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Justin D. Butterfield
1. Introduction
The goal of this project is to design a 12-bit pipeline analog to digital converter (ADC). The pipeline ADC design is to
use 1.5 bits/stage and capacitor error averaging. The ADC will operate with a maximum clock frequency of 100MHz, a
VDD of 1V, and a maximum VREF range from 0V to 1V. The design will be verified using ideal components in Spice
simulation to focus the design effort on the pipeline ADC architecture rather than on the Op-amps and comparators
themselves. Using ideal components will also keep the simulation times reasonable.
The purpose of analog to digital converts is to sample and digitize an analog signal. The more precisely the analog signal
is converted to digital, the more information can be obtained from it. It is also desirable to convert high bandwidth or
high frequency analog signals; thus, ADCs must be capable of a fast sampling rate as well being accurate. The pipeline
ADC is the architecture of choice for applications that require both speed and accuracy and where latency is not concern.
The basic idea behind the pipeline ADC is that each stage will first sample and hold the input then compare this to VREF/2.
If the input is greater than VREF/2, output a 1 for that stage and pass the input voltage directly to the next stage. If the input
is less than VREF/2, output a 0 for that stage and multiply the input voltage by 2 before passing it to the next stage. Figure
1 shows the block diagram for this basic operation.
There are a few challenges with the basic pipeline ADC architecture that this project will attempt to address. Before
looking at the sources of error, it is worth noting that an error in the early stages of the pipeline will propagate through the
pipeline affectively being amplified by 2 by each successive stage. Errors can be created by the comparators not
switching at the correct point. This means that the comparator may have some offset which will result in it making the
wrong decision. The sample and hold may also have some offset causing the wrong voltage to be passed to the
comparator which will result in the same problem of the comparator making a wrong decision. The other source of error
is the multiply by 2 function, because it is difficult to multiply by a gain of exactly 2. These limitations with real op-amps
and comparators will result in integral nonlinearity (INL) and differential nonlinearity (DNL) errors.
This design requires 12-bit resolution. This means that there will be 212 or 4096 possible output bit combinations.
Assuming a VREF of 1V, 1LSB or the level of analog resolution is given by
244
(Eq. 1)
To correct the errors caused by the offsets in the comparators and the sample and hold op-amps, a technique called 1.5
bits/stage will be used. The name 1.5 bits/stage is based on the fact that each stage has an output with three possible cases
consisting of a and b signals, where ab can be 00, 01, or 11. The 1.5 bits/stage algorithm works as follows:
1
If
Justin D. Butterfield
, then
, then
If
If
00 and
, then
2
01 and
11 and
The ideal transfer curve for the 1.5 bits/stage of vin versus vout is shown in Figure 2. And, the relationship between vin and
vout can be expressed as
.
(Eq. 2)
Using 1.5 bits/stage corrects reasonable comparator offsets by building in error correction with the extra half bit
resolution. Only strings of 01 output are valid. For instance, a 00 cannot be followed by another 00 output, and the same
is true for 11 output. This is because the subtraction or addition of VCM is done prior to the multiplication by 2. The
consequence of this error correction is that extra logic is required to take into account the output of the next stage and get
the final digital output code. The logic schematic will be shown in the design considerations section, but it basically does
the following logic functions, where denotes exclusive OR (XOR):
.
.
and
(Eq. 3)
and
and
.
(Eq. 4)
(Eq. 5)
Also note that the output at this point has a word size of N + 1 where bN is given by
.
(Eq. 6)
Finally, the binary output word needs to have the offset of VCM 0.5 LSB subtracted from it where this offset can be
expressed as:
0.5
001111
(Eq. 7)
Justin D. Butterfield
The simulation results in the Design Considerations section will show that comparator offset is removed by the error
correction of 1.5 bits/stage, but the pipeline ADC still requires a precise multiply by 2. To achieve a more precise
multiply by 2, a technique called capacitor error averaging will be used. This technique uses a modified bottom plate
sampling switched capacitor op-amp circuit with an ideal gain of 2 as is shown in Figure 3. This circuit works by
sampling and holding the input, but instead of sampling again the circuit swaps the positions of the C and C+C
capacitors. The outputs of the amplify and hold phases will then need to be averaged by another bottom plate sample and
hold circuit (not shown in Figure 3). The goal is that any mismatch in the capacitance of capacitors will be averaged out
by using both capacitors for the multiplication and averaging the result.
The cost of this capacitor error averaging is the added design complexity. There is an extra op-amp and set of switched
capacitors for the averaging stage. This will result in more current draw and increase the noise contribution at each stage;
although, some of the noise may be canceled out by the averaging action. The other drawback is the need for a three
phase non-overlapping clock as shown in the timing diagram at the bottom of Figure 3. This three phase clock must be
generated from the input clock which results in a reduction in the sampling rate to less than the input clock rate.
Although, the stages can share clocks as will be shown later, there is also a latency penalty for using capacitor error
averaging.
An additional goal of this project, beyond the design of the 12-bit ADC, is to investigate whether capacitor error
averaging provides any advantage when using op-amps with low open loop gains. The output error with finite gain will
be derived based on conservation of charge. Simulations will also be performed looking at the effect of finite gain on the
error of the multiply by 2 performed by the sample and hold.
Justin D. Butterfield
2. Design Considerations
The first step in the design is to setup the comparators and multiplexers for the 1.5 bits/stage operation. Figure 4(a) shows
the schematic of the block that includes the comparators and multiplexers. The inputs to the cell are the differential
sampled analog signal from the previous stage. The outputs of the cell are the a and b digital codes from the output of the
comparators and the VCIP and VCIM voltages that will be added to the input voltage before being multiplied by 2. Note that
the outputs of the comparators are connected to a latch with a delayed clock to prevent comparator metastability from
resulting in a timing error. Figure 4(b) shows the simulation results for this cell when a differential ramp voltage is
applied to the inputs. The simulation results show that at an input differential voltage of -250mV b goes to a 1 and VCIP
and VCIM both go to VCM. At the input differential voltage of 250mV, a goes to a 1, VCIP goes to 2VCM = 1V and VCIM goes
to 0V. Figures 5(a) and (b) show the schematic details of the multiplexer and 2-to-4 decoder which were created for this
design.
Clk
Qi
am
VDD
Clk
Qi
bm
S1
S0
VDD
C1
10p
S0
S1
Vcm
Out
Clk2
Clk
A1
am
bm
VDD
VDD +
Ideal comp.
Clk +
Mux
I3
I2
I1
I0
2Vcm
VDD Clk2
VDD Clk
-
VDD
R1
A2
Clk
C2
10p
Vcim
100
Clk2
V(vcip)
V(vcim)
V(a)
V(b)
1.0V
0.9V
0.8V
0.7V
0.6V
0.5V
0.4V
0.3V
0.2V
0.1V
0.0V
I3
I2
I1
I0
a
b
Out
Mux
VDD +
Ideal comp.
Clk +
Ref
Vcip
VDD
100
VDD
Vinp
R2
VDD
VDD
Vinm
1.0V
0.9V
0.8V
0.7V
0.6V
0.5V
0.4V
0.3V
0.2V
0.1V
0.0V
TD=500ps TD=500ps
500mV
400mV
300mV
200mV
100mV
0mV
-100mV
-200mV
-300mV
-400mV
-500mV
0.0s
V(vinsp)-V(vinsm)
0.2s
0.4s
0.6s
0.8s
1.0s
1.2s
1.4s
1.6s
A1
A0
D3
D2
D1
D0
Decoder
2-4
S1
S0
I0
I1
VDD
A0
VDD
A1
Out
I2
I3
A5
A1
D0
A6
A2
D1
A3
D2
A4
D3
VDD
VDD
1.8s
2.0s
Justin D. Butterfield
phih
phih
The next major cell to design is the capacitor error averaging sample and hold with a multiplication by two and the
addition/subtraction of the VCIP and VCIM. Figure 6 shows the schematic of this capacitor error averaging block. The
inputs to this cell are the differential analog voltage from the previous stage and the VCIP and VCIM outputs from the
multiplexers. The output of this stage is the vout from Eq. 2 and is the differential output of a given stage, which will be
the analog input to the next stage. Figure 7(a) shows the simulations results for a vout transfer curve of this single stage
where the differential input is a ramp from 0V to 1V as shown in Figure 7(b). Figure 7(b) also shows how VCIP and VCIM
are changing in relation to the input and output transfer curve. An important consideration for the design of this cell is the
size of the capacitors. The minimum size of the capacitors is determined by kT/C noise which must be less than 0.5 LSB
for the maximum operating temperature. Assuming a maximum operating temperature of 100C, the capacitors must be
larger than 0.35pF for the ADC to be 12-bit accurate. Thus, 1pF capacitors should give some margin while not being too
large.
VDD
phis
phis
VDD
CFT
1.00p
CIT
Vcip
CIB
1.00p
phih
Vinm2
+
Ideal op-amp
+
Vopm
VDD
VDD
CIB1
VDD
CFB
VDD
Vopp
VCM
phia
VDD
+
Ideal op-amp
+
phis
VDD
Vinp1
VDD
Vcim
1p
phih
Vinm1
phia
1.00p
2.00p
CIT1
VDD
VDD
VDD
VDD
VDD
1.00p
Vinm
VDD
phia
CFB1
VDD
2.00p
VDD
Voutp
VDD
Voutm
phih
1.00p
VDD
Vopp2
VCM
Vopm2
phia
VDD
CFT1
Vinp2
phih
VDD
VDD
phih
VDD
Vinp
phia
phia
phia
VDD
phih
VDD
VDD
500mV
V(vicm1)
1.0V
V(vcip1)
0.9V
0.8V
400mV
0.7V
0.6V
300mV
0.5V
0.4V
200mV
0.3V
0.2V
100mV
0.1V
0.0V
0mV
V(vinp1)-V(vinm1)
500mV
400mV
-100mV
300mV
200mV
-200mV
100mV
-300mV
-100mV
0mV
-200mV
-400mV
-300mV
-400mV
-500mV
0.0s
0.2s
0.4s
0.6s
0.8s
1.0s
1.2s
1.4s
1.6s
1.8s
2.0s
-500mV
0.0s
0.2s
0.4s
0.6s
0.8s
1.0s
1.2s
1.4s
1.6s
1.8s
2.0s
Justin D. Butterfield
The results in Figure 7 use an ideal clock from voltage sources, but the ADC system needs a way to take its 100MHz
input clock and convert it to a three phase non-overlapping clock. Figure 8(a) shows the schematic for the three phase
non-overlapping clock generation circuit. Figure 8(b) shows the simulation results for the three phase non-overlapping
clock generation circuit with a 100MHz input clock signal. Note, that the resulting three phase clock is one third the
frequency of the input clock. Thus, the sampling rate of the sample and hold will be one third the clock frequency or
33MS/s for a 100MHz clock. The extra Phi4 clock in Figure 8(a) will be used for the single-ended to differential
conversion.
V(clk)
1.1V
1.0V
0.9V
0.8V
0.7V
VDD
0.6V
0.5V
A3
A16
VDD Q
In1
0.4V
A1
A2
A4
A5
A17
A18
0.3V
Phi1
D
TD=25ps
Qi
Clk
VDD
Clk
0.1V
A6
In2
VDD Q
A7
A9
A10
A19
-0.1V
A20
V(phi1)
1.1V
Phi2
TD=25ps
TD=25psTD=25psTD=25psTD=25psTD=25psTD=25ps
V(phi2)
V(phi3)
1.0V
Qi
VDD
Clk
0.9V
0.8V
A13
0.7V
A11
In3
VDD Q
A12
A14
A15
A21
A22
0.6V
Phi3
TD=25ps
D
Clk
0.0V
A8
D
Clk
0.2V
TD=25psTD=25psTD=25psTD=25psTD=25psTD=25ps
0.5V
TD=25psTD=25psTD=25psTD=25psTD=25psTD=25ps
Qi
0.4V
Clk
In3
In3
A31
A23
A27
A28
A29
A26
A30
A25
TD=25psTD=25psTD=25psTD=25psTD=25psTD=25psTD=25ps
TD=25ps
A32
A24
0.3V
Phi4
TD=25ps
0.2V
0.1V
0.0V
-0.1V
4ns
8ns
12ns
16ns
20ns
24ns
28ns
32ns
36ns
40ns
44ns
VDD
phis1
VDD
R36
200k
VCM
R35
120k
phih1
phih2
phia1
R5
0.01
0.01
R3
R6
phis2
phih1
0.01
phih3
phis3
Rename Clocks
phia3
0.01
Vinp2
Vcip2
Vicm2
Vinm2
CLB1
VDD
Cap Err Avg S/H
Vinp
Vcip
Voutp
Vcim
Voutm
Vinm
VCM VCM
10p
CLT2
R11
R12
100
100
10p
Vinm3
CLB2
R13
R14
100
100
Vos3
Vcm VCM
2Vcm VDD
Ref Ref
Mux
1.5-Bit Comparator
b
Vinm
a
Vinp
VDD
Vcm VCM
2Vcm VDD
Ref Ref
Mux
1.5-Bit Comparator
b
Vinm
a
Vinp
VDD
Vos2
phia3 Clk
VDD
Cap Err Avg S/H
Vinp
Vcip
Voutp
Vcim
Voutm
Vinm
VCM VCM
10p
VDD
Vinp3
Vcip3
Vicm3
VDD
Vcim
Vcip
Vcm VCM
2Vcm VDD
Ref Ref
Mux
1.5-Bit Comparator
Vinm
b
Vinp
a
VDD
0
Vcim
Vcip
R2
R4
0.01
VDD
R9
R10
100
100
10p
Vos1
phia2 Clk
phis1
phia1 Clk
VDD
Vcim
Vcip
VCM VCM
CLT1
phis3 phis
phia3 phia
phih3 phih
VDD
Cap Err Avg S/H
Vinp
Vcip
Voutp
Vcim
Voutm
Vinm
phis2 phis
phia2 phia
phih2 phih
Vcip1
Vicm1
phia1
VDD
R33
100k
Phi1 phis1
Phi2 phia1
Phi3 phih1
Clk Clk
Ref
phia2
VDD
R34
100k
R1
0.01
phis1 phis
phia1 phia
phih1 phih
VDD
VDD
(a) Schematic
(b) Simulation Results
Figure 8 Three Phase Non-Overlapping Clock Generation
Figure 9 shows the first three stages of the pipeline ADC. The capacitor average error averaging sample and hold cells
are the top three blocks, and the comparator and multiplexer cells are the bottom three blocks. This schematic also shows
6
Justin D. Butterfield
the VCM and Ref = 3VCM/4 generating resistive voltage dividers. The three phase clock generation is also shown. The
clock generation is done once to create one set of three phase clock signals, and those signals are renamed for use in the
subsequent stages of the pipeline. Figure 10 shows each of the three sets of three phase clock signals. The pattern of
clock signals is repeated for the additional stages of the pipeline.
3.3V
V(phih3)+2.2
V(phis3)
V(phia3)+1.1
V(phia2)+1.1
V(phih2)+2.2
V(phis2)
V(phis1)
V(phia1)+1.1
V(phih1)+2.2
1.7V
0.0V
3.3V
1.7V
0.0V
3.3V
1.7V
0.0V
32ns
40ns
48ns
56ns
64ns
72ns
80ns
88ns
96ns
104ns
112ns
120ns
128ns
phi3
Another important component of the design is a circuit to take the single-ended analog input of ADC and convert it to a
differential analog signal with a common mode reference of VCM. The circuit shown in Figure 11(a) is one way to convert
the single-ended input to differential. The circuit is a basic bottom plate sample and hold that is modified with one of the
inputs tied to VCM and the other input broken up between the input and VCM. This is to keep the input common mode range
of the op-amp at or near VCM. Figure 11(b) shows the simulations results for this circuit which demonstrate that for an
input ramp of 0V to 1V the common mode voltage on the op-amp does not change. Errors arise with this circuit since it
has gain that is determined by CI/CF that is set to 1 for this application. Thus, there will be some gain error from this
circuit that will show up in the ADC output due to capacitor mismatch. Figure 12 shows the error from the single-ended
input to the differential output for three cases of CIT equal to 0.9pF, 1pF, and 1.1pF. This result shows the effect of the
gain error that will show up on the output of the ADC due to this capacitor mismatch.
phi1
phi2
VDD
VDD
Vin
VDD
CFT
VCM
1p
VDD
phi3
CIT
{CIT}
Vinm
phi3
VDD
VCM
CIB
VDD
CFB
1p
1p
VDD
Voutp
Voutm
phi1
VDD
Vopm
VDD
VDD
phi3
No connection
but to each other
Vopp
VCM
Vinp
VDD
+
Ideal op-amp
+
VDD
(a) Schematic
(b) Simulation Results
Figure 11 Single-Ended to Differential Sample and Hold
Justin D. Butterfield
af1p54
b1p54
af1p53
b1p53
af1p52
b1p52
A1
VDD
Cout
c4
bout4
c3
Adderbit
Cin
Cout
S
bout3
c2
VDD
a1p53
BitB
af1p54_b1p54
BitA
A10
VDD
a1p52
BitB
af1p53_b1p53
BitA
VDD
Adderbit
Cin
Cout
Cin
c1
bout2
bout1
VDD
Adderbit
A4
bout0
VDD
a1p51
BitB
af1p52_b1p52
BitA
A3
A2
af1p51_b1p51
A8
A6
af1p50
b1p50
a1p50
af1p51
b1p51
Before cascading the stages of the pipeline together, the design needs to implement the logic specified in Equations 3
through 6. Figure 13 shows how the design implements this logic using basic and full adders. Note that both true and
complement versions of a are required. Figure 13 only shows the first 5 least significant bits of the 13-bit word out of the
logic, but the logic is same for all bits except the first two bits and the last bit. The logic for the last 3 most significant bits
is shown in Figure 14.
After the a and b outputs of the 1.5 bits/stage are combined into a binary word, the logic needs to subtract VCM 0.5 LSB
as described in Equation 7 from the digital output code. The equivalent operation is to add the negative value of this to
the binary output. This way, the full adders can be used. The 13-bit binary twos complement of VCM + 0.5 LSB is
1100000000001. The schematic that adds this as a hard coded value to the output word is shown in Figure 15.
VDD
b5 BitA
BitB
S s0
VDD
VDD
Adderbit
Cout
S s10
VDD
Cin
Cout
VDD
S s5
b9 BitA
BitB
Cout
S s9
VDD
Cin
VDD
Cout
Cin
b10 BitA
BitB
Cin
VDD
b4 BitA
BitB
Adderbit
bout12
Adderbit
A16
VDD
VDD
S s6
Cin
Cin
b0 BitA
VDD BitB
Cout
Cout
VDD
S s4
b8 BitA
BitB
VDD
S s1
S s11
Cout
Cin
S s8
VDD
b12 BitA
VDD BitB
Cin
Adderbit
Cout
Cout
Cin
VDD
c11
bout11
bout10
VDD
b6 BitA
BitB
Adderbit
VDD
Adderbit
b1 BitA
BitB
b11 BitA
VDD BitB
VDD
S s2
VDD
Cout
Cout
Adderbit
VDD
a1p511
VDD
VDD
VDD
VDD
S s7
Cin
Cin
Adderbit
c10
Cin
Cout
Cin
Adderbit
c9
VDD
b2 BitA
BitB
Adderbit
A15
a1p510
BitB
BitA af1p511_b1p511
VDD
VDD
BitB a1p59
BitA af1p510_b1p510
A14
Cin
Cout
Adderbit
VDD
b7 BitA
BitB
Adderbit
S s3
Adderbit
Cout
Adderbit
Adderbit
VDD
af1p511
b1p511
VDD
b3 BitA
BitB
VDD
Justin D. Butterfield
af1p510
b1p510
Cout
S s12
Cin
The design cannot simply take the a and b outputs of each stage and directly apply them to the logic shown in Figures 13
and 14, because the pipeline processes the analog signal stage by stage each on a different clock cycle. The problem is
that the data is available first for the MSB stages and is available many clock cycles later for the LSB stages. The solution
is to add latches to delay the data for each stage of the pipeline to match the data coming out of the last stage. This way,
the data for each stage is available at the same time for the logic perform is function. Since the stages are sharing the
three phase clocks for the capacitor error averaging, the clocking of the data is not 1-to-1. This means that the first stage
does need 12 latched clock delays to match the output of the 12th stage. Table 1 shows the number of flip-flops this
design used to time align the a and b data going into the adder logic.
LSB
1
2
3
4
5
6
7
8
9
10
11
12
#FFDelays
8
8
7
6
6
5
4
4
3
2
2
1
VDD
Vin
12-bit ADC
Stage
Clock
Vrefp
Vrefm
Significance
MSB
B11
B10
B9
B8
B7
B6
B5
B4
B3
B2
B1
B0
The top level design symbol is shown in Figure 16, and the top level design schematic is shown in Figure 17. Although
the details cannot be seen from the schematic, the Figure does show how the different number of flip-flops are connected
to the outputs of each stage. Additionally, it shows how some to the pieces are connected together. The single-ended to
differential conversion stage is first followed by 12 stages of the sample and hold and comparators with multiplexer
blocks. The complete digital logic for combining the a and b outputs of the 1.5 bits/stage comparators is at the bottom
right. The subtraction cell and a final 12-bit register are directly above the digital logic. The purpose of the final 12-bit
register is to synchronize the data to the clock at the final output, which is necessary since real adders will have some
delay.
9
Justin D. Butterfield
R4
R1
VDD
Vrefp
Vrefp
phis1
phia2
phis1
phih3
0.01
0.01
VDD
R2
VDD
VDD
VDD
phih
phia
phis
Ref
VCM
Ref
Vcm
Vinp
2Vcm
Vinm
VDD
Mux
1.5-Bit Comparator
Vcip
Vcim
VDD
D
Q
a1p50
VDD
Clk
b1p50
Qi
phia2
af1p50
Clk
VDD
Qi
VDD
Ref
Ref
phia1
phis1
phih
VDD
10p
VDD
Q
a1p51
VDD
VDD
bout12
bout11
bout10
VDD
bout9
a1p54
b12
b9
b8
b7
bout6
b6
bout5
b5
bout3
bout2
VDD
b11
b10
bout8
bout7
b4
D12
s12
VDD
Q12
s11
D11
Q11
s10
D10
Q10
D9
s9
Subtract
VCM
Q9
b11
b10
b9
s8
D8
Q8
b8
s7
D7
Q7
b7
s6
D6
Q6
b6
s5
D5
Q5
b5
D4
s4
Q4
b3
s3
D3
Q3
b2
s2
D2
Q2
b1
s1
D1
Q1
b0
s0
D0
Q0
b4
b3
b2
b1
b0
b1p511
af1p511
b1p510
af1p510
b1p59
af1p59
b1p58
af1p58
b1p57
af1p57
b1p56
af1p56
b1p55
af1p55
b1p54
af1p54
b1p53
af1p53
b1p52
af1p52
A15
a1p511
a1p510
BitB
VDD
VDD
VDD
Adderbit
BitA
af1p511_b1p511
A14
a1p59
BitB
VDD
Adderbit
BitA
af1p510_b1p510
A13
a1p58
af1p59_b1p59
BitA
BitB
VDD
Adderbit
VDD
VDD
BitB
VDD
Adderbit
BitA
a1p57
af1p58_b1p58
A12
A9
a1p56
BitB
VDD
VDD
Adderbit
BitA
af1p57_b1p57
A7
BitA
VDD
Adderbit
VDD
BitB
VDD
a1p55
af1p56_b1p56
A5
a1p54
BitB
VDD
Adderbit
BitA
af1p55_b1p55
A1
a1p53
BitB
VDD
VDD
VDD
Adderbit
BitA
af1p54_b1p54
A10
af1p53_b1p53
a1p52
BitB
VDD
Adderbit
BitA
a1p51
af1p52_b1p52
BitA
BitB
A3
A2
VDD
VDD
af1p51_b1p51
A8
A6
a1p50
b1p50
af1p50
b1p51
af1p51
phia2
Clk
b1p54
CLB13
VDD
bout1
VDD
Adderbit
c11
bout12
bout11
bout10
bout9
bout8
bout7
bout6
bout5
bout4
bout3
bout2
bout1
bout0
b1p511
A16
Cin
c10
Cout
Cout
Cin
c9
Cin
c8
Cout
Cout
c7
Cin
Cout
c6
Cin
Cout
c5
Cin
Cout
c4
Cin
Cin
c3
Cout
Cout
Cin
c2
Cin
A4
VDD
Q
a1p510
100
VDD
bout0
Cout
Qi
Qi
Q
b1p510
a1p511
af1p510
Qi
af1p511
Qi
R32
100
phih1
phia
phis
phia3
phis3
VCM
VDD
Vcm
2Vcm
Vinm
VDD
b
Mux
1.5-Bit Comparator
Vinp
phia2
VDD
D
VDD
Q
Qi
Qi
Q
a1p52
Vcim
D
phia2
VDD
phia2
Clk
Clk
VDD
VDD
VDD
Qi
Clk
Qi
phia2
phia2
Clk
VDD
VDD
Clk
phia1
VDD
VDD
c1
Q
af1p54
a1p55
b1p55
af1p55
D
Q
a1p56
VDD
Clk
Clk
VDD
Qi
Qi
phia2
VDD
b1p56
VDD
phia2
af1p56
D
Clk
Q
a1p57
VDD
Qi
af1p57
Clk
VDD
Q
b1p57
Qi
VDD
Qi
phia2
phia2
Clk
VDD
VDD
Q
Q
VDD
Qi
a1p58
Clk
VDD
phia2
Qi
phia2
VDD
Clk
VDD
af1p58
Clk
VDD
Q
Qi
b1p58
VDD
Q
a1p59
VDD
phia2
Qi
phia2
VDD
VDD
Clk
D
Clk
phia2
VDD
phia2
VDD
Qi
VDD
Qi
VDD
Clk
VDD
Clk
VDD
Qi
b1p59
af1p59
Qi
Qi
VDD
Q
D
VDD
Q
D
VDD
VDD
Clk
Clk
VDD
phia2
Qi
VDD
Qi
phia2
phia2
VDD
phia2
VDD
Clk
VDD
Q
VDD
Q
Qi
Qi
D
VDD
Q
Qi
D
Clk
phia2
phia2
phia2
VDD
VDD
Clk
D
VDD
VDD
Clk
Clk
VDD
phia2
Q
D
VDD
Q
Qi
VDD
Q
Qi
D
VDD
Clk
VDD
Qi
phia2
Qi
Clk
VDD
phia2
phia2
Clk
Clk
phia2
VDD
VDD
Clk
VDD
Q
D
VDD
Q
Qi
phia2
Qi
phia2
phia2
VDD
VDD
VDD
D
Clk
VDD
phia2
VDD
Clk
D
Clk
Clk
phia2
VDD
Clk
VDD
Qi
phia2
Voutm
Vinm
VDD
a1p53
D
Q
Qi
VDD
D
VDD
Q
Qi
D
VDD
Qi
D
VDD
Qi
D
D
Clk
VDD
phia2
VDD
Qi
VDD
D
Clk
Clk
VDD
phia2
Qi
phia2
Voutp
Vcim
Vos12
bout4
phia2
R31
Vcip
VCM
VCM
10p
Vcip
Clk
b1p51
Qi
af1p52
phih3
phih
phia
phis
VDD
Q
Vinm12
CLB12
af1p51
VDD
VCM
Ref
Ref
Vcm
Vinp
2Vcm
Vinm
VDD
Ref
Mux
1.5-Bit Comparator
Vcip
phia3
D
Clk
VDD
VDD
Clk
Qi
VDD
VDD
Ref
Vicm12
100
10p
Vinp
Vcip12
R30
100
Vos11
Qi
phia2
phia2
Clk
Clk
VDD
VDD
VDD
b1p52
VDD
Voutm
Vinm
VDD
Voutp
Vcim
CLT13
VDD
Cap Err Avg S/H
Vinp12
10p
R29
Vcip
VCM
VCM
10p
Qi
phia2
phia2
Qi
phia2
phis2
phih
VDD
VDD
D
Qi
af1p53
Vinm11
CLB11
Clk
Vcim
phia2
VCM
Vcm
Vinp
2Vcm
Vinm
VDD
Mux
1.5-Bit Comparator
VDD
Q
VDD
Q
Qi
Clk
Qi
VDD
Q
Q
Vicm11
100
Vos10
D
phia2
VDD
Clk
Clk
VDD
Qi
phia2
phia2
VDD
VDD
Vcip11
R28
100
phih2
phia
phis
phia1
phis1
Voutm
Vinm
Vcip
Vcim
Clk
Ref
Voutp
Vcim
CLT12
VDD
Cap Err Avg S/H
Vinp
Vinp11
R27
Vcip
VCM
VCM
10p
Clk
Clk
phia2
VDD
Clk
VDD
Qi
phia2
phia2
D
VDD
phih1
phih
phis
phia
VDD
VDD
D
VDD
Vinm10
CLB10
b1p53
VDD
Ref
VDD
Q
D
VDD
Q
D
VDD
Qi
Qi
VDD
VDD
VDD
VCM
Vcm
Vinp
2Vcm
Vinm
VDD
Mux
1.5-Bit Comparator
phia2
phia1
Vcim
Vcip
VDD
Vicm10
100
10p
Vinp
Vcip10
R26
100
Vos9
D
phia2
Qi
Qi
VDD
Q
VDD
Voutm
Vinm
VDD
VDD
VDD
D
Clk
Clk
Clk
phia2
VDD
Clk
VDD
phia2
phia2
Qi
phia2
Qi
Clk
VDD
VDD
VDD
Clk
phia2
phia2
Clk
VDD
VDD
Clk
Ref
Ref
VDD
Q
Voutp
Vcim
CLT11
VDD
Cap Err Avg S/H
Vinp10
10p
R25
Vcip
VCM
VCM
10p
Qi
VCM
VDD
Vcm
Vinp
Vinm
2Vcm
Mux
1.5-Bit Comparator
VDD
b
Clk
Vcim
phia3
D
VDD
Q
Qi
Qi
VDD
D
VDD
Qi
Qi
Vicm9
Vinm9
CLB9
Vos8
D
phia2
VDD
VDD
Qi
phia2
Clk
Clk
Clk
VDD
Qi
VDD
phia2
VDD
Qi
Clk
VDD
phia2
phia2
Clk
Clk
phia2
VDD
VDD
Clk
VDD
Vcip
Clk
Vcip9
R24
100
100
phia3
phih
Voutm
Vinm
phis3
phia
phis
phia2
phis2
Voutp
Vcim
CLT10
VDD
Cap Err Avg S/H
Vinp
Vinp9
10p
R23
Vcip
VCM
VCM
10p
Clk
phia2
phia2
D
VDD
Vinm8
CLB8
Qi
VDD
VDD
D
VDD
Vcip8
Vicm8
100
CLT9
VDD
Cap Err Avg S/H
Vinp
Vinp8
R22
100
phih3
Voutm
phih2
phih
phia
phis
phia1
phis1
Ref
VDD
VCM
Vcm
Vinp
2Vcm
Vinm
VDD
phia2
Ref
Mux
Ref
1.5-Bit Comparator
VDD
Vcim
VDD
D
VDD
Q
Qi
Qi
VDD
Qi
Qi
VDD
Ref
Voutp
Vcim
VCM
Vos7
D
phia2
VDD
VDD
Qi
phia2
Clk
VDD
Qi
VDD
Clk
Clk
phia2
VDD
Clk
VDD
VDD
Qi
phia2
phia2
phia2
Clk
Clk
VDD
VDD
VDD
Clk
phia2
phia2
Vcip
Clk
10p
R21
Vcip
Vinm
VCM
10p
Clk
VDD
VDD
D
VDD
Vinm7
CLB7
Qi
VCM
Vcm
Vinp
Vinm
2Vcm
Mux
1.5-Bit Comparator
VDD
b
Vcip
phia1
VDD
Qi
Vcip7
Vicm7
100
CLT8
VDD
Cap Err Avg S/H
Vinp
Vinp7
R20
100
phih1
phih
Voutm
Vos6
Qi
D
VDD
Qi
D
Qi
VDD
VDD
VDD
phia
phis
phia3
phis3
Voutp
Vcim
Vinm
Clk
phia2
Qi
VDD
VDD
Clk
VDD
Qi
Q
VDD
Q
Qi
phia2
10p
R19
Vcip
VCM
VCM
10p
phia2
VDD
Qi
Clk
VDD
phia2
phia2
Clk
phia2
VDD
VDD
Clk
Clk
VDD
D
VDD
Vinm6
CLB6
Clk
Clk
phia2
VDD
phia2
VDD
Qi
Vicm6
100
phih3
phih
phis
Vcim
Clk
Ref
D
VDD
VDD
Qi
phia3
VDD
VDD
Ref
phia2
D
Qi
VDD
VCM
Vcm
Clk
VDD
Vcip6
R18
100
Vos5
Vinp
2Vcm
Vinm
VDD
phia2
Clk
Mux
1.5-Bit Comparator
b
Clk
VDD
D
VDD
Qi
VDD
Voutm
Vinm
Vcip
Clk
phia2
VDD
Vcim
phia2
VDD
Qi
phia2
Q
VDD
Voutp
Vcim
CLT7
VDD
Cap Err Avg S/H
Vinp
Vinp6
R17
Vcip
VCM
VCM
10p
VDD
10p
Vinp
Vcip5
Vicm5
Vinm5
CLB4
Clk
VDD
VDD
phia2
Qi
Clk
VDD
Clk
D
VDD
phia2
Qi
phia2
VDD
D
VDD
Q
Qi
Qi
VDD
Qi
VDD
Clk
Ref
phia2
Qi
phia2
VDD
VDD
Ref
VDD
VDD
Clk
VDD
Qi
VDD
CLT6
VDD
Cap Err Avg S/H
Vinp5
R16
100
100
phis2
phis1
VCM
Vcm
phia2
D
Clk
phia2
VDD
Clk
VDD
Q
VDD
Voutm
Vos4
Vinp
Vinm
2Vcm
Mux
VDD
VDD
1.5-Bit Comparator
phia2
Qi
phia2
Q
VDD
Voutp
Vcim
Vinm
Vcip
Clk
Vcim
phia2
VDD
10p
R15
Vcip
VCM
VCM
10p
Clk
Clk
VDD
Q
VDD
Qi
Vcip4
Vicm4
Vinm4
CLB3
VDD
CLT4
VDD
Cap Err Avg S/H
Vinp
Vinp4
R14
100
100
Clk
phia2
phia2
Q
VDD
VDD
VDD
phia2
VDD
VDD
phih
Voutm
Ref
VDD
VCM
Vcm
Vinp
2Vcm
Vinm
VDD
Mux
Ref
1.5-Bit Comparator
VDD
Clk
Vcim
Vcip
phia2
Qi
phia1
VDD
D
VDD
VDD
Clk
Clk
VDD
phia2
Qi
Qi
phia2
Qi
Qi
D
VDD
Q
Qi
VDD
VDD
Clk
Clk
phia2
D
VDD
Qi
Clk
Clk
Clk
VDD
Qi
phia2
Clk
VDD
Qi
Voutp
Vcim
VCM
Vos3
Clk
Clk
VDD
Qi
Q
VDD
VDD
Clk
phia2
phia2
VDD
Clk
VDD
phia2
Qi
phia2
VDD
VDD
Clk
Clk
VDD
VDD
phia2
Qi
Vinp
Vinm
VDD
Ref
VDD
Ref
phia2
VDD
D
Clk
phia2
VDD
phia2
Qi
phia3
VCM
Vcm
2Vcm
1.5-Bit Comparator
Mux
Vcip
VDD
Clk
Clk
VDD
phia2
Qi
phia2
VDD
10p
R13
Vcip
Vinm
VCM
10p
Vos2
Vcim
Clk
Vinm3
CLB2
Vos1
phia2
Vicm3
100
CLT3
VDD
Cap Err Avg S/H
Vinp
Vcip3
R12
100
phis
Voutm
Vinm
VCM
VCM
phia
phi3
Vinm2
10p
phis
phi2
Voutp
Vcim
CLB1
Vinp3
R11
Vcip
Vicm2
100
VCM
phis2
phi1
phi4
phi4
phih1
Voutm
Vinm
VCM
phia3
0.01
10p
Vinp
Vcip2
R10
100
phia3
Vinm1
10p
Vinp2
10p
R9
Voutp
Vcim
CLB5
VCM
R6
CLT2
VDD
Cap Err Avg S/H
phis3
100
VCM
phis3
0.01
phih3
Vcip
phih
Voutm
Vcip1
Vicm1
phih1
VDD
VDD
Vinp1
R8
100
phia
10p
R7
Voutp
phis
SE2Diff
Fig30_35
phia2
Vin
phia1
phis2
phia
R3
0.01
CLT1
VDD
Cap Err Avg S/H
Vinp
phih2
Vin
Vrefm
Vrefm
VDD
CLT5
VDD
R5
phih2
0.01
phih1
phi4
Clk
phih1
Phi4
phia2
phia1
phia1
Phi3
phih2
phis1
Phi2
phih
Clk
Clk
120k
phia
Clock
Ref
R35
100k
phia1
Phi1
200k
VCM
R33
phih1
R36
100k
Qi
R34
3. Characterization Results
Figure 18 characterizes the delay or latency of the pipeline ADC. Figure 18(a) shows the simulation stimulus and output
of an ideal digital to analog converter (DAC) that converts the digital output code from the pipeline ADC back to analog
voltage. The input voltage is a step from 0V to 0.8V. Figure 18(b) gives the results of measuring from the time the input
pulses high to the time when the same pulse is seen on the output. These plots show a 300ns latency with an input clock
frequency of 100MHz, which means the latency is 30 clock cycles.
V(vin)
900mV
V(vout)
810mV
720mV
630mV
540mV
450mV
360mV
270mV
180mV
90mV
0mV
-90mV
300ns
360ns
420ns
480ns
540ns
600ns
660ns
720ns
780ns
840ns
900ns
Figure 19 shows the simulation results for the ideal pipeline ADC with no comparator offsets, op-amp offsets, or capacitor
mismatches. Figure 19(a) shows the analog equivalent output of the pipeline ADC compared to the input ramp. The
results show that the output closely matches the input and there are no non-monotonicities. Figure 19(b) gives more
detailed perspective of the error between the input and output of the ADC or quantization error. This plot is generated by
subtracting the input from the output and also subtracting the static error due to the latency of the pipeline ADC. This
factor is based on the latency calculated from Figure 18(b) of 300ns and given the input ramp from 0V to 1V over 4us
which translates to about 75mV. Of course, there will always be some quantization error for an ADC since it has a finite
10
Justin D. Butterfield
The steeper the input ramp voltage the larger difference between input and output, but ideally the peaks high should be at
0V. The results show that the INL and DNL error are good, but that there may be some gain error which is likely coming
from the initial single-end to differential sample and hold. Note that these results cannot be used to determine if the ADC
is 12-bit accurate since the ramp is not exercising all 4096 output word combinations.
V(vout)
1.0V
V(vin)
0.9V
6mV
0.8V
3mV
0.7V
0mV
0.6V
-3mV
0.5V
-6mV
0.4V
-9mV
0.3V
-12mV
0.2V
-15mV
0.1V
-18mV
0.0V
0.8s
1.3s
1.8s
2.3s
2.8s
3.3s
3.8s
V(vin)-V(vout)-75m
9mV
4.3s
4.8s
-21mV
0.8s
1.2s
1.6s
2.0s
2.4s
2.8s
3.2s
3.6s
4.0s
4.4s
4.8s
Figure 20 shows the output of the pipeline ADC with all the comparators having an offset on the positive terminal. The
green waveform is the baseline and has a comparator offset of 0V. The blue waveform has a comparator offset of 50mV.
And, the red waveform has a comparator offset of 75mV. Very little difference can be observed between the ideal case
and the offset cases. This proves that the 1.5 bit/stage and error correction logic are able to cancel out these offset levels
to a first order.
V(vout)
1.0V
V(vin)-V(vout)-75m
9mV
6mV
0.9V
3mV
0.8V
0mV
0.7V
-3mV
0.6V
-6mV
0.5V
-9mV
0.4V
-12mV
0.3V
-15mV
0.2V
-18mV
0.1V
0.0V
0.8s
-21mV
1.3s
1.8s
2.3s
2.8s
3.3s
3.8s
4.3s
4.8s
-24mV
0.8s
1.2s
1.6s
2.0s
2.4s
2.8s
3.2s
3.6s
4.0s
4.4s
4.8s
Figure 21 shows the output of the pipeline ADC with all of the op-amps having an offset on the negative terminal. Again,
the green waveform is the baseline and has an op-amp offset of 0V. The blue waveform has an op-amp offset of 50mV.
And, the red waveform has an op-amp offset of 100mV. There are some small differences in the quantization error with
the op-amp offsets, but these are not significant.
11
Justin D. Butterfield
V(vout)
1.0V
V(vin)-V(vout)-75m
12mV
10mV
0.9V
8mV
0.8V
6mV
0.7V
4mV
2mV
0.6V
0mV
0.5V
-2mV
0.4V
-4mV
-6mV
0.3V
-8mV
0.2V
-10mV
0.1V
0.0V
0.8s
-12mV
1.3s
1.8s
2.3s
2.8s
3.3s
3.8s
4.3s
-14mV
4.8s
0.8s
1.2s
1.6s
2.0s
2.4s
2.8s
3.2s
3.6s
4.0s
4.4s
4.8s
Figures 22(a) and (b) show the output of the ADC and the quantization error with capacitor mismatches in all of the
sample and hold cells. Both the CIT and CIT1 capacitors in the sample and hold circuit shown in Figure 6 are varied. Both
capacitors are set to 1pF (displayed in green), 0.9pF (displayed in blue), and 1.1pF (displayed in red). Again, there are
some small differences in the quantization error with the op-amp offsets, but these are not significant.
V(vout)
1.0V
0.9V
6mV
0.8V
3mV
0.7V
0mV
0.6V
-3mV
0.5V
-6mV
0.4V
-9mV
0.3V
-12mV
0.2V
-15mV
0.1V
-18mV
0.0V
0.8s
1.3s
1.8s
2.3s
2.8s
V(vin)-V(vout)-75m
9mV
3.3s
3.8s
4.3s
4.8s
-21mV
0.8s
1.2s
1.6s
2.0s
2.4s
2.8s
3.2s
3.6s
4.0s
4.4s
4.8s
Figures 23(a) and (b) show the output of the ADC and an estimate for the quantization error with comparator offsets in the
first three pipeline stages. The comparator offset is set to 0V (displayed in green), 75mV (displayed in blue), and 150mV
(displayed in red). The 150mV offset case results in significant DNL errors at and around 0V, 250mV, 500mV and
750mV. These points make sense, because these are the points where the first three comparators make their decisions.
The 1.5 bit/stage error correction does help, but cannot completely remove this offset. The 75mV offset makes little
difference as is shown in Figure 20(b) where all the comparators have the same offset. Figures 23(c) and (d) show the
output of the ADC and the quantization error with comparator offsets in the last three pipeline stages. Interestingly, even
the offset of 150mV has little affect on the INL and DNL error when it is present in the last stages only.
12
Justin D. Butterfield
V(vout)
1.0V
V(vin)-V(vout)-75m
56mV
49mV
0.9V
42mV
0.8V
35mV
0.7V
28mV
0.6V
21mV
0.5V
14mV
0.4V
7mV
0.3V
0mV
0.2V
-7mV
0.1V
0.0V
0.8s
-14mV
1.3s
1.8s
2.3s
2.8s
3.3s
3.8s
4.3s
4.8s
1.2s
1.6s
2.0s
2.4s
2.8s
3.2s
3.6s
4.0s
4.4s
4.8s
V(vout)
1.0V
-21mV
0.8s
V(vin)-V(vout)-75m
12mV
9mV
0.9V
6mV
0.8V
3mV
0.7V
0mV
0.6V
-3mV
0.5V
-6mV
0.4V
-9mV
0.3V
-12mV
0.2V
-15mV
0.1V
0.0V
0.8s
-18mV
1.2s
1.6s
2.0s
2.4s
2.8s
3.2s
3.6s
4.0s
4.4s
4.8s
-21mV
0.8s
1.2s
1.6s
2.0s
2.4s
2.8s
3.2s
3.6s
4.0s
4.4s
4.8s
Figures 24(a) and (b) show the output of the ADC and the quantization error with sample and hold capacitor mismatches
in the first three stages of the pipeline. Both the CIT and CIT1 capacitors in the sample and hold circuit shown in Figure 6
are varied. They are both set to 1pF (displayed in green), 0.5pF (displayed in blue), and 1.5pF (displayed in red). Both
cases of this high capacitor mismatch (50%) show increases in the INL and DNL error from the ideal case. While,
Figures 24(c) and (d) show the output of the ADC and the quantization error with sample and hold capacitor mismatches
in the last three stages of the pipeline. Both cases with this amount of capacitor mismatch show some increased INL and
DNL error, but both errors are much less significant when the capacitor mismatch is the last few stages.
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Justin D. Butterfield
V(vout)
1.0V
V(vin)-V(vout)-75m
12mV
9mV
0.9V
6mV
0.8V
3mV
0.7V
0mV
0.6V
-3mV
0.5V
-6mV
0.4V
-9mV
0.3V
-12mV
0.2V
-15mV
0.1V
0.0V
0.8s
-18mV
1.3s
1.8s
2.3s
2.8s
3.3s
3.8s
4.3s
4.8s
-21mV
0.8s
1.0V
1.2s
1.6s
2.0s
2.4s
2.8s
3.2s
3.6s
4.0s
4.4s
4.8s
(b) Quantization Error Plot for First Three S/H Cap Mismatch
V(vin)-V(vout)-75m
9mV
0.9V
6mV
0.8V
3mV
0.7V
0mV
0.6V
-3mV
0.5V
-6mV
0.4V
-9mV
0.3V
-12mV
0.2V
-15mV
0.1V
0.0V
0.8s
1.3s
1.8s
2.3s
2.8s
3.3s
3.8s
4.3s
4.8s
-18mV
0.8s
1.2s
1.6s
2.0s
2.4s
2.8s
3.2s
3.6s
4.0s
4.4s
4.8s
(Eq. 8)
This equation assumes that there is no offset in the op-amps, the capacitors are exactly the same, and the op-amp gain is
sufficiently high. The hand derivations in Appendix A show that there is an error factor when the gain is finite. These
derivations assume that the gain of both op-amps is the same value of AOL, that there is no offset in the op-amps, and that
the capacitors are exactly matched to simplify the equations. The equation for the output of the averaging sample and
hold when the op-amps have finite gain is given by
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Justin D. Butterfield
(Eq. 9)
This equation shows that the output of the sample and hold will be reduced by some factor that depends on the gain of the
op-amps. If the open loop gain is 100, the output swing of the sample and hold will be 96.1% of its ideal value. If the
open loop gain is 1000, the output swing of the sample and hold will be 99.6% of its ideal value. Figure 25(a) shows the
effect on the single stage transfer curve previously shown in Figure 7(a) when the op-amp gain is swept from 100 (plotted
in green), 1K (plotted in blue), 10K (plotted in red), and 100K (plotted in pink). Figure 25(b) is a zoomed in plot of
Figure 25(a) at the point where the error is at its maximum. These results show the relationship between the open loop
gain and the error on the output as Equation 9 predicts.
V(voutp)-V(voutm)
500mV
V(voutp)-V(voutm)
400mV
-477mV
300mV
-480mV
200mV
-483mV
100mV
-486mV
0mV
-489mV
-100mV
-492mV
-200mV
-495mV
-300mV
-498mV
-400mV
-501mV
-500mV
-600mV
0.0s
0.2s
0.4s
0.6s
0.8s
1.0s
1.2s
1.4s
1.6s
1.8s
2.0s
-504mV
495ns
500ns
505ns
510ns
515ns
520ns
525ns
530ns
535ns
540ns
545ns
550ns
The characterization results of the 12-bit pipeline ADC have shown that the design is tolerant to op-amp offset and
capacitor mismatch in the sample and hold. The tolerance to capacitor mismatch is due to using the capacitor error
averaging sample and hold topology shown in Figure 6. The question that also arises is How does the performance of
the capacitor error average compare to a single stage sample and hold when the op-amp gain is low? Figure 26 shows
the topology for the single stage bottom plate sample and hold. This topology uses only one op-amp to do the sample,
hold, subtract and multiply by 2 operations. There is no swapping of the capacitors and no second stage to average two
output values, so this topology will be susceptible to capacitor mismatch error. Although it is not proven in the hand
calculations, it is presumed that since this topology has only one op-amp the error will be the square root of the error term
from Equation 9. This means that for the topology in Figure 26, the vout can be estimated by
.
(Eq. 10)
Figure 27(a) shows the maximum differential error for the single stage sample and hold in Figure 26, while Figure 27(b)
shows the maximum differential error for the capacitor error averaging sampled and hold. In these plots, the op-amp gain
is swept from 100 (plotted in green), 1K (plotted in blue), 10K (plotted in red), and 100K (plotted in light blue). These
results show that the single stage sample and hold topology has less error due to finite op-amp gain. The capacitor
averaging sample and hold has slightly less than twice the maximum error compared to the single stage sample and hold.
This makes sense based on Equations 9 and 10. If AOL is 100, the error term is 96.1% for the capacitor error averaging
case and 98.0% for the single stage case. This means that using capacitor error averaging has more of a decrease in
performance from finite op-amp gain than the standard single stage bottom plate sample and hold.
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Justin D. Butterfield
11mV
1-(V(voutp)-V(voutm))
18mV
10mV
16mV
9mV
14mV
8mV
12mV
7mV
6mV
10mV
5mV
8mV
4mV
6mV
3mV
4mV
2mV
2mV
1mV
0mV
0ns
20ns
40ns
60ns
80ns
100ns
120ns
140ns
0mV
0ns
20ns
40ns
60ns
80ns
100ns
120ns
140ns
5. References
[1]
R. J. Baker, CMOS: Circuit Design, Layout, and Simulation 3rd ed. Jon Wiley and Sons Publishers, 2010. ISBN
978-0-0470-88132-3.
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Justin D. Butterfield
A. Hand Calculations
First, consider the simple sample case:
17
Justin D. Butterfield
Next, consider the first stage of the capacitor error averaging sample and hold shown in Figure 6.
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Justin D. Butterfield
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Justin D. Butterfield
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Justin D. Butterfield
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Justin D. Butterfield
22