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lyxis.estanislao@gmail.com
janrafael.eusebio@hotmail.com
I. INTRODUCTION
In every circuit, it is quite impossible not to have a passive
and/or active electronic components. Passive components are those
that do not increase the power of a signal. They often cause power
to be lost. Some can increase the voltage at the expense of current,
so overall, there is a loss of power. Passive components include
two-terminal components such as resistors, capacitors, inductors,
and transformers. On the other hand, active components are those
that increase the power of a signal and it must be supplied with the
signal and a source of power. Active components include
amplifying components such as transistors, triode vacuum tubes
(valves), and tunnel diodes [1&2]. Analyzing these components is
the main objective of this paper.
There are different ways to analyze electronic components, and
most of them tend to analyze the voltage across and current passing
through these components. Different circuit analyses include
transient analysis, AC analysis, DC analysis, noise analysis,
transfer function analysis, etc. Among these analyses, transient
analysis and DC (or DC sweep) analysis are widely used. The
transient analysis computes the transient output variables as a
function of time over a user-specified time interval [3]. Transient
analysis is most useful for studying fault conditions in the circuit,
like short circuits, overloads, etc. [4].
DC sweep analysis deals with the computation of voltages and
currents as a function of (a) a variable dc voltage, or (b) a variable
dc current, or (c) a variable parts value (example: resistor), or (d) a
variable parameter (example: current gain of a transistor). A
"sweep" usually means turning one parameter then pausing for
each measurement, which is more efficient than randomly
hopscotching over a grid of measurements [5].
The authors used SIMetrix, a mixed-mode circuit
simulator that comprises a substantially enhanced SPICE simulator,
schematic editor and waveform viewer in a unified environment, in
acquiring the results in this paper.
dvc (t ) vc (t ) V
0
dt
RC RC
Using the Laplace Method, the voltage and current can be
derived as:
d qc ( t ) qc ( t ) V o
+
=0
dt
RC
R
Q (S ) V
( S Qc ( S ) ) + C = o
RC
SR
V
1
Qc ( S ) S+
= o
RC SR
Vo
R
Qc ( S ) =
1
S S+
RC
CV o
CV o
Q C ( S )=
S
1
S+
RC
q c ( t )=CV o( C V o ) e RC
t
q c ( t )=CV o 1e RC
dq
I=
dt
RC
d q c ( t ) d CV o 1e
=
dt
dt
)]
t
RC
I c=
CV (1e )
o
RC
t
I c =I o 1e RC
V =IR
V c =V o 1e RC
Results shown on Fig. 12, shows almost the same as the graph
of NPN except the PNP plot is rotated by 180 degrees. This shows
that the base current stills controls the behavior of a PNP even
though it is in outward direction.
The result on Fig. 16 showed the same relationship with the nchannel as that of the PNP with the NPN. The p-channel plot if just
the n-channel plot rotated by 180 degrees. Therefore, an ohmic
region is still present, and the relationships between the drain
current, drain-source voltage, and gate voltage are still the same.
The gate voltage still is the one controlling the behaviour of the
transistor.
I (L)*V (L) / kW
300
0
-300
1.2
-0
-1.2
6
3
0
I (R)*V (R) / W
10
15
20
Time/mSecs
100
-300
25
30
5mSecs/div
600
0
1
-3
10
15
20
25
30
Time/mSecs
5mSecs/div
Fig. 18 Voltage, Current, and Power at the Resistor
TABLE I
OTHER MEASUREMENTS FOR THE RESISTIVE CIRCUIT
Measurements
Maximum
Minimum
Frequency
Mean
RMS
Voltage
311.1270 V
-308.8116 V
60.0022 Hz
5.2726 mV
218.9580 V
Measurements
Maximum
Minimum
Frequency
Mean
RMS
Current
3.1113 A
-3.0881 A
60.0022 Hz
52.7256 uA
2.1896 A
Voltage
311.0106 V
-309.7230 V
60.0015 Hz
5.7465 mV
218.9581 V
Current
6.1889 A
0A
59.9998 Hz
3.0981 A
3.7862 A
V (C)
I (C)
C1
26.53u
V1
V1
V (L)
I (L)
265.26m IC=0
L1
I (C)*V (C) / W
AC 1 0 Sine(0 311.127 60 0 0)
300
0
-300
100
-400
3
0
-3
10
15
20
25
30
5mSecs/div
TABLE IIIII
OTHER MEASUREMENTS FOR THE CAPACITIVE CIRCUIT
Measurements
Maximum
Minimum
Frequency
Mean
RMS
Voltage
311.1270 V
-308.8116 V
60.0022 Hz
5.2726 mV
218.9580 V
Current
3.1175 A
-3.1269 A
60 Hz
-3.4260 mA
2.1990 A
D. RLC Circuit
A parallel-connected RLC circuit was investigated through a
transient analysis in order to directly compare and determine the
relationship between the voltage, current, and power through the
different passive components used in the circuit. A configuration
such as the one shown in Fig. 23 was used, with the postsimulation results shown in Fig. 24. Also listed in Table IV are
some of the other quantified data that were obtained during the
analysis.
AC 1 0 Sine(0 311.127 60 0 0)
TABLE IVV
OTHER MEASUREMENTS FOR THE RLC CIRCUIT
Max.
Min.
Freq.
Mean
RMS
Voltage
311.01 V
-309.72 V
60 Hz
5.75 mV
218.96 V
I (R)
3.11 A
-3.10 A
60 Hz
57.47 uA
2.19 A
I (L)
6.57 A
0A
60 Hz
3.29 A
4.02 A
I (C)
5.86 A
-5.90 A
60 Hz
-6.46 mA
4.14 A
ACKNOWLEDGMENT
We wish to acknowledge Engr. J.M. Martinez and other
contributors for useful discussions on the successful analysis of the
circuits involved. We also would like to thank the reviewers of our
paper for their time and valuable feedback.
REFERENCES
V1-pos
I(C)
C1
50u
V1
I(R)
100
R1
I(L)
250m IC=0
L1
[1]
[2]
[3]
[4]
[5]
[6]
[7]
I(C) / A
I(R) / A
[8]
0
-3
[9]
2
-4
[10]
V1-pos*I(C) / W
V1-pos*I(R) / W
[11]
[12]
0
800
400
0
[13]
[14]
[15]
1
0
-1
[16]
800
0
[17]
-800
300
0
-300
Time/mSecs
10
15
20
25
30
5mSecs/div
http://en.wikipedia.org/wiki/Electronic_component
http://homepage.ntlworld.com/g.knott/elect126.htm
http://www.wrcad.com/manual/wrsmanual/node5.html
http://www.researchgate.net/post/What_is_the_importance_of_AC_analysis_
DC_analysis_and_transient_analysis_in_the_analog_circuit_design
http://electronics.stackexchange.com/questions/16842/qucs-what-is-dc-sweep
S. M. Metev and V. P. Veiko, Laser Assisted Microtechnology, 2nd ed., R. M.
Osgood, Jr., Ed. Berlin, Germany: Springer-Verlag, 1998.
J. Breckling, Ed., The Analysis of Directional Time Series: Applications to
Wind Speed and Direction, ser. Lecture Notes in Statistics. Berlin, Germany:
Springer, 1989, vol. 61.
S. Zhang, C. Zhu, J. K. O. Sin, and P. K. T. Mok, A novel ultrathin elevated
channel low-temperature poly-Si TFT, IEEE Electron Device Lett., vol. 20,
pp. 569571, Nov. 1999.
M. Wegmuller, J. P. von der Weid, P. Oberson, and N. Gisin, High resolution
fiber distributed measurements with coherent OFDR, in Proc. ECOC00,
2000, paper 11.3.4, p. 109.
R. E. Sorace, V. S. Reinhardt, and S. A. Vaughn, High-speed digital-to-RF
converter, U.S. Patent 5 668 842, Sept. 16, 1997.
(2002) The IEEE website. [Online]. Available: http://www.ieee.org/
M. Shell. (2002) IEEEtran homepage on CTAN. [Online]. Available:
http://www.ctan.org/tex-archive/macros/latex/contrib/supported/IEEEtran/
FLEXChip Signal Processor (MC68175/D), Motorola, 1996.
PDCA12-70 data sheet, Opto Speed SA, Mezzovico, Switzerland.
A. Karnik, Performance of TCP congestion control with rate feedback:
TCP/ABR and rate adaptive TCP/IP, M. Eng. thesis, Indian Institute of
Science, Bangalore, India, Jan. 1999.
J. Padhye, V. Firoiu, and D. Towsley, A stochastic model of TCP Reno
congestion avoidance and control, Univ. of Massachusetts, Amherst, MA,
CMPSCI Tech. Rep. 99-02, 1999.
Wireless LAN Medium Access Control (MAC) and Physical Layer (PHY)
Specification, IEEE Std. 802.11, 1997.