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I.
INTRODUCTION
Impulse UWB radio transmits information through nanosecond order pulses. For low data rate applications, the duty
cycle of pulses is usually less than 10%. In other words, if the
ADC samples the input signal continuously, over 90% of the
sampled data is useless, which is a high waste of resource.
Therefore, as long as the timing pattern of the baseband
pulses is known, the burst-mode sampling can be employed to
reduce the power consumption [12]. As shown in Figure 1,
the power saving of burst sampling is obtained by keeping the
ADC in standby mode when there is no pulse expected. For a
sub-GHz impulse UWB radio with a pulse rate of 25 MHz,
the time between two consecutive pulses is 40 nanoseconds
and the width of each single pulse is only several
nanoseconds. Therefore over 75% of unnecessary operations
including sampling, comparing, and encoding will be saved if
the burst mode sampling is employed for power optimization.
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Figure 1.
Figure 1. Burst sampling low duty cycle impulse UWB signals
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be resynchronized at the registers before sending to the backend. Note that the frequency of the sampling clock is the same
as the UWB pulse rate. Lets take 25MHz for example; the
ADC can stay in standby mode for 31ns, which leads to about
77% of power savings.
Another advantage of burst sample pipelined ADC is to
alleviate the interference between the analog front-end and
digital back-end. Before digitization is complete, the digital
back-end has no data to process and thus can be turned off to
save power and reduce interference to the front-end. It can be
turned back on when the data is available. At this time, the
front-end, including the ADC, can be turned off for the same
reason. With this interleaved operation, both power
consumption and interference will decrease.
III.
CIRCUIT IMPLEMENTATION
1.0V
Figure 5.
Proposed programmable sampling generator
A. Timing
Circuits
Timing is the most important factor for the proposed
ADC. Generating the sampling clock with the precise pulse
width and phase is the key of the burst sampling ADC.
Usually it can be generated at every rising edge of the low
frequency global clock if the complement of the delayed
clock and the clock itself are fed into a NAND gate. However
the delay may vary at different processes, voltages, and
temperatures (PVT). To minimize the PVT variance, we
proposed a programmable sampling clock generator based on
a digital controlled delay element DCDE [14]. As shown in
Figure. 5, the drain current through the control transistor M7
is determined by a current mirror composed of transistors M5
and M7. An appropriate current through M7 can be adjusted
by turning-on transistor M1-M3. Therefore the overall pulse
width is digitally controlled by the vector (a, b, c). Depending
on the input vector, this circuit can generate a rectangle pulse
with eight different widths. The beauty of the programmable
sampling clock generator is that the pulse width of the
sampling clock can be adjusted by setting the control vector.
The delay/phase of the sampling clock can be adjusted by
using the DCDE as well. By sizing transistor M1, M2, M3,
and M4, a 100ps resolution can be achieved and the accuracy
can be further improved by adding more control vectors. This
0.6V
C. Comparator
The Quantum Voltage (QV) comparator consists of two
cascaded differential pairs with current mirror load [16]. It
has good common mode noise rejection and no resistor ladder
circuits to create the reference voltage, which can be
generated internally by intentionally introducing mismatch in
the differential pairs. We propose a modified QV comparator
shown in Figure 6 by replacing the second differential pair as
well as the current mirror load of the QV comparator with a
CMOS inverter. This replacement can save the bias current of
the second differential pair while still keeping the common
mode nose rejection properties of the differential pair. The
Last two inverters work as gain boosters to improve the gain
of the comparator. As shown in Figure 7, the 16 internally
generated reference voltages are almost equally spaced
between the input range, 0.6V1.0V. Comparing to the
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SIMULATION RESULTS
REFERENCES
[1]
[2]
[3]
[4]
[5]
[6]
[7]
Figure 8. Output waveform of ADC simulation
[8]
TABLE I.
Design
[5]
[6]
[7]
[8]
[9]
This
work
Technology
0.18m
4-bit
1.2
0.13m
6-bit
1.2
0.25m
6-bit
1.3
0.13m
4-bit
1.4
0.18m
5/6 bit
1.056
0.18m
4-bit
1
0.5 V
86
N/A
N/A
1V
160
N/A
N/A
1V
600
0.4
0.8
1V
62
0.3
0.2
1V
36/98
0.3/0.5
0.5/0.6
0.4 V
7.6
0.3
0.3
Resolution
Sampling rate
(GSPS)
Input range
Power (mW)
DNL (LSB)
INL (LSB)
V.
CONCLUSION
[9]
[10]
[11]
[12]
[13]
[14]
[15]
[16]
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