric keypad to enter the year, month, and date to begin measurements.
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PROG TIME HMS Applies PROGRAM for START was selected. Press SHIFT and use the numeric keypad to enter the hour, minute, and seconds to begin measurements. PRINT RESULT Options: TIMED (F1), LAST (F2) TIMED: Use to have the test results printed every minute to 999 hours and 59 minutes. Press SHIFT and use the numeric keypad to enter the time from 1 minute to 999 hours. LAST: The test results are printed only at the end of a timed test, or a continuous test that has ended due to a RESTART. PRINT EVENT Options: ENABLE (F1), DISABLE (F2) ENABLE: Use to print out a time and date-stamped error message every second that one or more errors occur. DISABLE: Use if you dont want to print each event. CODE CONFIGUR Options: HDB3 (F1), AMI (F2) Select the line coding. HDB3 line coding is used almost everywhere throughout the world in 2.048M transmission. An explanation of the related technology is located in Section 4.1.5. MEASURE MODE Options: BER (F1), LIVE (F2), AUTO (F3) BER: Use to search for the test pattern, and make bit error measurements with all other measurements. LIVE: Use to ignore the test pattern and make all measurements, except for bit error measurement. AUTO: The test set will try to detect the data pattern as in BER mode, then if the data pattern cannot be detected, the test set will turn to LIVE mode. Notes: Most technicians leave the test set in BER mode, even when they are monitoring live, in-service circuits. In this case, they expect the PAT SYNC light to remain RED, because there is no pattern synchronization. The bit error measurements will also show 100% UAS. If LIVE is selected, the PAT SYNC LED is turned OFF and the bit error measurement screen is not displayed in MEASUREMENT RESULTS.

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AUDIBLE ALARM Options: ENABLE (F1), DISABLE (F2) Choose if the test set will sound a beep when it is receiving alarms or errors. Note that the number of audible beeps is not equal to the number of received errors. Select the right screen in Figure 46 by pressing (more with up/ down arrows indicate additional screens). This screen relates to ITU standards for 2.048 Mbit/s transmission, G.821, G.826, and M.2100. The next four items relate to ITU standards on measurements and performance characteristics for 2.048 Mbit/s. G.821 Options: ON (F1), OFF (F2) ON: The LINE 1 BIT ERROR screen is shown in MEASUREMENT RESULTS. This Bit Error screen presents the measurement parameters specified in ITU G.821. DGRM Options: ON (F1), OFF (F2) ON: DGRM (Degraded Minutes) is shown in MEASUREMENT RESULTS, G.821. G.826 Options: ON (F1), OFF (F2) ON: The G.826 screen is displayed in MEASUREMENT RESULTS. This G.826 screen presents the measurement parameters dened in G.826. M.2100 Options: ON (F1), OFF (F2) ON: The M.2100 screen is shown in MEASUREMENT RESULTS. This section refers to ITU specifications used when a 2.048 Mbit/s circuit passes through international boundaries. It allocates a certain allowable error rate to each nation that carries the circuit. The technician needs to enter the appropriate percentage allowed for the line. The test set makes the M.2100/550 calculations and reports pass/fail in MEASUREMENT RESULTS, M.2100/550. The next settings refer to M.2100/550 measurements:

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MEAS PERIOD Options: 01-99 minutes This setting controls how often a new result is displayed in MEASUREMENT RESULTS, LINE 1(2)M.2100/550. Use the SHIFT key and the numeric keys to set the period. HRP MODEL % Options: .1 to 99.9 % Refer to M.2100, or to the older M.550, for information on how to select the Hypothetical Reference Performance model percent (HRP %). IDLE CHNL CODE Options: Any 8-bit pattern Program the idle code to be any 8-bit pattern, It is used during VF channel access operations, when the TxSOURCE is set to TESTPAT. The idle code is also used in fractional E1 testing to ll up unused channels. IDLE CHNL A/B/C/D Options: Any 4-bit pattern Program the idle channel signalling bits of channels 1-30 in the MFAS framing mode. These signalling bits are found in time slot 16 of frames 1-15. The default, 1101, is set in accordance with ITU G.704.

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2.8 View/Store/Print You may store up to 50 different results to view or print at a later time. To store results, use the procedure in Section 2.8.1.

VIEW RENAME UN/LOCK

PRINT DELETE

more more

Figure 47 View/Store/Print Screen VIEW/STORE/PRINT F-keys VIEW (F1): View a selected file, see Section 2.8.2. PRINT (F3): Print a selected file, see Section 2.8.3. RENAME (more, F1): Rename a selected file, see Section 2.8.6. UN/LOCK (more, F2): Lock and unlock a selected file, see Section 2.8.5. DELETE (more, F3): Delete a selected file, unless locked, see Section 2.8.4.

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2.8.1 Saving a Test 1. From any screen with a STORE F-key, press it and a, CSV le is created as indicated on screen. Press any key to return to the previous screen. 2.8.2 Viewing a Stored Test 1. From the E1 MAIN MENU, select VIEW/STORE/PRINT. 2. Select the desired file with the keypad up/down arrow keys. 3. Press VIEW (F1) and the stored result will appear. 4. Use the keypad up/down arrow keys to scroll through the available screens. 5. When finished, press ESC to return to the VIEW/STORE/ PRINT screen. 2.8.3 Printing a Stored Test 1. Connect a SunSet printer to the serial port of the test set. For other types of printers or for more information, refer to the Storing and Printing chapter in the test set users manual. 2. From the E1 MAIN MENU, select VIEW/STORE/PRINT. 3. Select the desired file with the keypad up/down arrow keys. 4. Press PRINT (F3) and the file will begin printing. 5. When finished, press ESC to return to the VIEW/STORE/ PRINT screen. 2.8.4 Deleting a Stored Test 1. From the E1 MAIN MENU, select VIEW/STORE/PRINT. 2. Select the desired file with the keypad up/down arrow keys. 3. Press DELETE (more, F3) and the file is deleted if the file is unlocked. 2.8.5 Locking and Unlocking a Stored Test 1. From the E1 MAIN MENU, select VIEW/STORE/PRINT. 2. Select the desired file with the keypad up/down arrow keys. 3. Press UN/LOCK (more, F2) and the file is locked or unlocked as indicated to the right of the le name. Refer to the lock icon shown in Figure 47.

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2.8.6 Renaming a Stored Test 1. From the E1 MAIN MENU, select VIEW/STORE/PRINT. 2. Select the desired le using . Press UN/LOCK (more, F2) if the file is locked as indicated by the lock icon. 3. Press RENAME (more, F2) and the character screen shown in Figure 48 is displayed 4. Press INPUT (F3). Note that the A character is highlighted and the INPUT F-key has changed to STOP.

Figure 48 Character Entry Screen 5. Use to move the cursor to the desired character. 6. Press ENTER to place the desired character in the FILENAME line. Continue this process until the FILENAME is complete. You may enter up to 15 characters. If a mistake is made in the entry: A. Press STOP (F3). B. Move the FILENAME cursor to the incorrect character. C. Press DELETE (F2) to delete the character or, press INSERT (F1) to insert a character. D. Press INPUT (F3) to select a character. Press ENTER to insert the new character to the left of the cursor. 7. Press SAVE (F4) to save and return to the View/Store/Print Screen shown in Figure 47.

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2.9 Proles Use the Prole function to store commonly used module conguration settings. The following screen contains a DEFAULT profile. This profile is based on the factory standard conguration of this module. To create other proles, change the conguration settings in any available screens. Once all configuration screens are changed as desired, select PROFILES from the modules main menu and select a blank line. Press F2 and the settings are saved with a generic lename. Use this screen to manage proles. The screen and its functions are as follows: Note: The DEFAULT file cant 8:21:36 be deleted or unlocked. PROFILE LIST
Free space: 113729 kbyte FILENAME LOADED MODULE LOCK 1.DEFAULT NO DE1 2.P00001 NO DE1 3.SANTA ROSE YES DE1 4. 5. 6. 7. 8. 9. 10. LOAD STORE RENAME more

DELETE

LOCK

more

Figure 49 Prole List Screen PROFILE LIST F-keys LOAD (F1): Press to change all configuration settings of the module to match the selected profile. The LOADED column changes from NO to YES. STORE (F2): Press to save all current configuration screens with a generic lename. Currently 10 proles can be saved. The type of module is indicated in the MODULE column. RENAME (F3): Select a filename and press F3 to change its name. A character entry screen is displayed. Use the procedure in Section 2.8.6 to edit the name from step 4. DELETE (more, F1): Press to delete a selected unlocked prole. LOCK/UNLOCK (more, F2): Press to lock or unlock a selected le. Lock a prole to prevent changes. The les status is indicated by a lock icon in the LOCK column. In Figure 49, DEFAULT is locked.

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3 Applications
3.1 Connecting the Cords CAUTIONS! Plugging into a live E1 circuit may cause a loss of service for multiple customers. Be sure you are properly trained before proceeding. For BRIDGE access, do not plug into the circuit until you have pre-selected the Rx Port: BRIDGE level. The test set will not place isolation resistors in the line unless this is specied. Figures 50 and 51 show various ways in which to connect the test set to the circuit.

RX TX

Figure 50 Term Mode Setup

RX

Figure 51 Monitor Mode Setup

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3.2 Accept a New Circuit

TX RX

Figure 52 Accept a New Span 1. Verify that the span is not in service. This test will disrupt service. There must be a loopback device at the far end. 2. From the E1 MAIN MENU, select TEST CONFIGURATION and configure as follows: Tx SOURCE: TESTPAT FRAMING: as specified by the circuit design CRC-4: as specied by the circuit design TEST RATE: 2.048M Rx Port: TERM TX CLOCK: INTERN When finished, press ENTER. 3. From the E1 MAIN MENU, select TEST PATTERN. 4. Select the desired test pattern and press ENTER. 5. Connect the test set to the circuit as shown in Figure 52. 6. Press HISTORY to acknowledge any history LEDs . Verify that the PAT SYNC LED is green. 7. From the E1 MAIN MENU, select MEASUREMENT RESULTS and press START (F3). 8. Verify that the circuit performs to your companys requirements for the service delivered. Use PAGE-UP (F1) and PAGE-DN (F2) to access each of the individual measurement screens. 9. When done, press ESC to return to the E1 MAIN MENU. Remove the loop at the far end of the circuit.

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3.3 In-Service Circuit Monitoring 1. This test may be performed while the line in service. 2. From the E1 MAIN MENU, select TEST CONFIGURATION and configure as follows: Tx SOURCE: TESTPAT FRAMING: as specified by the span design CRC-4: as specied by the span design TEST RATE: 2.048M Rx PORT: MONITOR or BRIDGE L2-Rx PORT: MONITOR or BRIDGE TX CLOCK: INTERN When finished, press ENTER. Note: If unsure of what RX PORT level to use, then use BRIDGE. MONITOR is used with a PMP (Protected Monitoring Point). 3. Connect to the circuit as in Figure 53 using either method. 4. Press HISTORY to acknowledge any history LEDs.
Monitor Mode
Rx MON OUT IN MON OUT IN

Bridge Mode
Rx

Line

Figure 53 In-Service Circuit Monitoring Setup 5. Examine the LEDs for information about the tested circuit: SIGNAL should be green, red indicates no signal. A valid framing type should be indicated. A steady ERROR or CODE indicates that the circuit is working but is experiencing trouble. An ALARM indicates a problem on the far end of the circuit. AIS may indicate a trouble condition where a network element transmitting to the test set has lost its incoming signal and has replaced it with the AIS signal. From the E1 MAIN MENU, select MEASUREMENT RESULT, press START (F3). Verify that the span performs to your companys requirements for the service delivered.
61

6. 7.

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3.4 Checking for Frequency Synchronization Frequency synchronization can be a problem when: The customer purchases a channelized E1 circuit. The customers circuit passes through a synchronous network element, i.e., exchange, PBX, or a digital cross-connect. The E1 circuit passes through more than one carrier. Frequency synchronization problems result in bit slips, a major source of service impairment. See Figure 54 for the setup and use this procedure to identify frequency synchronization problems.

RX EXT CLOCK MON OUT IN MON OUT IN

Figure 54 Frequency Synchronization Setup 1. This test may be performed while carrying live traffic, it also requires a 2.048 Mbit/s reference frequency source. On a 2.048 Mbit/s circuit, one side will usually provide a synchronized signal. This side can be used as the reference. The other side can be measured for frequency synchronization. 2. From the E1 MODULE main menu, select TEST CONFIGURATION and configure as follows: Tx SOURCE: TESTPAT FRAMING: as specified by the circuit design. CRC-4: as specied by the circuit design. TEST RATE: 2.048M Rx PORT: MONITOR TX CLOCK: REF CLK Press ENTER when configured. 3 Plug into the E1 signal as shown in Figure 54 and press HISTORY to acknowledge any blinking LEDs. 4. From the E1 MODULE MAIN MENU , select MEASUREMENT RESULTS and press START (F3). 5. Press PAGE-DN (F2) until the FREQUENCY screen is displayed and observe if frequency varies from the 2.048 MHz reference frequency. Frequency slippage rate is indicated by >>> or <<<. To view (+/-) WNDR values, use this screen to provide an indication of any low-frequency variation in the E1 signals frequency.
62 SSMTT-27L

3.5 Measuring Signal Level

RX
Equipment MON
SUN RIS E

Equipment MON TX RX

TX RX

Figure 55 Measuring Signal Level Setup A signal level measurement can be performed by itself or in conjunction with one of the other tests. 1. Select the Rx PORT level you want to use. You can make the measurement in TERM, MONITOR, or BRIDGE modes. A 1111 pattern in Rx PORT TERM and BRIDGE provides the most accurate results. MONITOR is a convenient mode, it generally shows a result of about -20 or -30 dB. TERM will disrupt service. BRIDGE: Measurement may be degraded by a low-quality termination at the network element terminating the E1 line. 2. The rest of this procedure will use the TERM mode for illustrative purposes. Verify that the span is not in service. 3. From the E1 MODULE main menu, select TEST CONFIGURATION and configure as follows: Tx SOURCE: TESTPAT FRAMING: As specified by the circuit design. CRC-4: As specied by the circuit design. TEST RATE: 2.048M Rx PORT: TERM TX CLOCK : INTERN Press ENTER when configured. 4. Plug the test set into the circuit as shown in Figure 55. 5. Press HISTORY to acknowledge any blinking LEDs. 6. From the E1 MODULE MAIN MENU, select MEASUREMENT RESULTS and press START (F3). 7 Press PAGE-DN (F2) until the ALM/SIG screen is displayed. 8. Read the signal level. Note that separate readings are given for the positive and negative signals so that you can get more accurate information on a faulty regenerator.
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3.6 V.54 Channel Loopback Test 1. From the E1 MODULE main menu, select TEST CONFIGURATION and configure as follows: Tx SOURCE: TESTPAT TEST RATE: Nx64/2.048M (as required) Press ENTER when configured. 2. Connect to the circuit as shown in Figure 5:

Figure 56 V.54 Setup 3. From the E1 MODULE main menu, select OTHER MEASUREMENT > CHANNEL LOOPBACK and at MODE select LOOP UP. If successful, a LOOP UP OK! message is displayed, if not, LOOP UP ERROR is displayed. 4. From the E1 MODULE main menu, select MEASUREMENT RESULT and run a BERT. 5. Stop the test. 6. From the E1 MODULE main menu, select OTHER MEASUREMENT > CHANNEL LOOPBACK and at MODE select LOOP DOWN. When the loopdown is complete LOOP DOWN OK is displayed.

64

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3.7 Running a Timed Test Many network tests require the use of an exact time period such as 15 minutes, 1 hour, or 24 hours over which to conduct a test. In this section, you will configure the timer for one of these tests. Use the following procedures. 3.7.1 Manual Start 1. Use a desired application for your test. 2. From the E1 MODULE main menu, select SYSTEM PARAMETERS > MEAS CONFIGURATION. 3. At the MEAS DURATION line press TIMED (F1). 4. Press SHIFT to display the SHFT indicator. 5. Enter in the number of hours and minutes that you want the test to run by using the keypad, press SHIFT when done. 6. Select the START line and press MANUAL (F2). 7. Press ESC until the E1 MODULE main menu is displayed. 8. Proceed with the desired application for your test. The test will now be timed when MEASUREMENT RESULT is performed. Observe the remaining time by viewing the RT (Remaining Time) indicator in the upper right-hand portion of the screen. 3.7.2 Auto Start To program the test set to begin measuring at a future date and time, use the following procedure: 1. In MEAS CONFIGURATION, at the MEAS DURATION line, press TIMED (F1). 2. Press SHIFT to display the SHFT indicator. 3. Enter in the number of hours and minutes that you want the test to run by using the keypad, press SHIFT when done. 4. Select the START line and press PROGRAM (F1). 5. Select the PROG DATE YMD line. Use the SHIFT and number keys to enter the Year, Month, and Day you wish the timed test to begin, press SHIFT when done. 6. Select the PROG TIME HMS line. Use the SHIFT and number keys to enter the Hour, Minute, and Second you wish the test to begin, press SHIFT when done. 7. Connect the test set to the circuit and congure as needed. 8. Leave the test set in module mode and it will begin measuring at your programmed date and time.

E1 Module

65

3.8 Observing Network Codes or Channel Data Observe in the screen to the right live data (binary or hexadecimal) with ASCII translations, It can also decode E1 network control codes that are in use and verify the content of individual channels. Use the following procedure: Figure 57 View Received Data Screen 1. From the E1 MODULE main menu, select TEST CONFIGURATION and configure using the following guidelines: If in-service use BRIDGE or MONITOR. If out-of-service use TERM. Specify the other TEST CONFIGURATION settings as required. The test set must detect valid framing. 2. Connect to the circuit using an approbate method to make the connection shown in Figure 53. 3. Press HISTORY to acknowledge any blinking LEDs. 4. Press ESC to display the E1 MODULE main menu and select OTHER MEASUREMENT >VIEW RECEIVED DATA. You will now receive a live display of the E1 data. Scroll down through 64 pages of information. Observe the changes which have occurred over time. 5. Review the live data as it is displayed. When the codes that you are interested in appear, press PAUSE (F3) to trap 64 pages of data. Press PAGE-DN (F2) to scroll through the data. The data is presented as it appears in the E1 bit stream and is broken out into timeslots. View control information in timeslot 00 for FAS framing. View control information in timeslots 00 and 16 for MFAS framing. All other channels (time slots) should contain actual voice/data signals (or your the received test pattern).

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3.9 Monitoring a Voice Frequency Channel This is a procedure for monitoring a voice frequency channel within an E1 circuit. This test may be performed while the span is in-service. 1. From the E1 MODULE main menu, select TEST CONFIGURATION and configure as follows: Tx SOURCE: TESTPAT FRAMING: As specified by the circuit design. CRC-4: As specied by the circuit design. TEST RATE: 2.048M Rx PORT: MONITOR or BRIDGE TX CLOCK: INTERN Press ENTER when configured. 2. Connect to the circuit using an approbate method to make the connection shown in Figure 53. 3. Press HISTORY to acknowledge any blinking LEDs. 4. Verify that FRAME is green. 5. Press ESC to reach E1 MODULE main menu and select VF CHANNEL ACCESS > VF & NOISE MEASUREMENTS. 6. Enter the desired transmit and receive timeslots. The channel number will bypass any timeslots containing the E1 framing information. In FAS framing, no access is granted to timeslot 00. In MFAS framing, access to timeslots 00 and 16 is denied. 7. Use either TALK or TONE for TxMODE. 8. Adjust the volume to the desired level by pressing VOLUME, then use UP (F1) or DOWN (F2). Note: If you are not able to monitor the channel: - Verify that the AUTO framing of the test set was able to synch on a recognized framing pattern. - Press the AUTO key to restart the auto framer if a valid frame pattern is not shown. - If this doesnt work, try unplugging and re-plugging the receive cord. This will positively verify that there is no recognizable framing at this moment.

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67

3.10 Simple Talk/Listen This is the simplest procedure for talking and listening on an E1 circuit. The setup is illustrated in Figure 52. However, instead of having a loopback at the far end of the circuit, the setup may have another test set, a channel bank, a switch, or other E1 terminating network element. Use this procedure: 1. Verify that the span is not in service. This test will disrupt service for all of the channels you are not using. 2. Connect to the circuit using method shown in Figure 52. 3. From the E1 MODULE main menu, select TEST CONFIGURATION and configure as follows: Tx SOURCE: TESTPAT FRAMING: As specified by the circuit design. CRC-4: As specied by the circuit design. TEST RATE: 2.048M Rx PORT: TERM TX CLOCK: INTERN Press ENTER when configured. Note: An unframed signal cant support Talk/Listen.The FRAME LED must be green for this procedure to work. 4. Press HISTORY to acknowledge any blinking history LEDs. 5. Press ESC to reach the E1 MODULE main menu and select VF CHANNEL ACCESS > VF & NOISE MEASUREMENTS. 6. Select the receive (listen) and transmit (talk) channels (they are usually the same channel number). 7. Select TALK for the TxMODE and talk/listen on the selected channel. 8. Adjust the volume to the desired level by pressing VOLUME and UP (F1) or DOWN (F2). When finished, press EXIT (F3) to exit from the VOLUME CONTROL screen.

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3.11 Send a Tone This is an intrusive test. Be sure the E1 line is not carrying trafc or that it will be able to withstand any hits that this procedure will introduce. 1. From the E1 MODULE main menu, select TEST CONFIGURATION and configure as follows: Tx SOURCE: TESTPAT FRAMING: As specified by the circuit design. CRC-4: As specied by the circuit design. TEST RATE: 2.048M Rx PORT: TERM TX CLOCK: INTERN Press ENTER when configured. 2. Connect the test set to the circuit as in Figure 50. 3. Press HISTORY to acknowledge any blinking LEDs. 4. Press ESC to reach the E1 MODULE main menu and select VF CHANNEL ACCESS > VF & NOISE MEASUREMENTS. 5. Use NEXT (F1) or PREVIUS (F2) to set up the receive and transmit channels (timeslots). Select the rest of the menu items as follows: Tx A/B/C/D: as required TxMODE: TONE TONE FREQ : enter the desired frequency Tx LVL (dBm): enter the desired tone level The test set is now transmitting a tone on the selected channel. In the VF & NOISE MEASUREMENTS screen, view the received frequency and noise measurements.

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69

3.12 Nx64 kbit/s Testing

MON

OUT IN Equipment

Figure 58 Fractional E1 Testing Setup Fractional E1 circuits are circuits of data rate Nx64 kbit/s, where N can be anywhere from 131 channels. N channels of the E1 line are dedicated to the fractional E1 circuit, and the remaining channels of the E1 line are either filled with idle code, other revenue trafc or framing information. Use the following procedure: 1. This test will disrupt service, Verify that it is not in service. 2. From the E1 MODULE main menu, select TEST CONFIGURATION and configure as follows: Tx SOURCE: TESTPAT FRAMING: As specified by the circuit design. CRC-4: As specied by the circuit design. TEST RATE: Nx64K, the fractional SELECT TIME SLOT screen is displayed. Manually configure the timeslots or use AUTO configure. If needed, refer to Section 2.1 for the procedure. Rx PORT: TERM TX CLOCK: INTERN Press ENTER when configured. AUTO configuration may not yield proper channels if: - any of the active channels are transmitting an idle code. - the idle code (set in SYSTEM PARAMETERS > MEAS CONFIGURATION page 2 > IDLE CHNL CODE) is not the same as the idle code of the circuit being tested. 3. Connect the test set to the circuit as shown in Figure 58. 4. Ensure that a loop is in place at the far end of the circuit. 5. Press HISTORY to acknowledge any blinking LEDs. 6. Select MEASUREMENT RESULTS and press START (F3) to perform the acceptance test. 7. Verify the fractional service performs to your companys requirements for the service delivered.
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Observing Idle and Active Channels: 1. In TEST CONFIGURATION, use the settings given in step 2 of Nx64 kbit/s Testing, except set TEST RATE to 2.048 Mbit/s. 1. Connect the test set as shown in Figure 58. 2. From the E1 MODULE main menu, select OTHER MEASUREMENTS > VIEW RECEIVED DATA, this will allow double checking the information being transmitted on a channel-by-channel basis.

E1 Module

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72

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4 Reference
4.1 E1 Technology Overview This E1 Technology Overview covers the fundamental concepts in 2.048 Mbit/s technology: sampling a signal, converting this information into a bitstream, and dividing the bitstream into segments (channels). This section also touches upon the basics of signalling technologies like MFR2 and CAS. 4.1.1 Technical Standards E1 transmission technology is dened by a number of technology standards. Such standards allow equipment designers and service providers to ensure that various pieces of equipment are compatible and that networks operate in a predictable, reliable manner. The following standards cover many of the important aspects of E1 transmission technology: ITU G.703: Physical/electrical characteristics of interfaces. ITU G.704: Synchronous frame structures. ITU G.706: Frame alignment and CRC. ITU G.821: Error performance of a international connection. ITU G.826: Error performance and transmission quality control. ITU M.550/M.2100 Getting an international connection into service. Q.140: Concerns redundant copies from subrate channels. Q.400: Concerns CAS (Channel Associated Signaling). Consult these standards when you need detailed information on particular aspects of E1 transmission technology. 4.1.2 Basic Denitions Binary Data: A signal which has been converted into a format of 0s and 1s. Bit Stream: Binary Data which has been placed in a sequence at a xed rate. Channel: A single portion of the bit stream which is available for bidirectional communication. 4.1.3 Converting a Voice Signal To transmit voice over a digital medium, like a 2.048 Mbit/s line. We first need to encode the analog voice signal into a binary format. Then it must be converted to a bit stream suitable for digital transmission. This conversion can be achieved through Pulse Code Modulation as shown in Figure 59.
E1 Module 73

Figure 59 Converting a Voice Signal The Nyquist theorem requires that the signal be sampled at twice the signals maximum frequency in order for the signal to be reproduced without a loss of information. For voice signals, the maximum frequency is approximately 4000 Hz. This provides adequate clarity for voice transmission bandwidth. Thus, we must sample our 4000 Hz voice signal at a frequency of 8000 Hz (8000 samples/second). The amplitude of the analog voice signal is sampled 8000 times per second. Each amplitude value is expressed as an 8-bit code word. These 8-bit words occurring 8000 times per second form a 64 kbit/s digital bit stream. The 8-bit code word is formed by comparing the amplitude of the analog sample to a companding characteristic. This characteristic is a formula which translates the amplitudes of the samples into the 8-bit code words. Internationally, a companding characteristic known as A-law is used. The purpose of A-law is to provide optimum signal-to-noise performance over a wide ranger of transmission levels. Linear encoding provides a poorer signal-to-noise ratio at the -20 dB level typical of speech. In North America, the encoding is done according to the Mu-Law. Therefore, the companding law used for encoding the voice signal must match that for decoding, for distortion-free transmission. 4.1.4 2.048 Mbit/s Data Rate The E1 signal (bitstream) is transmitted at a rate of 2.048 Mbit/s (2 048 000 bits per second). This transmission rate is achieved by combining 32 individual 64 kbit/s bitstreams:
64 (kbit/s /Channel) x 32 (Channels) = 2048 kbit/s = 2.048 Mbit/s

This 2048 Mbit/s signal is the overall E1 transmission rate.

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4.1.5 Line Coding Two common E1 line coding types are shown in Figure 60:
2.37V 0V -2.37V 2.37V 0V -2.37V Note: This voltage is seen from a 75 unbalanced connection. time AMI Line Coding

0 HDB3 Line Coding

time

Figure 60 AMI and HDB3 Line Codings AMI: This is the simplest of the two line coding formats. AMI stands for Alternate Mark Inversion, and is used to represent successive 1 values in a bitstream with alternating positive and negative pulses. Figure 60 depicts these alternating pulses. AMI is not used in most 2.048 Mbit/s transmission because synchronization loss occurs during long strings of data zeros. HDB3: This line coding format was adopted in order to eliminate synchronization problems occurring with AMI. With HDB3 coding, a string of four consecutive zeros is replaced with a substitute string of pulses containing an intentional bipolar violation. As the far end equipment receives the E1 signal, it examines the bit stream for these intentional bipolar code violations. It then extracts the code and reconstruct the original data. The HDB3 code substitutions provide high pulse density so that the receiving equipment is always able to maintain synchronization with the received signal. For example, in the code 1000 0000, HDB3 coding substitutes bipolar violations for the string of zeros. General rules apply to the substitutions. The particular substitution made is governed by the polarity of the last inserted bit, as well as the number of pulses following the previous violation bit. If there is an odd number of pulses, 000V is substituted; the polarity of V is the same as that of the bit immediately preceding it. If there is an even number of pulses, B00V is inserted; the polarity of B is opposite to that of the bit immediately preceding it and the polarity of V is the same as that of B. See Figure 61 to see the types of HDB3 zero substitution codes.
E1 Module 75

Number of pulses (since last substitution). Even (substitute B00V) Odd (substitute 000V) 1 0

Polarity of Previous Pulse

Figure 61 HDB3 Encoding The E1 module can be configured to detect the one of the two types of HDB3 substitution codes, even if they are not matched to the proper number of pulses since the last substitution. 4.1.6 Signal Levels Once a signal has been encoded into a binary format and assembled into a bit stream, the pulses in the bit stream are then converted to actual voltage levels suitable for E1 transmission. In Figure 62, a typical signal level for an E1 pulse with 75W impedance is either 2.37 volts (for a binary 1 value) or 0 volts (for a binary 0 value). Real-world values are typically 10%. Ideally, each pulse transmitted would be perfectly symmetrical. However, in the real-world, each pulse is slightly distorted when generated and more so when it travels down the line. In Figure 62 the shape of an ideal pulse is compared to an actual pulse. An E1 pulse might need to conform to a standardized pulse shape. This is often determined by comparing it to a specied mask. A commonly used pulse mask is defined by ITU-T G.703, it is shown in the G.703 Mask illustration in Figure 62. Note: For an E1 pulse with 120W impedance, the signal level is either 3 volts (for a binary 1 value) or 0 volts (for a binary 0 value) with real world values typically be 10%.

Ideal Pulse

Actual Pulse

G.703 Mask

Figure 62 Pulse Shape

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4.1.7 2.048 Mbit/s Framing E1 transmission utilizes two types of framing: FAS (Frame Alignment Signal) and MFAS (MultiFrame Alignment Signal). Framing is necessary so that the equipment receiving the E1 signal is able to identify and extract the individual channels. PCM-31 uses FAS framing and PCM-30 uses MFAS with FAS framing. FAS (Frame Alignment Signal) The 2.048 Mbit/s frame consists of 32 individual time slots (numbered 0-31). As described previously, each time slot consists of an individual 64 kbit/s channel of data. In the FAS format, time slot 0 of every other frame is reserved for the FAS pattern. Alternate frames contain the FAS Distant Alarm indication bit and other bits reserved for National and International use. Hence, there are 31 time slots into which data can be placed as in Figure 63.
One 2.048 Mbit/s Frame T ime Slot 0 BITS 1 E E 2 0 1 3 0 A 4 1 Sa 5 1 Sa 6 0 Sa 7 1 Sa 8 1 Sa 1 ... 31

Notes: Even Frame: Contains FAS. Odd Frame: Contains NFAS. Sa: This bit is reserved for national use. E: Error indicator bit. A: Remote alarm indicator bit. 0011011: Frame alignment signal. (8 bits per timeslot)(8000 frames per second) = 2.048 Mbps

Figure 63 FAS Framing Format FAS does not accommodate voice channel signalling. The rst bit (c or Si) of these frames is reserved for international use. It can be used for the CRC-4, Cyclic Redundancy Check-4, when enhanced performance monitoring is required. Therefore, when CRC is enabled in TEST CONFIGURATION, these bits depend upon the CRC calculation and should continually change between 0 and 1. When CRC-4 is not enabled, these bits are set to 1. In FAS framing, the odd frames do not contain the frame alignment signal. The bits are defined as follows:
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 When CRC is enabled, bit 1 is used for the Cyclic Redundancy Check-4 performance monitoring. When CRC is enabled, this bit may only be changed when CRC is disabled. The second bit is set to 1 to avoid FAS signal confusion. Bit A is used for the Remote (FAS) Distant Alarm. This bit is set to 1 to indicate an alarm. It is set to 0 for no alarm. Spare bits (4-8): Are set to 1 for crossing an international border. When unused, their settings are defined by ITU-T G.704. The first bits of frames 13 and 15 transmit the two E-bits, which are used to indicate CRC-4 errors. A 0 in this bit denotes received errored sub-multiframes; a 1 represents errorless received frames. MFAS (MultiFrame Alignment Signal)
FRM 0 FRM 1 FRM 2 FRM 3 --------- FRM 15

TS 0 -------- TS 16 -------- TS 31

TS 0 -------- TS 16 -------- TS 31

TS 0 -------- TS 16 -------- TS 31

BITS 1 0 2 0 3 0 4 0 5 X 6 Y 7 X 8 X 1 2 3

BITS 4 5 6 7 8 1 2 3 A B C D Ch 1 (TS-1) A B C D Ch 16 (TS-17)

BITS 4 5 6 7 8 A B C D Ch 15 (TS-15) A B C D Ch 30 (TS-31)

Notes: Frame 0, timeslot 16: 8 bit MFAS signal. Frames 1-15, time slot 16: (4 signalling bits per channel)(30 channels) / (8 signalling bits per frame timeslot 16) = 15 frames of timeslot, 16 signalling. Frame 0 TS 16 bits: MFAS = 0000 NMFAS = XYXX, where X is spare bits. If this is not used, then this is 1). Y is the MFAS remote alarm. If MFAS synch is lost, then this is 1. Frames are transmitted with 30 voice channels in time slots 1 through 15, and 17 through 31. Timeslot 16 (TS16) contains A/B/C/D bits for signalling (CAS). MFAS multiframe consistes of 16 frames.

Figure 64 MFAS Framing Format MFAS framing provides CAS (Channel-Associated Signalling) to transmit A/B/C/D bit supervision information for each channel. This method uses the 32 timeslot frame format including timeslot 0 for the FAS. This method also uses timeslot 16 for the MFAS and the CAS. It takes 16 frames to make up a MultiFrame. When the MFAS frame is transmitted, all of the individual FAS frames and framing information intact is left intact. The 16 FAS frames are assembled together, dedicating timeslot 16 of the rst frame to MFAS framing information, then dedicating timeslot 16 of the remaining 15 frames to A/B/C/D bits as in Figure 64.
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CRC-4 Error Checking in a MultiFrame Format

TIME SLOT 0 MFRM SMFRM FRM 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 Bits Bit 1 c1 0 c2 0 c3 1 c4 0 c1 1 c2 1 c3 E c4 E Bit 2 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 Bit 3 0 A 0 A 0 A 0 A 0 A 0 A 0 A 0 A Bit 4 1 Sa4 1 Sa4 1 Sa4 1 Sa4 1 Sa4 1 Sa4 1 Sa4 1 Sa4 Bit 5 1 Sa5 1 Sa5 1 Sa5 1 Sa5 1 Sa5 1 Sa5 1 Sa5 1 Sa5 Bit 6 0 Sa6 0 Sa6 0 Sa6 0 Sa6 0 Sa6 0 Sa6 0 Sa6 0 Sa6 Bit 7 1 Sa7 1 Sa7 1 Sa7 1 Sa7 1 Sa7 1 Sa7 1 Sa7 1 Sa7 Bit 8 1 Sa8 1 Sa8 1 Sa8 1 Sa8 1 Sa8 1 Sa8 1 Sa8 1 Sa8

Notes: SMF-FRM+1: Sub-Multiframe #1. Sa: Spare bit reserved for national use. A: Remote Alarm (FAS: Remote Alarm Indication). Frame Alignment Signal Pattern: 0011011 CRC-4 Frame Alignment Signal: 001011 CRC multiframe is not aligned with MFAS timeslot 16 multiframe. SM-FRM 2: Sub-Multiframe 2 E: E-bit Errors. c1, c2, c3, c4: CRC bits

Figure 65 CRC-4 Multiframe Format Cyclic Redundancy Check-4 (CRC-4) is often used in E1 transmission to identify possible bit errors. CRC-4 allows the detection of errors within the 2.048 Mbit/s signal while it is in service. CRC-4 is based on a mathematical calculation performed on each submultiframe of data. The equipment which originates the E1 data calculates the CRC-4 bits for one submultiframe. Next it inserts the CRC-4 bits in the CRC-4 positions in the next submultiframe. The receiving equipment performs the reverse mathematical computation on the submultiframe. It examines the CRC-4 bits which were transmitted in the next submultiframe, then it compares the transmitted CRC-4 bits to the calculated value. If there is a discrepancy in the two values, a CRC-4 error is reported. There are two things to remember when using CRC-4 errors
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to determine the performance of an E1 circuit. Each individual CRC-4 error does not necessarily correspond to a single bit error. Multiple bit errors within the same submultiframe will lead to only one CRC-4 error for the block. Also, it is possible that errors could occur such that the new CRC-4 bits are calculated to be the same as the original CRC-4 bits. CRC-4 error checking provides a convenient method of identifying bit errors within an in-service system. On an in-service system, it is generally not possible to measure the actual bit errors because there is no pattern synch. Bit error measurement is used on an out-of-service system because the results are slightly more precise. CRC-4 also uses a multiframe structure consisting of 16 frames, as shown in Figure 65. However, the CRC-4 multiframe is not necessarily aligned with the MFAS multiframe. Each CRC-4 multiframe can be divided into 2 sub multiframes (SMF). These are labeled SMF#1 and SMF#2 and consist of 8 frames apiece. Four bits of CRC information are associated with each submultiframe. The CRC-4 bits are calculated for each submultiframe, buffered, and inserted into the following submultiframe to be transmitted across the E1 span. When the terminating equipment calculates an error using CRC4, it should transmit an E-bit to the far end, thus informing the far end equipment of the error. E-bit Performance Monitoring

RX

No Errors

RX

E-Bit Error

Trouble Point Test Set 1

Protected Monitor Point

Test Set 2 Error CRC

Terminal Equipment A

Error

E-Bit

Terminal Equipment B

Figure 66 In-service E-bit Performance Monitoring When the terminal equipment of a 2.048 circuit is optioned for CRC-4 transmission, E-bit transmission may also be enabled.
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E-bit performance monitoring of the circuit is now possible. The terminating equipment transmits an E-bit error on the 2.048 Mbit/s line, when it receives a CRC-4 error. However, E-bit error transmission is a relatively new feature in 2.048 transmission. Therefore, it is likely that the embedded equipment does not transmit the E-bit error information correctly. You should check the specifications of your network. Refer to Figure 66. When this type of terminal equipment detects an incoming CRC-4 error, it will respond by transmitting an E-bit error toward the other terminal. Test set 2, shown in Figure 66, will be able to see the E-bit errors by plugging into a protected monitoring point. Note that the test set can not see the actual code errors, framing bit errors and CRC errors introduced at the trouble point. The test set can see only the E-bit errors transmitted by Terminal B. Thus, E-bit error transmission allows a 2.048 Mbit/s in-service circuit to be reliably monitored for transmission performance from any point on the circuit. Without E-bit error transmission, only a complete circuit failure can be reliably determined at any point on the circuit. With a complete circuit failure, the test set will see either loss of signal, alarm indication signal, or remote alarm indication. 4.2 MFR2/DTMF/DP Technology There are a number of signalling methods used by public telephone networks. The methods are divided between the local loop and interoffice signalling. In Figure 67, the signalling applied for each environment is as follows: LOCAL LOOP: - Pulse - DTMF (Dual Tone Multi-Frequency) - ISDN (Integrated Services Digital Network) INTEROFFICE: - MFR2 (Multi-Frequency) - MFC (Multi-Frequency Compelled) - SS7 (Signalling System #7)
MF, MFC, SS7 Pulse DTMF ISDN Local Loop

X X
Interoffice

C. O.

C. O.

Pulse DTMF ISDN Local Loop

Figure 67 Local Loop and Interofce Signalling Method

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Local Loop

In the local loop environment, a common signalling method is DTMF. It uses two tones, a high and a low, to represent a digit. The frequencies used are shown in Figure 68.

Figure 68 DTMF Frequency Keypad For example, if 5 is pressed, two frequencies are generated; 1336 Hz and 770 Hz. DTMF registers, converters, or receivers then recognize these tones as representing the digit 5 and translate them into digital signals. Pulse signalling is older than DTMF, and was originally used for rotary phone sets. When a number is dialled, a series of short IDLE/SEIZURE signals are created with specific timing, usually 10 pulses per second. If a number 3 is dialed, the wheel will send 3 IDLE/SEIZURE signals with a specific inter-digit timing between the digits. The switch will interpret the number of IDLE/SEIZURE signals, and the inter-digit duration to determine the dialed digit. B-bit dialing is used to toggle the B-bit when seizing the line. In the seizure state, the B supervision bit is toggled (ABCD ABCD). If the number 463 is dialled, the B bit will flash 4 times, then rest for approximately one second, toggle six times, rest again, and toggle 3 times. ISDN provides digital services via regular phone lines. Interofce Signalling MFR2 is a common signalling method used in the interofce environment. Similar to DTMF, MFR2 uses two tones for each digit being dialled. However, these tones are selected from a group of only six frequencies. A and B bit signalling is used to seize and acknowledge the line. These can be found in: ITU Q.441 Tables 5-9 MFC (Multi Frequency Compelled) dialling allows the two exchanges to send digits to each other in both the forward and backward direction. This helps ensure accurate transmission of the digits in a noisy environment.
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5 General Information
5.1 Testing and Calibration Statement Sunrise Telecom certifies that this product was manufactured, tested, and veried according to the applicable Sunrise Telecom Incorporated manufacturing and test procedure(s). These formal procedures are designed to assure that the product meets its required specications. This product has no user-adjustable settings. During normal usage, periodic calibration is not a requirement. However, if the product fails during the self-verification test, during power up, the product can be returned to the manufacturer for evaluation and repair. 5.2 Ofces Sunrise Telecom offices are located around the world: SUNRISE TELECOM INCORPORATED 302 Enzo Drive San Jose, CA 95138 U.S.A. Tel: 1-800-701-5208 Fax: 1-408-363-8313 Internet: http://www.sunrisetelecom.com E-mail: support@sunrisetelecom.com SUNRISE TELECOM ATLANTA 3075 Northwoods Circle, Norcross, GA 30071, USA Tel: 770-446-6086, Fax: 770-446-6850 catv@sunrisetelecom.com SUNRISE TELECOM CHINA Room 1503, Tower 3 , No.1, Xizhimenwai Street Xicheng District, Beijing, 100044, CHINA Tel: +86-10-5830-2220, Fax: +86-10-5830-2239 info@sunrisetelecom.com.cn SUNRISE TELECOM FRANCE SAS ZA Courtaboeuf 2 - Immeuble le Ceylan 6 Alle de Londres 91140 Villejust, FRANCE Tel: +33 (0) 1 6993 8990, Fax: +33 (0) 1 6993 8991 france@sunrisetelecom.com SUNRISE TELECOM GERMANY Grabenstrasse 1, 72116 Mssingen GERMANY Tel: +49 7473 378 2400 Fax: +49 7473 378 2424 info@sunrisetelecom.deAmerica
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SUNRISE TELECOM TAIWAN 21, Wu Chuan 3rd Road, Wu-Ku Hsiang Taipei County, 248, Taiwan, R.O.C. Tel: +886-2-5578-0788, Fax: +886-2-2298-2575 info@sunrisetelecom.com.tw

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5.3 Express Limited Warranty This Sunrise Telecom product is warranted against defects in materials and workmanship during its warranty period. The warranty period for this product is contained in the warranty page on http://www.sunrisetelecom.com. Sunrise Telecom agrees to repair or replace any assembly or compo nent found to be defective under normal use during this period. The obligation under this warranty is limited solely to repairing or replacing the product that proves to be defective within the scope of the warranty when returned to the factory. This warranty does not apply under certain conditions, as set forth on the warranty page on http://www.sunrisetelecom.com. Please refer to the website for specific details. THIS IS A LIMITED WARRANTY AND THE ONLY WARRANTY MADE BY SUNRISE TELECOM. SUNRISE TELECOM MAKES NO OTHER WARRANTY, REPRESENTATION OR CONDITION, EXPRESS OR IMPLIED, AND EXPRESSLY DISCLAIMS THE IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE AND NON-INFRINGEMENT OF THIRD PARTY RIGHTS.

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Index
A Alarm Generation Screen AIS; 48 FAS DISTANT; 48 MFAS DISTANT; 48 T/S-16 AIS; 48 To Invoke an Alarm; 48 Applications Accept a New Circuit; 60 Checking for Frequency Synchronization; 62 Connecting the Cords; 59 In-Service Circuit Monitoring; 61 Measuring Signal Level; 63 Monitoring a Voice Frequency Channel; 67 Nx64 kbit/s Testing; 70 Observing Idle and Active Channels; 71 Observing Network Codes or Channel Data; 66 Send a Tone; 69 Simple Talk/Listen; 68 V.54 Channel Loopback Test; 64 C C-Bit Analysis Screen L1-Rx; 29 L1-Tx T/S or L2-Tx T/S; 29 TRANSMIT USER or IDLE; 29 C-bit Denitions; 30 Call Emulator Call Emulator List Screen; 39 Call Emulator Proles Screen; 43 Dial Parameters Screen % BREAK 40%, 50%, or 60%; 45 B-BIT; 45 DIAL PERIOD; 45 INTERDIGIT PRD; 45 PULSE (10pps); 45 SILENT PERIOD; 45 TONE LEVEL dbm; 45 DTMF Receive Sequence Screen; 39 Edit Emulator Screen; 43 RECEIVE Side-TOUT; 44 SEND Side-CODE; 44
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SEND Side-PERD; 44 SEND Side-TYPE NONE, CAS, DTMF, MF-F, MF-B, or DP; 43 Q.441 MFCR2 Call Emulation Screen; 40 Label; 40 Recv; 40 Send; 40 Time/s; 40 Q.441 MFCR2 Call Setup Screen; 40 Q.441 MFCR2 Receive Screen; 42 Q.441 MFCR2 Receive Setup Screen CHANNEL; 41 No. DIGITS EXPECTED; 41 REQUEST CALLER ID; 41 REQUEST CATEGORY; 41 Start User Emulation Screen; 44 User Call Emulator Screen; 42 Cautions; 2,12 Channel Loopback; 34 Connector Panel Ports; 6 Credit card functionality; 41 Current Histogram; 31 E E1 Connector Panels EXT CLOCK; 6 E1 Single Test Conguration Screen CRC-4; 11 FRAMING PCM-30, PCM-31, or UNFRAME; 10 Rx PORT TERM, BRIDGE, or MONITOR; 12 TEST RATE 2.048M or Nx64K; 11 TX CLOCK L1-RX, INTERN, L2-RX, OFFSET, or TTL-L2; 13 Tx SOURCE LOOP or TESTPAT; 10 E1 Technical Standards ITU G.703; 73 ITU G.704; 73 ITU G.706; 73 ITU G.821; 73 ITU G.826; 73 ITU M.550/M.2100; 73 Q.140; 73 Q.400; 73
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E1 Technology 2.048 Mbit/s Data Rate; 74 Basic Denitions Binary Data; 73 Bit Stream; 73 Channel; 73 Converting a Voice Signal; 73 E-bit Performance Monitoring; 80 Framing 2.048 Mbit/s; 77 CRC-4 Error Checking in a MultiFrame Format; 79 FAS; 77 MFAS; 78 Line Coding AMI; 75 HDB3; 75 Signal Levels; 76 Error Injection Screen COUNT/RATE Number or 1e-9 to 2e-3; 46 MODE BURST or RATE; 46 Programming a 10-6 Bit Error Rate; 47 Programming a Burst of 10 Errors; 47 TYPE CODE, BIT, BIT + CODE, CRC-4, FRAME, or E-BIT; 46 Event Report Screen; 26 F FAS Frame Words Screens; 26 Figures 01 Test Set LED Panels; 5 02 E1 Connector Panels; 6 03 Status Screen; 7 04 Menu Tree; 9 05 E1 Test Conguration; 10 06 Select Timeslot Screen; 11 07 DDS Shift Screen; 13 08 Send Test Pattern; 14 09 User Test Pattern Selection Screen; 16 10 User Test Pattern Character Screen; 16 11 Summary Screen; 22 12 Frequency Screen; 22 13 G.821 Logical Screen; 23 14 ALM/SIG Screen; 23 15 M.2100/550 Screen; 23 16 G.826 Screen; 24
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17 View Received Data Screen; 25 18 Event Report Screen; 26 19 FAS Frame Words Screens; 26 20 MFAS Frame Words; 27 21 Pulse Shape Analysis Screen; 28 22 C-Bit Analysis Screen; 29 23 Current Histogram Selection Screen; 31 24 Current Histogram Screen; 32 25 Saved Histogram Selection Screen; 33 26 Propagation Delay Screen; 34 27 V.54 Channel Loopback Screen; 34 28 V.54 Setup; 34 29 VF Measurements E1 Setup Screen; 35 30 View CAS; 38 31 Call Emulator List Screen; 39 32 DTMF Receive Sequence Screen; 39 33 Q.441 MFCR2 Call Setup Screen; 40 34 Q.441 MFCR2 Call Emulation Screen; 40 35 Q.441 MFCR2 Receive Setup Screen; 41 36 Q.441 MFCR2 Receive Screen; 42 37 User Call Emulator Screen; 42 38 Call Emulator Proles Screen; 43 39 Edit Emulator Screen; 43 40 Start User Emulation Screen; 44 41 Dial Parameters Screen; 45 42 Error Injection Screen; 46 43 Alarm Generation Screen; 48 44 Send Frame Words Screen; 49 45 Automatic E-Bit Transmission Setup; 49 46 Measurement Conguration Screens; 51 47 View/Store/Print Screen; 55 48 Character Entry Screen; 57 49 Prole List Screen; 58 50 Term Mode Setup; 59 51 Monitor Mode Setup; 59 52 Accept a New Span; 60 53 In-Service Circuit Monitoring-Monitor Mode; 61 54 Frequency Synchronization Setup; 62 55 Measuring Signal Level Setup; 63 56 V.54 Application; 64 57 View Received Data Screen; 66 58 Fractional E1 Testing; 70 59 Converting a Voice Signal; 74 60 AMI and HDB3 Line Codings; 75 61 HDB3 Encoding; 76 62 Pulse Shape; 76 63 FAS Framing Format; 77
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64 MFAS Framing Format; 78 65 CRC-4 Multiframe Format; 79 66 In-service E-bit Performance Monitoring; 80 67 Local Loop and Interoffice Signalling Method; 81 68 DTMF Frequency Keypad; 82 Format SRAM; 31 Fractional E1 Screen Automatic Selection of Timeslots; 11 Manual Selection of Timeslots; 11 H Histogram Analysis; 31 Current Histogram Screen; 32 Current Histogram Selection Screen; 31 Saved Histogram Selection Screen; 33 M Measurement Conguration Screen AUDIBLE ALARM; 53 Measurement Conguration Screens CODE CONFIGUR HDB3 or AMI; 52 DGRM; 53 G.821; 53 G.826; 53 HRP MODEL %; 54 IDLE CHNL A/B/C/D; 54 IDLE CHNL CODE; 54 M.2100; 53 MEAS DURATION TIMED or CONTINU; 51 MEAS PERIOD; 54 MEASURE MODE BER, LIVE, or AUTO; 52 PRINT EVENT ENABLE or DISABLE; 52 PRINT RESULT TIMED or LAST; 52 PROG DATE YMD; 51 PROG TIME HMS; 52 START PROGRAM or MANUAL; 51 Measurement Results Screen-General Denitions BER; 20 Measurement Results Screens ALM/SIG; 23 Frequency; 22 G.821; 23
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G.826 %BBE; 24 %EB; 24 %SES; 24 BBE; 24 EB; 24 SES; 24 Line SUMMARY; 22 M2100/500; 23 %ES; 24 %SES; 24 P/F; 24 PERIOD; 24 Measurement Result Denitions %AS; 20 %DGRM; 20 %EFS; 20 %ES; 21 %SES; 21 %UAS; 22 (CODE) RATE; 20 (CRC) RATE; 20 +/- RxLVL; 21 +LVL; 21 +WANDR; 22 -LVL; 21 -WANDR; 22 AISS; 20 AS; 20 BIT; 20 CLK SLIP; 20 CODE; 20 CRC; 20 Current Time; 19 DGRM; 20 EBER; 20 EBIT; 20 EFS; 20 ES; 20 ET; 19 FALM; 21 FE; 21 FRM; 19 Hz/PPM; 21 LOFS; 21 LOSS; 21 Lpp; 21
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MAX Hz; 21 MFAL; 21 MIN Hz; 21 PATT; 19 RATE; 19 RCV Hz; 21 RT; 19 RxCLK; 21 SES; 21 SLIP; 21 TxCK; 19 UAS; 21 Measurement Result F-keys HOLDSCR/CONTINU; 19 LOCK/UNLOCK; 19 PAGE-UP, PAGE-DN; 19 STOP/START; 19 Menu Tree; 9 MFR2/DTMF/DP Technology Interoffice Signalling; 82 Local Loop; 82 O Offices; 83 P Prole List Screen LOAD, STORE, RENAME, DELETE, and LOCK/UNLOCK; 58 Propagation Delay Screen; 34 Pulse Mask Analysis Screen; 28 Pulse Shape Analysis Screen Fall Time; 28 Level; 28 Ovr Shoot; 28 Rise Time; 28 Und Shoot; 28 Width; 28 R Running a Timed Test Auto Start; 65 Manual Start; 65 S Saved Histogram; 33 Send Frame Words Screen Automatic E-Bit Transmission Setup; 49 CRC; 49 E-BIT; 49
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FAS WORD; 50 MFAS ABCD; 50 MFAS WORD; 50 NFAS WORDS; 50 Standard Test Patterns; 1416 T Tables 01 Storage Allocation; 8 02 C-bit Denitions; 30 Test Patterns, User Correcting a Mistake in the Pattern; 17 Deleting; 17 Editing a Label; 17 Test Set LEDs; 56 U User Test Patterns Creating User-Dened Patterns; 16 Sending a User Test Pattern; 16 Viewing a User Test Pattern; 16 User Test Pattern Selection Screen; 16 V VF Channel Access View CAS; 38 VF Measurements-Setup Rx-T/S; 36 Tx-T/S; 36 TxABCD; 36 TxFREQ; 36 TxLVL; 36 TxMODE; 36 VF Measurement Results 1010 (dBm); 37 3K (dBm); 37 OFFSET; 37 PEAK; 37 PSOP (dBm); 37 Rx(dBm); 37 RxABCD; 37 RxDATA; 37 RxFREQ; 37 S/N (dB); 37 View/Store/Print Screen; 55 Deleting a Stored Test; 56 Locking and Unlocking a Stored Test; 56 Printing a Stored Test; 56
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Renaming a Stored Test; 57 Saving a Test; 56 Viewing a Stored Test; 56 View Current Event; 26 View FAS Words Screens; 26 View MFAS Words Screen; 27 View Received Data Screen ASCII; 25 BINARY; 25 HEX; 25 T/S; 25 W Warnings; 2 Warranty; 85

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