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Overview
Phased Array probe
Beam forming
Array probe configurations
Linear
Matrix
Circular
Sectorial-annular
Probe modeling
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Array Probe
A
e
A aperture
e element width
g gap
p pitch
L element length
sin 0.5
A
Aperture
6 dB beam width
4.52
2.26
1.13
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Small Flaw
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Typical Parameters
Max No. of elements in system
256
Max No. of elements to fire as
one group 32
Pulser Voltage 50V fixed spike
Amplifier Bandwidth 0.25 - 20
MHz
Max PRF 20 kHz
Pre amplifier gain fixed 6 dB
Digitization resolution 50 MHz
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Electronic Focusing
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Uniform Arrays - I
Uniform Arrays - II
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Uniform Arrays - IV
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A2
N
4
sin 0.5
F
N
d st
F
A
10
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10
16
32
Active
Aperture
(mm)
10
16
32
N (mm)
84
216
865
84
84
84
0.99
0.39
0.10
d (in mm)
at F
2.49
1.55
0.78
F (mm)
sin 0.5
sin st 0.5
lobe
e
p
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Focal depth: 4 mm
Focal depth: 8 mm
Focal depth: 12 mm
Focal depth: 16 mm
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Simulations at 5 MHz in Al
Simulations at 5 MHz in Al
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Beam quality
0.9
0.9
0.8
0.8
0.7
0.7
0.6
0.6
Focus
0.4
0.3
0.3
0.2
0.2
0.1
0
10
1
8 Elements
20
30
40
50
60
70
80
0.1
90
0.9
0
-30
1
0.9
0.8
-20
-10
10
20
30
Narrower
Main Lobe
16 Elements
0.8
0.7
0.7
0.6
0.6
0.5
0.5
0.4
0.4
Focus
0.3
0.3
0.2
0.2
0.1
0
10
Grating Lobes
0.5
0.5
0.4
8 Elements
16 Elements
20
30
40
50
60
On Axis (mm)
70
80
0.1
90
0
-30
-20
-10
10
20
30
N = 16, d = /2
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Grating Lobes
For an N-element array, inter-element spacing d,
time-delay between adjacent elements , the
steering angle is given by
c
s sin 1
15
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16
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Normal Incidence
Axial Distance (mm)
Beam Steered to 39
20
20
20
20
40
40
40
60
100
0
20
40
60
60
80
100
80
-60 -40 -20
40
60
60
80
120
Focused On-axis
0
20
40
60
120
80
-60 -40 -20
20
40
60
20
40
60
17
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18
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Refraction
point
Depth
Refracted Angle
The calculator searches the Snell point. It considers the center of the active aperture
(from elements 2 to 7 in this example). Then, the X, Z point of the focal point is
determined. The wedge delay is calculated and the focal law is offset accordingly.
In wedge
In material
Element number
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Tandem Scans
Phased arrays allow for dynamic scanning using the tandem technique.
Separate array groups are defined as transmit and receive "virtual
probes" and scanned to cover the test area.
This technique can be used for testing weldments in thick sections.
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Tube Inspection
Segment arrays for
large pipes
Rotating water
system segment
arrays for mid-size
pipes
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Estimated
from
Simulations
Estimated
from
Experiment
3.1
2.9
4.8
4.7
7.2
7.4
Comparison of simulated and experimental B-scan images of 7-mm bottom surface crack
obtained for the various angles of incidence. (a) 35, (b) 45 and (c) 55 angle inspections
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L. Satyanarayan et al., Inverse method for detection and sizing of cracks in thin sections ..., Theor.
Appl. Fract. Mech. (2008)
AATT - Principle
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AATT Examples
A
B
C
Steel specimen
Schematic
Snapshot
Scanned Images
10
10
20
30
20
40
30
50
60
40
70
50
80
90
Experiment
10
15
20
25
Simulation
60
30
35
40
10
15
20
25
30
35
40
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S-scan
S-scans are stacked A-scans
Examples of S-scan
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TOFD
PE 45 SW
PE 60 SW
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Probe Movement
45-SW
60 SW
TOFD
60-SW
45-SW
Time
Small Flaw
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Example of SAFT
Element by element pulse-echo from a 1.5 mm dia SDH in Al
100
200
300
400
RAW
Image
500
600
100
100
100
200
200
200
300
300
400
400
500
500
300
400
500
600
600
600
10
20
30
40
50
60
10
20
30
40
50
10
60
20
30
40
50
60
10
100
200
300
400
100
100
100
200
200
200
300
300
300
400
400
400
500
SAFT
Image
500
600
10
20
30
40
50
10
20
30
40
50
1
X: 27
Y: 1
X: 36
Y: 1
X: 29
Y: 0.8049
10
0.8
0.7
0.7
0.6
X: 31
Y: 0.3422
30
40
X: 25
Y: 1
X: 42
Y: 0.8298
50
60
10
X: 45
Y: 0.9315
X: 35
Y: 1
20
30
40
50
60
1
X: 35
Y: 1
X: 27
Y: 0.9589
X: 43
Y: 0.9178
0.9
0.8
X: 35
Y: 0.7397
0.8
X: 29
Y: 0.6986
0.7
X: 22
Y: 0.6438
0.7
0.6
X: 27
Y: 0.5802
0.6
X: 34
Y: 0.5054
0.4
X: 35
Y: 0.3466
0.3
0.5
0.4
0.4
X: 36
Y: 0.2977
X: 37
Y: 0.254
0.3
X: 53
Y: 0.5802
X: 36
Y: 0.5309
X: 18
Y: 0.4938
0.5
X: 33
Y: 0.3148
X: 49
Y: 1
X: 47
Y: 0.9505
X: 36
Y: 0.9146
X: 22
Y: 0.8764
X: 40
Y: 0.6809
X: 32
Y: 0.6489
0.5
0.4
20
0.9
0.6
0.5
60
X: 44
Y: 0.9255
X: 40
Y: 0.8049
0.8
50
600
60
X: 43
Y: 0.9681
0.9
X: 34
Y: 0.8171
40
X: 45
Y: 0.9681
X: 27
Y: 0.9146
X: 24
Y: 0.8902
30
500
600
60
0.9
0.3
X: 34
Y: 0.2826
0.3
X: 37
Y: 0.2653
X: 30
Y: 0.2619
0.2
X: 29
Y: 0.115
0.2
0.2
X: 34
Y: 0.1011
X: 33
Y: 0.0715
0.1
10
20
30
0.2
X: 40
Y: 0.112
0.1
500
600
20
40
50
60
70
13 mm deep SDH
10
20
30
X: 32
Y: 0.07272
0.1
40
50
60
70
19 mm deep SDH
10
20
30
X: 32
Y: 0.1241
X: 39
Y: 0.09162
X: 40
Y: 0.1107
0.1
40
50
60
26 mm deep SDH
70
10
20
30
40
50
60
70
45 mm deep SDH
Inspection Speed
Real-time images
Flexibility
Analysis Tools
Reporting
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Coupling
Frequency, attenuation etc.
Acoustic impedance mismatch requirements
Dead zones
31
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ASME Codes
32