FEEDER-5 D60:

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Test Object - Device Settings
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Substation/Bay:
Substation: BORAMPALLI Substation address: BORAMPALLI
Bay: FEEDER-5 Bay address: BORAMPALLI
. . .
Device:
Name/description: Multilin D60 Manufacturer: GE
Device type: Line Distance Protection Device address: device address
Serial/model number: serial no.AABC15001542
Additional info 1: Protected object name
Additional info 2: D60-N03-HLH-F8L-H6P-M6K-PXX-
UXX-WXX
. . .
Nominal Values:
f nom: 50.00 Hz Number of phases: 3
V nom (secondary): 115.0 V V primary: 400.0 kV
I nom (secondary): 1.000 A I primary: 1.200 kA
. . .
Residual Voltage/Current Factors:
VLN / VN: 1.732 IN / I nom: 1.000
. . .
Limits:
V max: 500.0 V I max: 50.00 A
. . .
Debounce/Deglitch Filters:
Debounce time: 3.000 ms Deglitch time: 0.000 s
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Overload Detection:
Suppression time: 50.00 ms

Test Object - Custom Settings

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GE Multilin D60 \ Relay Parameter Section \ Device Definition
Description Name Value
Order Code () Order Code () D60-E09-HCH-F8F-
H4L-M8F-P4L-UXX-
W\XXX
Version () Version () 5.5x
Description () Description () D60
Interface () Interface () COM1: 19200 N 8 1

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GE Multilin D60 \ Relay Parameter Section \ System Setup \ AC Inputs \ Current \ CT F1
Description Name Value
Phase CT Primary (A) Phase CT Primary (A) 1200 A
Phase CT Secondary (A) Phase CT Secondary (A) 1A
Ground CT Primary (A) Ground CT Primary (A) 1200 A
Ground CT Secondary (A) Ground CT Secondary (A) 1A

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GE Multilin D60 \ Relay Parameter Section \ System Setup \ AC Inputs \ Voltage \ VT F5
Description Name Value
Phase VT Connection () Phase VT Connection () Wye
Phase VT Secondary (V) Phase VT Secondary (V) 66.4 V
Phase VT Ratio () Phase VT Ratio () 3478.00 :1
Auxilliary VT Connection () Auxilliary VT Connection () Vag
Auxilliary VT Secondary (V) Auxilliary VT Secondary (V) 66.4 V
Auxilliary VT Ratio () Auxilliary VT Ratio () 120 : 1

Test Object - Other RIO Functions

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CB Configuration
Description Name Value
CB trip time CB trip time 50.00 ms
CB close time CB close time 100.00 ms
Times for 52a, 52b in percent of CB time 52a, 52b % of CB 20.00 %

Test Object - Distance Settings

. . . .
System parameters:
Line length: 15.50 Line angle: 81.00
PT connection: at line CT starpoint: Dir. line
Impedance correction no
1A/I nom:
Impedances in primary no
values:
. . . .
Tolerances:
Tol. T rel.: 3.000 %
Tol. T abs. +: 30.00 ms Tol. T abs. -: 30.00 ms
Tol. Z rel.: 5.000 % Tol. Z abs.: 20.00 m
. . . .
Grounding factor:
Z0/Z1 mag.: 3.410000 Z0/Z1 angle: -2.000000
Separate arc resistance: no

Zone Settings:
Label Type Fault loop Trip time Tol.T rel Tol.T abs+ Tol.T abs- Tol.Z rel. Tol.Z abs
Z1LL Tripping L-L 40.00 ms 3.000 % 30.00 ms 30.00 ms 5.000 % 99.00 m
Z2LL Tripping L-L 340.0 ms 3.000 % 30.00 ms 30.00 ms 5.000 % 185.0 m
Z3LL Tripping L-L 640.0 ms 3.000 % 30.00 ms 30.00 ms 5.000 % 271.5 m
Z4LL Tripping L-L 1.240 s 3.000 % 30.00 ms 30.00 ms 5.000 % 555.5 m
Z1LN Tripping L-E 40.00 ms 3.000 % 30.00 ms 30.00 ms 5.000 % 103.0 m
Z2LN Tripping L-E 340.0 ms 3.000 % 30.00 ms 30.00 ms 5.000 % 192.6 m
Z3LN Tripping L-E 640.0 ms 3.000 % 30.00 ms 30.00 ms 5.000 % 282.6 m
Z4LN Tripping L-E 1.240 s 3.000 % 30.00 ms 30.00 ms 5.000 % 578.2 m
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Linked XRIO References

Reference Name Unit Value XRIO Path
RIO.DEVICE.NOMINALVALUES.INOM In 1.00 A RIO/Device/Nominal Values/In
RIO.DEVICE.NOMINALVALUES.VNOM V_nom 115.00 V RIO/Device/Nominal Values/V nom

Test Settings
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Test model:
Test model: constant test current ITest 2.000 A
Allow reduction of yes
ITest/VTest:
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Fault Inception:
Mode: random
DC-offset: no

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Times:
Prefault: 1.000 s Max. fault: 6.000 s
Postfault: 500.0 ms Time reference: fault inception

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Other:
CB simulation: off Extended zones: not active
Switch off at zero yes
crossing:

Test Results
Shot Test: Fault Type L1-E
|Z| Phi t nom t act. Dev. ITest Result
1.359 80.86 40.00 ms 40.50 ms 1.25 % 2.000 A Passed
3.508 58.12 340.0 ms 343.1 ms 0.9118 % 2.000 A Passed
4.496 82.01 640.0 ms 633.4 ms -1.031 % 2.000 A Passed
8.036 79.06 1.240 s 1.230 s -0.8468 % 2.000 A Passed
10.90 80.65 1.240 s 1.244 s 0.3387 % 2.000 A Passed
14.88 64.02 no trip no trip 2.000 A Passed
12.23 12.92 340.0 ms 333.8 ms -1.824 % 2.000 A Passed
5.249 -39.28 40.00 ms 30.50 ms -23.75 % 2.000 A Passed
11.64 44.36 1.240 s 1.233 s -0.5484 % 2.000 A Passed
14.65 -31.52 340.0 ms 330.1 ms -2.912 % 2.000 A Passed
19.67 20.82 1.240 s 1.230 s -0.8065 % 2.000 A Passed
20.03 -11.70 640.0 ms 626.9 ms -2.047 % 2.000 A Passed
10.19 119.51 no trip no trip 2.000 A Passed
5.832 7.58 40.00 ms 36.40 ms -9 % 2.000 A Passed
24.60 -22.01 1.240 s 1.232 s -0.6371 % 1.797 A Passed
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Shot Test: Fault Type L2-E

|Z| Phi t nom t act. Dev. ITest Result
1.359 80.86 40.00 ms 42.80 ms 7% 2.000 A Passed
3.508 58.12 340.0 ms 339.0 ms -0.2941 % 2.000 A Passed
4.496 82.01 640.0 ms 633.5 ms -1.016 % 2.000 A Passed
8.036 79.06 1.240 s 1.230 s -0.7984 % 2.000 A Passed
10.90 80.65 1.240 s 1.243 s 0.2742 % 2.000 A Passed
14.88 64.02 no trip no trip 2.000 A Passed
12.23 12.92 340.0 ms 336.0 ms -1.176 % 2.000 A Passed
5.249 -39.28 40.00 ms 32.20 ms -19.5 % 2.000 A Passed
11.64 44.36 1.240 s 1.232 s -0.6129 % 2.000 A Passed
14.65 -31.52 340.0 ms 331.1 ms -2.618 % 2.000 A Passed
19.67 20.82 1.240 s 1.235 s -0.4274 % 2.000 A Passed
20.03 -11.70 640.0 ms 629.7 ms -1.609 % 2.000 A Passed
10.19 119.51 no trip no trip 2.000 A Passed
5.832 7.58 40.00 ms 31.30 ms -21.75 % 2.000 A Passed
24.60 -22.01 1.240 s 1.232 s -0.6774 % 1.797 A Passed
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Shot Test: Fault Type L3-E

|Z| Phi t nom t act. Dev. ITest Result
1.359 80.86 40.00 ms 43.20 ms 8% 2.000 A Passed
3.508 58.12 340.0 ms 343.7 ms 1.088 % 2.000 A Passed
4.496 82.01 640.0 ms 636.0 ms -0.625 % 2.000 A Passed
8.036 79.06 1.240 s 1.230 s -0.7742 % 2.000 A Passed
10.90 80.65 1.240 s 1.245 s 0.371 % 2.000 A Passed
14.88 64.02 no trip no trip 2.000 A Passed
12.23 12.92 340.0 ms 335.6 ms -1.294 % 2.000 A Passed
5.249 -39.28 40.00 ms 29.00 ms -27.5 % 2.000 A Passed
11.64 44.36 1.240 s 1.227 s -1.032 % 2.000 A Passed
14.65 -31.52 340.0 ms 332.6 ms -2.176 % 2.000 A Passed
19.67 20.82 1.240 s 1.230 s -0.8306 % 2.000 A Passed
20.03 -11.70 640.0 ms 630.6 ms -1.469 % 2.000 A Passed
10.19 119.51 no trip no trip 2.000 A Passed
5.832 7.58 40.00 ms 37.00 ms -7.5 % 2.000 A Passed
24.60 -22.01 1.240 s 1.231 s -0.7258 % 1.797 A Passed
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Shot Test: Fault Type L1-L2

|Z| Phi t nom t act. Dev. ITest Result
1.683 82.63 40.00 ms 63.60 ms 59 % 2.000 A Passed
2.934 80.95 340.0 ms 341.8 ms 0.5294 % 2.000 A Passed
1.825 14.01 40.00 ms 42.30 ms 5.75 % 2.000 A Passed
10.16 80.43 1.240 s 1.236 s -0.2984 % 2.000 A Passed
4.683 80.30 640.0 ms 637.6 ms -0.375 % 2.000 A Passed
15.23 53.91 no trip no trip 2.000 A Passed
4.529 28.49 340.0 ms 338.6 ms -0.4118 % 2.000 A Passed
6.751 62.85 1.240 s 1.228 s -0.9839 % 2.000 A Passed
3.077 -33.59 40.00 ms 29.90 ms -25.25 % 2.000 A Passed
6.498 41.11 640.0 ms 636.8 ms -0.5 % 2.000 A Passed
5.401 -14.75 340.0 ms 340.9 ms 0.2647 % 2.000 A Passed
6.628 3.68 640.0 ms 643.2 ms 0.5 % 2.000 A Passed
8.784 32.20 1.240 s 1.228 s -0.9839 % 2.000 A Passed
3.781 -56.02 no trip no trip 2.000 A Passed
11.14 57.23 1.240 s 1.234 s -0.5081 % 2.000 A Passed
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Shot Test: Fault Type L2-L3

|Z| Phi t nom t act. Dev. ITest Result
1.683 82.63 40.00 ms 65.50 ms 63.75 % 2.000 A Passed
2.934 80.95 340.0 ms 340.4 ms 0.1176 % 2.000 A Passed
1.825 14.01 40.00 ms 40.30 ms 0.75 % 2.000 A Passed
10.16 80.43 1.240 s 1.235 s -0.3871 % 2.000 A Passed
4.683 80.30 640.0 ms 637.3 ms -0.4219 % 2.000 A Passed
15.23 53.91 no trip no trip 2.000 A Passed
4.529 28.49 340.0 ms 334.1 ms -1.735 % 2.000 A Passed
6.751 62.85 1.240 s 1.230 s -0.7903 % 2.000 A Passed
3.077 -33.59 40.00 ms 31.10 ms -22.25 % 2.000 A Passed
6.498 41.11 640.0 ms 640.8 ms 0.125 % 2.000 A Passed
5.401 -14.75 340.0 ms 343.2 ms 0.9412 % 2.000 A Passed
6.628 3.68 640.0 ms 635.1 ms -0.7656 % 2.000 A Passed
8.784 32.20 1.240 s 1.230 s -0.8065 % 2.000 A Passed
3.781 -56.02 no trip no trip 2.000 A Passed
11.14 57.23 1.240 s 1.238 s -0.1935 % 2.000 A Passed
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Shot Test: Fault Type L3-L1

|Z| Phi t nom t act. Dev. ITest Result
1.683 82.63 40.00 ms 58.60 ms 46.5 % 2.000 A Passed
2.934 80.95 340.0 ms 342.2 ms 0.6471 % 2.000 A Passed
1.825 14.01 40.00 ms 38.30 ms -4.25 % 2.000 A Passed
10.16 80.43 1.240 s 1.233 s -0.5806 % 2.000 A Passed
4.683 80.30 640.0 ms 640.6 ms 0.09375 % 2.000 A Passed
15.23 53.91 no trip no trip 2.000 A Passed
4.529 28.49 340.0 ms 336.0 ms -1.176 % 2.000 A Passed
6.751 62.85 1.240 s 1.228 s -0.9274 % 2.000 A Passed
3.077 -33.59 40.00 ms 36.90 ms -7.75 % 2.000 A Passed
6.498 41.11 640.0 ms 640.7 ms 0.1094 % 2.000 A Passed
5.401 -14.75 340.0 ms 339.6 ms -0.1176 % 2.000 A Passed
6.628 3.68 640.0 ms 640.1 ms 0.01562 % 2.000 A Passed
8.784 32.20 1.240 s 1.232 s -0.6452 % 2.000 A Passed
3.781 -56.02 no trip no trip 2.000 A Passed
11.14 57.23 1.240 s 1.240 s 0.04032 % 2.000 A Passed
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Shot Test: Fault Type L1-L2-L3

|Z| Phi t nom t act. Dev. ITest Result
1.683 82.63 40.00 ms 59.70 ms 49.25 % 2.000 A Passed
2.934 80.95 340.0 ms 341.2 ms 0.3529 % 2.000 A Passed
1.825 14.01 40.00 ms 38.30 ms -4.25 % 2.000 A Passed
10.16 80.43 1.240 s 1.234 s -0.5161 % 2.000 A Passed
4.683 80.30 640.0 ms 636.6 ms -0.5312 % 2.000 A Passed
15.23 53.91 no trip no trip 2.000 A Passed
4.529 28.49 340.0 ms 334.3 ms -1.676 % 2.000 A Passed
6.751 62.85 1.240 s 1.228 s -0.9839 % 2.000 A Passed
3.077 -33.59 40.00 ms 33.70 ms -15.75 % 2.000 A Passed
6.498 41.11 640.0 ms 638.4 ms -0.25 % 2.000 A Passed
5.401 -14.75 340.0 ms 329.1 ms -3.206 % 2.000 A Passed
6.628 3.68 640.0 ms 637.7 ms -0.3594 % 2.000 A Passed
8.784 32.20 1.240 s 1.226 s -1.105 % 2.000 A Passed
3.781 -56.02 no trip no trip 2.000 A Passed
11.14 57.23 1.240 s 1.239 s -0.09677 % 2.000 A Passed
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Shot Details:
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Parameters:
Fault Type: L1-L2-L3
| Z |: 11.14 Phi: 57.23
R: 6.027 X: 9.363
ITest 2.000 A

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Results:
t act.: 1.239 s Assessment: Passed
t nom: 1.240 s Dev.: -0.09677 %
t min: 1.203 s t max: 1.277 s

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Fault Quantities (natural):
VL1: 22.27 V 0.00
VL2: 22.27 V -120.00
VL3: 22.27 V 120.00
IL1: 2.000 A -57.23
IL2: 2.000 A -177.23
IL3: 2.000 A 62.77
VFault: 22.27 V 0.00
IFault: 2.000 A -57.23

Fault Postfault
Trip
 V/V

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10

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-0.75 -0.50 -0.25 0.00 0.25 0.50 0.75 1.00 1.25 1.50
-10 t/s

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VL1 VL2 VL3

I/A

2.0

1.0

0.0
-0.75 -0.50 -0.25 0.00 0.25 0.50 0.75 1.00 1.25 1.50
t/s
-1.0

-2.0

-3.0
IL1 IL2 IL3

Trip
Start

-0.75 -0.50 -0.25 0.00 0.25 0.50 0.75 1.00 1.25 1.50
t/s

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Cursor Data
Time Signal Value
Cursor 1 0.000 s <none> n/a
Cursor 2 1.239 s <none> n/a
C2 - C1 1.239 s n/a

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Test State:
Test passed