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B5-118
CIGRE 2012
SUMMARY
The primary plant and instrument transformers used in transmission substations generally
remain in-service for many decades, typically 40 70 years, and are renewed only when
physically or mechanically life-expired. However, the secondary systems, which include
protection and control, are changed significantly more frequently. The current replacement
rate for protection and control on the UK transmission network is about 5% per annum, i.e. it
take approximately 20 years to complete the replacement cycle. However, the asset life of
numerical protection and control is often considered to be 15 years, although 10 years may be
more realistic due to declining technical knowledge and support, product obsolescence and
difficulties in obtaining spares.
One way to overcome the problem is to develop a new architecture for substation secondary
systems by deploying technologies such as standard interface modules, the bay process bus
and the IEC 61850 communication protocol. IEC 61850-9-2 Process Bus proposes a local
communication network that replaces traditional hard-wiring with serial communication of
analogue and binary signals using Ethernet messages. A Process Bus solution reduces the lifetime cost of the system, improves flexibility and functionality and allows substation
secondary equipment retrofitting to proceed without the long circuit outages normally
required. Once the new technology is installed, secondary equipment renewals, particularly
those occurring mid-life in the primary plant lifecycle, can be undertaken in a safer, quicker
and easier way with reduced or no outages of primary systems. This enables vendor
interoperability and provides easier modification and extension of the secondary schemes;
particularly those related to reconfiguration and feature enhancement by software means,
rather than the hardwiring changes required in the past.
As a precursor to the widespread deployment of IEC 61850 technology within the UK utility
AS3 (Architecture of Substation Secondary System) project, it must be ensured that the
reliability and performance of IEC 61850 based protection and control schemes meets or
peter.crossley@manchester.ac.uk
exceeds that of its hardwired SICAP (Substation Information, Control and Protection)
predecessors. The aims of the AS3 Architectures are to allow the replacement of faulty
Intelligent Electronic Device (IED) without outages; enable the refurbishment of bay level
secondary systems with minimal disruption to the primary system; simplify the isolation
procedures between the primary and secondary systems; and reduce the risk of mal-operation.
This paper presents the research outcomes of two industry-university projects (Working
Stream 1 & 2) aligned to the AS3 projectWS 1: Evaluation of the IEC 61850 Process Bus Architecture and Reliability. This was
designed to study the AS3 generic architecture, the process bus reliability and the optimal
architecture when considering the life cycle costs and the design of a testing system;
WS 2: Protection Performance Study for Secondary Systems with IEC 61850 Process Bus
Architecture. The objective was to design and evaluate the performance of a prototype
protection scheme, implemented using the Process Bus architecture and applicable to the
corner of a mesh transmission substation. The scheme was evaluated in a laboratory, using a
series of test scenarios designed to verify the operating performance, and the results are
reported in this paper.
KEYWORDS
Substation Automation System (SAS) Protection - IEC 61850 - Process Bus Architecture Intelligent Electronic Device (IED) - Merging Unit (MU) Reliability Performance Testing
1. INTRODUCTION
The IEC 61850 standard on Communication Networks and Systems for Power Utility
Automation ushers in a new era in substation design. It offers new possibilities for
maximising the economic and effective utilisation of the transmission assets and the network
topology. The 61850-9-2 sub-set of the IEC 61850 standard, referred to as Process-Bus,
allows the replacement of conventional analogue and binary signals with Ethernet messages
and enables the use of a digital communication link between Merging Units (MUs), which
provide the interface between the current & voltage transformers and the switchgear, and the
bay devices, such as the protection relays, bay controllers or meters [1].
Sufficient confidence must be demonstrated in the application of this new technology before
it can be widely applied on a transmission network. The projects aim to investigate, quantify
and optimise the level of security, dependability and operating speed of secondary schemes,
implemented using the IEC 61850 process bus architecture and operating within a UK
utilitys mesh topology substation. Prototype protection schemes were evaluated for practical
use, including actual interoperability between different manufacturers, degree of maturity,
robustness, and other operating advantages and disadvantages. The paper describes how a
comprehensive test and validation facility, based on multiple test-sets, can assess the
peter.crossley@manchester.ac.uk
peter.crossley@manchester.ac.uk
The reliability and operating performance study into a complete protection system
implemented using IEC 61850-9-2 process bus architecture and applied to the mesh-corner of
a UK 400kV transmission substation, is presented in this paper, as shown in Figure 2. The
local substation (A) uses process bus architecture and the remote conventional double
busbar substation (B) uses traditional hardwired protection.
Different configurations for the bay and inter-bay process bus architectures are discussed and
the results of laboratory trials presented with respect to reliability, security, dependability,
interoperability and operating speed. The performance is compared with that of a similar
protection system implemented using traditional hard-wiring.
3. PROCESS BUS ARCHITECTURE AND RELIABILITY
3.1 Architectures
Figure 3a shows a simplified version of the National Grid connectivity diagram for a mesh
corner transformer bay. This diagram shows the hard wired copper connections between the
Current Transformers (C10, C11, C13, C14, C15, C18 and C19), Voltage Transformers (V2
and V3) and the Transformer Protection. The Transformer protection is represented by the
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Intelligent Electronic Device(s) - IED(s) - which perform main and backup protection
functions for this bay.
A. Scenario 1
Figure 3b shows the bay after the implementation of the process bus. Each CT and VT is
connected to a merging unit (MU) and each circuit breaker is connected to a circuit breaker
controller (CBC). The MUs and CBCs are connected to an Ethernet switch (SW1). These new
connections are made using fibre optic cables (FIOC). This scenario is based on a star
topology.
a
X120
C1
C8
C9
X420
X428
X124
X126
C2
X113
C10
C11
X103
C5
C3
C4
C7
C6
V1
C12
T1
C13
C14
IED(S)
C15
V2
C16
C17
V3
X110
C18
C19
Figure 3. Transformer bay (a) before and (b) after the introduction of the process bus
For system success the MU would need to be able to receive current and voltage information
from the connected CT and VT and be able to send CT and VT sampled values to the
appropriate IED(s) via the SW. In addition, the CBC should be able to receive trip signals
from the appropriate IED(s).
Figure 4 shows Figure 3b redrawn with the focus on the CBCs, MUs and SW.
B. Scenario 2
In scenario 2, as shown in Figure 5, each device is duplicated; for example, Circuit Breaker
X110 is connected to both CBC1 and CBC2. If CBC1 fails, a trip signal from the bay level
IED(s) can still be sent via CBC2. Each duplicated device is boldly outlined.
C. Scenario 3
As in Scenario 2, each device is duplicated, but now each CBC and MU is connected to both
SWs. Hence, if one SW fails, the connected CBCs and MUs still can be accessed via the other
SW. Scenario 3 is shown in Figure 6.
SW1
CBC1
MU1
MU2
MU3
SW2
MU4
MU5
MU6
MU7
CBC2
MU8
MU9
MU10
MU11
MU12
MU13
MU14
t
Device Reliability r = exp
MTBF
(1)
where: t = period under consideration and MTBF= Mean Time Between Failures (years).
An MTBF of 100 years means that in a statistical population of 100 devices, on average one
device is expected to fail each year. It is assumed there is a constant failure rate and the period
under consideration is the first year, thus t = 1.
The process bus scenarios shown above are systems made up of a combination of devices and
in order to evaluate the system reliability, the event tree methodology was used [2].
B. Life Cycle Cost Analysis
The minimum life cycle cost can be used to determine an optimal solution. The life cycle cost
was estimated as follows:
(2)
where: LCC: life cycle cost, CIRM: sum of investment cost, renewal cost and maintenance
cost and CF: failure cost including replacement cost and penalty cost
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within the CIRM, the investment cost (CI) is the cost of acquiring the devices, the renewal
cost (CR) is the cost of replacing the devices at their end of useful life, and the maintenance
cost (CM) is the cost of carrying out scheduled maintenance on each component/device.
3.3 Methodology Application
In this paper, the device reliability and availability figures were calculated based on the
MTBF data presented in [3], and engineering judgement (see Table 1 for the MTBF,
Investment Cost and device lifetime estimates).
Table 2: Reliability and Cost data for transformer bay process bus scenarios
Scenarios Reliability Investment Renewal Failure Cost Life Cycle Cost
and Maintenance
(IRM) Cost
1
2
3
0.859113
0.980151
0.993327
106180
212360
220680
185055
44469
48652
291235
256829
269332
It can be seen from both Table 3 and Figure 7 that the minimum LCC occurs in Scenario 2.
Based on this, the proposed optimum architecture would be that of scenario 2.
IRM Cost
Failure Cost
350000
300000
Cost
250000
200000
150000
100000
50000
0
0.850
0.875
0.900
0.925
0.950
0.975
1.000
Reliability
Figure 8 Test setup for feeder local (IEC 61850) and remote (hardwired) panels
For test scenario 2, the test set was configured to generate a pre-fault set of signals (nominal
current and the relays were expected to remain stable). The scenario was then switched to an
internal fault (3 x nominal current and the relays must trip) and after an appropriate delay the
currents were switched off. The test set then waited for the close command of the relays and
when received the scenario was switched to an external fault; note, the relays were expected
to remain stable and not trip. Tests were repeated 100 times and the combined scheme
remained stable during external faults and healthy conditions, the average trip time when
switched to internal fault was 27.60ms. Figure 10 demonstrates an example for test scenario
2.
the current 100Mbps. Theoretically 20 SV data streams occupy the full network capacity, but
normal expectations are around 12~14 streams when using a star architecture.
Table Overload test result for IEC 61850 distance relay (8 SV streams)
Fault
Type
L-E
(300 shots)
19.697
0.8256
218.439
0.9965
618.256
0.9464
L-L
(300 shots)
19.834
0.9140
218.591
1.2411
618.368
1.0132
L-L-L
(100 shots)
23.644
4.7230
229.607
6.6208
628.692
7.2794
5. CONCLUSION
A number of process bus architecture scenarios have been introduced for a UK utilitys mesh corner
transformer bay. The methodology for evaluating the reliability has been discussed, and this
methodology has been applied to the aforementioned architecture scenarios.
The paper described how a prototype feeder protection scheme was designed and the operating
performance evaluated when the process bus at the local terminal was heavily loaded with multicast
traffic. The relay at the remote terminal was a part of a traditional hardwired protection scheme and
was used as the reference with which to compare the local IEC 61850-9-2 distance relay. A
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comprehensive series of tests were used to evaluate the operating performance and characteristics of
the hardwired, IEC 61850-9-2 relays and the combined current differential and distance schemes in
terms of security, dependability and operating speed. Results indicate that given an appropriate
network configuration, the performance of a process bus based protection scheme is comparable with
a conventional hardwired scheme.
The optimal application of a process bus based protection scheme can be achieved by close
collaboration between protection specialists in academia and industry. These results provide a
reference to help increase the acceptance of process bus application to provide reliable and cost
effective protection applications.
BIBLIOGRAPHY
[1]
[2]
[3]
[4]
[5]
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