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FEATURES
Avalanche Rugged Technology Rugged Gate Oxide Technology Lower Input Capacitance Improved Gate Charge Extended Safe Operating Area 175 C Operating Temperature Lower Leakage Current : 10 A (Max.) @ VDS = 100V Lower RDS(ON) : 0.018 (Typ.)
SSH70N10A
BVDSS = 100 V RDS(on) = 0.023 ID = 70 A
TO-3P
1 2 3
Units V A A V mJ A mJ V/ns W W/ C
Continuous Drain Current (TC=100 C) Drain Current-Pulsed Gate-to-Source Voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Total Power Dissipation (TC=25 C)
O 1 O 1 O 3 O
2
Linear Derating Factor Operating Junction and Storage Temperature Range Maximum Lead Temp. for Soldering Purposes, 1/8 from case for 5-seconds
300
Thermal Resistance
Symbol R JC R CS R JA Characteristic Junction-to-Case Case-to-Sink Junction-to-Ambient Typ. -0.24 -Max. 0.5 -40
Units
C /W
Rev. B
SSH70N10A
Test Condition VGS=0V,ID=250 A ID=250 A See Fig 7 VDS=5V,ID=250 A VGS=20V VGS=-20V VDS=100V VDS=80V,TC=150 C VGS=10V,ID=35A VDS=40V,ID=35A
4 O 4 O
3750 4870
VGS=0V,VDS=25V,f =1MHz See Fig 5 VDD=50V,ID=70A, RG=5.3 See Fig 13 VDS=80V,VGS=10V, ID=70A See Fig 6 & Fig 12
4 O 5 O 4 O 5 O
Test Condition Integral reverse pn-diode in the MOSFET TJ=25 C,IS=70A,VGS=0V TJ=25 C,IF=70A diF/dt=100A/ s
4 O
Notes ; Temperature 1 O Repetitive Rating : Pulse Width Limited by Maximum Junction o 2 L=0.5mH, I AS=70A, V DD=25V, R G=27 , Starting T J =25 C O 3 ISD < _ 530A/ s, V DD< _ 70A, di/dt < _ BVDSS , Starting T J =25 oC O _2% Pulse Test : Pulse Width = 250 s, Duty Cycle < 4 O Essentially Independent of Operating Temperature 5 O
SSH70N10A
Fig 2. Transfer Characteristics
[A] ID , Drain Current
[A]
Top :
102
ID , Drain Current
102
175 oC
101
- 55 oC 100
1 02
0 . 0 2
VGS = 20 V 0 . 0 1
1 01
1 7 5 oC 2 5 oC 1 00 0 . 4 0 . 6 0 . 8 1 . 0 1 . 2 1 . 4 1 . 6
@N o t e s: 1 . VGS = 0 V 2 .2 5 0 s P u l s eT e s t 1 . 8 2 . 0 2 . 2 2 . 4 2 . 6
@N o t e : TJ 0 . 0 0 0 50 1 0 0 1 5 0 2 0 0
=2 5 oC 3 0 0
2 5 0
[pF]
1 0
VDS = 2 0V 0V VDS = 5 V 0V DS = 8
Capacitance
2 0 0 0
C rss
@N o t e s:I 7 0 . 0A D = 0 0 2 0 4 0 6 0 8 0 1 0 0 1 2 0 1 4 0 1 6 0
00 10
1 10
SSH70N10A
BVDSS , (Normalized) Drain-Source Breakdown Voltage
2.5
1.1
2.0
1.0
1.5
0.9
0.5
0.8 -75
-50
-25
25
50
75
100
125
150
175
200
-50
-25
25
50
75
100
125
150
175
200
ID , Drain Current
ID , Drain Current
[A]
60 100 s 1 ms 10 ms DC 40 20 102 0 25
2 10
1 10
0 10
10-1 0 10
1 10
50
75
100
125
150
175
Thermal Response
10- 1
o C/W
Max.
Z JC(t) ,
PDM
single pulse
10- 2
0.01
t1 t2
10- 5
10- 4
10- 3
10- 2
10- 1
100
101
[sec]
SSH70N10A
Current Regulator
50K 12V 200nF 300nF
VGS Qg
10V
Qgs
Qgd
R1
Current Sampling (I G) Resistor
R2
Current Sampling (I D) Resistor
Charge
Vout VDD
( 0.5 rated V DS )
90%
td(on) t on
tr
td(off) t off
tf
LL VDS
Vary tp to obtain required peak ID
BVDSS 1 EAS = ---- LL IAS2 -------------------2 BVDSS -- VDD BVDSS IAS C VDD VDD
tp
ID
RG DUT 10V
tp
SSH70N10A
Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
+ VDS --
IS L Driver RG VGS
Same Type as DUT
VGS
VDD
VGS ( Driver )
10V
IS ( DUT ) IRM
di/dt
VDS ( DUT )
Vf
VDD
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