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DS1643
Nonvolatile Timekeeping RAM
FEATURES
PIN ASSIGNMENT
NC
28
A12
27
VCC
WE
A7
26
CE2
A6
25
A8
A5
24
A9
A4
23
A11
A3
22
OE
A2
21
A10
A1
20
CE
A0
10
19
DQ7
DQ0
11
18
DQ6
DQ1
12
17
DQ5
DQ2
13
16
DQ4
GND
14
15
DQ3
Powerfail
ORDERING INFORMATION
DS1643XXX
DESCRIPTION
The DS1643 is an 8K x 8 nonvolatile static RAM with a
full function real time clock which are both accessible in
a bytewide format. The nonvolatile time keeping RAM is
pin and function equivalent to any JEDEC standard
8K x 8 SRAM. The device can also be easily substituted
in ROM, EPROM and EEPROM sockets providing read/
write nonvolatility and the addition of the real time clock
function. The real time clock information resides in the
eight uppermost RAM locations. The RTC registers
contain year, month, date, day, hours, minutes, and seconds data in 24 hour BCD format. Corrections for the
day of the month and leap year are made automatically.
041697 1/11
DS1643
PIN DESCRIPTION
A0A12
CE
OE
WE
NC
VCC
GND
DQ0-DQ7
Address Input
Chip Enable
Output Enable
Write Enable
No Connection
+5 Volts
Ground
Data Input/Output
CLOCK
REGISTERS
OSCILLATOR AND
CLOCK COUNTDOWN
CHAIN
32.768 KHz
CE
WE
8K X 8 NV SRAM
OE
+
VBAT
POWER MONITOR,
SWITCHING, AND
WRITE PROTECTION
A0A12
DQ0DQ7
VCC
041697 2/11
POWER GOOD
DS1643
CE
CE2
OE
WE
MODE
DQ
POWER
VIH
DESELECT
HIGH Z
STANDBY
VIL
DESELECT
HIGH Z
STANDBY
VIL
VIH
VIL
WRITE
DATA IN
ACTIVE
VIL
VIH
VIL
VIH
READ
DATA OUT
ACTIVE
VIL
VIH
VIH
VIH
READ
HIGH Z
ACTIVE
<4.5 VOLTS
>VBAT
DESELECT
HIGH Z
CMOS STANDBY
<VBAT
DESELECT
HIGH Z
DATA RETENTION
MODE
5 VOLTS 10%
CLOCK ACCURACY
The DS1643 is guaranteed to keep time accuracy to
within 1 minute per month at 25C. The clock is calibrated at the factory by Dallas Semiconductor using
special calibration nonvolatile tuning elements. The
DS1643 does not require additional calibration and temperature deviations will have a negligible effect in most
applications. For this reason, methods of field clock calibration are not available and not necessary. Attempts
to calibrate the clock that may be used with similar device types (MK48T08 family) will not have any effect
even though the DS1643 appears to accept calibration
data.
041697 3/11
DS1643
FUNCTION
B7
B6
B5
B4
B3
B2
B1
B0
1FFF
YEAR
0099
1FFE
MONTH
0112
1FFD
DATE
0131
1FFC
FT
DAY
0107
1FFB
HOUR
0023
1FFA
MINUTES
0059
1FF9
OSC
SECONDS
0059
1FF8
CONTROL
R
X
=
=
READ BIT
UNUSED
FT =
FREQUENCY TEST
NOTE:
All indicated X bits are not dedicated to any particular function and can be used as normal RAM bits.
041697 4/11
DS1643
041697 5/11
DS1643
0.3V to +7.0V
0C to 70C
20C to +70C
260C for 10 seconds (See Note 7)
* This is a stress rating only and functional operation of the device at these or any other conditions above those
indicated in the operation sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods of time may affect reliability.
(0C to 70C)
SYMBOL
MIN
TYP
MAX
UNITS
NOTES
Supply Voltage
VCC
4.5
5.0
5.5
VIH
2.2
VCC+0.3
VIL
0.3
0.8
DC ELECTRICAL CHARACTERISTICS
PARAMETER
SYMBOL
ICC1
ICC2
ICC3
IIL
MIN
MAX
UNITS
NOTES
65
mA
2, 3
mA
2, 3
4.0
mA
2, 3
IOL
VOH
2.4
VOL
VTP
041697 6/11
TYP
4.0
+1
+1
A
V
4.25
0.4
4.5
DS1643
AC ELECTRICAL CHARACTERISTICS
DS1643120
DS1643150
SYMBOL
MIN
tRC
120
tAA
120
150
ns
tCEA
120
150
ns
tCEZ
40
50
ns
tOEA
100
120
ns
tOEZ
35
45
ns
tOEL
ns
tCEL
ns
PARAMETER
MAX
MIN
MAX
150
UNITS
NOTES
ns
tOH
ns
tWC
120
150
ns
tAS
ns
tCEW
100
120
ns
tAH1
tAH2
5
30
5
30
ns
ns
tWEW
120
150
ns
tWEZ
WE or CE Inactive Time
tWR
10
10
ns
tDS
85
110
ns
tDH1
tDH2
0
15
0
15
ns
ns
40
50
5
6
ns
5
6
AC TEST CONDITIONS
Input Levels:
Transition Times:
0V to 3V
5 ns
CAPACITANCE
PARAMETER
(tA = 25C)
SYMBOL
MIN
TYP
MAX
UNITS
CI
pF
Capacitance on DQ pins
CDQ
10
pF
NOTES
041697 7/11
DS1643
(0C to 70C)
SYMBOL
MIN
TYP
MAX
UNITS
tPD
tF
300
tFB
10
tRB
tR
PowerUp
tREC
15
tDR
10
25
35
NOTES
ms
years
READ
tRC
tRC
WRITE
tWC
A0A12
tAA
tAH
tAS
tCEA
CE
tCEL
OE
tOEA
tWR
tWEW
WE
tOEL
tOH
tOEZ
DQ0DQ7
VALID OUT
041697 8/11
VALID OUT
VALID IN
DS1643
WRITE
tWC
tWC
READ
tRC
A0A12
tAH2
tAS
tAA
tWR
tAH1
tCEW
CE
tOEA
OE
tWR
tWEW
WE
tDH1
tCEZ
DQ0
DQ7
tDH2
tDS
VALID
OUT
VALID IN
tWEZ
tDS
VALID IN
VALID OUT
POWERDOWN/POWERUP TIMING
VCC
VPF (MAX)
VPF (MIN)
VPF
tF
tR
tFB
VSO
VSO
tPD
tRB
tREC
CE
IBATT
DATA RETENTION
tDR
041697 9/11
DS1643
NOTES:
1. All voltages are referenced to ground.
2. Typical values are at 25C and nominal supplies.
3. Outputs are open.
4. Data retention time is at 25C and is calculated from the date code on the device package. The date code XXYY
is the year followed by the week of the year in which the device was manufactured. For example, 9225, would
mean the 25th week of 1992.
5. tAH1, tDH1 are measured from WE going high.
6. tAH2, tDH2 are measured from CE going high.
7. RealTime Clock Modules can be successfully processed through conventional wavesoldering techniques as
long as temperature exposure to the lithium energy source contained within does not exceed +85C. Post solder
cleaning with water washing techniques is acceptable, provided that ultrasonic vibration is not used.
OUTPUT LOAD
+5 VOLTS
1.8K
D.U.T.
1K
100 pF
041697 10/11
DS1643
1
A
F
D
28PIN
DIM
MIN
MAX
A IN.
MM
1.470
37.34
1.490
37.85
B IN.
MM
0.675
17.75
0.740
18.80
C IN.
MM
0.335
8.51
0.355
9.02
D IN.
MM
0.075
1.91
0.105
2.67
E IN.
MM
0.015
0.38
0.030
0.76
IN.
MM
0.140
3.56
0.180
4.57
G IN.
MM
0.090
2.29
0.110
2.79
H IN.
MM
0.590
14.99
0.630
16.00
IN.
MM
0.010
0.25
0.018
0.45
K IN.
MM
0.015
0.43
0.025
0.58
J
E
H
B
041697 11/11