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1. General description
The TJA1041 provides an advanced interface between the protocol controller and the
physical bus in a Controller Area Network (CAN) node. The TJA1041 is primarily intended
for automotive high-speed CAN applications (up to 1 Mbit/s). The transceiver provides
differential transmit capability to the bus and differential receive capability to the CAN
controller. The TJA1041 is fully compatible to the ISO 11898 standard, and offers
excellent ElectroMagnetic Compatibility (EMC) performance, very low power
consumption, and passive behavior when supply voltage is off. The advanced features
include:
• Low-power management, supporting local and remote wake-up with wake-up source
recognition and the capability to control the power supply in the rest of the node
• Several protection and diagnosis functions including short circuits of the bus lines and
first battery connection
• Automatic adaptation of the I/O-levels, in line with the supply voltage of the controller
2. Features
[1] Equivalent to discharging a 100 pF capacitor via a 1.5 kΩ series resistor (6 kV level with pin GND connected to ground).
4. Ordering information
Table 2. Ordering information
Type number Package
Name Description Version
TJA1041T SO14 plastic small outline package; 14 leads; body width 3.9 mm SOT108-1
TJA1041U - bare die; 1930 × 3200 × 380 µm -
5. Block diagram
5 3 10
TJA1041
1 7
INH
TXD TEMPERATURE
TIME-OUT
PROTECTION
LEVEL
6 ADAPTOR
EN
13
CANH
DRIVER
14 CANL
STB 12
VBAT
9 WAKE VCC
WAKE
COMPARATOR
MODE
11
CONTROL SPLIT SPLIT
VI/O +
FAILURE
DETECTOR
8 +
ERR WAKE-UP
DETECTOR VBAT
VCC
4
RXD
NORMAL
RECEIVER
2
mgu166
GND
6. Pinning information
6.1 Pinning
TXD 1 14 STB
GND 2 13 CANH
VCC 3 12 CANL
VI/O 5 10 VBAT
EN 6 9 WAKE
INH 7 8 ERR
001aag909
7. Functional description
The primary function of a CAN transceiver is to provide the CAN physical layer as
described in the ISO 11898 standard. In the TJA1041 this primary function is
complemented with a number of operating modes, fail-safe features and diagnosis
features, which offer enhanced system reliability and advanced power management
functionality.
STB = H
and
EN = H
STB = H
PWON/LISTEN- NORMAL
and
ONLY MODE MODE
EN = L
STB = H
and
STB = H EN = H
and
STB = H STB = H
EN = L
and and
EN = L EN = H
STB = L STB = L
and STB = L and EN = H and
(EN = L or flag set) and EN = H
flags cleared
STB = L
and
EN = L
STB = L
and
(EN = L or flag set)
STB = L flags cleared
STB = H and EN = L and STB = H and EN = H
and and
and flag set t > th(min)
UVNOM cleared UVNOM cleared
SLEEP
MODE
LEGEND:
Fig 3. Mode transitions when VCC, VI/O and VBAT are present
Pins RXD and ERR will reflect any wake-up requests (provided that VI/O and VCC are
present).
[1] Pin ERR is an active-LOW output, so a LOW level indicates a set flag and a HIGH level indicates a cleared
flag. Allow pin ERR to stabilize for at least 8 µs after changing operating modes.
[2] Allow for a TXD dominant time of at least 4 µs per dominant-recessive cycle.
cleared. The wake-up flag is immediately available on pins ERR and RXD (provided that
VI/O and VCC are present). The flag is cleared at power-on, or when the UVNOM flag is set
or the transceiver enters normal mode.
8. Limiting values
Table 6. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
VCC DC voltage on pin VCC no time limit −0.3 +6 V
operating range 4.75 5.25 V
VI/O DC voltage on pin VI/O no time limit −0.3 +6 V
operating range 2.8 5.25 V
VBAT DC voltage on pin VBAT no time limit −0.3 +40 V
operating range 5 27 V
load dump - 40 V
VTXD DC voltage on pin TXD −0.3 VI/O + 0.3 V
VRXD DC voltage on pin RXD −0.3 VI/O + 0.3 V
VSTB DC voltage on pin STB −0.3 VI/O + 0.3 V
VEN DC voltage on pin EN −0.3 VI/O + 0.3 V
VERR DC voltage on pin ERR −0.3 VI/O + 0.3 V
VINH DC voltage on pin INH −0.3 VBAT + 0.3 V
VWAKE DC voltage on pin WAKE −0.3 VBAT + 0.3 V
IWAKE DC current on pin WAKE - −15 mA
VCANH DC voltage on pin CANH 0 V < VCC < 5.25 V; no time limit −27 +40 V
VCANL DC voltage on pin CANL 0 V < VCC < 5.25 V; no time limit −27 +40 V
VSPLIT DC voltage on pin SPLIT 0 V < VCC < 5.25 V; no time limit −27 +40 V
Vtrt transient voltages on pins CANH, according to ISO 7637; see −200 +200 V
CANL, SPLIT and VBAT Figure 6
Vesd electrostatic discharge voltage Human Body Model (HBM) [1]
[1] Equivalent to discharging a 100 pF capacitor via a 1.5 kΩ series resistor (6 kV level with pin GND connected to ground).
[2] Equivalent to discharging a 200 pF capacitor via a 0.75 µH series inductor and a 10 Ω series resistor.
[3] Junction temperature in accordance with IEC 60747-1. An alternative definition is: Tvj = Tamb + P × Rth(vj-amb), where Rth(vj-amb) is a fixed
value. The rating for Tvj limits the allowable combinations of power dissipation (P) and ambient temperature (Tamb).
9. Thermal characteristics
Table 7. Thermal characteristics
Symbol Parameter Conditions Typ Unit
Rth(j-a) thermal resistance from junction SO14 package; in 120 K/W
to ambient free air
Rth(j-s) thermal resistance from junction bare die; in free air 40 K/W
to substrate
10. Characteristics
Table 8. Characteristics
VCC = 4.75 V to 5.25 V; VI/O = 2.8 V to VCC; VBAT = 5 V to 27 V; RL = 60 Ω; Tvj = −40 °C to +150 °C; unless specified
otherwise; all voltages are defined with respect to ground; positive currents flow into the device.[1]
Symbol Parameter Conditions Min Typ Max Unit
Supplies (pins VBAT, VCC and VI/O)
VCC(sleep) VCC undervoltage detection VBAT = 12 V (fail-safe) 2.75 3.3 4.5 V
level for forced Sleep mode
VI/O(sleep) VI/O undervoltage detection 0.5 1.5 2 V
level for forced Sleep mode
VBAT(stb) VBAT voltage level for fail-safe VCC = 5 V (fail-safe) 2.75 3.3 4.5 V
fallback mode
VBAT(pwon) VBAT voltage level for setting VCC = 0 V 2.5 3.3 4.1 V
pwon flag
ICC VCC input current normal mode; VTXD = 0 V 25 55 80 mA
(dominant)
normal or pwon/listen-only 2 6 10 mA
mode; VTXD = VI/O (recessive)
Standby or Sleep mode - 1 10 µA
II/O VI/O input current normal mode; VTXD = 0 V 100 350 1000 µA
(dominant)
normal or pwon/listen-only 15 80 200 µA
mode; VTXD = VI/O (recessive)
Standby or Sleep mode - 0 5 µA
IBAT VBAT input current normal or pwon/listen-only 15 30 40 µA
mode
Standby mode; VCC > 4.75 V; 10 20 30 µA
VI/O = 2.8 V;
VINH = VWAKE = VBAT = 12 V
Sleep mode; 10 20 30 µA
VINH = VCC = VI/O = 0 V;
VWAKE = VBAT = 12 V
Transmitter data input (pin TXD)
VIH HIGH-level input voltage 0.7VI/O - VCC + 0.3 V
VIL LOW-level input voltage −0.3 - +0.3VI/O V
IIH HIGH-level input current normal or pwon/listen-only −5 0 +5 µA
mode; VTXD = VI/O
[1] All parameters are guaranteed over the virtual junction temperature range by design, but only 100 % tested at Tamb = 125 °C for dies on
wafer level and in addition to this, 100 % tested at Tamb = 125 °C for cased products, unless specified otherwise. For bare dies, all
parameters are only guaranteed with the reverse side of the die connected to ground.
3V
BAT 5V
mgu173
CAN bus wires
VCC
TJA1041
CANH
R 60 Ω
VSPLIT = 0.5VCC
in normal mode SPLIT VSPLIT
and pwon/listen-only
mode;
otherwise floating R 60 Ω
CANL
mgu169
GND
+12 V
+5 V
47 µF 100 nF VI/O VCC VBAT 10 µF
5 3 10
TXD 1 nF
1 CANH
13
EN TRANSIENT
6 1 nF
CANL GENERATOR
STB 12
14
WAKE TJA1041 SPLIT
9 11
ERR
500 kHz 8
INH
7
RXD
4
2
GND
mgw337
The waveforms of the applied transients will be in accordance with ISO 7637 part 1, test pulses
1, 2, 3a, 3b, 5, 6 and 7.
Fig 6. Test circuit for automotive transients
VRXD
HIGH
LOW
hysteresis
mgs378
+12 V
+5 V
47 µF 100 nF VI/O VCC VBAT 10 µF
5 3 10
TXD CANH
1 13
EN RL CL
6 60 Ω 100 pF
STB CANL
14 12
WAKE TJA1041 SPLIT
9 11
ERR
8
INH
7
RXD
4
2
15 pF
GND
mgw338
HIGH
TXD
LOW
CANH
CANL
dominant
(BUS on)
0.9 V
Vi(dif)(bus)(1)
0.5 V
recessive
(BUS off)
HIGH
0.7VCC
RXD 0.3VCC
LOW
td(TXD-BUSon) td(TXD-BUSoff)
td(BUSon-RXD) td(BUSoff-RXD)
SO14: plastic small outline package; 14 leads; body width 3.9 mm SOT108-1
D E A
X
y HE v M A
14 8
Q
A2
(A 3) A
A1
pin 1 index
θ
Lp
1 7 L
e w M detail X
bp
0 2.5 5 mm
scale
Note
1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.
99-12-27
SOT108-1 076E06 MS-012
03-02-19
1 14
2 13
12
4
TJA1041U
11
10
5 9
x
0 6 7 8
0
mgu984
y
[1] All x/y coordinates represent the position of the center of each pad (in µm) with respect to the left hand
bottom corner of the top aluminium layer.
15. Soldering
This text provides a very brief insight into a complex technology. A more in-depth account
of soldering ICs can be found in Application Note AN10365 “Surface mount reflow
soldering description”.
• Through-hole components
• Leaded or leadless SMDs, which are glued to the surface of the printed circuit board
Not all SMDs can be wave soldered. Packages with solder balls, and some leadless
packages which have solder lands underneath the body, cannot be wave soldered. Also,
leaded SMDs with leads having a pitch smaller than ~0.6 mm cannot be wave soldered,
due to an increased probability of bridging.
The reflow soldering process involves applying solder paste to a board, followed by
component placement and exposure to a temperature profile. Leaded packages,
packages with solder balls, and leadless packages are all reflow solderable.
• Board specifications, including the board finish, solder masks and vias
• Package footprints, including solder thieves and orientation
• The moisture sensitivity level of the packages
• Package placement
• Inspection and repair
• Lead-free soldering versus PbSn soldering
• Process issues, such as application of adhesive and flux, clinching of leads, board
transport, the solder wave parameters, and the time during which components are
exposed to the wave
• Solder bath specifications, including temperature and impurities
• Lead-free versus SnPb soldering; note that a lead-free reflow process usually leads to
higher minimum peak temperatures (see Figure 12) than a PbSn process, thus
reducing the process window
• Solder paste printing issues including smearing, release, and adjusting the process
window for a mix of large and small components on one board
• Reflow temperature profile; this profile includes preheat, reflow (in which the board is
heated to the peak temperature) and cooling down. It is imperative that the peak
temperature is high enough for the solder to make reliable solder joints (a solder paste
characteristic). In addition, the peak temperature must be low enough that the
packages and/or boards are not damaged. The peak temperature of the package
depends on package thickness and volume and is classified in accordance with
Table 10 and 11
Studies have shown that small packages reach higher temperatures during reflow
soldering, see Figure 12.
peak
temperature
time
001aac844
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
[3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
17.2 Definitions Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) may cause permanent
damage to the device. Limiting values are stress ratings only and operation of
Draft — The document is a draft version only. The content is still under
the device at these or any other conditions above those given in the
internal review and subject to formal approval, which may result in
Characteristics sections of this document is not implied. Exposure to limiting
modifications or additions. NXP Semiconductors does not give any
values for extended periods may affect device reliability.
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of Terms and conditions of sale — NXP Semiconductors products are sold
use of such information. subject to the general terms and conditions of commercial sale, as published
at http://www.nxp.com/profile/terms, including those pertaining to warranty,
Short data sheet — A short data sheet is an extract from a full data sheet
intellectual property rights infringement and limitation of liability, unless
with the same product type number(s) and title. A short data sheet is intended
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of
for quick reference only and should not be relied upon to contain detailed and
any inconsistency or conflict between information in this document and such
full information. For detailed and full information see the relevant full data
terms and conditions, the latter will prevail.
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the No offer to sell or license — Nothing in this document may be interpreted
full data sheet shall prevail. or construed as an offer to sell products that is open for acceptance or the
grant, conveyance or implication of any license under any copyrights, patents
or other industrial or intellectual property rights.
17.3 Disclaimers Bare die — All die are tested on compliance with all related technical
specifications as stated in this data sheet up to the point of wafer sawing for a
General — Information in this document is believed to be accurate and period of ninety (90) days from the date of delivery by NXP Semiconductors.
reliable. However, NXP Semiconductors does not give any representations or If there are data sheet limits not guaranteed, these will be separately
warranties, expressed or implied, as to the accuracy or completeness of such indicated in the data sheet. There are no post-packing tests performed on
information and shall have no liability for the consequences of use of such individual die or wafers.
information.
NXP Semiconductors has no control of third party procedures in the sawing,
Right to make changes — NXP Semiconductors reserves the right to make handling, packing or assembly of the die. Accordingly, NXP Semiconductors
changes to information published in this document, including without assumes no liability for device functionality or performance of the die or
limitation specifications and product descriptions, at any time and without systems after third party sawing, handling, packing or assembly of the die. It
notice. This document supersedes and replaces all information supplied prior is the responsibility of the customer to test and qualify their application in
to the publication hereof. which the die is used.
Suitability for use — NXP Semiconductors products are not designed, All die sales are conditioned upon and subject to the customer entering into a
authorized or warranted to be suitable for use in medical, military, aircraft, written die sale agreement with NXP Semiconductors through its legal
space or life support equipment, nor in applications where failure or department.
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liability for inclusion and/or use of 17.4 Trademarks
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk. Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
19. Contents
1 General description . . . . . . . . . . . . . . . . . . . . . . 1 15 Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 15.1 Introduction to soldering. . . . . . . . . . . . . . . . . 21
2.1 Optimized for in-vehicle high speed 15.2 Wave and reflow soldering . . . . . . . . . . . . . . . 21
communication . . . . . . . . . . . . . . . . . . . . . . . . . 1 15.3 Wave soldering. . . . . . . . . . . . . . . . . . . . . . . . 21
2.2 Low-power management . . . . . . . . . . . . . . . . . 1 15.4 Reflow soldering. . . . . . . . . . . . . . . . . . . . . . . 22
2.3 Protection and diagnosis (detection and 16 Revision history . . . . . . . . . . . . . . . . . . . . . . . 24
signalling) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 17 Legal information . . . . . . . . . . . . . . . . . . . . . . 25
3 Quick reference data . . . . . . . . . . . . . . . . . . . . . 2 17.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 25
4 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 17.2 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
5 Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 3 17.3 Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 25
17.4 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . 25
6 Pinning information . . . . . . . . . . . . . . . . . . . . . . 4
6.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 18 Contact information . . . . . . . . . . . . . . . . . . . . 25
6.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 4 19 Contents. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
7 Functional description . . . . . . . . . . . . . . . . . . . 5
7.1 Operating modes . . . . . . . . . . . . . . . . . . . . . . . 5
7.1.1 Normal mode . . . . . . . . . . . . . . . . . . . . . . . . . . 6
7.1.2 Pwon/listen-only mode . . . . . . . . . . . . . . . . . . . 6
7.1.3 Standby mode. . . . . . . . . . . . . . . . . . . . . . . . . . 7
7.1.4 Go-to-sleep command mode . . . . . . . . . . . . . . 7
7.1.5 Sleep mode. . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
7.2 Internal flags . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
7.2.1 UVNOM flag . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
7.2.2 UVBAT flag . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
7.2.3 Pwon flag . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
7.2.4 Wake-up flag. . . . . . . . . . . . . . . . . . . . . . . . . . . 8
7.2.5 Wake-up source flag . . . . . . . . . . . . . . . . . . . . . 9
7.2.6 Bus failure flag . . . . . . . . . . . . . . . . . . . . . . . . . 9
7.2.7 Local failure flag . . . . . . . . . . . . . . . . . . . . . . . . 9
7.3 Local failures. . . . . . . . . . . . . . . . . . . . . . . . . . . 9
7.3.1 TXD dominant clamping detection . . . . . . . . . . 9
7.3.2 RXD recessive clamping detection . . . . . . . . . . 9
7.3.3 TXD-to-RXD short-circuit detection . . . . . . . . 10
7.3.4 Bus dominant clamping detection. . . . . . . . . . 10
7.3.5 Overtemperature detection . . . . . . . . . . . . . . . 10
7.4 Recessive bus voltage stabilization . . . . . . . . 10
7.5 I/O level adapter . . . . . . . . . . . . . . . . . . . . . . . 10
7.6 Pin WAKE . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
8 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . 11
9 Thermal characteristics. . . . . . . . . . . . . . . . . . 12
10 Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . 12
11 Application information. . . . . . . . . . . . . . . . . . 15
12 Test information . . . . . . . . . . . . . . . . . . . . . . . . 18
12.1 Quality information . . . . . . . . . . . . . . . . . . . . . 18
13 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 19
14 Bare die outline . . . . . . . . . . . . . . . . . . . . . . . . 20
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.