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1N 6263
DESCRIPTION
Metal to silicon junction diode featuring high breakdown, low turn-on voltage and ultrafast switching.
Primarly intended for high level UHF/VHF detection
and pulse application with broad dynamic range.
DO 35
(Glass)
Parameter
Value
60
Ta = 25 C
15
mA
IFSM
tp 1s
50
mA
Tstg
Tj
- 65 to 200
- 65 to 200
TL
230
Value
Unit
400
C/W
VRRM
IF
Unit
THERMAL RESISTANCE
Symbol
Rth(j-a)
Test Conditions
Junction-ambient*
ELECTRICAL CHARACTERISTICS
STATIC CHARACTERISTICS
Symbol
Test Conditions
Min.
Typ.
Max.
60
Unit
V
VBR
Tamb = 25C
IR = 10A
VF * *
Tamb = 25C
IF = 1mA
0.41
Tamb = 25C
IF = 15mA
Tamb = 25C
VR = 50V
0.2
Max.
Unit
IR * *
DYNAMIC CHARACTERISTICS
Symbol
Test Conditions
Min.
Typ.
Tamb = 25C
VR = 0V
f = 1MHz
2.2
pF
Tamb = 25C
IF = 5mA
Krakauer Method
100
ps
November 1994
1/3
1N 6263
Fig.1 : Forward current versus forward voltage
(typical values).
2/3
1N 6263
PACKAGE MECHANICAL DATA
DO 35 Glass
note 1 E
/C
O
E note 1
/D
O
O
/D
note 2
DIMENSIONS
REF.
NOTES
Millimeters
Min.
Max.
Inches
Min.
Max.
A
B
3.050
12.7
4.500
0.120
0.500
0.117
1.530
2.000
0.060
0.079 2 - The minimum axial lengh within which the device may be
0.458
0.558
0.018
0.022 placed with its leads bent at right angles is 0.59"(15 mm)
1.27
0.050
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consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No
license is granted by implication or otherwise under any patent or patent rights of SGS-THOMSON Microelectronics. Specifications mentioned
in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied.
SGS-THOMSON Microelectronics products are not authorized for use as critical components in life support devices or systems without express
written approval of SGS-THOMSON Microelectronics.