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I. I NTRODUCTION
Nanoscience and nanotechnology have experienced substantial growth in recent decades, contributing to numerous
areas such as biology, chemistry, materials science, and
physics [1]. A key enabling technology for nanoscience and
nanotechnology is scanning probe microscopy [2], [3], as
scanning probe microscopy can be used for both manipulation [4] and interrogation [5] at the nanometer scale.
Scanning probe microscopy requires one or more positioners to physically position the probe in space. As such, scanning probe microscopy requires high performance motion
control. The motion can be generated using e.g. piezoelectric
actuators [6], [7], electrostatic comb drives [8], or voice
coil actuators [9], [10]. However, many positioner designs
feature high stiffness materials and little structural damping.
Thus, the mechanical structures of such devices have lightly
damped vibration modes which limit the usable bandwidth,
since reference signals with high frequency components will
excite the vibration modes, which results in non accurate positioning. In addition, the device is affected by environmental
disturbances, such as sound and floor vibrations. Depending
on the actuator, a positioner might exhibit various non-linear
behavior as well.
For known signals, the effect of mechanical vibrations
in these systems can be reduced using feed-forward techniques [11]. However, feedback control may be necessary in
order to reduce the sensitivity to uncertainty and unknown
disturbances. In order to control lightly damped vibrational
modes in active structures, several control schemes that introduce damping have been developed, such as positive position
feedback [12], integral force feedback [13], passive shuntdamping [14], resonant control [15] and integral resonant
94
(1)
Gd (s) = ea
d
X
i
d
(s)
+ Dr
2 + 2 s + 2
fa
s
i i
i
i=1
(2)
Magnitude (dB)
Phase (deg)
r=0
20
Gd
40
0
90
180
270
360
450
540
630
vf
ks
Gf
Measured response
Model response
10
Frequency (Hz)
10
Gd
r=0
40
60
100
180
135
G1
G2
vf
Gf
strictly passive
90
45
45
Gf
passive
80
Phase (deg)
ka
(a) Displacement.
Magnitude (dB)
10
Frequency (Hz)
10
1.5
1max
x 10
max
0.5
0
0.5
1
1.5
9000 8000 7000 6000 5000 4000 3000 2000 1000
1
Real Axis (seconds )
1000
1 z1
=
,
2z1
B. Nonlinear Control Scheme
1 1
.
z1 kf ks
(5)
thus
Re [G1 (j)] =
nd
X
2i i i 2
ks
i=1
where
and
sat(x, L) =
L, k1 , k2 > 0
(2i i 2 )2 + (i 2 3 )2
(6)
x,
|x| < L
.
L sgn(x), |x| L
C(s) =
(vf ) dt
r=0
=
!1/2
T
2
(sat(k1 |vf |, K) + k2 )
)vf2
dt
DSP
!1/2
(K + k2 )2 vf2 dt
= (K + k2 )kvf kT . (8)
kf
i=1
i
Dr
s2 + 2i i s + i 2
ks
Wo
Whp
Gf
vf
Wi
nd
X
(10)
Gd
1
s
,
s + li s
!1/2
0 R , (9)
=K
K = sat(k1 |vf |, L) + k2 ,
1
Gf (j) =
j
!
nd
X
i 2i i 2 + j(i 2 3 )
kf Dr
j
,
(2i i 2 )2 + (i 2 3 )2
i=1
97
Power/frequency [db/Hz]
70
90
100
120
0
2000
4000
6000
8000
Frequency [Hz]
10000
12000
V. D ISCUSSION
0.08
Displacement (m)
80
110
0.1
Openloop
Linear control law
Nonlinear control law
60
0.06
0.04
0.02
0
0.02
0
0.2
0.4
0.6
0.8
1
Time (s)
1.2
1.4
1.6
1.8
x 10
VI. C ONCLUSIONS
8
x 10
6
Force Transducer Voltage (V)
This paper presents the application of a nonlinear augmentation of the vibration damping control scheme integral
force feedback (IFF). The original linear control law was
compared to the augmented nonlinear control law in a set of
experiments using a nanopositioning device exhibiting highly
resonant vibrational modes. The nonlinear control law was
seen to result in improved damping performance compared to
the original linear scheme, while having the same theoretical
stability properties, i.e. the augmentation retains the robust
L2 stability property.
4
2
0
2
A PPENDIX
4
6
0
0.2
0.4
0.6
0.8
1
Time (s)
1.2
1.4
1.6
1.8
x 10
Typically T R+ , R, Z, or Z+ .
98
i=0
X
fi (t ti ) + fa (t), t 0 ,
u1
e1
G1
y1
y2
G2
e2
u2
R EFERENCES
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Control Issues in Nanopositioning, Control Systems Technology, IEEE
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May 2008.
[3] S. M. Salapaka and M. V. Salapaka, Scanning Probe Microscopy,
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[8] J. B. C. Engelen, H. E. Rothuizen, U. Drechsler, R. Stutz, M. Despont, L. Abelmann, and M. A. Lantz, A mass-balanced throughwafer electrostatic x/y-scanner for probe data storage, Microelectronic
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[9] H. Barnard, C. Randall, D. Bridges, and P. K. Hansma, The long
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[10] T. Tuma, W. Haeberle, H. Rothuizen, J. Lygeros, A. Pantazi, and
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dual-stage nanopositioning, in 6th IFAC Symposium on Mechatronic
Systems, Proceedings of the, Hangzhou, Apr. 2013, pp. 125130.
[11] G. M. Clayton, S. Tien, K. K. Leang, Q. Zou, and S. Devasia, A
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High-Speed SPM, Journal of Dynamic Systems Measurement and
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pages), 2009.
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