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DesignForTest
Wednesday,September11,2013

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DFTQ&Apart1

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1.WhatissequentialDepthInDFT?Howdoesitimprovecoverage?
Ans:FastScanperformsclocksequentialtestgenerationifyouspecifyanonzerosequential
depth.
Clocksequentialidentificationselectsscannablecellsbycuttingsequentialloopsandlimiting
sequentialdepthbasedontheDepthswitch.Typically,thismethodisusedtocreatestructured
partialscandesignsthatcanusetheFastScanclocksequentialATPGalgorithm.
SettingtheSequentialswitchtoeither0(thedefault)or1resultsinpatternswitha

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maximumsequentialdepthofone,butFastScancreatesclocksequentialpatternsonlyifthe
settingis1orhigher.
Themaximumallowablesequentialdepthis255(atypicaldepthwouldrangefrom
2to5).

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CoverageImprovement:

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TestablefaultsbecomeATPG_untestablefaultsbecauseofconstraints,orlimitations,
placedontheATPGtool(suchasapinconstraintoraninsufficientsequentialdepth).
Thesefaultsmaybepossibledetectable,ordetectable,ifyouremovesomeconstraint,orchange
somelimitation,onthetestgenerator(suchasremovingapinconstraintorchangingthe
sequentialdepth).
Also,(whileusingnamedcaptureprocedure)graduallyaddmorecaptureprocedureswithhigher
sequentialdepthuntilthetestcoveragegoalisachievedorthepatterncountlimitisreached.
2.Whatisthedifferencebetweenflopsandscanflops?

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Ans:Differencebetweenscanflopandsimpleflopsbecomesmoreeasytounderstandwhenwe
knowwhydoweneedscanflop!!
Needofscanflop:
Thegoalofscandesignistomakeadifficulttotestsequentialcircuitbehave(duringthetesting
process)likeaneasiertotestcombinationalcircuit.Achievingthisgoalinvolvesreplacing
sequentialelementswithscannablesequentialelements(scancells/scanflops)andthenstitching
thescancellstogetherintoscanregisters,orscanchains.Youcanthenusetheseserially
connectedscancellstoshiftdatainandoutwhenthedesignisinscanmode.

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BeforeScandesignisdifficulttoinitializetoaknownstate,makingitdifficulttobothcontrolthe
internalcircuitryandobserveitsbehaviorusingtheprimaryinputsandoutputsofthedesign.Ina
"Scandesign"scanmemoryelements(scanflops)replacetheoriginalmemoryelements(normal
flops)impartingcontrollabilityandobservabilitytothedesign(primerequirementforthedesign
beingtestable),whenshiftingisenabled.
3.Whatisrobust/non_robusttestforpathdelayfaults?
Ans:NonRobusttests:

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Apairofatspeedvectorsthattestapathdelayfaultfaultdetectionisnotguaranteed,becauseit
dependsonotherdelaysinthecircuit.

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RobustTests:

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Apairofatspeedvectorsthattestapathdelayfaultindependentofotherdelaysordelayfaultsin

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DesignForTest:DFTQ&Apart1
thecircuit.

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4.Whatarethetechniquesusedtoreducepatterncountwithoutlosingcoverage?

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Ans:Thenumberoftestpatternsthatyouneedtoachievefullcoveragedependsonthedesign
size.DifferentATPGtoolsofferdifferentcompressionandpatternorderingtechniquestohelp
reducepatterncount.

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faultmodelsbeyondstuckattypicallyrequirepatterncountsthataremuchlargerthanthosefor
stuckatonly.

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ForPatternreduction,firststepisthechainbalancingduringStitchingorscaninsertion.Ifyour
chainsarebalanced,Toolneedstoinsertlessdummypatternsforreachingtillrequiredflop.

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Alsowecanincludecompressiononthechainswherewehaveconstraintsonthepinsof
device.Thismeansifwearehavingthecompressionfactorof2thenyour1scanchainwillget
dividedinto2insidethedevicereducingyourchainlength(flopsperscanchain).
5.Arethefaultsontheresetsoftheflopsaredetected?ifsohowaretheydetected?

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Ans:Yesthefaultsonresetofthefloparedetectable.Itisdetectedinthefollowingway
1)Definetheresetpinasclockinthetdl
2)Letusassumethattheresetoftheflopisactivelow.Keeptheresetas'high'andscanin'1'in
totheflop(duringthisscanenableis'high')
3)Aswehavescanin'1'theQoftheflopwillhave'1'
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4)Makethescanenable'low'andtogglethereset(i.e.makeitlow).Thisisallowedbecausewe
havedeclaredtheresetasclock.

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5)Asresetis'low'theflopneedtogetresetandwhateverthevalueintheflopwillbecome'0'

1 6 5 2 2 7

6)Thenstrobefor'0',whileshiftingoutthecontentsfromtheflop.
7)Iftheoutputwhileshiftingoutis'0',itmeanstheresetpinoftheflopisnotstuckat1.
Otherwiseitisstuckat'1'.

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Note:

1.Intestmodealltheflopsshouldhaveaasynchronousreset.
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2.TheresetpinsofallflopsshouldbecontrollablefromTop(Chip)level.
Ifyourdesigncontainsalotofsynchronousresetflops.ThensinceduringAC(transdly)testing
theseresetlinefaultsarenottargetedforAC,Constrainingtheresettooffstateisthebestway.

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