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Voltage-Controlled Oscillator (VCO)

fosc
Desirable characteristics: fmax
Monotonic fosc vs. VC characteristic
with adequate frequency range
Well-defined Kvco slope = Kvco
fmin
VC
VC
in
KPD
VD
F (s) +

VC K^vco out
s
K^vco
out = VC
s + KPD K^vco F (s) / N

Noise coupling from VC into PLL
N output is directly proportional to Kvco.

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine
1


Oscillator Design

Vin 0
Vout Vout A(s)
A(s) HCL (s) =
Vin 1+ f A(s)
loop gain



f Barkhausens Criterion:

If a negative-feedback loop satisfies:

( )
f A j o 1
A( j ) = 180
o
!

then the circuit will oscillate at frequency 0.

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine


2

Inverters with Feedback (1)
1 inverter: V2 1 inverter

V1 V2
1 stable
feedback
equilibrium
point

V1

V2
2 inverters:

feedback 3 equilibrium
V1 V2 points: 2 stable,
1 unstable
(latch)
2 inverters
V1
EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine
3

Inverters with Feedback (2)

3 inverters forming an oscillator:


V2

V1 V2 1 unstable
equilibrium point
due to phase shift
from 3 capacitors

V1
A0
Let each inverter have transfer function Hinv ( j ) =
1+ j p
3 A30
Loop gain: Hloop ( j ) = [Hinv ( j )] = 3
(1+ j p )
% (
1
Applying Barkhausens criterion: Hloop ( j ) = 3 tan ' * = 180! o = 3 p
& p)

A30
Hloop ( j o ) = 3
> 1 A0 > 2
[1+ 3] 2

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine


4


Ring Oscillator Operation
tp tp tp
VA VB VC

VA
tp
1
VB Tosc = 3t p
tp 2
Tosc = 6t p
VC
tp
VA

1
Tosc
2

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine


5


Variable Delay Inverters (1)

Inverter with variable load capacitance: Current-starved inverter:

Vin Vout

VC
Vin Vout

VC

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine


6

Variable Delay Inverters (2)

Interpolating inverter:

ISS R R
Vout-
Vout+
+
V Vin+ Vin- Vin+ Vin-
_C
RG RG
Ifast
Islow

tp is varied by selecting weighted sum of fast and slow inverter.


Differential inverter operation and differential control voltage
Voltage swing maintained at ISSR independent of VC.

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine


7

Differential Ring Oscillator

+ + + +
VA VB VC VD VA
+

additional inversion
VA (zero-delay)
tp

VB tp
1
Tosc = 4t p
VC tp 2
Tosc = 8t p
VD tp
Use of 4 inverters makes
quadrature signals available.
VA
1
Tosc
EECS 270C / Spring 2014 2 Prof. M. Green / U.C. Irvine
8


Resonance in Oscillation Loop
H r ( j )

Hr (s)
1

r

Hr ( j )
Hr (s)
+
2


r



2

At dc: At resonance:

Since Hr(0) < 1, latch-up does not occur. H r ( j r ) > 1
o = r
Hr ( jr ) = 0
EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine
9



LC VCO

L C
Vin Vout 1
Hr (s) r =
Vout LC
Vin

Hr (s)
2L

C C
Hr (s)

realizes negative
resistance

EECS 270C / Spring 2014

Prof. M. Green / U.C. Irvine


10

Variable Capacitance
varactor = variable reactance

Cj
A. Reverse-biased p-n junction

+ VR

VR

B. MOSFET accumulation capacitance Cg


p-channel

VBG
+ n diffusion in n-well

VBG
accumulation inversion
region region
EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

11

LC VCO Variations

IS IS
2L 2L

C C C C

2L 2L

C C C C

ISS

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



12

Effect of CML Loading

1.
1. ideal capacitor load
1 nH 3.8

400 fF 400 fF 108 fF 108 fF

2.
Cg = 108fF

1 nH 3.8

400 fF 400 fF

2. CML buffer load

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine


13

CML Buffer Input Admittance (1)

1+ j / z
Yin = jCgs + jCgd A0
1+ j / p

A0 = 1+ gm R

where: 1/ p = CL + Cgd R ( ) (note p < z)

CL R
1/ z =
A0

1 p 1 z
Re Yin = A0Cgd 2
( ) 2
(
1+ p )
Substantial parallel loss at high
frequencies weakens VCOs

tendency to oscillate

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine


14

CML Buffer Input Admittance (2)

Yin magnitude/phase: Yin real part/imaginary part:

magnitude

imaginary

phase

real

Contributes 2k additional parallel resistance

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine


15

CML Buffer Input Admittance (3)

3. CML tuned buffer load

Cg = 108 fF

imaginary
1 nH 3.8

3.8 nH
400 fF 400 fF

real

Contributes negative parallel resistance

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine


16

CML Buffer Input Admittance (4)

ideal capacitor load

Cg = 108 fF

1 nH 3.8

3.8 nH
400 fF 400 fF

CML buffer load


Loading VCO with tuned CML buffer
allows negative real part at high
frequencies more robust oscillation!
CML tuned buffer load

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



17

Differential Control of LC VCO

Differential VCO control is preferred to reduce VC noise coupling into PLL output.

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



18

Oscillator Type Comparison

Ring Oscillator LC Oscillator

slower + faster

low Q more jitter generation + high Q less jitter generation

+ Control voltage can be applied Control voltage applied single-ended


differentially

+ Easier to design; behavior more Inductors & varactors make design


predictable more difficult and behavior less
predictable

+ Less chip area More chip area (inductor)

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



19

Random Processes (1)

Random variable: A quantity X whose value is not exactly known.

Probability distribution function PX(x): The probability that a random variable


X is less than or equal to a value x.

PX(x)
1

Example 1:
Random variable X [,+] 0.5

x
EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

20

Random Processes (2)

Probability of X within a range is straightforward:

PX(x)
1

0.5
( )
P X [x 1, x 2 ] = P(x 2 ) P(x 1)

x1 x2 x

If we let x2-x1 become very small

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



21

Random Processes (3)
Probability density function pX(x):
Probability that random variable X lies within the range of x and x+dx.
x2
p X (x) dx = PX (x + dx) PX (x) ( )
P X [ x 1, x 2 ] = p X (x) dx
x1
dPX (x)
p X (x) =
dx

PX(x)
pX(x)
1

0.5

dx x x

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



22

Random Processes (4)

Expectation value E[X]: Expected (mean) value of random variable X


over a large number of samples.
+

E[X ] X = x p X (x)dx

Mean square value E[X2]: Mean value of the square of a random


variable X2 over a large number of samples.
+

E[X 2 ] = x 2
p X (x)dx

+ 2

Variance: [
E (X X ) = 2
] 2
(x X ) p X (x)dx

Standard deviation: = E (X X )
2
[ ]

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

23


Gaussian Function

1. Provides a good model for the probability density functions of many


random phenomena.
2. Can be easily characterized mathematically , X . ( )
3. Combinations of Gaussian random variables are themselves
Gaussian.

1 f (x)
2

0.607
1 % (x X )2 ( 2
f (x) = exp' * 2
2
2 '& 2 *)
+
f (x)dx = 1
X X + x
X

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



24


Joint Probability (1)

Consider 2 random variables:

(
P(x, y) P X x and Y y )

If X and Y are statistically independent (i.e., uncorrelated):

( )
P X [ x, x + dx ] and Y [ y, y + dy ] = p X (x) pY (y) dx dy

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



25

Joint Probability (2)

Consider sum of 2 random variables:


Z = X +Y

y
(
P Z [ z0 , z0 + dz ] = ) strip
p X (x)pY (y) dx dy

% (
='
&

p X (x)pY (z0 x) dx * dz
)

x + y = z0 + dz

p Z (z0 )
x + y = z0 dy = dz
determined by convolution
of pX and pY.
x
dx

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



26

Joint Probability (3)
Example: Consider the sum of 2 non-Gaussian random processes:

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



27

Joint Probability (4)
3 sources combined:

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



28

Joint Probability (5)
4 sources combined:

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



29

Joint Probability (6)
Noise sources

Central Limit Theorem:


Superposition of random variables tends toward normality.

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



30

Fourier transform of Gaussians:
% 2(
1 X ) % 1 2 2(
p X (x) = exp'
(x * F PX ( ) = exp' X *
2 '& 2 2 *)
X X & 2 )

Recall:
& )
(
P Z [ z0 , z0 + dz ] = (
'
)
p X (x)pY (z0 x) dx + dz
*

F
p Z (z0 ) =

p X (x)pY (z0 x) dx PZ ( ) = PX ( ) PY ( )
% 1 ( % 1 (
= exp' 2X 2 * exp' Y2 2 *
& 2 ) & 2 )
% (
p Z (z) =
1
exp'
(z Z)2
'2 2 + 2
*
*
F -1 % 1 (
= exp' ( 2X + 2X ) 2 *
(
2 2X + Y2 ) & ( X Y ) ) & 2 )

Variances of sum of random normal processes add.




EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

31

Autocorrelation function RX(t1,t2): Expected value of the product of 2
samples of a random variable at times t1 & t2.

RX (t1,t2 ) = E [ X (t1) X (t2 )]

For a stationary random process, RX depends only on the time


difference = t1 t 2

RX ( ) = E [ X (t) X (t + )] for any t


2
Note RX (0) =

Power spectral density SX():


' + 2*
) ,

SX ( ) = E) X (t) e jt dt , SX() given in units of [dBm/Hz]
)( ,+

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



32

Relationship between spectral density & autocorrelation function:

1
RX ( ) =
2

SX ( ) e j d

1
RX (0) = =
2
2


SX ( )d

infinite variance
Example 1: white noise (non-physical)

SX ( ) RX ( )


K
( )
SX = K RX ( ) =
2
()
t


EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

33

Example 2: band-limited white noise
RX ( ) 1
SX ( ) 2 = K p
2
K


p p p

RX ( ) = 2e
K
( )
SX =
2
1+ 2
p

p X (x)

For parallel RC circuit


capacitorvoltage noise:

i n2
K= R2 = 2kBTR
f kBT
V2C =
1 C
p =
RC + x

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



34



Random Jitter (Time Domain)

Experiment:
CLK
data
source
DATA CDR RCK
(DUT) analyzer

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



35

Jitter Accumulation (1)

Experiment:
Observe N cycles of a free-running VCO on an oscilloscope over a long
measurement interval using infinite persistence.

NT

Free-running
oscillator output

1
2
3
4

1
Tosc =
fosc

1 2 3 4 Histogram plots

trigger

EECS 270C
/ Spring 2014 / U.C. Irvine

Prof. M. Green
36

Jitter Accumulation (2)


proportional proportional
to to 2
Observation:
As increases, rms jitter increases.
EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine


37

Noise Spectral Density (Frequency Domain)

Power spectral density Single-sideband


of oscillation waveform: spectral density:

Sv(f) ( ) [dBc Hz]


Ltotal f
[dBm Hz] 1/f3 region (-30dBc/Hz/decade)


1/f2 region (-20dBc/Hz/decade)

fosc f (log scale)


fosc+f
" P f + f
Ltotal (f ) = 10 log$
1Hz osc ( ) %' Ltotal(f) given in units of [dBc/Hz]
$# Ptotal '&
Ltotal includes both amplitude and phase noise
EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

38

Noise Analysis of LC VCO (1)
noise from
resistor
+
vc C L
C L R -R _ inR
active
circuitry j L
Z( j ) =
1 R $ '2
r = Q= 1 & )
LC r L % r (

Consider
frequencies near resonance:

(
j r + L ) r2
[(
Z j r + = )] 2
2
jL
2
1
+ 2r +
r ( )
r2
R R r r
r L =
Q
[(
Z j r + j
2Q
)] r +

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine


39


Noise Analysis of LC VCO (2)

+
Spot noise current from resistor:
vc C L 4kT
_ inR 2
i nR = f
R

v c2 = i nR
2
| Z( j ) |2

4kT % r (2
= f 'R *
R & 2Q )
% r (2
= 4kTR ' * f
& 2Q )

Leesons formula (taken from measurements): spot noise relative to carrier power

2 +- % (2 /-% 3 (5
kT
L{ } = 10 log4F ,1+ ' r
* 0''1+ 1/ f **7 dBc/Hz
4 Psig - & 2Q ) - )7
3 . 1& 6

Where F and 1/f3 are empirical parameters.

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



40

Oscillator Phase Disturbance
ip(t) ip(t)
Current impulse q/t

ip(t)

1 t 2 t
_ Vosc +
Vosc(t) Vosc(t)

= 0
< 0

Vosc jumps by q/C

Effect of electrical noise on oscillator phase noise is time-variant.


Current impulse results in step phase change (i.e., an integration).
current-to-phase transfer function is proportional to 1/s
EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

41

Impulse Sensitivity Function (1)
The phase response for a particular noise source can be determined at each point
over the oscillation waveform.
( )
Impulse sensitivity function (ISF): ( ) q max
q
= C Vmax
change in phase
(normalized to
charge in impulse
signal amplitude)

Example 1: sine wave Example 2: square wave

Vosc (t) Vosc (t)

Vmax
t t

( ) ( )

Note has same period as Vosc.


EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

42

Impulse Sensitivity Function (2)
Recall from network theory:

out (s)
i in H(s) out LaPlace transform: = H(s)
Iin (s)
t
h(t)
Impulse response: out (t) = h(t, ) i in ( ) d
0

time-variant
( ) ( ) impulse response
( )
Recall: q max ( ) = q
q q max

ISF convolution integral:


t t
( )
(t) =
q

max
u(t ) [i ( ) d ] = q( ) i ( ) d
max
can be expressed in terms of
Fourier coefficients:
0 0

from q
= 1 for (0,t) ( ) = c k (
cos kosc + k )
k=0


EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

43

Impulse Sensitivity Function (3)
Case 1: Disturbance is sinusoidal:

[( )]
i (t) = I0 cos mosc + t , m = 0, 1, 2,

(Any frequency can be expressed in terms of m and .)

I t
(t) = 0
q max
c {cos(k
k
0
osc ) [(
+ k cos mosc + t ) ] } d
k=0

( )
& sin (k + m) + t +
I

( [ { osc ] k } {
sin [(k m)osc + ]t + k } *(+
= 0
2q max
ck '
() (k + m) osc +
+
(k m)osc + (,
k=0

negligible significant only for
m=k


I0
cm
(
sin t + k )
2q max

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



44


Impulse Sensitivity Function (4)

[(
For i (t) = I0 cos mosc + t )]
(t)
I0
cm
sin t + k 2( I02
= 2
cm2 )
2q max 8q max 2

( )
Current-to-phase frequency response:

osc
2osc


1
osc-1
osc+1



2osc-1 2osc+1

I0 c0 I0 c1 I0 c2

2q max 1 2q max 1 2q max 1

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



45

Impulse Sensitivity Function (5)
Case 2: Disturbance is stochastic:
2
MOSFET current noise: i n (f ) = 4kTgm + gm2 Kf A2/Hz
f Cg f in
2 i n2 f cm2
f 2
8q max 2 thermal 1/f
( ) noise noise


i n2 i n2
1/f noise
f f
2 Kf
gm2 thermal noise
Cg
c0 c0 c1 c2
4kTgm

osc 2osc osc 2osc




( )
S



EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

46

Impulse Sensitivity Function (6)
* -

1
,
,
ck2 gm2 Kf c02
/
/
Total phase noise: S ( ) = 2 , 4kTgm
0
2
+ 2 3/
8q max C
, ( ) g ( ) /
,+ /.
due to due to 1/f
thermal noise noise
i n2
f

c0 c1 c2

n osc 2osc

( )
S
2
2
c =
0 ( )

2


ck2 = rms
( )
k=0
EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

47


Impulse Sensitivity Function (7)

) 2 , 2

S ( ) =
1 +
4kTg
( )
rms
+ 2
g Kf

2
m . ( )

2 + m 2 3.
8q max Cg
+* ( ) .- ( )
2 2 2
( )
rms 2
( )
g ( +
g Kf

4kTgm 2
= 2 m
Cg
3 n,phase = m ** -
2kT Cg ) rms -,
() ( )
noise corner
frequency n

( )
S (dBc/Hz)


1/()3
region:
30 dBc/Hz/decade

1/()2 region:
20 dBc/Hz/decade

n,phase
(log scale)
EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

48


Impulse Sensitivity Function (8)
Example 1: sine wave Example 2: square wave
Vosc (t) Vosc (t)

t t

( ) ( )

rms is higher will generate more


1/()2 phase noise
Example 3: asymmetric square wave
Vosc (t)

( )

> 0 will generate more 1/()3 phase noise

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



49


Impulse Sensitivity Function (9)

Effect of current source in LC VCO:

Due to symmetry, ISF of this noise source


contains only even-order coefficients c0 and c2
are dominant.

+ Vosc _ Noise from current source will contribute to


phase noise of differential waveform.

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



50

Impulse Sensitivity Function (10)

ID varies over
oscillation waveform Same period as
oscillation

i n2
= 4kTgm (t)
f
& W )
= (4kT ) ( Cox
' L
(
VGS (t) Vt +
*
)
2 & )
i n0 W
Let
f
= (4kT ) ( Cox
' L
(
VGS(DC ) Vt +
*
)

i 2
i 2 VGS (t) Vt
Then n
= n0
(t) where (t) =
f f VGS(DC ) Vt

We can use eff ( ) = ( ) ( )



EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

51


ISF Example: 3-Stage Ring Oscillator

R1A R1B R2A R2B R3A R3B


+
Vout

M1A M1B M2A M2B M3A M3B

MS1 MS2 MS3

fosc = 1.08 GHz


PD = 11 mW

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



52

ISF of Diff. Pairs
ISF by tx1 for 3stage differential ring osc ISF by tx3 for differential ring osc ISF by tx5 for differential ring osc
M1A M2A M3A
3 3 3

2 2 2

1 1 1

0 0 0
ISF by tx1

ISF by tx3

ISF by tx5
0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7
-1 -1 -1

-2 -2 -2

-3 -3 -3

-4 -4 -4

-5 -5 -5
Radian Radian Radian
ISF by tx2 for differential ring osc ISF by tx4 for differential ring osc ISF by tx6 for differential ring osc
M1B M2B M3B
3 3 3

2 2 2

1 1 1
0
0 0
ISF by tx4
ISF by tx2

ISF by tx6
0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7
-1 -1 -1

-2 -2 -2

-3 -3 -3

-4 -4 -4

-5 -5 -5
Radian Radian Radian

rms = 1.86
for each diff. pair transistor
= 0.26

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



53

ISF of Resistors

R1A R2A R3A

rms = 1.72
for each resistor
= 0.16

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



54

ISF of Current Sources

ISF by tail tx1 for differential ring osc ISF by tail tx2 for differential ring osc ISF by tail tx3 for differential ring osc
MS1 MS2 MS3
2 2 2

1.5 1.5 1.5

1 1 1
ISF by tail tx1

ISF by tail tx3


0.5

ISF by tail tx2


0.5 0.5

0 0 0
0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7
-0.5 -0.5 -0.5

-1 -1 -1

-1.5 -1.5 -1.5

-2 -2 -2
Radian Radian Radian

rms = 1.00
for each current source transistor
= 0.12

ISF shows double frequency due to source-coupled node connection.

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



55

Phase Noise Calculation

Using: Cout = 1.13 pF


Vout = 601 mV p-p
qmax = 679 fC

2 2 2
rms(dp) 4kT gm(dp) rms(res) 4kT R rms(cs) 4kT gm(cs)
L{f } = 6 2 2 2
+ 6 2 2 2 + 3 2 2 2
8 f qmax 8 f qmax 8 f qmax
322 122 70
f 2 f 2 f 2

514
L{f } = = 112 dBc/Hz @ f = 10 MHz
f 2

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



56

Phase Noise vs. Amplitude Noise (1)

How are the single-sideband noise spectrum Ltotal() and phase


spectral density S() related?

[(
Vosc (t) = [Vc + v (t)] exp j osc t + (t) )]

v Spectrum of Vosc would


v include effects of both

amplitude noise v(t) and
phase noise (t).
osct

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



57

Phase Noise vs. Amplitude Noise (2)

Recall that an input current impulse causes an enduring phase


perturbation and a momentary change in amplitude:

i(t) i(t)

t t

Vc(t) Vc(t)
q
t = 0 t =
osc Amplitude impulse response
exhibits an exponential decay
due to the natural amplitude
limiting of an oscillator ...

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



58

Phase Noise vs. Amplitude Noise (3)

Lamp ( ) ( )
L

c


Q

( )
Ltotal

Phase noise dominates



at low offset frequencies.



EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

59

Phase Noise vs. Amplitude Noise (4)

Sv()

( ) (
Vosc (t) = Vc + v (t) cos osc t + (t) )
(V + v (t)) [cos( t) (t) sin(osc t)] phase amplitude
c osc
noise noise
= Vc cos(osc t) (t) Vc sin(osc t) + v (t) cos(osc t)

noiseless phase amplitude


oscillation noise noise osc


waveform component component
Phase & amplitude noise
cant be distinguished in a
signal.
Amplitude limiting will decrease amplitude noise
but will not affect phase noise.

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



60

Sideband Noise/Phase Spectral Density

(
Vosc (t) = Vc cos osc t + (t) )
Vc [cos(osc t) (t) sin(osc t)]

Vc cos(osc t) Vc (t) sin(osc t)


noiseless phase
oscillation noise
waveform component

1 2 2
Pphase noise Vc
2 1
= = 2 ( )
Lphase = ( )
S
Psignal 1 2 2
Vc
2



EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

61

Jitter/Phase Noise Relationship (1)

NT

1 ) 2,
2 2
E *[ (t + ) (t) ] -
osc + .
1
= 2
osc
E { [
2
(t + ) + E ] [
2
]
(t) 2E [ (t) (t + )] }
autocorrelation functions

R (0) R (0) 2R ( )

2
2 = 2
[R (0) R ( )]

osc
Recall R and S() are a Fourier transform pair:

1
R ( ) =
2

) e j ( ) d( )
S (

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



62

Jitter/Phase Noise Relationship (2)



1
R (0) =
2
S ()d()



1
R ( ) =
2
S () e

j ( )
d( )


1
2
=
2

osc
S
( ) 1 e j ( )
(
d( ) )

1
= 2
osc

S ( ) [1 cos( ) j sin( )] d( )


4 , /
= 2
osc
S ( ) sin .
- 2 0
2
1 d( )
0


EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

63

Jitter/Phase Noise Relationship (3)

2 3
Jitter from 1/() noise:
Jitter from 1/() noise:

a^ b
Let
S ( ) = Let
S ( ) =
( )2 ( )3

4 a^ (
2 ( )
+ 4 b (
2 ( )
+
2 = 2
osc
( ) 2
sin *
) 2
- d( )
,
2 = 2
osc
( ) 3
sin *
) 2 ,
- d( )
0

4 a^ = 2
=
2
osc 4

a^ a
= 2
= 2 where a^ (2 )2 a
osc fosc

Consistent with jitter accumulation measurements!

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



64

Jitter/Phase Noise Relationship (4)

( )
S f (dBc/Hz)
Let fosc = 10 GHz
Assume phase noise dominated by 1/()2
-20dBc/Hz
per decade

-100 a
( )
S f =
(f )2
Setting f = 2 X 106 and S =10-10:
a
2 MHz f (
S 2 106 = ) 2
= 1010 a = 400
(2 10 ) 6

Accumulated jitter:
a 400
2 =
fc2
= 2 [ ]
= 4 1018 [
= 2 109 ]
(
10 109 )
Let = 100 ps (cycle-to-cycle jitter):
= 0.02ps rms (0.2 mUI rms)

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

65

Jitter/Phase Noise Relationship (5)

More generally:
a (fm )2 10Nm 10
( )
S f =
(f )2
=
(f )2
( )
S f (dBc/Hz)
a % f (2
2 = = ' m * 10Nm 10
-20 dBc/Hz 2
fosc & fosc )
per decade

Nm
$f '
= & m ) 10Nm 20 [ps]
% fosc (

= fm 10Nm 20 [UI]
f Tosc
fm
Let phase noise increase by 10 dBc/Hz:
( Nm+10) 20 & )
fm 10 = (fm 10Nm 20 + 100.5
Tosc ' *

rms jitter increases by a factor of 3.2



EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

66

Jitter Accumulation (1)
in vco
phase loop
VCO out
filter
detector +
Kpd F (s) Kvco
fb


N

out K 1
Open-loop characteristic:
= G(s) = K pd F (s) vco
2s N

NG(s) 1
Closed-loop characteristic: out
= in + vco
1+G(s) 1+G(s)


EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

67

Jitter Accumulation (2)
Ich Kvco 1 1+ sCR
Recall from Type-2 PLL: G(s) = 2
N s (C + Cp ) 1+ sCeq R

-40 dB/decade


( )
S (dBc/Hz)

|1 + G| 1/()3 region:
30 dBc/Hz/decade

|G|
z 1/()2 region:
0
p

20 dBc/Hz/decade
2
out
vco
(
j ) n,phase

1


As a result, the phase noise at low offset frequencies
is determined by input noise...
80 dB/decade

0


EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

68

Jitter Accumulation (3)

fosc = 10 GHz
Assume 1-pole closed-loop PLL characteristic
( )
S f (dBc/Hz)
+ a a
2 - 2
, f << f0
f0 ( )
- f0 ( )
-20dBc/Hz
( )
S f = ,
$ f '2 - a , f >> f
-100 per decade 1+ & ) - f 2 0
% f0 ( . ( )

a

R ( ) = S (f ) e j (2 f ) d(f ) =
(2 f )
e 2 f0
0

f0 = 2 MHz f
2
2 = 2
[R (0) R ( )]
2 fosc
a 1 e 2 f0
= 2

fosc 2 f0

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



69


Jitter Accumulation (4)
) a 1
+ 2
, <<
2 a 1 e 2 f0 + fosc 2 (f0 )
= *
+ a 1
2
fosc 2 f0 1
2
, >>
+, fosc 2 (f0 ) 2 (f0 )

a = 4 102 For small :


= 0.02 ps rms
f0 = 2 MHz cycle-to-cycle jitter
fosc = 10 GHz
For large :
= 1.4 ps rms
2 (log scale) Total accumulated jitter

a
slope = 2
fosc


1

(2 ) (2 MHz)
EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

70


Jitter Accumulation (5)

2 (log scale)

proportional to 2
(due to 1/f noise)

proportional to
(due to thermal noise)

The primary function of a PLL is to place a bound on cumulative jitter:


2 (log scale)



EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

71

Closed-Loop PLL Phase Noise Measurement

L() for OC-192 SONET transmitter

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



72

Other Sources of Jitter in PLL

Clock divider

Phase detector
Ripple on phase detector output can cause high-frequency jitter. This
affects primarily the jitter tolerance of CDR.

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



73

Jitter/Bit Error Rate (1)

Eye diagram from


sampling oscilloscope

Histogram showing
Gaussian distribution
near sampling point

2 L 2 R

L R

1UI

Bit error rate (BER) determined by and UI

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



74

Jitter/Bit Error Rate (2)

& 2 )
1 & t )
2
pR (t) =
1 (
( T t ) +
pL (t) = exp( 2 + exp( +
2 ' 2 * 2 2 2
(' +*

2 2

0 t0 T T t0 T
R

1 & x2 )
Probability of sample at t > t0 from left-

PL =
2
exp( 2 + dx
t0
' 2 *
hand transition:
& 2)
Probability of sample at t < t0 from right- 1
(( T )
x +
hand transition: P R =
2

t0
exp(
2 2 + dx
(' +*
EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

75


Jitter/Bit Error Rate (3)

1& x2 )
PL =
2 t0
' 2 *

exp( 2 + dx

& 2 )
1 ( T x ( ) + 1 & x2 )
PR =
2
exp(
t0 2 2
+ dx =
2
Tt 0
exp( 2 +
' 2 *
(' +*

Total Bit Error Rate (BER) given by:


1 & x2 ) 1
& x2 )
BER = PL + PU =
2 t0
' *

exp( 2 + dx +
2 2
Tt 0
exp( 2 + dx
' 2 *

1* # t &
0
#T t &-
0
= ,erfc%% (( + erfc%% ((/
2 ,+ $ 2 ' $ 2 '/.

2
where erfc(t)

t
( )
exp x 2 dx

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

76


Jitter/Bit Error Rate (4)
Example: T = 100ps
log(0.5)
log BER
= 2.5 ps

= 5 ps

= 2.5 ps :
t0 (ps)

BER 1012 for t0 [18ps, 82ps] (64 ps eye opening)
= 5 ps :
BER 1012 for t0 [36ps, 74ps] (38 ps eye opening)

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

77



Bathtub Curves (1)
The bit error-rate vs. sampling time can be measured directly using a bit
error-rate tester (BERT) at various sampling points.

Note: The inherent jitter of the analyzer trigger should be considered.


2 2 2
( )
RJ
Jrms
measured
( )
RJ
= Jrms
actual
( )
RJ
+ Jrms
trigger

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



78

Bathtub Curves (2)

Bathtub curve can easily be numerically extrapolated to very low BERs


(corresponding to random jitter), allowing much lower measurement times.

Example:
10-12 BER with T = 100ps is
equivalent to an average of 1 error
per 100s. To verify this over a
sample of 100 errors would require
almost 3 hours!


t0 (ps)

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine



79

Equivalent Peak-to-Peak Total Jitter
p(t)
RJ
BER JPP Areas sum
10-10 12.7 to BER


10-11 13.4

10-12 14.1

10-13 14.7

10-14 15.3

1 1
n n
2 2
, T determine BER
RJ
BER determines effective JPP
Total jitter given by:

J TJ = n + JPP
( DJ
)

EECS 270C / Spring 2014 Prof. M. Green / U.C. Irvine

80

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