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I. I NTRODUCTION
The IEEE Std. 399-1997 (Brown Book) [3] and the IEEE Std.
141-1993 (Red Book) [4] detail the recommended practices for
performing the short-circuit studies. The Brown Book presents
the following main reasons for performing the short-circuit
studies.
1) The verification of the adequacy of the existing interrupting equipment. The same type of studies will form the
basis for the selection of the interrupting equipment for
system planning purposes.
2) The determination of the system protective device settings, which is done primarily by the quantities characterizing the system under fault conditions. These quantities,
also referred to as protection handles, typically include
the phase and sequence currents or voltages and the rates
of the changes of the system currents or voltages.
3) The determination of the effects of the fault currents
on various system components, such as cables, lines,
busways, transformers, and reactors, during the time the
fault persists. The thermal and mechanical stresses from
the resulting fault currents should always be compared
with the corresponding short-term, usually first-cycle,
withstand capabilities of the system equipment.
4) The assessment of the effect that different kinds of short
circuits of varying severity may have on the overall system voltage profile. These studies will identify the areas
in the system for which faults can result in unacceptably
widespread voltage depressions.
5) The conceptualization, design, and refinement of the system layout, neutral grounding, and substation grounding.
Manuscript received June 17, 2009; accepted January 23, 2010. Date of
publication July 15, 2010; date of current version September 17, 2010. Paper
2009-PCIC-192, presented at the 2009 IEEE Petroleum and Chemical Industry
Technical Conference, Anaheim, CA, September 1416, and approved for
publication in the IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS by
the Petroleum and Chemical Industry Committee of the IEEE Industry Applications Society.
I. Balasubramanian is with Eaton Electrical Services and Systems,
Grapevine, TX 76051 USA (e-mail: IlanchezhianBalasubramanian@eaton.
com).
A. M. Graham is with Eaton Electrical Services and Systems, Warrendale,
PA 98005 USA (e-mail: AidanMGraham@eaton.com).
Color versions of one or more of the figures in this paper are available online
at http://ieeexplore.ieee.org.
Digital Object Identifier 10.1109/TIA.2010.2058083
1837
Epu
=
Ibase
Zpu
kVAt
Ibase =
3 kVLL
(1)
(2)
2000
1
= 41.8 kA.
0.0575
3 0.48
2000
1
= 29.3 kA.
(0.0246 + 0.0575)
3 0.48
1838
arc time of 0.2 s and a distance from the possible arc point to
the person of 610 mm
lg En = K1 + K2 + 1.081 lg Ia + 0.0011G
(6)
where
En incident energy (in joules per square centimeter) normalized for time and distance;
K1 0.792 for open configurations (no enclosure) and
0.555 for box configurations (enclosed equipment);
K2 0 for ungrounded and high-resistance grounded systems
and 0.113 for grounded systems;
G
gap between conductors (in millimeters).
Fig. 2. Impact of changes in primary fault current to secondary fault current
of a transformer.
this paper. This method uses the equations that were developed
using the statistical analysis of the data from the arc-flash
testing performed at laboratories. During testing, it was shown
that the incident energy was dependent on the following main
factors:
1) available fault current at the fault location;
2) protective device clearing time;
3) equipment and installation type;
4) working distance from the arc.
The equations from IEEE Std. 1584-2002 [6] are given in
the following paragraphs to explain the impact of the bolted
fault current on the incident energy calculations in the sample
system.
For the applications with a system voltage under 1000 V,
solve (3)
lg Ia = K + 0.662 lg Ibf + 0.0966V + 0.000526G
+ 0.5588V (lg Ibf ) 0.00304G(lg Ibf ) (3)
where
lg log 10;
Ia arcing current (in kiloamperes);
K 0.153 for open configurations and 0.097 for box
configurations;
Ibf bolted fault current for three-phase faults (symmetrical
rms) (in kiloamperes);
V
system voltage (in kilovolts);
G gap between conductors (in millimeters).
For the applications with a system voltage of 1000 V and
higher, solve (4) and (5) to determine the arcing current
lg Ia = 0.00402 + 0.983 lg Ibf .
(4)
Convert from lg
Ia = 10lg Ia .
(5)
En = 10lg En
(7)
1839
1840
Fig. 4. Timecurrent characteristics of the main protective devices in sample systems 14.
TABLE II
I NCIDENT E NERGY C ALCULATIONS FOR D IFFERENT
AVAILABLE U TILITY FAULT C URRENTS
1841
TABLE IV
A RC -F LASH R ESULTS OF S CENARIO 1 V ERSUS S CENARIO 0
TABLE V
A RC -F LASH R ESULTS OF S CENARIO 2 V ERSUS S CENARIO 0
Fig. 5.
TABLE III
AVAILABLE FAULT C URRENT IN % OF M AXIMUM S ECONDARY FAULT
C URRENT (Ibf,max,sec ) BASED ON S ERVICE T RANSFORMER DATA
TABLE VI
A RC -F LASH R ESULTS FOR W ORST C ASE PPE OF
S CENARIOS 1 AND 2 V ERSUS S CENARIO 0
actual fault current data as the top reason to use the infinite bus
assumption. The survey has shown that obtaining realistic fault
current data from the utility has become increasingly difficult
and it has become a common practice to use the infinite bus
assumption.
VIII. C ONCLUSION
When the utility cannot provide the fault current data,
the IEEE Std. 1584-2002 [6] suggests requesting public utility commissions to require the utility companies to provide
1842
TABLE VII
R ESULTS OF THE A RC -F LASH H AZARD A NALYSIS S URVEY
R EFERENCES
[1] NFPA 70E-2009 Electrical Safety Requirements for Employee
Workplaces.
[2] Occupational and Safety Health Administration, General Industry Regulations Title 29 CFR1910.
[3] IEEE Recommended Practice for Industrial and Commercial Power System
Analysis, IEEE Std. 399-1997, 1997.
[4] IEEE Recommended Practice for Electric Power Distribution for Industrial
Plants, IEEE Std. 141-1993, 1993.
[5] A. M. Graham, M. Hodder, and G. Gates, Current methods for conducting an arc flash hazard analysis, IEEE Trans. Ind. Appl., vol. 44, no. 6,
pp. 19021909, Nov./Dec. 2008.
[6] IEEE Guide for Performing Arc-Flash Hazard Calculations, IEEE Std.
1584-2002, 2002.
[7] [Online]. Available: http://www.nema.org/prod/be/lvde/upload/
LVDEARCFLASH.pdf