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DOI 10.1007/s10967-013-2474-2
Introduction
Alpha-particle spectrometry of high resolution is a measurement method widely used in many applications like
nuclear decay data measurements, geological studies and
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parameters using standard radioactive sources. Repeatability of the results was tested for method validation
purposes. To our knowledge, this paper constitutes a first
attempt to evaluate the performance of a multi-chamber
alpha spectrometer by complete individual measurements
of its ion-implanted-silicon alpha detectors and to present
the results in a comparative manner.
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(RSS) are 3.6, 1.26 and 0.03 for 241Am, 5.5, 1.38 and 0.05
for 233U and 5.3, 1.37 and 0.04 for 244Cm. Due to the
straggling effects, the efficiency of the alpha detector has a
rapid decrease for source-detector distances less than
1.529 (detector diameter), reaching then a stable level for
higher distances. At small source-detector distance, the
values of 241Am efficiency respecting to those of 233U and
244
Cm are systematically lower due to geometrical differences of the source active areas. Moreover, because of the
characteristics of the alpha particle interaction with the ionimplanted-silicon charged-particle detectors, the efficiency
of the alpha detectors is constant regardless of the incident
alpha energy [8] and that it depends on the measurement
geometry, as it is represented in Fig. 2.
The values of the FWHM at the main energy lines of the
241
Am, 233U and 244Cm sources, are represented, in Fig. 3,
for seven chambers, as a function of the source-detector
distance.
It can be seen, for all three alpha sources, that the variation of the resolution with the source-detector distance
has two distinct parts: a fast decreasing of the FWHM for
distances corresponding to the 420 mm and a smooth
decrease of the FWHM for source-detector distances in the
range from 24 to 40 mm [9]. The straggling effect is
responsible for the high variation of the resolution on the
first five source-detector distances of each chamber making
difficult the identification and quantification of the 241Am,
233
U and 244Cm alpha energy lines. The data of the
chamber no. 7 are not presented in Fig. 3 because of a high
leakage current ranging from 120 to 180 nA, developed by
the detector due to a scratch on its front surface. The other
ion-implanted detectors have standard leakage currents in
the tenths of nanoamperes, from 30 to 60 nA. In Table 1
the optimum values of the energy resolution of the
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Background consideration
The background of the ULTRA-AS detector is nearly
negligible. Since the surface area of the detector is small
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Resolution calculated
(keV)
1/32
18.44
2/24
18.88
3/32
19.14
4/32
18.95
5/28
19.09
6/24
18.55
8/24
19.74
Conclusions
A comprehensive characterization of the multi-chamber/
multi-channel analyzer alpha spectrometer ORTEC Octete
Plus was performed. Many measurements were done to
assess the main spectrometric parameters of all eight
ULTRA-AS detectors. In addition, the determination of the
solid angle for quantifying the fraction of the total emitted
radiation detected was achieved. The tests of efficiency and
resolution repeatability evaluation and of measuring
another alpha source demonstrate the fact that the alpha
spectrometer was correctly calibrated in energy and in
efficiency and that the measurement methods used are
robust and can be validated. The spectrometer was
designed to assure a very good reproducibility of the
measurement geometry with direct impact on data accuracy. More comprehensive data analysis and spectra
modelling are considered for the future.
241
241
Am
Efficiency (cps/alpha/s)
FWHM (keV)
Efficiency average
S (n-1) (%)
S (aver) (%)
FWHM average
S (n-1) (%)
S (aver) (%)
0.042456
0.1033
0.0311
18.872
1.959
0.591
0.067763
0.3004
0.0906
19.213
2.974
0.897
3
4
0.042446
0.042331
0.2704
1.4060
0.0815
0.4239
18.828
19.042
1.731
1.072
0.522
0.323
0.054065
0.2271
0.0685
19.593
4.122
1.243
0.070239
0.3739
0.1127
19.009
3.271
0.986
0.068514
0.5126
0.1546
20.008
3.667
1.106
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References
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