Usm 25 PDF

Contents
1 Introduction ....................................... 1-1 1.3 The USM 25 family ................................... 1-9

The different instrument versions ............... 1-9
1.1 Safety information ................................... 1-2
Special features ........................................1-10
Batteries .................................................... 1-3
Software .................................................... 1-3 1.4 How to use this manual .......................... 1-11
Defects/errors and exceptional stresses .... 1-3 For a quick grasp of the
operating manual ...................................... 1-11
1.2 Important information on
ultrasonic testing ..................................... 1-4 1.5 Layout and presentation
in this manual ......................................... 1-12
Preconditions for testing with
ultrasonic test equipment ........................... 1-4 Attention and Note symbols ......................1-12
Operator training ........................................ 1-4 Listings ..................................................... 1-12
Technical test requirements ....................... 1-5 Operating steps ........................................1-12
Limits of testing ......................................... 1-5
Ultrasonic wall thickness measurement ..... 1-5 2 Standard package and
Effect of the test object’s material ............. 1-6 accessories........................................ 2-1
Effect of temperature variations ................. 1-6 2.1 Standard package .................................... 2-3
Measurement of remaining wall thickness .. 1-6
Ultrasonic evaluation of flaws .................... 1-7 2.2 Recommended accessories .................... 2-5
Flaw boundary method ............................... 1-7
Echo display comparison method .............. 1-7
Krautkramer USM 25 Issue 07, 07/2003 0-1
Contents
1 Introduction ....................................... 1-1 1.3 The USM 25 family ................................... 1-9

The different instrument versions ............... 1-9
1.1 Safety information ................................... 1-2
Special features ........................................1-10
Batteries .................................................... 1-3
Software .................................................... 1-3 1.4 How to use this manual .......................... 1-11
Defects/errors and exceptional stresses .... 1-3 For a quick grasp of the
operating manual ...................................... 1-11
1.2 Important information on
ultrasonic testing ..................................... 1-4 1.5 Layout and presentation
in this manual ......................................... 1-12
Preconditions for testing with
ultrasonic test equipment ........................... 1-4 Attention and Note symbols ......................1-12
Operator training ........................................ 1-4 Listings ..................................................... 1-12
Technical test requirements ....................... 1-5 Operating steps ........................................1-12
Limits of testing ......................................... 1-5
Ultrasonic wall thickness measurement ..... 1-5 2 Standard package and
Effect of the test object’s material ............. 1-6 accessories........................................ 2-1
Effect of temperature variations ................. 1-6 2.1 Standard package .................................... 2-3
Measurement of remaining wall thickness .. 1-6
Ultrasonic evaluation of flaws .................... 1-7 2.2 Recommended accessories .................... 2-5
Flaw boundary method ............................... 1-7
Echo display comparison method .............. 1-7

Contents
3 Initial start-up ..................................... 3-1 4.4 Operational concept ................................ 4-7

Setting the functions .................................. 4-7
3.1 Power supply ........................................... 3-2
Operation using the power supply unit ........ 3-2 4.5 Important basic settings .......................... 4-9
Operation using batteries ........................... 3-3 Selecting the language ............................... 4-9
Selecting units ........................................... 4-9
3.2 Connecting a probe ................................. 3-5
Setting the backlight .................................4-10
3.3 Starting the USM 25 ................................. 3-6
Switching on/off ......................................... 3-6 5 Operation ........................................... 5-1
Reset ......................................................... 3-6
5.1 Overview of the functions ........................ 5-2
Information lines in the startup screen ....... 3-6
Function groups first operating level........... 5-3
Function groups second operating level ..... 5-3
4 Principles of operation ...................... 4-1
Function groups third operating level .......... 5-4
4.1 Operator’s controls .................................. 4-2
5.2 Setting the gain ........................................ 5-5
4.2 Screen display ......................................... 4-3 V – Defining the dB incrementation
Functions on the display ............................ 4-4 for gain ..................................................... 5-5
Other displays ........................................... 4-5 5.3 Adjusting the display range
4.3 Keys .......................................................... 4-6 (function group BASE) ............................ 5-6
RANGE (Display range) ............................. 5-7
MTLVEL (Material velocity) ........................ 5-8
0-2 Issue 07, 07/2003 Krautkramer USM 25
Contents
3 Initial start-up ..................................... 3-1 4.4 Operational concept ................................ 4-7

Setting the functions .................................. 4-7
3.1 Power supply ........................................... 3-2
Operation using the power supply unit ........ 3-2 4.5 Important basic settings .......................... 4-9
Operation using batteries ........................... 3-3 Selecting the language ............................... 4-9
Selecting units ........................................... 4-9
3.2 Connecting a probe ................................. 3-5
Setting the backlight .................................4-10
3.3 Starting the USM 25 ................................. 3-6
Switching on/off ......................................... 3-6 5 Operation ........................................... 5-1
Reset ......................................................... 3-6
5.1 Overview of the functions ........................ 5-2
Information lines in the startup screen ....... 3-6
Function groups first operating level........... 5-3
Function groups second operating level ..... 5-3
4 Principles of operation ...................... 4-1
Function groups third operating level .......... 5-4
4.1 Operator’s controls .................................. 4-2
5.2 Setting the gain ........................................ 5-5
4.2 Screen display ......................................... 4-3 V – Defining the dB incrementation
Functions on the display ............................ 4-4 for gain ..................................................... 5-5
Other displays ........................................... 4-5 5.3 Adjusting the display range
4.3 Keys .......................................................... 4-6 (function group BASE) ............................ 5-6
RANGE (Display range) ............................. 5-7
MTLVEL (Material velocity) ........................ 5-8

Contents
D-DELAY (Display starting point) ............... 5-9 aSTART / bSTART

P-DELAY (Probe delay) ............................ 5-10 (Starting points of the gates) ..................... 5-18
aWIDTH / bWIDTH
5.4 Adjusting the pulser (Width of the gates) ..................................5-18
(function group PULS) ............................5-10
aTHRSH / bTHRSH
DAMPING (Probe matching) .....................5-11 (Response and measurement
POWER (Intensity) ................................... 5-11 threshold of the gates) .............................. 5-18
DUAL (Pulser-receiver separation) ............5-12
5.7 Calibrating the USM 25 ........................... 5-19
PRF-MOD (Pulse repetition frequency) ..... 5-12
Calibrating the display range ..................... 5-19
5.5 Adjusting the receiver Choosing the measuring point ...................5-19
(function group RECV) ...........................5-13 Calibration with straight- and
FINE G (fine adjustment of gain) ...............5-13 angle-beam probes.................................... 5-20
dBSTEP ...................................................5-14 Calibration with dual-element
REJECT ...................................................5-14 (TR) probes ............................................... 5-23
FREQU (Frequency range) ........................5-15 5.8 Measuring ................................................ 5-26
RECTIFY (rectification) ............................. 5-15 General notes ...........................................5-26
5.6 Setting the gates 5.9 Measurement of dB difference
(function groups aGAT and bGAT) ......... 5-16 (function group REF) .............................. 5-27
Tasks of the gates ....................................5-16
aLOGIC / bLOGIC
(Evaluation logic of the gates) ...................5-17
Contents
D-DELAY (Display starting point) ............... 5-9 aSTART / bSTART

P-DELAY (Probe delay) ............................ 5-10 (Starting points of the gates) ..................... 5-18
aWIDTH / bWIDTH
5.4 Adjusting the pulser (Width of the gates) ..................................5-18
(function group PULS) ............................5-10
aTHRSH / bTHRSH
DAMPING (Probe matching) .....................5-11 (Response and measurement
POWER (Intensity) ................................... 5-11 threshold of the gates) .............................. 5-18
DUAL (Pulser-receiver separation) ............5-12
5.7 Calibrating the USM 25 ........................... 5-19
PRF-MOD (Pulse repetition frequency) ..... 5-12
Calibrating the display range ..................... 5-19
5.5 Adjusting the receiver Choosing the measuring point ...................5-19
(function group RECV) ...........................5-13 Calibration with straight- and
FINE G (fine adjustment of gain) ...............5-13 angle-beam probes.................................... 5-20
dBSTEP ...................................................5-14 Calibration with dual-element
REJECT ...................................................5-14 (TR) probes ............................................... 5-23
FREQU (Frequency range) ........................5-15 5.8 Measuring ................................................ 5-26
RECTIFY (rectification) ............................. 5-15 General notes ...........................................5-26
5.6 Setting the gates 5.9 Measurement of dB difference
(function groups aGAT and bGAT) ......... 5-16 (function group REF) .............................. 5-27
Tasks of the gates ....................................5-16
aLOGIC / bLOGIC
(Evaluation logic of the gates) ...................5-17

Contents
5.10 Calculation of flaw position 5.13 Configuring the USM 25 for a test
(function group TRIG) .............................5-30 application ..............................................5-41
ANGLE (angle of incidence) ......................5-31 TOF (selecting the measuring point) .........5-42
X-VALUE (X-value of the probe) ...............5-31 S-DISP (zoomed display of reading) .........5-42
THICKNE (material thickness) ..................5-32 MAGNIFY (gate spreading) ....................... 5-44
DIAMET A-Scan (setting the A-scan) ......................5-44
(outside diameter of the test object) ..........5-32 Configuring the measurement line .............5-45
5.11 Data saving Setting the display ....................................5-46
(function group MEM) .............................5-33 FILLED (Echo display mode) .................... 5-47
Storing a data set .....................................5-34 LIGHT (LCD backlight) .............................. 5-47
Deleting a data set ....................................5-34 CONTR (LCD contrast) ............................. 5-48
Recalling a stored data set ....................... 5-35 SCALE
(configuring the measurement line) ........... 5-48
5.12 Dataset management
(function group DATA).............................5-36 5.14 General configuration ............................. 5-49
TESTINF (storing additional information) ...5-37 UNIT (Selecting units of measurement) ....5-49
Editing additional information ....................5-38 DIALOG (Selecting the language) .............5-50
Storing additional information ....................5-39 PRINTER (Printer for test report) .............. 5-51
PREVIEW (dataset preview) .....................5-39 COPYMOD (assignment of the Y key) ....5-51
DIR (dataset directory) ..............................5-40 TIME / DATE
SETTING (function list) .............................5-40 (setting the time and date) ........................5-52
Contents
5.10 Calculation of flaw position 5.13 Configuring the USM 25 for a test
(function group TRIG) .............................5-30 application ..............................................5-41
ANGLE (angle of incidence) ......................5-31 TOF (selecting the measuring point) .........5-42
X-VALUE (X-value of the probe) ...............5-31 S-DISP (zoomed display of reading) .........5-42
THICKNE (material thickness) ..................5-32 MAGNIFY (gate spreading) ....................... 5-44
DIAMET A-Scan (setting the A-scan) ......................5-44
(outside diameter of the test object) ..........5-32 Configuring the measurement line .............5-45
5.11 Data saving Setting the display ....................................5-46
(function group MEM) .............................5-33 FILLED (Echo display mode) .................... 5-47
Storing a data set .....................................5-34 LIGHT (LCD backlight) .............................. 5-47
Deleting a data set ....................................5-34 CONTR (LCD contrast) ............................. 5-48
Recalling a stored data set ....................... 5-35 SCALE
(configuring the measurement line) ........... 5-48
5.12 Dataset management
(function group DATA).............................5-36 5.14 General configuration ............................. 5-49
TESTINF (storing additional information) ...5-37 UNIT (Selecting units of measurement) ....5-49
Editing additional information ....................5-38 DIALOG (Selecting the language) .............5-50
Storing additional information ....................5-39 PRINTER (Printer for test report) .............. 5-51
PREVIEW (dataset preview) .....................5-39 COPYMOD (assignment of the Y key) ....5-51
DIR (dataset directory) ..............................5-40 TIME / DATE
SETTING (function list) .............................5-40 (setting the time and date) ........................5-52

Contents
HORN .......................................................5-53 5.18Evaluation according to the

ANAMOD .................................................. 5-53 DGS method (only USM 25S) ................. 5-63
EVAMOD (echo evaluation) ......................5-54 Measuring with DGS ................................. 5-63
Selecting the DGS mode .......................... 5-64
5.15 Other functions with
Default settings for the
special keys .............................................5-55
DGS measurement ................................... 5-65
W Freeze ................................................ 5-55
Recording the reference echo
X Enlarged echo display .........................5-55 and displaying the DGS curve ...................5-67
5.16 Status symbols and LEDs ......................5-56 Evaluation of reflectors ............................. 5-68
Status symbols ......................................... 5-56 Transfer correction .................................... 5-69
LED ..........................................................5-56 Sound attenuation .....................................5-70
Locks, error messages ............................. 5-73
5.17 Distance-amplitude curve
Validity of the DGS method ......................5-73
(only USM 25 DAC and USM 25S) ........... 5-58
DACMOD (activating DAC/TCG) ...............5-59
DACECHO (recording reference curve) ..... 5-60 6 Documentation .................................. 6-1
T-CORR (sensitivity correction) ................5-61 6.1 Printing data ............................................. 6-2
OFFSET (distance of multiple DAC) .........5-62 Preparing the printer ................................... 6-2
Echo evaluation with DAC.........................5-62 Preparing the USM 25 ................................ 6-2
Printing ...................................................... 6-3
6.2 Documentation with UltraDOC ................. 6-4
Contents
HORN .......................................................5-53 5.18Evaluation according to the

ANAMOD .................................................. 5-53 DGS method (only USM 25S) ................. 5-63
EVAMOD (echo evaluation) ......................5-54 Measuring with DGS ................................. 5-63
Selecting the DGS mode .......................... 5-64
5.15 Other functions with
Default settings for the
special keys .............................................5-55
DGS measurement ................................... 5-65
W Freeze ................................................ 5-55
Recording the reference echo
X Enlarged echo display .........................5-55 and displaying the DGS curve ...................5-67
5.16 Status symbols and LEDs ......................5-56 Evaluation of reflectors ............................. 5-68
Status symbols ......................................... 5-56 Transfer correction .................................... 5-69
LED ..........................................................5-56 Sound attenuation .....................................5-70
Locks, error messages ............................. 5-73
5.17 Distance-amplitude curve
Validity of the DGS method ......................5-73
(only USM 25 DAC and USM 25S) ........... 5-58
DACMOD (activating DAC/TCG) ...............5-59
DACECHO (recording reference curve) ..... 5-60 6 Documentation .................................. 6-1
T-CORR (sensitivity correction) ................5-61 6.1 Printing data ............................................. 6-2
OFFSET (distance of multiple DAC) .........5-62 Preparing the printer ................................... 6-2
Echo evaluation with DAC.........................5-62 Preparing the USM 25 ................................ 6-2
Printing ...................................................... 6-3
6.2 Documentation with UltraDOC ................. 6-4

Contents
7 Maintenance and care ....................... 7-1 Other remote control codes ....................... 8-13
Control codes for the function keys ........... 8-14
7.1 Care .......................................................... 7-2
Care of the instrument ............................... 7-2
9 Appendix ............................................ 9-1
Care of NiCd batteries ................................ 7-2
Charging the NiCd batteries ....................... 7-2 9.1 Function directory ................................... 9-2
7.2 Maintenance ............................................. 7-4 9.2 EC declaration of conformity .................. 9-6
9.3 Manufacturer/Service addresses ............. 9-7

8 Interface and peripherals .................. 8-1
8.1 I/O interface .............................................. 8-2 10 Changes ........................................... 10-1
Contact assignment of the
LEMO-1B socket ....................................... 8-2 11 Index ................................................. 11-1
8.2 RS232 interface ........................................ 8-3
Contact assignment of the Sub-D socket ... 8-3 Option Data Logger .......................... O-1
8.3 Data exchange .......................................... 8-4 Technical Specifications according

Connecting a printer or a PC ...................... 8-4 to EN 12668-1
Printing data .............................................. 8-4
8.4 Remote control ......................................... 8-5 Assembly Instructions,

Functions and remote control codes .......... 8-6 Spare Parts List
Contents
7 Maintenance and care ....................... 7-1 Other remote control codes ....................... 8-13
Control codes for the function keys ........... 8-14
7.1 Care .......................................................... 7-2
Care of the instrument ............................... 7-2
9 Appendix ............................................ 9-1
Care of NiCd batteries ................................ 7-2
Charging the NiCd batteries ....................... 7-2 9.1 Function directory ................................... 9-2
7.2 Maintenance ............................................. 7-4 9.2 EC declaration of conformity .................. 9-6
9.3 Manufacturer/Service addresses ............. 9-7

8 Interface and peripherals .................. 8-1
8.1 I/O interface .............................................. 8-2 10 Changes ........................................... 10-1
Contact assignment of the
LEMO-1B socket ....................................... 8-2 11 Index ................................................. 11-1
8.2 RS232 interface ........................................ 8-3
Contact assignment of the Sub-D socket ... 8-3 Option Data Logger .......................... O-1
8.3 Data exchange .......................................... 8-4 Technical Specifications according

Connecting a printer or a PC ...................... 8-4 to EN 12668-1
Printing data .............................................. 8-4
8.4 Remote control ......................................... 8-5 Assembly Instructions,

Functions and remote control codes .......... 8-6 Spare Parts List

Introduction 1
Introduction 1

Introduction Safety information
1.1 Safety information

The USM 25 has been designed and tested according The USM 25 can be operated with batteries or a power
to DIN EN 61 010 Part 1, March 1994, Safety require- supply unit.
ments for electrical measuring, control and lab equip-
ment, and was technically in perfectly safe and fault- The power supply unit has the electrical safety class II.
less condition when leaving the manufacturing works.
In order to maintain this condition and to ensure a safe

operation, you should urgently read the following safety
information before putting the instrument into operation.
A Attention:
The USM 25 is an instrument for materials testing.
Any use for medical applications or other purposes
is not allowed!
The USM 25 may only be used in industrial environ-

ments!
Introduction Safety information
1.1 Safety information

The USM 25 has been designed and tested according The USM 25 can be operated with batteries or a power
to DIN EN 61 010 Part 1, March 1994, Safety require- supply unit.
ments for electrical measuring, control and lab equip-
ment, and was technically in perfectly safe and fault- The power supply unit has the electrical safety class II.
less condition when leaving the manufacturing works.
In order to maintain this condition and to ensure a safe

operation, you should urgently read the following safety
information before putting the instrument into operation.
A Attention:
The USM 25 is an instrument for materials testing.
Any use for medical applications or other purposes
is not allowed!
The USM 25 may only be used in industrial environ-

ments!

Safety information Introduction
Batteries Defects/errors and exceptional stresses

The USM 25 can be operated with NiCd, AlMn or NiMH If you have reason to believe that a safe operation of
batteries or a power supply unit. Please only use the your USM 25 is no longer possible, you have to discon-
products recommended by us for the battery operation. nect the instrument and secure it against unintentional
reconnection. Remove the batteries if necessary.
If you want to use NiCd or NiMH batteries, you have to
charge them in an external battery charger. As soon as A safe operation is e.g. no longer possible
you connect the power supply unit to the USM 25, the
power supply to the batteries is interrupted. For informa- • if the instrument shows visible damages,
tion on how to handle the batteries, please refer to • if the instrument no longer operates perfectly,
chapter 7 Maintenance and care. • after prolonged storage under adverse conditions
(e.g. exceptional temperatures and/or especially high
Software air humidity, or corrosive environmental conditions),
According to the current state of the art, software is • after being subjected to heavy stresses during
never completely free from errors. transportation.
Before using any software-controlled test equipment,

please make sure that the required functions operate
perfectly in the intended combination.
If you have any questions about the use of your

Krautkramer test equipment, please contact your
nearest representative of Krautkramer Ultrasonic
Systems.
Safety information Introduction
Batteries Defects/errors and exceptional stresses

The USM 25 can be operated with NiCd, AlMn or NiMH If you have reason to believe that a safe operation of
batteries or a power supply unit. Please only use the your USM 25 is no longer possible, you have to discon-
products recommended by us for the battery operation. nect the instrument and secure it against unintentional
reconnection. Remove the batteries if necessary.
If you want to use NiCd or NiMH batteries, you have to
charge them in an external battery charger. As soon as A safe operation is e.g. no longer possible
you connect the power supply unit to the USM 25, the
power supply to the batteries is interrupted. For informa- • if the instrument shows visible damages,
tion on how to handle the batteries, please refer to • if the instrument no longer operates perfectly,
chapter 7 Maintenance and care. • after prolonged storage under adverse conditions
(e.g. exceptional temperatures and/or especially high
Software air humidity, or corrosive environmental conditions),
According to the current state of the art, software is • after being subjected to heavy stresses during
never completely free from errors. transportation.
Before using any software-controlled test equipment,

please make sure that the required functions operate
perfectly in the intended combination.
If you have any questions about the use of your

Krautkramer test equipment, please contact your
nearest representative of Krautkramer Ultrasonic
Systems.

Introduction Important information on ultrasonic testing
1.2 Important information on Operator training

ultrasonic testing The operation of an ultrasonic test device requires a
proper training in ultrasonic test methods.
Please read the following information before using your
USM 25. It is important that you understand and A proper training comprises for example adequate
observe this information to avoid any operator errors knowledge of:
that might lead to false test results. This could result in • the theory of sound propagation
personal injuries or damages to property.
• the effects of sound velocity in the test material
Preconditions for testing with ultrasonic • the behavior of the sound wave at interfaces be-
tween different materials
test equipment
• the propagation of the sound beam
This operating manual contains essential information on
• the influence of sound attenuation in the test object
how to operate your test equipment. In addition, there
and the influence of surface quality of the test
are a number of factors which affect the test results. A
object.
description of these factors would go beyond the scope
of an operating manual. The following list therefore only Lack of such knowledge could lead to false test results
mentions the three most important conditions for a safe with unforeseeable consequences. You can contact for
and reliable ultrasonic inspection: example NDT societies or organizations in your country
(DGZfP in Germany; ASNT in the USA), or also
• the operator training Krautkramer Ultrasonic Systems, for information
• the knowledge of special technical test requirements concerning existing possibilities for the training of
and limits ultrasonic inspectors as well as on the qualifications
• the choice of appropriate test equipment. and certificates that can finally be obtained.
1.2 Important information on Operator training

ultrasonic testing The operation of an ultrasonic test device requires a
proper training in ultrasonic test methods.
Please read the following information before using your
USM 25. It is important that you understand and A proper training comprises for example adequate
observe this information to avoid any operator errors knowledge of:
that might lead to false test results. This could result in • the theory of sound propagation
personal injuries or damages to property.
• the effects of sound velocity in the test material
Preconditions for testing with ultrasonic • the behavior of the sound wave at interfaces be-
tween different materials
test equipment
• the propagation of the sound beam
This operating manual contains essential information on
• the influence of sound attenuation in the test object
how to operate your test equipment. In addition, there
and the influence of surface quality of the test
are a number of factors which affect the test results. A
object.
description of these factors would go beyond the scope
of an operating manual. The following list therefore only Lack of such knowledge could lead to false test results
mentions the three most important conditions for a safe with unforeseeable consequences. You can contact for
and reliable ultrasonic inspection: example NDT societies or organizations in your country
(DGZfP in Germany; ASNT in the USA), or also
• the operator training Krautkramer Ultrasonic Systems, for information
• the knowledge of special technical test requirements concerning existing possibilities for the training of
and limits ultrasonic inspectors as well as on the qualifications
• the choice of appropriate test equipment. and certificates that can finally be obtained.

Important information on ultrasonic testing Introduction
Technical test requirements Limits of testing

Every ultrasonic test is subject to specific technical The information obtained from ultrasonic tests only
test requirements. The most important ones are: refers to those parts of the test object which are
covered by the sound beam of the probe used.
• the definition of the scope of inspection
• the choice of the appropriate test method Any conclusions from the tested parts to be applied to
the untested parts of the test object should be made
• the consideration of material properties with extreme caution.
• the determination of limits for recording and evalua-
tion. Such conclusions are generally only possible in cases
where extensive experience and proven methods of
It is the task of those with overall responsibility for statistical data acquisition are available.
testing to ensure that the inspector is fully informed
about these requirements. The best basis for such The sound beam can be completely reflected from
information is experience with identical test objects. It boundary surfaces within the test object so that flaws
is also essential that the relevant test specifications be and reflection points lying deeper remain undetected. It
clearly and completely understood by the inspector. is therefore important to make sure that all areas to be
Krautkramer Ultrasonic Systems regularly holds tested in the test object are covered by the sound
specialized training courses in the field of ultrasonic beam.
testing.
The scheduled dates for these courses will be given to

Ultrasonic wall thickness measurement
you on request. All ultrasonic wall thickness measurements are based
on a time-of-flight measurement. Accurate measure-
ment results require a constant sound velocity in the
Technical test requirements Limits of testing

Every ultrasonic test is subject to specific technical The information obtained from ultrasonic tests only
test requirements. The most important ones are: refers to those parts of the test object which are
covered by the sound beam of the probe used.
• the definition of the scope of inspection
• the choice of the appropriate test method Any conclusions from the tested parts to be applied to
the untested parts of the test object should be made
• the consideration of material properties with extreme caution.
• the determination of limits for recording and evalua-
tion. Such conclusions are generally only possible in cases
where extensive experience and proven methods of
It is the task of those with overall responsibility for statistical data acquisition are available.
testing to ensure that the inspector is fully informed
about these requirements. The best basis for such The sound beam can be completely reflected from
information is experience with identical test objects. It boundary surfaces within the test object so that flaws
is also essential that the relevant test specifications be and reflection points lying deeper remain undetected. It
clearly and completely understood by the inspector. is therefore important to make sure that all areas to be
Krautkramer Ultrasonic Systems regularly holds tested in the test object are covered by the sound
specialized training courses in the field of ultrasonic beam.
testing.
The scheduled dates for these courses will be given to

Ultrasonic wall thickness measurement
you on request. All ultrasonic wall thickness measurements are based
on a time-of-flight measurement. Accurate measure-
ment results require a constant sound velocity in the

test object. In test objects made of steel, even with Effect of temperature variations
varying alloying constituents, this condition is mostly
fulfilled. The variation in sound velocity is so slight that The sound velocity within the test object also varies as
it is only of importance for high-precision measure- a function of the material’s temperature. This can cause
ments. In other materials, e.g. nonferrous metals or appreciable errors in measurements if the instrument
plastics, the sound velocity variations may be even has been calibrated on a cold reference block and is
larger and thus affect the measuring accuracy. then used on a warm or hot test object. Such measure-
ment errors can be avoided either by warming the
reference block to the same temperature before cali-
Effect of the test object’s material
brating, or by using a correction factor obtained from
If the test object’s material is not homogeneous, the tables.
sound may propagate at different sound velocities in
different parts of the test objects. An average sound Measurement of remaining wall thickness
velocity should then be taken into account for the range
calibration. This is achieved by means of a reference The measurement of the remaining wall thickness on
block whose sound velocity corresponds to the average plant components, e.g. pipes, tanks and reaction
sound velocity of the test object. vessels of all types which are corroded or eroded from
the inside, requires a perfectly suitable gauge and
If substantial sound velocity variations are to be special care in handling the probe.
expected, then the instrument calibration should be
readjusted to the actual sound velocity values at The inspectors should always be informed about the
shorter time intervals. Failure to do so may lead to false corresponding nominal wall thicknesses and the likely
thickness readings. amount of wall thickness losses.
test object. In test objects made of steel, even with Effect of temperature variations
varying alloying constituents, this condition is mostly
fulfilled. The variation in sound velocity is so slight that The sound velocity within the test object also varies as
it is only of importance for high-precision measure- a function of the material’s temperature. This can cause
ments. In other materials, e.g. nonferrous metals or appreciable errors in measurements if the instrument
plastics, the sound velocity variations may be even has been calibrated on a cold reference block and is
larger and thus affect the measuring accuracy. then used on a warm or hot test object. Such measure-
ment errors can be avoided either by warming the
reference block to the same temperature before cali-
Effect of the test object’s material
brating, or by using a correction factor obtained from
If the test object’s material is not homogeneous, the tables.
sound may propagate at different sound velocities in
different parts of the test objects. An average sound Measurement of remaining wall thickness
velocity should then be taken into account for the range
calibration. This is achieved by means of a reference The measurement of the remaining wall thickness on
block whose sound velocity corresponds to the average plant components, e.g. pipes, tanks and reaction
sound velocity of the test object. vessels of all types which are corroded or eroded from
the inside, requires a perfectly suitable gauge and
If substantial sound velocity variations are to be special care in handling the probe.
expected, then the instrument calibration should be
readjusted to the actual sound velocity values at The inspectors should always be informed about the
shorter time intervals. Failure to do so may lead to false corresponding nominal wall thicknesses and the likely
thickness readings. amount of wall thickness losses.

Ultrasonic evaluation of flaws Echo display comparison method

In present-day test practice, there are basically two The echo from a small, natural flaw is usually smaller
different methods of flaw evaluation: than the echo from an artificial comparison flaw, e.g.
circular disc flaw of the same size. This is due, for
If the diameter of the sound beam is smaller than the instance, to the roughness of the surface of a natural
extent of the flaw, then the beam can be used to flaw, or to the fact that the beam does not impinge on it
explore the boundaries of the flaw and thus determine at right angles.
its area.
If this fact is not taken into account when evaluating
If, however, the diameter of the sound beam is larger natural flaws, there is a danger of underestimating their
than the size of the flaw, the maximum echo response magnitude.
from the flaw must be compared with the maximum
echo response from an artificial flaw provided for In the case of very jagged or fissured flaws, e.g. shrink
comparison purposes. holes in castings, it may be that the sound scattering
occurring at the boundary surface of the flaw is so
Flaw boundary method strong that no echo at all is produced. In such cases, a
different evaluation method should be chosen, e.g. use
The smaller the diameter of the probe’s sound beam, of the backwall echo attenuation in the evaluation.
the more accurately the boundaries (and therefore the
flaw area) can be determined by the flaw boundary The distance sensitivity of the flaw echo plays an
method. If, however, the sound beam is relatively important part when testing large components. Atten-
broad, the flaw area determined can substantially differ tion should be paid here to choosing artificial compari-
from the actual flaw area. Care should therefore be son flaws which are as far as possible governed by the
taken to select a probe which will give a sufficiently same ”distance laws” as the natural flaws to be evalu-
narrow beam at the position of the flaw. ated.
Ultrasonic evaluation of flaws Echo display comparison method

In present-day test practice, there are basically two The echo from a small, natural flaw is usually smaller
different methods of flaw evaluation: than the echo from an artificial comparison flaw, e.g.
circular disc flaw of the same size. This is due, for
If the diameter of the sound beam is smaller than the instance, to the roughness of the surface of a natural
extent of the flaw, then the beam can be used to flaw, or to the fact that the beam does not impinge on it
explore the boundaries of the flaw and thus determine at right angles.
its area.
If this fact is not taken into account when evaluating
If, however, the diameter of the sound beam is larger natural flaws, there is a danger of underestimating their
than the size of the flaw, the maximum echo response magnitude.
from the flaw must be compared with the maximum
echo response from an artificial flaw provided for In the case of very jagged or fissured flaws, e.g. shrink
comparison purposes. holes in castings, it may be that the sound scattering
occurring at the boundary surface of the flaw is so
Flaw boundary method strong that no echo at all is produced. In such cases, a
different evaluation method should be chosen, e.g. use
The smaller the diameter of the probe’s sound beam, of the backwall echo attenuation in the evaluation.
the more accurately the boundaries (and therefore the
flaw area) can be determined by the flaw boundary The distance sensitivity of the flaw echo plays an
method. If, however, the sound beam is relatively important part when testing large components. Atten-
broad, the flaw area determined can substantially differ tion should be paid here to choosing artificial compari-
from the actual flaw area. Care should therefore be son flaws which are as far as possible governed by the
taken to select a probe which will give a sufficiently same ”distance laws” as the natural flaws to be evalu-
narrow beam at the position of the flaw. ated.

The ultrasonic wave is attenuated in any material. This

sound attenuation is very low, e.g. in parts made of
fine-grained steel, likewise in many small parts made of
other materials. However, if the sound wave travels
larger distances through the material, a high cumulative
sound attenuation can result even with small attenua-
tion coefficients. There is then a danger that echoes
from natural flaws appear too small. For this reason, an
estimate must always be made of the effects of attenu-
ation on the evaluation result and taken into account if
applicable.
If the test object has a rough surface, part of the

incident sound energy will be scattered at its surface
and is not available for the test. The larger this initial
scattering, the smaller the flaw echoes appear, and the
more errors occur in the evaluation result.
It is therefore important to take the effect of the test

object’s surfaces on the height of the echo into account
(transfer correction).
The ultrasonic wave is attenuated in any material. This

sound attenuation is very low, e.g. in parts made of
fine-grained steel, likewise in many small parts made of
other materials. However, if the sound wave travels
larger distances through the material, a high cumulative
sound attenuation can result even with small attenua-
tion coefficients. There is then a danger that echoes
from natural flaws appear too small. For this reason, an
estimate must always be made of the effects of attenu-
ation on the evaluation result and taken into account if
applicable.
If the test object has a rough surface, part of the

incident sound energy will be scattered at its surface
and is not available for the test. The larger this initial
scattering, the smaller the flaw echoes appear, and the
more errors occur in the evaluation result.
It is therefore important to take the effect of the test

object’s surfaces on the height of the echo into account
(transfer correction).

The USM 25 family Introduction
1.3 The USM 25 family The different instrument versions

The USM 25 is available in several versions which are
The USM 25 is a lightweight and compact ultrasonic desgined for different applications:
flaw detector especially suitable for
• USM 25
• locating and evaluating material defects Standard version for universal ultrasonic test
• measuring wall thicknesses applications.
• saving and documenting test results. • USM 25 DAC
The multiple DAC curves enable a field-oriented
With its frequency range from 0.5 to 20 MHz and a
display evaluation according to international test
maximum calibration range of 10 m (steel), the USM 25
specifications.
is designed for use on large workpieces and in high-
resolution measurements. • USM 25S
Either DAC/TCG or DGS evaluation mode.
DGS curves are stored for all narrow-band single-
element probes; amplitude evaluation is carried out
either in dB above DAC curve or equivalent reflector
size (ERS).
• Data Logger option
This option is available for all USM 25 versions and
is used for the recording and documentation of
thickness readings.
The USM 25 family Introduction
1.3 The USM 25 family The different instrument versions

The USM 25 is available in several versions which are
The USM 25 is a lightweight and compact ultrasonic desgined for different applications:
flaw detector especially suitable for
• USM 25
• locating and evaluating material defects Standard version for universal ultrasonic test
• measuring wall thicknesses applications.
• saving and documenting test results. • USM 25 DAC
The multiple DAC curves enable a field-oriented
With its frequency range from 0.5 to 20 MHz and a
display evaluation according to international test
maximum calibration range of 10 m (steel), the USM 25
specifications.
is designed for use on large workpieces and in high-
resolution measurements. • USM 25S
Either DAC/TCG or DGS evaluation mode.
DGS curves are stored for all narrow-band single-
element probes; amplitude evaluation is carried out
either in dB above DAC curve or equivalent reflector
size (ERS).
• Data Logger option
This option is available for all USM 25 versions and
is used for the recording and documentation of
thickness readings.

Introduction Special features
Special features • pulse repetition frequency variable in ten steps

to avoid phantom echoes when testing large
• low weight (1.6 kg including batteries) and compact workpieces
size
• choice of frequency range for the connected probe.
• handy – equipped with a non-slip, ratcheting prop-up
stand, also used as handle • signal display mode: full-wave rectification, positive
half-wave or negative halv-wave and radio frequency
• rotary knobs for direct adjustment of gain as well as
• display of 4 readings plus 1 reading zoomed in the
for changing the currently selected function
A-scan, user-configurable
• two independant gates for accurate wall thickness
measurements from the workpiece surface up to the
first echo, or between two backwall echoes, including
measurement on coated workpieces with a resolution
of 0.01 mm (up to 100 mm), referred to steel
• Magnify gate: spreading of the gate range over the
entire screen width
• fast, high-contrast LCD to display the digitized echo
signals (320 × 240 pixels, 96 × 72 mm)
• data memory: 200 data sets, including alphanumeric
description, documentation possibility via a printer
• increased calibration range: up to 9999 mm (steel),
depending on the frequency range
• semiautomatic two point calibration
Introduction Special features
Special features • pulse repetition frequency variable in ten steps

to avoid phantom echoes when testing large
• low weight (1.6 kg including batteries) and compact workpieces
size
• choice of frequency range for the connected probe.
• handy – equipped with a non-slip, ratcheting prop-up
stand, also used as handle • signal display mode: full-wave rectification, positive
half-wave or negative halv-wave and radio frequency
• rotary knobs for direct adjustment of gain as well as
• display of 4 readings plus 1 reading zoomed in the
for changing the currently selected function
A-scan, user-configurable
• two independant gates for accurate wall thickness
measurements from the workpiece surface up to the
first echo, or between two backwall echoes, including
measurement on coated workpieces with a resolution
of 0.01 mm (up to 100 mm), referred to steel
• Magnify gate: spreading of the gate range over the
entire screen width
• fast, high-contrast LCD to display the digitized echo
signals (320 × 240 pixels, 96 × 72 mm)
• data memory: 200 data sets, including alphanumeric
description, documentation possibility via a printer
• increased calibration range: up to 9999 mm (steel),
depending on the frequency range
• semiautomatic two point calibration

How to use this manual Introduction
1.4 How to use this manual The Data Logger option, which can be applied to all
USM 25 versions, is described in a chapter of its own -
at the end of the operating manual. All functions refer-
For a quick grasp of the operating manual ring to the Data Logger and the tolerance monitor are
described here. At the same time, the standard operat-
Before operating the USM 25 for the first time, it is ing manual applies to all other functions.
absolutely necessary that you read the chapters 1, 3
and 4 of this manual. They will inform you about the
necessary preparations of the instrument, give you a
description of all keys and screen displays, and explain
the operating principle.
In doing this, you will avoid any errors or failures of the

instrument and be able to use the full range of instru-
ment functions.
You will find the latest changes to this operating manual

in chapter 10 Changes. It describes corrections that
have become necessary at short notice and have not
yet been included in the general manual. If no correc-
tions have become necessary, this chapter is empty.
The specifications / Technical Specifications according

to EN 12668-1 for the USM 25 family can be found in
the attachment at the end of this operating manual.
How to use this manual Introduction
1.4 How to use this manual The Data Logger option, which can be applied to all
USM 25 versions, is described in a chapter of its own -
at the end of the operating manual. All functions refer-
For a quick grasp of the operating manual ring to the Data Logger and the tolerance monitor are
described here. At the same time, the standard operat-
Before operating the USM 25 for the first time, it is ing manual applies to all other functions.
absolutely necessary that you read the chapters 1, 3
and 4 of this manual. They will inform you about the
necessary preparations of the instrument, give you a
description of all keys and screen displays, and explain
the operating principle.
In doing this, you will avoid any errors or failures of the

instrument and be able to use the full range of instru-
ment functions.
You will find the latest changes to this operating manual

in chapter 10 Changes. It describes corrections that
have become necessary at short notice and have not
yet been included in the general manual. If no correc-
tions have become necessary, this chapter is empty.
The specifications / Technical Specifications according

to EN 12668-1 for the USM 25 family can be found in
the attachment at the end of this operating manual.

Introduction Layout and presentation in this manual
1.5 Layout and presentation in Listings

this manual Listings are presented in the following form:
To make it easier for you to use this manual, all operat- • Variant A
ing steps, notes, etc., are always presented in the • Variant B
same way. This will help you find individual pieces of • ...
information quickly.
Operating steps
Attention and Note symbols
Operating steps appear as shown in the following
example:
A Attention:
– Loosen the two screws at the bottom.
The Attention symbol indicates peculiarities and
special aspects in the operation which could affect the – Remove the cover.
accuracy of the results. – ...
H Note:
Note contains e.g. references to other chapters or
special recommendations for a function.
Introduction Layout and presentation in this manual
1.5 Layout and presentation in Listings

this manual Listings are presented in the following form:
To make it easier for you to use this manual, all operat- • Variant A
ing steps, notes, etc., are always presented in the • Variant B
same way. This will help you find individual pieces of • ...
information quickly.
Operating steps
Attention and Note symbols
Operating steps appear as shown in the following
example:
A Attention:
– Loosen the two screws at the bottom.
The Attention symbol indicates peculiarities and
special aspects in the operation which could affect the – Remove the cover.
accuracy of the results. – ...
H Note:
Note contains e.g. references to other chapters or
special recommendations for a function.

Standard package and accessories 2
Standard package and accessories 2

Scope of supply and accessories
This chapter informs you about the standard package

and the accessories available for the USM 25.
It describes
• accessories included in the standard package,
• recommended accessories
Scope of supply and accessories
This chapter informs you about the standard package

and the accessories available for the USM 25.
It describes
• accessories included in the standard package,
• recommended accessories

Standard package Scope of supply and accessories
2.1 Standard package

Product code Description Order number
Ultrasonic testing kit

consisting of:
USM 25 Compact Ultrasonic Flaw Detector, basic version
with Lemo connectors 35 050
or
with BNC connectors 35 052
or
USM 25 DAC Compact Ultrasonic Flaw Detector, DAC version

or
or
USM 25S Compact Ultrasonic Flaw Detector, DA/TCGC and

DGS evaluation with LEMO connectors 35 054
or
UM 20 Transport case 34 913

Plug-in power supply unit 18 348
Standard package Scope of supply and accessories
2.1 Standard package

Ultrasonic testing kit

consisting of:
USM 25 Compact Ultrasonic Flaw Detector, basic version
or
or
USM 25 DAC Compact Ultrasonic Flaw Detector, DAC version

or
or
USM 25S Compact Ultrasonic Flaw Detector, DA/TCGC and

DGS evaluation with LEMO connectors 35 054
or
UM 20 Transport case 34 913

Plug-in power supply unit 18 348

Scope of supply and accessories Standard package
Operating manual in German 28 661
or
operating manual in English 28 662
Scope of supply and accessories Standard package
Operating manual in German 28 661
or
operating manual in English 28 662

Recommended accessories Scope of supply and accessories
2.2 Recommended accessories

UM 23 NiMH battery pack 25 274
NCA 1-4 4 NiCd cells 34 910
Quick charger for external charging of the NiCds 18 673
UM 21 Transport case for instrument and accessories 25 255
UM 22 Weatherproof protection with neckstrap 35 254
UM 25 Lemo plug (8 pin) with open ended cable 35 268
UD 20 PC cable, 25-pin (PC), 9-pin (instrument) 32 291
UD 30 Seiko Printer cable, 9-pin (instrument) / 9-pin (printer) 18 495
UD 32 Epson Printer cable, 9-pin (instrument) / 25-pin (printer) 34 944
Adapter 25/9-pin for printer cable UD 19-1 on USM 25 16 121
UM 27 DL Option: Data Logger (retrofittable to all versions) 35 455
Recommended accessories Scope of supply and accessories
2.2 Recommended accessories

UM 23 NiMH battery pack 25 274
NCA 1-4 4 NiCd cells 34 910
Quick charger for external charging of the NiCds 18 673
UM 21 Transport case for instrument and accessories 25 255
UM 22 Weatherproof protection with neckstrap 35 254
UM 25 Lemo plug (8 pin) with open ended cable 35 268
UD 30 Seiko Printer cable, 9-pin (instrument) / 9-pin (printer) 18 495
UD 32 Epson Printer cable, 9-pin (instrument) / 25-pin (printer) 34 944
Adapter 25/9-pin for printer cable UD 19-1 on USM 25 16 121
UM 27 DL Option: Data Logger (retrofittable to all versions) 35 455

Scope of supply and accessories Recommended accessories
Epson LX Matrix printer for mains operation, single sheet and

continuous stationary 17 995
Seiko DPU Thermal printer for mains and battery operation 17 993
UM 200 W UltraDOC data communication software for USM 35 024
PZ-USM Test certificate according to EN 12668-1 35 263
Scope of supply and accessories Recommended accessories
Epson LX Matrix printer for mains operation, single sheet and

continuous stationary 17 995
Seiko DPU Thermal printer for mains and battery operation 17 993
UM 200 W UltraDOC data communication software for USM 35 024
PZ-USM Test certificate according to EN 12668-1 35 263

Initial start-up 3
Initial start-up 3

Initial start-up Power supply
3.1 Power supply Connecting the instrument
Use the corresponding power supply unit to connect the

The USM 25 can be operated with a plug-in power USM 25 to the mains socket-outlet. The socket-contact
supply unit or with batteries. is at the top left of the USM 25.
You can connect the USM 25 to the mains supply
system even if it carries batteries. The battery power is
Ð
then automatically interrupted.
Operation using the power supply unit

Power pack adaptor
The power supply unit is delivered with two different plug

adaptors - for Euro and USA standard. If the adaptor
plugged in your power supply unit does not correspond to
your plug connector standard, you can exchange it.
– To do this, just pull out the attached adaptor and

replace it with the required one. The power supply unit is automatically set to any
H Note: nominal voltage between 100 VAC and 240 VAC.
You should exchange the plug adaptor only once A Attention:

because the plug-in power supply unit is not meant for Always press the U key in order to switch the instru-
frequent changing. ment off correctly. If power is interrupted (battery
3.1 Power supply Connecting the instrument
Use the corresponding power supply unit to connect the

The USM 25 can be operated with a plug-in power USM 25 to the mains socket-outlet. The socket-contact
supply unit or with batteries. is at the top left of the USM 25.
You can connect the USM 25 to the mains supply
system even if it carries batteries. The battery power is
Ð
then automatically interrupted.
Operation using the power supply unit

Power pack adaptor
The power supply unit is delivered with two different plug

adaptors - for Euro and USA standard. If the adaptor
plugged in your power supply unit does not correspond to
your plug connector standard, you can exchange it.
– To do this, just pull out the attached adaptor and

replace it with the required one. The power supply unit is automatically set to any
H Note: nominal voltage between 100 VAC and 240 VAC.
You should exchange the plug adaptor only once A Attention:

because the plug-in power supply unit is not meant for Always press the U key in order to switch the instru-
frequent changing. ment off correctly. If power is interrupted (battery

Power supply Initial start-up
compartment cover open, mains plug pulled) the – Insert the four C-size cells one by one into the
instrument will not correctly switch off, therefore the battery compartment, with the positive pole to the
last A-scan will remain on the display for about 10 left. Notice the information on the instrument back.
minutes.
– After that, close the battery compartment by tighten-
ing the Bayonet lock up to the limit stop again.
Operation using batteries
Charge indicator
Please only use the products recommended by us for
the battery operation. The measurement line of the USM 25 indicates an
inverted B if the battery voltage is too low.
Inserting batteries
H Note:
The battery compartment is located at the bottom of
the instrument; the opening with the Bayonet lock cap If the symbol for low battery voltage appears, you
is on the right. should urgently end your test job and exchange the
batteries.
– Loosen the Bayonet lock. Half a quarter turn of the
lock is enogh to open or close it. Please take spare batteries with you if you aim to carry
out measurements on site.
Charging NiCd or NiMH batteries
NiMH batteries can be charged in the instrument (using

the NiMH battery pack UM 23) or using an external
battery charger (single NiCd or NiMH batteries).
open closed
Power supply Initial start-up
compartment cover open, mains plug pulled) the – Insert the four C-size cells one by one into the
instrument will not correctly switch off, therefore the battery compartment, with the positive pole to the
last A-scan will remain on the display for about 10 left. Notice the information on the instrument back.
minutes.
– After that, close the battery compartment by tighten-
ing the Bayonet lock up to the limit stop again.
Operation using batteries
Charge indicator
Please only use the products recommended by us for
the battery operation. The measurement line of the USM 25 indicates an
inverted B if the battery voltage is too low.
Inserting batteries
H Note:
The battery compartment is located at the bottom of
the instrument; the opening with the Bayonet lock cap If the symbol for low battery voltage appears, you
is on the right. should urgently end your test job and exchange the
batteries.
– Loosen the Bayonet lock. Half a quarter turn of the
lock is enogh to open or close it. Please take spare batteries with you if you aim to carry
out measurements on site.
Charging NiCd or NiMH batteries
NiMH batteries can be charged in the instrument (using

the NiMH battery pack UM 23) or using an external
battery charger (single NiCd or NiMH batteries).
open closed

Internal charging completion of the charging process, the three LEDs

flash at a quick pace.
H Note:
Carging time:
Internal charging option will be available for instruments
from serial number 2501. The charging time is < 3 hours at an ambient
temperature ranging from 25 °C to 30 °C. Please note
Requirements: that the batteries are not recharged to their full capacity
at higher temperatures.
• NiMH battery pack, product code UM 23
Interruption of charging:
• Plug-in power supply unit
1. Normal case: monitoring after gradual temperature
Operation:
rise
A check is made at each charging start to find out whether
2. Safety precaution: Interruption at an excess
a battery pack has been inserted or not. If not, the three
temperature (approx. 50 °C)
LEDs on the USM 25 (A, R, D) flash at a slow pace.
3. Saftey precaution: Interruption approx. 6 hours after
If the battery pack UM 23 is in the instrument, charging
charging start.
will start automatically:
After each interruption of charging, the timer is restarted.
– with the instrument turned off if you connect the
plug-in power supply unit H Note:
– with the plug-in power supply unit connected if you If the USM 25 is turned on during the charging process,
turn the instrument off charging is interrupted and the timer is reset. The
temperature monitoring is maintained.
During charging, the three LEDs are constantly lit. On
Internal charging completion of the charging process, the three LEDs

flash at a quick pace.
H Note:
Carging time:
Internal charging option will be available for instruments
from serial number 2501. The charging time is < 3 hours at an ambient
temperature ranging from 25 °C to 30 °C. Please note
Requirements: that the batteries are not recharged to their full capacity
at higher temperatures.
• NiMH battery pack, product code UM 23
Interruption of charging:
• Plug-in power supply unit
1. Normal case: monitoring after gradual temperature
Operation:
rise
A check is made at each charging start to find out whether
2. Safety precaution: Interruption at an excess
a battery pack has been inserted or not. If not, the three
temperature (approx. 50 °C)
LEDs on the USM 25 (A, R, D) flash at a slow pace.
3. Saftey precaution: Interruption approx. 6 hours after
If the battery pack UM 23 is in the instrument, charging
charging start.
will start automatically:
After each interruption of charging, the timer is restarted.
– with the instrument turned off if you connect the
plug-in power supply unit H Note:
– with the plug-in power supply unit connected if you If the USM 25 is turned on during the charging process,
turn the instrument off charging is interrupted and the timer is reset. The
temperature monitoring is maintained.
During charging, the three LEDs are constantly lit. On
Connecting a probe Initial start-up
3.2 Connecting a probe If this is not taken into account, the consequence
would be a mismatching which may lead to consider-
able power losses or even to echo waveform distor-
To prepare the USM 25 for operation, you have to
tions.
connect a probe to it. Any Krautkramer probe can be
used for the USM 25, provided the appropriate cable is Receiver Transmitter
available and the operating frequency is within an
adequate range.
The USM 25 is available with the probe connectors

LEMO 1 or BNC.
The probe is connected to the sockets at the top right

on the instrument casing. Both connector sockets are
equally suitable (connected in parallel) for connecting
probes equipped with only one ultrasonic element
(ultrasonic transducer) so that it does not matter which
one of the two sockets is used.
When connecting a dual-element (TR) probe (having

one transmitter element and one receiver element), or
two probes (of which one is transmitting and the other
one receiving), attention should be paid to connecting
the transmitter element to the right-hand socket (trans-
mitter, marked with black circle at the rear of the
instrument case) and the receiver element to the left-
hand socket (receiver, marked with red circle).
Connecting a probe Initial start-up
3.2 Connecting a probe If this is not taken into account, the consequence
would be a mismatching which may lead to consider-
able power losses or even to echo waveform distor-
To prepare the USM 25 for operation, you have to
tions.
connect a probe to it. Any Krautkramer probe can be
used for the USM 25, provided the appropriate cable is Receiver Transmitter
available and the operating frequency is within an
adequate range.
The USM 25 is available with the probe connectors

LEMO 1 or BNC.
The probe is connected to the sockets at the top right

on the instrument casing. Both connector sockets are
equally suitable (connected in parallel) for connecting
probes equipped with only one ultrasonic element
(ultrasonic transducer) so that it does not matter which
one of the two sockets is used.
When connecting a dual-element (TR) probe (having

one transmitter element and one receiver element), or
two probes (of which one is transmitting and the other
one receiving), attention should be paid to connecting
the transmitter element to the right-hand socket (trans-
mitter, marked with black circle at the rear of the
instrument case) and the receiver element to the left-
hand socket (receiver, marked with red circle).
Initial start-up Starting the USM 25
3.3 Starting the USM 25 Reset

If any functions can no longer be operated after a warm
Switching on/off start, or if you want to reset the instrument to the basic
setup, then you should carry out a cold start by simul-
To start the USM 25, press the switch-on key U. taneously pressing the Y and the U key.
The start display of the USM 25 appears; here you will The cold start message “Basic Initialization” is dis-
also see the current software version of the instrument. played. The instrument is initialized and reset to its
basic setup (dialog language: English, for more details
The instrument carries out a self-check and then
on how to select the language, please refer to chapter 4).
switches over to stand-by mode.
The settings of all function values and the basic A Attention:

settings (language and units) are the same as before
switching-on of the instrument. All saved data are deleted.
H Note:
The LCD contrast is always set to the medium value Information lines in the startup screen
CONTR = 50 after switch-on. If another value is already
required during the switch-on, e.g. because of a higher or You can enter two lines (each with up to 39 characters)
lower ambient temperature, press one of the five function for information purposes in the startup screen. For this
group keys u while pressing the switch-on key U. use the remote function (codes I1 and I2, refer to
chapter 8.4).
CONTR = 10 30 50 70 90
u u u u u
Initial start-up Starting the USM 25
3.3 Starting the USM 25 Reset

If any functions can no longer be operated after a warm
Switching on/off start, or if you want to reset the instrument to the basic
setup, then you should carry out a cold start by simul-
To start the USM 25, press the switch-on key U. taneously pressing the Y and the U key.
The start display of the USM 25 appears; here you will The cold start message “Basic Initialization” is dis-
also see the current software version of the instrument. played. The instrument is initialized and reset to its
basic setup (dialog language: English, for more details
The instrument carries out a self-check and then
on how to select the language, please refer to chapter 4).
switches over to stand-by mode.
The settings of all function values and the basic A Attention:

settings (language and units) are the same as before
switching-on of the instrument. All saved data are deleted.
H Note:
The LCD contrast is always set to the medium value Information lines in the startup screen
CONTR = 50 after switch-on. If another value is already
required during the switch-on, e.g. because of a higher or You can enter two lines (each with up to 39 characters)
lower ambient temperature, press one of the five function for information purposes in the startup screen. For this
group keys u while pressing the switch-on key U. use the remote function (codes I1 and I2, refer to
chapter 8.4).
CONTR = 10 30 50 70 90
u u u u u

Principles of operation 4
Principles of operation 4

Principles of operation Operator’s controls
4.1 Operator’s controls LED A: Gate alarm

R: Rejection
D: Dual on
Special keys for Keys for selecting
special instrument a function
functions
Rotary knob for Rotary knob for

direct gain setting direct setting of the
current function
Key for changing On/Off key

the operation level
Keys for selecting a function group
Principles of operation Operator’s controls
4.1 Operator’s controls LED A: Gate alarm

R: Rejection
D: Dual on
Special keys for Keys for selecting
special instrument a function
functions
Rotary knob for Rotary knob for

direct gain setting direct setting of the
current function
Key for changing On/Off key

the operation level
Keys for selecting a function group

Screen display Principles of operation
4.2 Screen display

The USM 25 has a digital screen for the display of
• A-scan in the normal mode
• A-scan in the zoom mode

The zoom mode is activated using the X-key.
The screen display always shows the gain and the

adjusted dB step value. All other functions are locked.
Screen display Principles of operation
4.2 Screen display

The USM 25 has a digital screen for the display of
• A-scan in the normal mode
• A-scan in the zoom mode

The zoom mode is activated using the X-key.
The screen display always shows the gain and the

adjusted dB step value. All other functions are locked.

Principles of operation Functions on the display
Functions on the display

The names of the five function groups are displayed
at the bottom of the screen. The currently selected
function group is highlighted.
Indicated at the right of the display, next to the A-scan,

are the functions of the corresponding function group.
The display of the functions disappears in the zoom
mode.
Principles of operation Functions on the display
Functions on the display

The names of the five function groups are displayed
at the bottom of the screen. The currently selected
function group is highlighted.
Indicated at the right of the display, next to the A-scan,

are the functions of the corresponding function group.
The display of the functions disappears in the zoom
mode.

Other displays Principles of operation
Other displays
A line below the screen display indicates settings and
readings as well as status symbols.
H Note:
Every measurement value can also be shown in an
enlarged display at the top right corner of the A-scan
(setting in the function group MEAS, function S-DISP).
Amplitude height Amplitude height Status indicator:

H Note: Gate A (%)t Gate B (%) TOF = Flank
You can configure the four positions of the measure-

ment line for set and measured values as required
(function group MSEL). Please refer to chapter 5.12,
section Configuring the measurement line on this Sound path Sound path
subject. Gate A Gate B
Example of a measurement line
Other displays Principles of operation
Other displays
A line below the screen display indicates settings and
readings as well as status symbols.
H Note:
Every measurement value can also be shown in an
enlarged display at the top right corner of the A-scan
(setting in the function group MEAS, function S-DISP).
Amplitude height Amplitude height Status indicator:

H Note: Gate A (%)t Gate B (%) TOF = Flank
You can configure the four positions of the measure-

ment line for set and measured values as required
(function group MSEL). Please refer to chapter 5.12,
section Configuring the measurement line on this Sound path Sound path
subject. Gate A Gate B
Example of a measurement line

Principles of operation Keys
4.3 Keys
Function keys
for changing between operation levels (below),
for selection of the function groups (below) and
for selection of the functions (right).
Special keys
for direct activation of particularly important instru-
ment functions:
Key Function
V dB-step Step size for gain setting
W Freeze Storage (freezing) of

screen display
X Zoom Enlarged echo display

over the entire screen
Y Copy Printing/transferring data
U On/Off Switching instrument on/off
Principles of operation Keys
4.3 Keys
Function keys
for changing between operation levels (below),
for selection of the function groups (below) and
for selection of the functions (right).
Special keys
for direct activation of particularly important instru-
ment functions:
Key Function
V dB-step Step size for gain setting
W Freeze Storage (freezing) of

screen display
X Zoom Enlarged echo display

over the entire screen
Y Copy Printing/transferring data
U On/Off Switching instrument on/off

Operational concept Principles of operation
4.4 Operational concept Setting the functions

Shown below the A-scan are five function groups that
The USM 25 is an easy-to-use instrument. It has three you can directly select using the corresponding u-key.
operating levels, and you can change between them by The selected function group is highlighted and the
pressing the E key. You will recognize your currently corresponding four functions are displayed next to the
active operating level by the number on the separation A-scan on the right. You can likewise directly select the
line between the first and the second function group. individual functions using the corresponding v-keys.
If the instrument is equipped with the Data Logger option, Coarse and fine adjustment of functions
a fourth operating level is added to the existing ones.
You can choose between coarse and fine adjustment
Each operating level contains five function groups. for some functions. You can toggle between these two
First operating level adjustment modes by pressing the corresponding
v-key several times.
The fine adjustment is identified by an asterisk pre-

Second operating level ceding the function value.
The following functions offer a choice between coarse

and fine adjustment:
Third operating level
Operational concept Principles of operation
4.4 Operational concept Setting the functions

Shown below the A-scan are five function groups that
The USM 25 is an easy-to-use instrument. It has three you can directly select using the corresponding u-key.
operating levels, and you can change between them by The selected function group is highlighted and the
pressing the E key. You will recognize your currently corresponding four functions are displayed next to the
active operating level by the number on the separation A-scan on the right. You can likewise directly select the
line between the first and the second function group. individual functions using the corresponding v-keys.
If the instrument is equipped with the Data Logger option, Coarse and fine adjustment of functions
a fourth operating level is added to the existing ones.
You can choose between coarse and fine adjustment
Each operating level contains five function groups. for some functions. You can toggle between these two
First operating level adjustment modes by pressing the corresponding
v-key several times.
The fine adjustment is identified by an asterisk pre-

Second operating level ceding the function value.
The following functions offer a choice between coarse

and fine adjustment:
Third operating level

Principles of operation Operational concept
Function Function group Rotary knobs for function adjustment
RANGE BASE In addition, the USM 25 is equipped with two rotary

MTLVEL BASE knobs.
D-DELAY BASE
You can use the left-hand rotary knob to directly adjust
aSTART aGAT
the gain; use the right-hand rotary knob to adjust the
aWIDTH aGAT
current function selected.
bWIDTH bGAT
S-REF1 CAL The rotary knobs also enable an accelerated adjust-
S-REF2 CAL ment. You can make an adjustment step by step by
ANGLE TRIG slightly turning the rotary knob, it will lock into place
THICKNE TRIG with the next adjustment. In the case of functions
having a larger adjustment range, you can quickly
For more details on the adjustment possibilities, please
bridge major differences between values by turning the
read from page 5-5 onward.
rotary knob correspondingly faster.
Principles of operation Operational concept
Function Function group Rotary knobs for function adjustment
RANGE BASE In addition, the USM 25 is equipped with two rotary

MTLVEL BASE knobs.
D-DELAY BASE
You can use the left-hand rotary knob to directly adjust
aSTART aGAT
the gain; use the right-hand rotary knob to adjust the
aWIDTH aGAT
current function selected.
bWIDTH bGAT
S-REF1 CAL The rotary knobs also enable an accelerated adjust-
S-REF2 CAL ment. You can make an adjustment step by step by
ANGLE TRIG slightly turning the rotary knob, it will lock into place
THICKNE TRIG with the next adjustment. In the case of functions
having a larger adjustment range, you can quickly
For more details on the adjustment possibilities, please
bridge major differences between values by turning the
read from page 5-5 onward.
rotary knob correspondingly faster.

Important basic settings Principles of operation
4.5 Important basic settings Operation:
– Use E to change over to the third operating level.

Selecting the language – Use u to select the function group CFG1 and v to
select the function DIALOG.
Select the language in which the function names should
be displayed on the screen in the function DIALOG – Select the required language by means of the right-
(Function group CFG1). The following languages are hand rotary knob.
available:
• German • Romanian
• English (default setting) • Finnish
• French • Czech Selecting units
• Italian • Danish In the function UNIT (function group CFG1) you can
• Spanish • Hungarian choose your favorite units between mm or inch.
• Portuguese • Croatian
• Dutch • Russian Operation:
• Swedish • Slovakian
• Slovenian • Norwegian – Use E to change over to the third operating level.
• Polish – Use u to select the function group CFG1 and then
use v to select the function UNIT
H Note: – Set the required unit by means of the right-hand

More dialog languages can be added on request. rotary knob.
4.5 Important basic settings Operation:
– Use E to change over to the third operating level.

Selecting the language – Use u to select the function group CFG1 and v to
select the function DIALOG.
Select the language in which the function names should
be displayed on the screen in the function DIALOG – Select the required language by means of the right-
(Function group CFG1). The following languages are hand rotary knob.
available:
• German • Romanian
• English (default setting) • Finnish
• French • Czech Selecting units
• Italian • Danish In the function UNIT (function group CFG1) you can
• Spanish • Hungarian choose your favorite units between mm or inch.
• Portuguese • Croatian
• Dutch • Russian Operation:
• Swedish • Slovakian
• Slovenian • Norwegian – Use E to change over to the third operating level.
• Polish – Use u to select the function group CFG1 and then
use v to select the function UNIT
H Note: – Set the required unit by means of the right-hand

More dialog languages can be added on request. rotary knob.

Principles of operation Important basic settings
A Attention: Setting the backlight

Select your units immediately when you start working You can switch the backlight for the display on and off
with the USM 25 because if you change the unit, all in the function LIGHT (function group LCD). Apart from
current settings are deleted, and the basic setup is this, you can also use a simple key combination to
loaded again. witch it on and off.
In order not to delete anything by accident, a safety
prompt is displayed in the measurement line: Change H Note:
unit? The operating time is reduced by 25 to 30 % with the
– If you are sure that you want to change the unit, backlight switched on in battery operation! You should
press the v key belonging to the function UNIT one therefore ensure that the light is always switched off
more time. when not needed.
The unit is now changed, the current data are deleted. Operation:
– If you want to abort the process, press any other – Use E to change over to the third operating level.
key. The previous setting is kept in that case.
– Use u to select the function group LCD and then
use v to select the function LIGHT.
– Use the right-hand rotary knob to switch the

backlight on or off.
Principles of operation Important basic settings
A Attention: Setting the backlight

Select your units immediately when you start working You can switch the backlight for the display on and off
with the USM 25 because if you change the unit, all in the function LIGHT (function group LCD). Apart from
current settings are deleted, and the basic setup is this, you can also use a simple key combination to
loaded again. witch it on and off.
In order not to delete anything by accident, a safety
prompt is displayed in the measurement line: Change H Note:
unit? The operating time is reduced by 25 to 30 % with the
– If you are sure that you want to change the unit, backlight switched on in battery operation! You should
press the v key belonging to the function UNIT one therefore ensure that the light is always switched off
more time. when not needed.
The unit is now changed, the current data are deleted. Operation:
– If you want to abort the process, press any other – Use E to change over to the third operating level.
key. The previous setting is kept in that case.
– Use u to select the function group LCD and then
use v to select the function LIGHT.
– Use the right-hand rotary knob to switch the

backlight on or off.

Or: H Note:
– Press the two keys u + u on the left both at the The higher the ambient temperature, the lower you have
same time in order to switch the backlight on and off: to set the contrast.
With extremely intense sunlight, the screen display is

inverted. You can now set the display using the contrast
setting so that you will see the A-scan as well as all
functions and values appearing white against a black
background.
The screen inversion with high ambient temperatures is

typical of LCD displays. The effect vanishes at normal
temperatures and is no risk to the screen.
Press both keys
Or: H Note:
– Press the two keys u + u on the left both at the The higher the ambient temperature, the lower you have
same time in order to switch the backlight on and off: to set the contrast.
With extremely intense sunlight, the screen display is

inverted. You can now set the display using the contrast
setting so that you will see the A-scan as well as all
functions and values appearing white against a black
background.
The screen inversion with high ambient temperatures is

typical of LCD displays. The effect vanishes at normal
temperatures and is no risk to the screen.
Press both keys


Operation 5
Operation 5

Overview of the functions
Operation
5.1 Overview of the functions
The functions of the USM 25 are combined to form Each operating level contains five function groups.You
function groups on two operating levels. will recognize your currently active operating level by
the number on the separation line between the first and
– Press the E key to change between the two the second function group.
operating levels.
First operating level
– Press the u key to select the function group shown
above it.
– Press the v key to select the function shown next Second operating level
to it. The setting of the selected function is carried
out via the right-hand rotary knob.
The Gain function is always directly available via the Third operating level
left-hand rotary knob.
You can carry out important functions (switch on/off,

dB-step, freeze, zoom and report printout) by pressing H Note:
the special keys (ref. chapter 4).
If the instrument is equipped with the Data Logger
You will also find an overview of the function groups option, a fourth operating level is added. For this, refer
and their functions on the fold-out page. to the corresponding chapter Option Data Logger.

Operation
5.1 Overview of the functions
The functions of the USM 25 are combined to form Each operating level contains five function groups.You
function groups on two operating levels. will recognize your currently active operating level by
the number on the separation line between the first and
– Press the E key to change between the two the second function group.
operating levels.
First operating level
– Press the u key to select the function group shown
above it.
– Press the v key to select the function shown next Second operating level
to it. The setting of the selected function is carried
out via the right-hand rotary knob.
The Gain function is always directly available via the Third operating level
left-hand rotary knob.
You can carry out important functions (switch on/off,

dB-step, freeze, zoom and report printout) by pressing H Note:
the special keys (ref. chapter 4).
If the instrument is equipped with the Data Logger
You will also find an overview of the function groups option, a fourth operating level is added. For this, refer
and their functions on the fold-out page. to the corresponding chapter Option Data Logger.

Overview of the functions Operation
Function groups first operating level Function groups second operating level
BASE The functions that you find here are CAL This function group makes functions for
required for the basic adjustment of the the semiautomatic calibration available to
screen displays. you.
PULS Combined in this group are the functions REF This function group serves for measuring
that serve for the adjustment of pulser. the dB difference between a reference
echo and the reflector echo.
RECV Combined in this group are the functions
that serve for the adjustment of receiver. DAC This is the function group where you
can set the functions for the DAC (only
aGAT All functions for setting the gate A can be USM 25 DAC and USM 25S).
found in this group.
DGS This function group serves for the
bGAT All functions for setting the gate B can be amplitude evaluation according to the
found in this group. DGS method (only USM 25S).
TRIG Combined in this group are the functions

required for angle beaming using angle-
beam probes for the display of a (reduced)
projection distance and depth position of a
reflector (for plane-parallel and circular
curved test components).
Overview of the functions Operation

Function groups first operating level Function groups second operating level
BASE The functions that you find here are CAL This function group makes functions for
required for the basic adjustment of the the semiautomatic calibration available to
screen displays. you.
PULS Combined in this group are the functions REF This function group serves for measuring
that serve for the adjustment of pulser. the dB difference between a reference
echo and the reflector echo.
RECV Combined in this group are the functions
that serve for the adjustment of receiver. DAC This is the function group where you
can set the functions for the DAC (only
aGAT All functions for setting the gate A can be USM 25 DAC and USM 25S).
found in this group.
DGS This function group serves for the
bGAT All functions for setting the gate B can be amplitude evaluation according to the
found in this group. DGS method (only USM 25S).
TRIG Combined in this group are the functions

required for angle beaming using angle-
beam probes for the display of a (reduced)
projection distance and depth position of a
reflector (for plane-parallel and circular
curved test components).

Operation
MEM These functions serve for storing, loading Function groups third operating level
and deleting of data sets.
MEAS In this group, you can define the
DATA The functions of this group serve for the measuring point, select a parameter for
dataset management and documentation. the zoomed measured-value display in the
A-scan as well as for the setting of the
Magnify function, and you can select diffe-
rent settings for the A-scan.
MSEL This is where you configure your

measurement line. You can choose one
display for each of the four positions.
LCD This is the function group where you can

set the LCD contrast and backlight as well
as the echo display mode on the screen.
CFG1 Functions for the configuration: unit, dialog

language, printer driver and assignment of
the Y key.
CFG2 Other functions for configuration: time and

date, alarm horn; plus the changeover
between the evaluation modes

Operation
MEM These functions serve for storing, loading Function groups third operating level
and deleting of data sets.
MEAS In this group, you can define the
DATA The functions of this group serve for the measuring point, select a parameter for
dataset management and documentation. the zoomed measured-value display in the
A-scan as well as for the setting of the
Magnify function, and you can select diffe-
rent settings for the A-scan.
MSEL This is where you configure your

measurement line. You can choose one
display for each of the four positions.
LCD This is the function group where you can

set the LCD contrast and backlight as well
as the echo display mode on the screen.
CFG1 Functions for the configuration: unit, dialog

language, printer driver and assignment of
the Y key.
CFG2 Other functions for configuration: time and

date, alarm horn; plus the changeover
between the evaluation modes

Setting the gain Operation
5.2 Setting the gain

This function, operated via the left-hand rotary knob, • 0.0 dB (locked)
enables you to quickly and directly set the gain. • 0.5 dB
You can use the gain to adjust the required sensitivity • 1.0 dB
in order to control the echo amplitudes. • 2.0 dB
• 6.0 dB
Operation:
• 12.0 dB
– Turn the left-hand rotary knob to set the gain.
The current gain is indicated in the top left corner of the H Note:
screen. The setting 0.0 dB locks the gain in this way preventing
any accidental change of setting.
You can determine the step size of the sixth step using
V – Defining the dB incrementation the function dBSTEP in the function group RECV.
for gain
Operation:
You can use the V-key to select a certain incremen-
tation for setting the gain. You have a choice between – Press V to change between the six steps.
6 steps: The corresponding step size setting is indicated
below the current gain on the screen.
Setting the gain Operation
5.2 Setting the gain

This function, operated via the left-hand rotary knob, • 0.0 dB (locked)
enables you to quickly and directly set the gain. • 0.5 dB
You can use the gain to adjust the required sensitivity • 1.0 dB
in order to control the echo amplitudes. • 2.0 dB
• 6.0 dB
Operation:
• 12.0 dB
– Turn the left-hand rotary knob to set the gain.
The current gain is indicated in the top left corner of the H Note:
screen. The setting 0.0 dB locks the gain in this way preventing
any accidental change of setting.
You can determine the step size of the sixth step using
V – Defining the dB incrementation the function dBSTEP in the function group RECV.
for gain
Operation:
You can use the V-key to select a certain incremen-
tation for setting the gain. You have a choice between – Press V to change between the six steps.
6 steps: The corresponding step size setting is indicated
below the current gain on the screen.

Adjusting the display range (function group BASE)
Operation
5.3 Adjusting the display range The display on the screen must be adjusted for the
material to be tested (function MTLVEL) and for the
(function group BASE) probe used (function P-DELAY). In addition, you must
choose the range for your measurement and the display
The function group BASE enables you to make the start point.
basic adjustment of the display range.
– If required, use E to change the operating level. H Note:
– Use u to select the function group BASE. In order to accurately adjust the material velocity and
the probe delay, please read the section Calibrating the
USM 25, chapter 5.7, beforehand.

Operation
5.3 Adjusting the display range The display on the screen must be adjusted for the
material to be tested (function MTLVEL) and for the
(function group BASE) probe used (function P-DELAY). In addition, you must
choose the range for your measurement and the display
The function group BASE enables you to make the start point.
basic adjustment of the display range.
– If required, use E to change the operating level. H Note:
– Use u to select the function group BASE. In order to accurately adjust the material velocity and
the probe delay, please read the section Calibrating the
USM 25, chapter 5.7, beforehand.

Adjusting the display range (function group BASE) Operation
RANGE (Display range) Fine adjustment:
You can adjust the range for your measurement in up to 99.9 mm in steps of 0.1 mm
RANGE. up to 999 mm in steps of 1 mm
up to 9999 mm in steps of 10 mm
H Note:
Operation:
The adjustment range for the display range depends on
the frequency range setting (function FREQU). – Use v to select the function RANGE and adjust the
required value by means of the right-hand rotary
Frequency range Adjustment range (c = 5920 m/s) knob.
0.2 to 1 MHz 0.5 to 9999 mm / 0.02“ to 390“
0.5 to 4 MHz 0.5 to 9999 mm / 0.02“ to 390“ – Toggle between coarse and fine adjustment by
0.8 to 8 MHz 0.5 to 1420 mm / 0.02“ to 50“ repeatedly pressing v. The function value is always
2 to 20 MHz 0.5 to 1420 mm / 0.02“ to 50“ marked with an asterisk in the fine adjustment.
You can select between coarse and fine adjustment of

H Note:
the values.
The range limits are also dependent on the set sound
Coarse adjustment: velocities (function MTVEL): with small values for c,
from 0.5 mm to 1400 (9999) mm in even steps the range limits are shifted downwards, with large
values upwards.

RANGE (Display range) Fine adjustment:
You can adjust the range for your measurement in up to 99.9 mm in steps of 0.1 mm
RANGE. up to 999 mm in steps of 1 mm
up to 9999 mm in steps of 10 mm
H Note:
Operation:
The adjustment range for the display range depends on
the frequency range setting (function FREQU). – Use v to select the function RANGE and adjust the
Frequency range Adjustment range (c = 5920 m/s) knob.
0.2 to 1 MHz 0.5 to 9999 mm / 0.02“ to 390“
0.5 to 4 MHz 0.5 to 9999 mm / 0.02“ to 390“ – Toggle between coarse and fine adjustment by
0.8 to 8 MHz 0.5 to 1420 mm / 0.02“ to 50“ repeatedly pressing v. The function value is always
2 to 20 MHz 0.5 to 1420 mm / 0.02“ to 50“ marked with an asterisk in the fine adjustment.
You can select between coarse and fine adjustment of

H Note:
the values.
The range limits are also dependent on the set sound
Coarse adjustment: velocities (function MTVEL): with small values for c,
from 0.5 mm to 1400 (9999) mm in even steps the range limits are shifted downwards, with large
values upwards.

Operation
MTLVEL (Material velocity) Operation:
In MTLVEL, you can set the sound velocity in the test – Use v to select the function MTLVEL and adjust
object. You can select one of two predefined fixed the required value by means of the right-hand rotary
values, or you can continuously vary the value. knob.
Adjustment range: 1000 - 15000 m/s – Toggle between coarse and fine adjustment by
40 - 600 “/ms repeatedly pressing v. The function value is always
marked with an asterisk in the fine adjustment.
You can choose between coarse and fine adjustment of
the values.
Coarse adjustment: A Attention:

in steps as follows (m/s): Always ensure that the function MTLVEL is correctly
set. The USM 25 calculates all range and distance
15000 9000 5000 2000 indications on the basis of the value adjusted here.
14000 8000 4000 1600
13000 7000 3250 1450
12000 6320 3130 1000
11000 6000 3000
10000 5920 2730
Fine adjustment:
in steps of 1 m/s (0.1 “/ms)

Operation
MTLVEL (Material velocity) Operation:
In MTLVEL, you can set the sound velocity in the test – Use v to select the function MTLVEL and adjust
object. You can select one of two predefined fixed the required value by means of the right-hand rotary
values, or you can continuously vary the value. knob.
Adjustment range: 1000 - 15000 m/s – Toggle between coarse and fine adjustment by
40 - 600 “/ms repeatedly pressing v. The function value is always
marked with an asterisk in the fine adjustment.
the values.
Coarse adjustment: A Attention:

in steps as follows (m/s): Always ensure that the function MTLVEL is correctly
set. The USM 25 calculates all range and distance
15000 9000 5000 2000 indications on the basis of the value adjusted here.
14000 8000 4000 1600
13000 7000 3250 1450
12000 6320 3130 1000
11000 6000 3000
10000 5920 2730
Fine adjustment:
in steps of 1 m/s (0.1 “/ms)

D-DELAY (Display starting point) up to 9.999” in steps of 0.001”
from 10” in steps of 0.01”
In D-DELAY you can choose whether to display the
adjusted range (for example 250 mm) starting from the Operation:
surface of the test object, or in a section of the test
object starting at a later point. – Use v to select the function D-DELAY and adjust
the value for the display starting point by means of
This allows you to shift the complete screen display the right-hand rotary knob.
and consequently also the display zero.
– Toggle between coarse and fine adjustment by
If the display should for example start from the surface of repeatedly pressing v. The function value is marked
the test object, the value in D-DELAY must be set to 0. with an asterisk in the fine adjustment.
Adjustment range: -10 mm to +1024 mm
-0.3” to +40”

the values.
Coarse adjustment:
-10 mm to +1024 mm / -0.3” to +40” in even steps
Fine adjustment:
up to 99.9 mm in steps of 0.01 mm

up to 1024 mm in steps of 0.1 mm /

D-DELAY (Display starting point) up to 9.999” in steps of 0.001”
from 10” in steps of 0.01”
In D-DELAY you can choose whether to display the
adjusted range (for example 250 mm) starting from the Operation:
surface of the test object, or in a section of the test
object starting at a later point. – Use v to select the function D-DELAY and adjust
the value for the display starting point by means of
This allows you to shift the complete screen display the right-hand rotary knob.
and consequently also the display zero.
– Toggle between coarse and fine adjustment by
If the display should for example start from the surface of repeatedly pressing v. The function value is marked
the test object, the value in D-DELAY must be set to 0. with an asterisk in the fine adjustment.
Adjustment range: -10 mm to +1024 mm
-0.3” to +40”

the values.
Coarse adjustment:
-10 mm to +1024 mm / -0.3” to +40” in even steps
Fine adjustment:
up to 99.9 mm in steps of 0.01 mm

up to 1024 mm in steps of 0.1 mm /

Adjusting the pulser (function group PULS)
Operation
P-DELAY (Probe delay) 5.4 Adjusting the pulser
Every probe has a delay line between the transducer (function group PULS)
element and the coupling face. This means that the
initial pulse must first pass through this delay line You will find all functions for the adjustment of the
before the sound wave can enter the test object. You pulser in the function group PULS.
can compensate for this influence of the delay line in
the function P-DELAY. – If required, use E to change the operating level.
– Use u to select the function group PULS.

Operation:
– Use v to select the function P-DELAY and adjust

the value for the probe delay by means of the right-
hand rotary knob.
H Note:
If the value for P-DELAY is not known, read the section
Calibrating the USM 25, chapter 5.7, in order to deter-
mine this value.

Operation
P-DELAY (Probe delay) 5.4 Adjusting the pulser
Every probe has a delay line between the transducer (function group PULS)
element and the coupling face. This means that the
initial pulse must first pass through this delay line You will find all functions for the adjustment of the
before the sound wave can enter the test object. You pulser in the function group PULS.
can compensate for this influence of the delay line in
the function P-DELAY. – If required, use E to change the operating level.
– Use u to select the function group PULS.

Operation:
– Use v to select the function P-DELAY and adjust

the value for the probe delay by means of the right-
hand rotary knob.
H Note:
If the value for P-DELAY is not known, read the section
Calibrating the USM 25, chapter 5.7, in order to deter-
mine this value.

Adjusting the pulser (function group PULS) Operation
DAMPING (Probe matching) POWER (Intensity)
This function serves for matching the probe. You can The function POWER allows you to adjust the intensity
use it to adjust the damping of the probe’s oscillating of the initial pulse. Choose low if you need a higher
circuit and to consequently change the height, width resolution and high if you are mainly interested in the
and resolution of the echo display. penetration (with large components).
You can choose between the settings high and low.

Operation:
The setting low has a lower damping effect and pro-
duces higher and broader echoes, the setting high – Use v to select the function POWER and set the
reduces the echo height but mostly also produces required value by means of the right-hand rotary
narrow echoes with higher resolution. knob.
Operation:
– Use v to select the function DAMPING and set the

knob.
Adjusting the pulser (function group PULS) Operation

DAMPING (Probe matching) POWER (Intensity)
This function serves for matching the probe. You can The function POWER allows you to adjust the intensity
use it to adjust the damping of the probe’s oscillating of the initial pulse. Choose low if you need a higher
circuit and to consequently change the height, width resolution and high if you are mainly interested in the
and resolution of the echo display. penetration (with large components).
You can choose between the settings high and low.

Operation:
The setting low has a lower damping effect and pro-
duces higher and broader echoes, the setting high – Use v to select the function POWER and set the
reduces the echo height but mostly also produces required value by means of the right-hand rotary
narrow echoes with higher resolution. knob.
Operation:
– Use v to select the function DAMPING and set the

knob.

Operation
DUAL (Pulser-receiver separation) PRF-MOD (Pulse repetition frequency)
You can activate the pulser-receiver separation in the The pulse repetition frequency indicates the number of
function DUAL. times an initial pulse is triggered per second. You can
determine whether you need the highest possible PRF
This function must be set to off in pulse-echo mode value, or whether you are satisfied with a low value.
using a single-element probe. Set the function to on if You have 10 steps available for the setting; step 1
you intend to work in through-transmission mode or with means the lowest PRF value.
a dual-element (TR) probe.
The larger your workpiece, the smaller PRF values are
Operation: needed in order to avoid phantom echoes. In the case
of smaller PRF values, however, the A-scan update
– Use v to select the function DUAL and set the rate becomes lower; for this reason, high values are
function to on or off by means of the right-hand required if a workpiece should be scanned fast.
rotary knob.
The best way to determine the suitable PRF value is by
The LED D (Dual) is lit with active DUAL function. experimenting: start from the highest step and reduce
the value until there are no more phantom echoes.
Operation:
– Use v to select the function PRF-MOD and adjust

the required value by means of the right-hand rotary
knob.

Operation
DUAL (Pulser-receiver separation) PRF-MOD (Pulse repetition frequency)
You can activate the pulser-receiver separation in the The pulse repetition frequency indicates the number of
function DUAL. times an initial pulse is triggered per second. You can
determine whether you need the highest possible PRF
This function must be set to off in pulse-echo mode value, or whether you are satisfied with a low value.
using a single-element probe. Set the function to on if You have 10 steps available for the setting; step 1
you intend to work in through-transmission mode or with means the lowest PRF value.
a dual-element (TR) probe.
The larger your workpiece, the smaller PRF values are
Operation: needed in order to avoid phantom echoes. In the case
of smaller PRF values, however, the A-scan update
– Use v to select the function DUAL and set the rate becomes lower; for this reason, high values are
function to on or off by means of the right-hand required if a workpiece should be scanned fast.
rotary knob.
The best way to determine the suitable PRF value is by
The LED D (Dual) is lit with active DUAL function. experimenting: start from the highest step and reduce
the value until there are no more phantom echoes.
Operation:
– Use v to select the function PRF-MOD and adjust

the required value by means of the right-hand rotary
knob.

Adjusting the receiver (function group RECV) Operation
5.5 Adjusting the receiver FINE G (fine adjustment of gain)

(function group RECV) This function serves for the fine adjustment of the
current gain value. The fine adjustment is possible over
You will find all functions for the adjustment of the a range of 40 steps within the range of approx. 4 dB.
pulser in the function group RECV. The displayed gain value will not change.
– If required, use E to change the operating level. Adjustment range: -10 to +30
– Use u to select the function group RECV.

Operation:
– The function FINE G / dBSTEP has a double

assignment (icon >). Toggle between the two
functions by repeatedly pressing the corresponding
key v.
– Use v to select the function FINE G, and then use

the right-hand rotary knob to adjust the value for the
fine gain.
H Note:
Double assignment of the function FINE G / dBSTEP.
For operation (changeover), please see the operation of
the corresponding function.
5.5 Adjusting the receiver FINE G (fine adjustment of gain)

(function group RECV) This function serves for the fine adjustment of the
current gain value. The fine adjustment is possible over
You will find all functions for the adjustment of the a range of 40 steps within the range of approx. 4 dB.
pulser in the function group RECV. The displayed gain value will not change.
– If required, use E to change the operating level. Adjustment range: -10 to +30
– Use u to select the function group RECV.

Operation:
– The function FINE G / dBSTEP has a double

key v.
– Use v to select the function FINE G, and then use

the right-hand rotary knob to adjust the value for the
fine gain.
H Note:
Double assignment of the function FINE G / dBSTEP.
For operation (changeover), please see the operation of
the corresponding function.
Operation Adjusting the receiver (function group RECV)
dBSTEP REJECT
Use this function to set a step size for the gain vari- The function REJECT allows you to suppress unwanted
ation by means of the key V. The value set here is echo indications, for example structural noise from your
subsequently available to you as the sixth step for the test object.
stepwise gain variation. You have a free choice of the
value within the setting range. The % screen height setting indicates the minimum
height that the echoes should attain in order for them to
be displayed on the screen at all. The Reject setting
Operation:
cannot be higher than the lowest threshold setting
Setting range: 6.5 to 20 dB (minus 1 %) of any gate.
– The function FINE G / dBSTEP has a double Operation:

functions by repeatedly pressing the corresponding – Use v to select the function REJECT and set the
key v. required percentage value by means of the right-hand
rotary knob.
– Use v to select the function dBSTEP and set the
value for the gain by means of the right-hand rotary
knob. A Attention:
You should handle this function with great caution, as it
may of course happen that you suppress echoes from
flaws as well. Many test specifications expressly forbid
using the Reject function.
The LED R is therefore lit with active REJECT function.
Operation Adjusting the receiver (function group RECV)
dBSTEP REJECT
Use this function to set a step size for the gain vari- The function REJECT allows you to suppress unwanted
ation by means of the key V. The value set here is echo indications, for example structural noise from your
subsequently available to you as the sixth step for the test object.
stepwise gain variation. You have a free choice of the
value within the setting range. The % screen height setting indicates the minimum
height that the echoes should attain in order for them to
be displayed on the screen at all. The Reject setting
Operation:
cannot be higher than the lowest threshold setting
Setting range: 6.5 to 20 dB (minus 1 %) of any gate.
– The function FINE G / dBSTEP has a double Operation:

functions by repeatedly pressing the corresponding – Use v to select the function REJECT and set the
key v. required percentage value by means of the right-hand
rotary knob.
– Use v to select the function dBSTEP and set the
value for the gain by means of the right-hand rotary
knob. A Attention:
You should handle this function with great caution, as it
may of course happen that you suppress echoes from
flaws as well. Many test specifications expressly forbid
using the Reject function.
The LED R is therefore lit with active REJECT function.

FREQU (Frequency range) RECTIFY (rectification)
In this function, you can adjust the operating frequency You can select the rectification mode of the echo
according to the frequency of your probe. pulses according to your application in the function
RECTIFY. You have the following options to choose
You have a choice between four frequency ranges:
from:
0.2 – 1 MHz • full-w (= full-wave) All half-waves are displayed
0.5 – 4 MHz above the baseline.
0.8 – 8 MHz
2 – 20 MHz • pos hw (= positive half-wave) Only positive half-
waves are displayed.
Operation:
• neg hw (= negative half-wave) Only negative half-
– Use v to select the function FREQU and adjust the waves are displayed.
knob. • rf (= radio frequency). Only applies to the display
range up to 50 mm (steel).
Operation:
– Use v to select the function RECTIFY, and then

use the right-hand rotary knob to adjust the required
setting.

FREQU (Frequency range) RECTIFY (rectification)
In this function, you can adjust the operating frequency You can select the rectification mode of the echo
according to the frequency of your probe. pulses according to your application in the function
RECTIFY. You have the following options to choose
You have a choice between four frequency ranges:
from:
0.2 – 1 MHz • full-w (= full-wave) All half-waves are displayed
0.5 – 4 MHz above the baseline.
0.8 – 8 MHz
2 – 20 MHz • pos hw (= positive half-wave) Only positive half-
waves are displayed.
Operation:
• neg hw (= negative half-wave) Only negative half-
– Use v to select the function FREQU and adjust the waves are displayed.
knob. • rf (= radio frequency). Only applies to the display
range up to 50 mm (steel).
Operation:
– Use v to select the function RECTIFY, and then

use the right-hand rotary knob to adjust the required
setting.

Setting the gates (function groups aGAT and bGAT)
Operation
5.6 Setting the gates H Note:
(function groups aGAT and If you have an instrument equipped with the Data Logger
option at your disposal, you’ll be additionally able to use
bGAT) the C gate including all corresponding functions.
All functions for setting the (dual) gate are arranged in

the function group aGAT and bGAT.
– If required, use E to change the operating level.

Tasks of the gates
– Use u to select the function group aGAT or bGAT. • It monitors the range of the test object where you
expect to detect a flaw. If an echo exceeds or falls
below the gate, an alarm signal is output via the
LED A.
H Note:
Error alarms can be triggered unter certain circum-
stances. These are caused by intermediate conditions
in instrument operation occuring when the instrumet is
used, i.e. when function parameters are changed.
Possible alarms occuring during instrument opera-
tion (setting of functions) are to be ignored.
Setting the gates (function groups aGAT and bGAT)

Operation
5.6 Setting the gates H Note:
(function groups aGAT and If you have an instrument equipped with the Data Logger
option at your disposal, you’ll be additionally able to use
bGAT) the C gate including all corresponding functions.
All functions for setting the (dual) gate are arranged in

the function group aGAT and bGAT.
– If required, use E to change the operating level.

Tasks of the gates
– Use u to select the function group aGAT or bGAT. • It monitors the range of the test object where you
expect to detect a flaw. If an echo exceeds or falls
below the gate, an alarm signal is output via the
LED A.
H Note:
in instrument operation occuring when the instrumet is
used, i.e. when function parameters are changed.
tion (setting of functions) are to be ignored.

Setting the gates (function groups aGAT and bGAT) Operation
• The gates A and B are independant of one another. • neg Anticoincidence
Gate A can also have the function of an echo-start The alarm (LED A) is on if the preset response
gate. threshold of the gate is not reached within the
displayed range.
• The gate chooses the echo for the digital time-of-
flight or amplitude measurement. The measured • a trig Triggering by interface echo
value is indicated in the measurement line. When using gate A as echo-start gate (setting of the
evaluation logic for gate B)
Operation:
aLOGIC / bLOGIC (Evaluation logic of the – Use v to select the function aLOGIC or bLOGIC
gates) and set the required alarm logic by means of the
right-hand rotary knob.
This function allows you to choose the method for
triggering the gate alarm. The alarm is output to the Then determine the position of the gate. This is defined
LED A on the front panel of the USM 25. There are four by means of three parameters:
setting options available:
• off Evaluation logic off
The alarm and measurement capability are switched
off. The gate is not visible.
• pos Coincidence
The alarm (LED A) is on if the preset response
threshold of the gate is exceeded within the dis-
played range.
Setting the gates (function groups aGAT and bGAT) Operation

• The gates A and B are independant of one another. • neg Anticoincidence
Gate A can also have the function of an echo-start The alarm (LED A) is on if the preset response
gate. threshold of the gate is not reached within the
displayed range.
• The gate chooses the echo for the digital time-of-
flight or amplitude measurement. The measured • a trig Triggering by interface echo
value is indicated in the measurement line. When using gate A as echo-start gate (setting of the
evaluation logic for gate B)
Operation:
aLOGIC / bLOGIC (Evaluation logic of the – Use v to select the function aLOGIC or bLOGIC
gates) and set the required alarm logic by means of the
right-hand rotary knob.
This function allows you to choose the method for
triggering the gate alarm. The alarm is output to the Then determine the position of the gate. This is defined
LED A on the front panel of the USM 25. There are four by means of three parameters:
setting options available:
• off Evaluation logic off
The alarm and measurement capability are switched
off. The gate is not visible.
• pos Coincidence
The alarm (LED A) is on if the preset response
threshold of the gate is exceeded within the dis-
played range.

Operation Setting the gates (function groups aGAT and bGAT)
aSTART / bSTART aTHRSH / bTHRSH

(Starting points of the gates) (Response and measurement threshold of
the gates)
You can fix the starting point of the gates A or B within
the adjustment range of 0 to max. 9999 mm / 250”. You can determine the threshold value of the gates within
the range of 10 to 90 % screen height for triggering the
– Use v to select the function aSTART or bSTART,
LED alarm if this value is exceeded or not reached,
and then use the right-hand rotary knob to adjust the
depending on the setting of the aLOGIC function. In the
required setting.
RF mode, the threshold can be additionally set from
-90 % to -10 %.
aWIDTH / bWIDTH (Width of the gates) Operation:
– Select the function aTHRSH or bTHRSH usting the

You can determine the gate width within the range of
corresponding v-key and by set the required value
0.2 to 9999 mm / 0.008 to 250 ”.
using the right-hand rotary knob.
– Use v to select the function aWIDTH or bWIDTH,
required value.
H Note:
The alarm and measurement function of the gates is
only active within the display range.
Operation Setting the gates (function groups aGAT and bGAT)
aSTART / bSTART aTHRSH / bTHRSH

(Starting points of the gates) (Response and measurement threshold of
the gates)
You can fix the starting point of the gates A or B within
the adjustment range of 0 to max. 9999 mm / 250”. You can determine the threshold value of the gates within
the range of 10 to 90 % screen height for triggering the
– Use v to select the function aSTART or bSTART,
LED alarm if this value is exceeded or not reached,
depending on the setting of the aLOGIC function. In the
required setting.
RF mode, the threshold can be additionally set from
-90 % to -10 %.
aWIDTH / bWIDTH (Width of the gates) Operation:
– Select the function aTHRSH or bTHRSH usting the

You can determine the gate width within the range of
corresponding v-key and by set the required value
0.2 to 9999 mm / 0.008 to 250 ”.
using the right-hand rotary knob.
– Use v to select the function aWIDTH or bWIDTH,
required value.
H Note:
The alarm and measurement function of the gates is
only active within the display range.

Calibrating the USM 25 Operation
5.7 Calibrating the USM 25 Choosing the measuring point

The sound path measurement in the calibration process
Calibrating the display range or in the subsequent echo evaluation process depends
on the choice of the measuring point which can be set
Before working with the USM 25, you have to calibrate either to flank or to peak in the USM 25. In principle,
the instrument: you have to adjust the material velocity the peak measurement should be preferred because the
and display range and allow for the probe delay depend- measured distances do not depend on the echo height
ing on the material and dimensions of the test object. in that case. However, there are application cases in
which the flank measurement is either specified, or it
To ensure a safe and proper operation of the USM 25, it must be applied for technical reasons, e.g. in many
is necessary that the operator be adequately trained in tests using dual-element (TR) probes.
the field of ultrasonic testing technology.
Below you will find some examples of common calibra- A Attention:

tion methods for certain test tasks. In addition, the
In any case, the setting of the measuring point must
USM 25 has a semiautomatic calibration function which
always be identical for the calibration and for the
is described as Case B: With unknown material veloc-
subsequent test application. Otherwise measurement
ity.
errors might occur.
5.7 Calibrating the USM 25 Choosing the measuring point

The sound path measurement in the calibration process
Calibrating the display range or in the subsequent echo evaluation process depends
on the choice of the measuring point which can be set
Before working with the USM 25, you have to calibrate either to flank or to peak in the USM 25. In principle,
the instrument: you have to adjust the material velocity the peak measurement should be preferred because the
and display range and allow for the probe delay depend- measured distances do not depend on the echo height
ing on the material and dimensions of the test object. in that case. However, there are application cases in
which the flank measurement is either specified, or it
To ensure a safe and proper operation of the USM 25, it must be applied for technical reasons, e.g. in many
is necessary that the operator be adequately trained in tests using dual-element (TR) probes.
the field of ultrasonic testing technology.
Below you will find some examples of common calibra- A Attention:

tion methods for certain test tasks. In addition, the
In any case, the setting of the measuring point must
USM 25 has a semiautomatic calibration function which
always be identical for the calibration and for the
is described as Case B: With unknown material veloc-
subsequent test application. Otherwise measurement
ity.
errors might occur.

Calibrating the USM 25
Operation
Calibration with straight- and angle-beam Example:
probes You are carrying out the calibration for the calibration
Case A: With known material velocity range of 100 mm / 5” via the function group BASE
using the calibration block V1 (thickness 25 mm/1” )
Calibration process
which is laid flatwise.
– Set the known material velocity in MTLVEL (function
– Set RANGE to 100 mm/5”.
group BASE).
– Set the known material velocity of 5920 m/s
– Couple the probe to the calibration block.
(233 “/ms) in MTLVEL.
– Set the required display range in RANGE (function
– Set the gate so that it is positioned on the first
group BASE). The calibration echo must be dis-
calibration echo (from 25 mm/1”).
played on the screen.
– Read the sound path in the measurement line. If this
– Position the gate on one of the calibration echoes
value is not equal to 25 mm/1”, change the adjust-
until the sound path of the echo is indicated in the
ment for the function P-DELAY until it is at 25 mm/1”.
measurement line.
This completes the calibration of the USM 25 to the
– After this, change the adjustment of the function
material velocity of 5920 m/s (233 “/ms) with a calibra-
P-DELAY (function group BASE) until the correct
tion range of 100 mm / 5” for the probe used.
sound path for the selected calibration echo is
indicated in the measurement line.

Operation
Calibration with straight- and angle-beam Example:
probes You are carrying out the calibration for the calibration
Case A: With known material velocity range of 100 mm / 5” via the function group BASE
using the calibration block V1 (thickness 25 mm/1” )
Calibration process
which is laid flatwise.
– Set the known material velocity in MTLVEL (function
– Set RANGE to 100 mm/5”.
group BASE).
– Set the known material velocity of 5920 m/s
– Couple the probe to the calibration block.
(233 “/ms) in MTLVEL.
– Set the required display range in RANGE (function
– Set the gate so that it is positioned on the first
group BASE). The calibration echo must be dis-
calibration echo (from 25 mm/1”).
played on the screen.
– Read the sound path in the measurement line. If this
– Position the gate on one of the calibration echoes
value is not equal to 25 mm/1”, change the adjust-
until the sound path of the echo is indicated in the
ment for the function P-DELAY until it is at 25 mm/1”.
measurement line.
This completes the calibration of the USM 25 to the
– After this, change the adjustment of the function
material velocity of 5920 m/s (233 “/ms) with a calibra-
P-DELAY (function group BASE) until the correct
tion range of 100 mm / 5” for the probe used.
sound path for the selected calibration echo is
indicated in the measurement line.

Case B: With unknown material velocity Calibration process
Use the semiautomatic calibration function of the – Set the required display range in RANGE (function
USM 25 via the function group CAL for this calibration group BASE). The two calibraion echoes selected
case. must be displayed on the screen. Set the range so
that the second calibration echo is located on the
right edge of the screen.
– Select the function group CAL using u.
– Enter the distances of the two calibation echoes in

S-REF1 and S-REF2.
– Position the gate (function aSTART) on the first

calibration echo.
– Press Y to record the first calibration echo.
The distances between 2 calibration echoes must be – The recording of the first calibration echo is con-
entered as default data. The USM 25 will then carry out firmed by the message “Echo is recorded”, and the
a plausibility check, calculate the material velocity and function CAL indicates the value 1.
the probe delay, and automatically set the parameters.
– Move the gate to the second calibration echo.
– Press Y to record the second calibration echo.
The correct calibration is confirmed by the message

“Calibration is done”. The material velocity and probe

Case B: With unknown material velocity Calibration process
Use the semiautomatic calibration function of the – Set the required display range in RANGE (function
USM 25 via the function group CAL for this calibration group BASE). The two calibraion echoes selected
case. must be displayed on the screen. Set the range so
that the second calibration echo is located on the
right edge of the screen.
– Enter the distances of the two calibation echoes in

S-REF1 and S-REF2.
– Position the gate (function aSTART) on the first

calibration echo.
The distances between 2 calibration echoes must be – The recording of the first calibration echo is con-
entered as default data. The USM 25 will then carry out firmed by the message “Echo is recorded”, and the
a plausibility check, calculate the material velocity and function CAL indicates the value 1.
the probe delay, and automatically set the parameters.
– Move the gate to the second calibration echo.

“Calibration is done”. The material velocity and probe

Operation
delay are calculated and set. The value of the CAL – Position the gate on the first calibration echo.
function goes back to 0.
H Note:
If the instrument is not able to carry out any valid
calibration on the basis of the input values and the
echoes recorded, a corresponding error message is
displayed. In that case, please check the values of
your calibration lines and repeat the process of record-
ing the calibration echoes.
Example
– Position the gate on the second calibration echo:
– Enter the distances (thicknesses) of the two calibra-
tion lines S-REF1 (20 mm) and S-REF2 (40 mm).
– Press Y.

Operation
delay are calculated and set. The value of the CAL – Position the gate on the first calibration echo.
function goes back to 0.
H Note:
If the instrument is not able to carry out any valid
calibration on the basis of the input values and the
echoes recorded, a corresponding error message is
displayed. In that case, please check the values of
your calibration lines and repeat the process of record-
ing the calibration echoes.
Example
– Position the gate on the second calibration echo:
– Enter the distances (thicknesses) of the two calibra-
tion lines S-REF1 (20 mm) and S-REF2 (40 mm).
– Press Y.

The second echo is stored, the calibration is carried Calibration with dual-element (TR) probes
out, and the CAL function is reset to 0.
Dual-element (TR) probes are especially used for wall
The valid calibration is briefly confirmed and carried thickness measurement. The following peculiarities
out. must be taken into account when using these probes:
If you select the function group BASE, you can read Echo flank
the material velocity and probe delay.
Most dual-element (TR) probes have a roof angle
(transducer elements with inclined orientation toward
the test surface). This causes mode conversions both
at beam index (sound entry into the material) and at the
reflection from the backwall, which can result in very
jagged echoes.
V-path error
Dual-element (TR) probes produce a v-shaped sound

path from the pulser via the reflection from the backwall
to the receiver element. This so-called “V-path error”
affects the measuring accuracy. You should therefore
choose two wall thicknesses that cover the expected
thickness measurement range for the calibration. In this
way, the V-path error can be corrected to the greatest
possible extent.

The second echo is stored, the calibration is carried Calibration with dual-element (TR) probes
out, and the CAL function is reset to 0.
Dual-element (TR) probes are especially used for wall
The valid calibration is briefly confirmed and carried thickness measurement. The following peculiarities
out. must be taken into account when using these probes:
If you select the function group BASE, you can read Echo flank
the material velocity and probe delay.
Most dual-element (TR) probes have a roof angle
(transducer elements with inclined orientation toward
the test surface). This causes mode conversions both
at beam index (sound entry into the material) and at the
reflection from the backwall, which can result in very
jagged echoes.
V-path error
Dual-element (TR) probes produce a v-shaped sound

path from the pulser via the reflection from the backwall
to the receiver element. This so-called “V-path error”
affects the measuring accuracy. You should therefore
choose two wall thicknesses that cover the expected
thickness measurement range for the calibration. In this
way, the V-path error can be corrected to the greatest
possible extent.

Operation
Higher material velocity – Set the pulser and receiver functions according to
the probe used and the test application.
Due to the V-path error, a higher material velocity than
that of the test material is given during calibration, – Set the function TOF (function group MEAS) to
especially with small thicknesses. This is typical of flank.
dual-element (TR) probes and serves for compensation
of the V-path error. – Vary the gain so that the highest echo reaches
approximately the full screen height.
With small wall thicknesses, the above-described effect
leads to an echo amplitude drop which has to be – Set the gate threshold to the required height for
especially taken into account with thicknesses less measuring the sound paths at the echo flanks.
than 2 mm / 0.08”.
A stepped reference block having different wall thick-
– Enter the distances of the two calibration echoes in
nesses is required for calibration. The wall thicknesses
S-REF1 and S-REF2.
must be selected so that they cover the expected
readings. – Position the gate (function aSTART) on the first
calibration echo.
Calibration process:
We recommend to use the semiautomatic calibration
function for the calibration with T/R probes. – Couple the probe to the calibration block containing
the second calibration line, and set the height so that
– Set the required test range. it’s about as high as the first calibration echo.
– Increase the probe delay (P-DELAY) until the two – Move the gate to the second calibration echo.
calibration lines are displayed within the range.

Operation
Higher material velocity – Set the pulser and receiver functions according to
the probe used and the test application.
Due to the V-path error, a higher material velocity than
that of the test material is given during calibration, – Set the function TOF (function group MEAS) to
especially with small thicknesses. This is typical of flank.
dual-element (TR) probes and serves for compensation
of the V-path error. – Vary the gain so that the highest echo reaches
approximately the full screen height.
With small wall thicknesses, the above-described effect
leads to an echo amplitude drop which has to be – Set the gate threshold to the required height for
especially taken into account with thicknesses less measuring the sound paths at the echo flanks.
than 2 mm / 0.08”.
A stepped reference block having different wall thick-
– Enter the distances of the two calibration echoes in
nesses is required for calibration. The wall thicknesses
S-REF1 and S-REF2.
must be selected so that they cover the expected
readings. – Position the gate (function aSTART) on the first
calibration echo.
Calibration process:
We recommend to use the semiautomatic calibration
function for the calibration with T/R probes. – Couple the probe to the calibration block containing
the second calibration line, and set the height so that
– Set the required test range. it’s about as high as the first calibration echo.
– Increase the probe delay (P-DELAY) until the two – Move the gate to the second calibration echo.
calibration lines are displayed within the range.


„Calibration is done“. The material velocity and probe
delay are set. The value of the CAL function goes back
to 0.
– If necessary, check the calibration on one or several

known calibration lines, e.g. using the stepped
reference block VW.
H Note:
Always keep in mind that the measured value is
determined at the intersection point of gate and echo
flank when the function TOF was set to flank. A correct
setting of the echo height and gate threshold is there-
fore decisive for accurate calibration and measurement!
Calibrations or measurements in the peak mode are

mostly not possible when using dual-element (TR)
probes. As the echoes are often very broad and jagged,
a clear echo peak cannot always be found in these
cases.


„Calibration is done“. The material velocity and probe
delay are set. The value of the CAL function goes back
to 0.
– If necessary, check the calibration on one or several

known calibration lines, e.g. using the stepped
reference block VW.
H Note:
Always keep in mind that the measured value is
determined at the intersection point of gate and echo
flank when the function TOF was set to flank. A correct
setting of the echo height and gate threshold is there-
fore decisive for accurate calibration and measurement!
Calibrations or measurements in the peak mode are

mostly not possible when using dual-element (TR)
probes. As the echoes are often very broad and jagged,
a clear echo peak cannot always be found in these
cases.

Measuring
Operation
5.8 Measuring
General notes
Please pay attention to the following notes when
measuring with the USM 25.
• Condition for measurements is the correct instrument
calibration (sound velocity, probe delay).
• All amplitude measurements are carried out at the
highest signal in the gate. Gate threshold at 20 %
measured sound path: 24.44 mm
• All distance measurements are carried out at the
intersection point of gate and the first echo flank
(TOF = flank),
or at the peak of the highest echo (TOF = peak).
The following example shows the dependency of

distance measurement on the echo waveform, i.e. on
the height of the gate threshold and thus on the selec-
tion of the intersection point at the signal.
H Note:
The point of measurement is marked with a small Gate threshold at 80 %

triangle on the corresponding gate bar. measured sound path: 24.91 mm
Measuring
Operation
5.8 Measuring
General notes
Please pay attention to the following notes when
measuring with the USM 25.
• Condition for measurements is the correct instrument
calibration (sound velocity, probe delay).
• All amplitude measurements are carried out at the
highest signal in the gate. Gate threshold at 20 %
measured sound path: 24.44 mm
• All distance measurements are carried out at the
intersection point of gate and the first echo flank
(TOF = flank),
or at the peak of the highest echo (TOF = peak).
The following example shows the dependency of

distance measurement on the echo waveform, i.e. on
the height of the gate threshold and thus on the selec-
tion of the intersection point at the signal.
H Note:
The point of measurement is marked with a small Gate threshold at 80 %

triangle on the corresponding gate bar. measured sound path: 24.91 mm
Measurement of dB difference(function group REF) Operation
5.9 Measurement of dB difference H Note:
(function group REF) Depending on the instrument version used, the function
group DAC or DGS may also be displayed at this point.
Please also see chapter 5.14 General configuration.
You can evaluate reflector echoes by means of refer-
ence echoes. The function group REF makes all You will find the following function:
functions for the echo comparison between a reflector
echo and a reference echo available to you. REFECHO Storing or deleting the reference echo
– If necessary, change the operation level using the REFMOD Activating the measurement of
key E. dB difference
– Use u to select the function group REF. aSTART Positioning the A gate
The functions are described in the order in which you

need them during your work.
5.9 Measurement of dB difference H Note:
(function group REF) Depending on the instrument version used, the function
group DAC or DGS may also be displayed at this point.
Please also see chapter 5.14 General configuration.
You can evaluate reflector echoes by means of refer-
ence echoes. The function group REF makes all You will find the following function:
functions for the echo comparison between a reflector
echo and a reference echo available to you. REFECHO Storing or deleting the reference echo
– If necessary, change the operation level using the REFMOD Activating the measurement of
key E. dB difference
– Use u to select the function group REF. aSTART Positioning the A gate


Measurement of dB difference(function group REF)
Operation
Recording a reference echo The reference echo is now recorded. An inverted R is
shown in the measurement line.
Before using the measurement of dB difference, you
have to first record a reference echo.
A Attention:
When recording a reference echo, an already stored
reference echo is overwritten after a corresponding
warning.
– Peak the reference echo according to the test

specification.
– Position the A gate over the reference echo using

the function aSTART.
– Use v to select the function REFECHO.
– Turn the right-hand rotary knob upward in order to

store the echo in gate A as a reference echo.
– If necessary, confirm the warning message in order

to overwrite a stored reference echo.
Measurement of dB difference(function group REF)

Operation
Recording a reference echo The reference echo is now recorded. An inverted R is
shown in the measurement line.
Before using the measurement of dB difference, you
have to first record a reference echo.
A Attention:
When recording a reference echo, an already stored
reference echo is overwritten after a corresponding
warning.
– Peak the reference echo according to the test

specification.
– Position the A gate over the reference echo using

the function aSTART.
– Turn the right-hand rotary knob upward in order to

store the echo in gate A as a reference echo.

to overwrite a stored reference echo.

Deleting a reference echo – Use v to select the function REFMOD.
You can delete stored reference echoes. – Activate the function by means of the right-hand
rotary knob.
The dB difference between the reference echo and
– Turn the right-hand rotary knob downward in order to the reflector echo is now displayed as the measured
delete the reference echo. value.
to delete the stored reference echo.
Echo comparison
You can compare the echo of any reflector of your

choice with the reference echo. The displayed result is
the dB difference of the two echoes.
H Note:
The dB difference is independent of any possible gain
variation.
– Choose Ha dB or Hb dB as measured value.
– Position the A gate over the echo.

Deleting a reference echo – Use v to select the function REFMOD.
You can delete stored reference echoes. – Activate the function by means of the right-hand
rotary knob.
The dB difference between the reference echo and
– Turn the right-hand rotary knob downward in order to the reflector echo is now displayed as the measured
delete the reference echo. value.
to delete the stored reference echo.
Echo comparison
You can compare the echo of any reflector of your

choice with the reference echo. The displayed result is
the dB difference of the two echoes.
H Note:
The dB difference is independent of any possible gain
variation.
– Choose Ha dB or Hb dB as measured value.
– Position the A gate over the echo.

Calculation of flaw position (function group TRIG)
Operation
5.10 Calculation of flaw position depth of the flaw in addition to the sound path S, and to
digitally display them in the measurement line.
(function group TRIG)
• Projection distance PD:
In the function group TRIG you will find the functions for distance of probe index (sound exit point) from the
setting the flaw position calculation when using angle- position of the flaw, projected on the surface
beam probes.
• Reduced projection distance rPD:
– If necessary, use E to change the operating level. distance of the probe’s leading face from the position
of the flaw, projected on the surface
– Use u to select the function group TRIG.
• Depth d:
Distance between flaw position and surface
The functions in the group TRIG enable to automatically

calculate the (reduced) projection distance and the real

Operation
5.10 Calculation of flaw position depth of the flaw in addition to the sound path S, and to
digitally display them in the measurement line.
(function group TRIG)
• Projection distance PD:
In the function group TRIG you will find the functions for distance of probe index (sound exit point) from the
setting the flaw position calculation when using angle- position of the flaw, projected on the surface
beam probes.
• Reduced projection distance rPD:
– If necessary, use E to change the operating level. distance of the probe’s leading face from the position
of the flaw, projected on the surface
– Use u to select the function group TRIG.
• Depth d:
Distance between flaw position and surface
The functions in the group TRIG enable to automatically

calculate the (reduced) projection distance and the real

Calculation of flaw position (function group TRIG) Operation
When using angle-beam probes, the instrument can ANGLE (angle of incidence)
additionally calculate the sound path section or so-
called leg L up to the next reflection point. This sound The ANGLE function enables you to adjust the angle of
path section or leg can be displayed as the measured incidence of your probe for the material used. This
value La, Lb, or Lc. value is required for the automatic calculation of the
flaw position.
Adjustment range: 0° to 90°
Operation:
– Use v to select the ANGLE function, and then use

the right-hand rotary knob to select the required
setting.
X-VALUE (X-value of the probe)

The function X-VALUE enables you to set the X-value
(distance between the probe’s leading face and probe
index/sound exit point) of the probe used. This value is
required for the automatic calculation of the reduced
projection distance.
Adjustment range: 0 to 100 mm / 0 to 40 “
Calculation of flaw position (function group TRIG) Operation

When using angle-beam probes, the instrument can ANGLE (angle of incidence)
additionally calculate the sound path section or so-
called leg L up to the next reflection point. This sound The ANGLE function enables you to adjust the angle of
path section or leg can be displayed as the measured incidence of your probe for the material used. This
value La, Lb, or Lc. value is required for the automatic calculation of the
flaw position.
Adjustment range: 0° to 90°
Operation:
– Use v to select the ANGLE function, and then use

setting.
X-VALUE (X-value of the probe)

The function X-VALUE enables you to set the X-value
(distance between the probe’s leading face and probe
index/sound exit point) of the probe used. This value is
required for the automatic calculation of the reduced
projection distance.
Adjustment range: 0 to 100 mm / 0 to 40 “

Operation
Operation: DIAMET (outside diameter of the test
– Use v to select the function X-VALUE, and then
object)
use the right-hand rotary knob to set the required You will need the DIAMET function for tests on circular
value. curved surfaces, for example when testing longitudi-
nally welded tubes. In order to make the USM 25 carry
out the corresponding correction of (reduced) projection
distance and depth, you should enter the outside
THICKNE (material thickness) diameter of your test object in this function.
Use the THICKNE function to set the material’s wall Adjustment range: 10 to 2000 mm / 0.4 - 800 “
thickness. This value is required for the automatic
calculation of the real depth. If you plan to carry out the flaw position calculation for
plane-parallel (flat) test objects, the DIAMET function
Adjustment range: 1 to 1000 mm / 0.05 to 400 “ should be set to flat.
Operation: Operation:
– Use v to select the THICKNE function, and then – Use v to select the DIAMET function, and then use
use the right-hand rotary knob to set the required the right-hand rotary knob to set the required value.
value.

Operation
Operation: DIAMET (outside diameter of the test
– Use v to select the function X-VALUE, and then
object)
use the right-hand rotary knob to set the required You will need the DIAMET function for tests on circular
value. curved surfaces, for example when testing longitudi-
nally welded tubes. In order to make the USM 25 carry
out the corresponding correction of (reduced) projection
distance and depth, you should enter the outside
THICKNE (material thickness) diameter of your test object in this function.
Use the THICKNE function to set the material’s wall Adjustment range: 10 to 2000 mm / 0.4 - 800 “
thickness. This value is required for the automatic
calculation of the real depth. If you plan to carry out the flaw position calculation for
plane-parallel (flat) test objects, the DIAMET function
Adjustment range: 1 to 1000 mm / 0.05 to 400 “ should be set to flat.
Operation: Operation:
– Use v to select the THICKNE function, and then – Use v to select the DIAMET function, and then use
use the right-hand rotary knob to set the required the right-hand rotary knob to set the required value.
value.

Data saving (function group MEM) Operation
5.11 Data saving A data set contains all instrument settings as well as
the A-scan. This means that whenever you recall a
(function group MEM) stored data set, your instrument is again set up exactly
the same as it was at the moment when the data set
You will find all functions for storing, recalling and was stored. This makes each one of your tests repro-
deleting complete data sets in the function group MEM. ducible.
– If necessary, use E to change the operating level. You will find the following functions:
– Use u to select the function group MEM. SET-# selecting number of a data set
RECALL recalling a stored data set
STORE storing a data set
DELETE deleting a data set

5.11 Data saving A data set contains all instrument settings as well as
the A-scan. This means that whenever you recall a
(function group MEM) stored data set, your instrument is again set up exactly
the same as it was at the moment when the data set
You will find all functions for storing, recalling and was stored. This makes each one of your tests repro-
deleting complete data sets in the function group MEM. ducible.
– If necessary, use E to change the operating level. You will find the following functions:
– Use u to select the function group MEM. SET-# selecting number of a data set
RECALL recalling a stored data set
STORE storing a data set
DELETE deleting a data set


Data saving (function group MEM)
Operation
Storing a data set Deleting a data set
You can save your current setup to a data set. An occupied data set is marked with an asterisk (*)
before the data set number. You can delete these data
Operation: sets if you no longer need them.
– Use v to select the function SET-# and then use the Operation:
right-hand rotary knob to set the number where you
would want to store the current data set (1 to 100). – Use v to select the function SET-# and then use the
right-hand rotary knob to set the number of the data
– Use v to select the function STORE and use the set that you want to delete.
right-hand rotary knob to set it to on.
– Use v to select the function DELETE and use the
The USM 25 stores the current data set. When the right-hand rotary knob to set it to on.
storage process is completed, the function STORE is
automatically reset to off. The measurement line will then prompt:
Delete data set?
H Note:
– Confirm by pressing the v key of the function
The asterisk (*) before a selected data set number DELETE one more time (all other keys would abort
indicates that this data set is already occupied. It is not the process).
possible to overwrite an occupied data set; selet
another data set which is still empty, or delete the The data set is now deleted; the asterisk preceding
occupied data set. the data set number is no longer there. The function
DELETE is automatically reset to off.
All active entries in the information table (TESTINF) are
automatically allocated to the data set being stored.
Data saving (function group MEM)

Operation
Storing a data set Deleting a data set
You can save your current setup to a data set. An occupied data set is marked with an asterisk (*)
before the data set number. You can delete these data
Operation: sets if you no longer need them.
– Use v to select the function SET-# and then use the Operation:
right-hand rotary knob to set the number where you
would want to store the current data set (1 to 100). – Use v to select the function SET-# and then use the
– Use v to select the function STORE and use the set that you want to delete.
right-hand rotary knob to set it to on.
– Use v to select the function DELETE and use the
The USM 25 stores the current data set. When the right-hand rotary knob to set it to on.
storage process is completed, the function STORE is
automatically reset to off. The measurement line will then prompt:
Delete data set?
H Note:
The asterisk (*) before a selected data set number DELETE one more time (all other keys would abort
indicates that this data set is already occupied. It is not the process).
possible to overwrite an occupied data set; selet
another data set which is still empty, or delete the The data set is now deleted; the asterisk preceding
occupied data set. the data set number is no longer there. The function
DELETE is automatically reset to off.
All active entries in the information table (TESTINF) are
automatically allocated to the data set being stored.

Recalling a stored data set The data set is now loaded and the current setup is
overwritten. When the loading process is completed,
You can recall a stored data set; your instrument will the function RECALL is automatically reset to off.
then be provided with all the test-relevant technical
features that existed at the moment of the setup. A
H Note:
frozen display of the stored A-scan appears.
The gate for surveying the echo can be moved in the
Operation: recalled A-scan. However, as the evaluation is made in
the frozen A-scan, the measurement resolution is only
– Use v to select the function SET-# and then use the 0.5 % of the adjusted calibration range.
set that you want to recall.
– Use v to select the function RECALL and then use

the right-hand rotary knob to set it to on.
The measurement line will then prompt:

Recall data set?
A Attention:
Please observe this safety prompt as the current setup
is overwritten if a stored data set is loaded.

RECALL one more time (all other keys would abort
the process).

Recalling a stored data set The data set is now loaded and the current setup is
overwritten. When the loading process is completed,
You can recall a stored data set; your instrument will the function RECALL is automatically reset to off.
then be provided with all the test-relevant technical
features that existed at the moment of the setup. A
H Note:
frozen display of the stored A-scan appears.
The gate for surveying the echo can be moved in the
Operation: recalled A-scan. However, as the evaluation is made in
the frozen A-scan, the measurement resolution is only
– Use v to select the function SET-# and then use the 0.5 % of the adjusted calibration range.
set that you want to recall.
– Use v to select the function RECALL and then use

the right-hand rotary knob to set it to on.
The measurement line will then prompt:

Recall data set?
A Attention:
Please observe this safety prompt as the current setup
is overwritten if a stored data set is loaded.

RECALL one more time (all other keys would abort
the process).
Dataset management (function group DATA)
Operation
5.12 Dataset management The following functions are available:
(function group DATA) TESTINF You can save a lot of additional
information for every data set, e.g. data on
The USM 25 offers comprehensive functions for an the test object, on the flaw detected, or
easy dataset management. comments.
– If necessary, use E to change the operating level. PREVIEW In this dataset preview you will see the
A-scan, the dataset name and the storage
– Use u to select the function group DATA. date of each data set.
DIR This function enables you to display a list

of all stored data sets, including the
corresponding dataset names.
SETTING This is where you will see a list of

functions including all settings of the
current data set.
The functions in the function group DATA enable you to

easily manage the data sets stored in the USM 25.

Operation
5.12 Dataset management The following functions are available:
(function group DATA) TESTINF You can save a lot of additional
information for every data set, e.g. data on
The USM 25 offers comprehensive functions for an the test object, on the flaw detected, or
easy dataset management. comments.
– If necessary, use E to change the operating level. PREVIEW In this dataset preview you will see the
A-scan, the dataset name and the storage
– Use u to select the function group DATA. date of each data set.
DIR This function enables you to display a list

of all stored data sets, including the
corresponding dataset names.
SETTING This is where you will see a list of

functions including all settings of the
current data set.
The functions in the function group DATA enable you to

easily manage the data sets stored in the USM 25.

Dataset management (function group DATA) Operation
TESTINF (storing additional information) You can
For every data set, you can store additional information • save the current settings - together with the edited
which will support you in the easy management of the additional information - at a new and still empty
data sets. You have 9 fields at your disposal for this dataset number (analogously to function STORE in
purpose. the function group MEM),
You can enter a maximum of 24 alphanumeric charac- • subsequently enter and save additional information
ters in the following fields: for an already stored data set,
DATNAME Dataset name • overwrite the already saved additional information of

a data set.
OBJECT Object description
FLAWIND Flaw indication Operation:
OPERAT Name of the person carrying out the test – Use u to select the function group DATA.
SURFACE Surface quality – Use v to select the function TESTINF. The table will
now show the additional information saved for the
COMMENT Comments currently selected data set (please see field SET-#).
You can enter numerical values in these fields: – Use u (INFO 3) and v to select the field SET-#.
You can now use the right-hand rotary knob to view
FLAWLEN Flaw length the additional information for other data sets and to
edit this information if required.
X-POS x-position coordinate
Y-POS y-position coordinate


TESTINF (storing additional information) You can
For every data set, you can store additional information • save the current settings - together with the edited
which will support you in the easy management of the additional information - at a new and still empty
data sets. You have 9 fields at your disposal for this dataset number (analogously to function STORE in
purpose. the function group MEM),
You can enter a maximum of 24 alphanumeric charac- • subsequently enter and save additional information
ters in the following fields: for an already stored data set,
DATNAME Dataset name • overwrite the already saved additional information of

a data set.
OBJECT Object description
FLAWIND Flaw indication Operation:
OPERAT Name of the person carrying out the test – Use u to select the function group DATA.
SURFACE Surface quality – Use v to select the function TESTINF. The table will
now show the additional information saved for the
COMMENT Comments currently selected data set (please see field SET-#).
You can enter numerical values in these fields: – Use u (INFO 3) and v to select the field SET-#.
You can now use the right-hand rotary knob to view
FLAWLEN Flaw length the additional information for other data sets and to
edit this information if required.
X-POS x-position coordinate
Y-POS y-position coordinate

Operation
transferred. However, the data in the numerical fields
FLAWLEN, X-POS and Y-POS are deleted. This means
that you only have to edit the variable fields in test
applications which include continuous saving of results.
All alphanumerical field data are automatically trans-
ferred but can also be edited if necessary.
A Attention:
As long as the field data edited in this table have not
been saved, the previous entries remain valid. Please
keep this in mind, e.g. before selecting a new dataset
number: all changes in the current data set are lost!
– Use u and v to select the required field.
Editing additional information – Use the left-hand rotary knob to mark the required
character position.
– Use u (INFO 3) and v to select the field SET-#, and
then use the right-hand rotary knob to select the – Use the right-hand rotary knob to select the
required data set. character for this position. You only need the right-
hand rotary knob to enter the numerical values in
All stored data are displayed for data sets which are FLAWLEN, X-POS and Y-POS.
already occupied.
If you have selected an empty data set, the field data

of the previously displayed data set are automatically

Operation
transferred. However, the data in the numerical fields
FLAWLEN, X-POS and Y-POS are deleted. This means
that you only have to edit the variable fields in test
applications which include continuous saving of results.
All alphanumerical field data are automatically trans-
ferred but can also be edited if necessary.
A Attention:
As long as the field data edited in this table have not
been saved, the previous entries remain valid. Please
keep this in mind, e.g. before selecting a new dataset
number: all changes in the current data set are lost!
– Use u and v to select the required field.
Editing additional information – Use the left-hand rotary knob to mark the required
character position.
– Use u (INFO 3) and v to select the field SET-#, and
then use the right-hand rotary knob to select the – Use the right-hand rotary knob to select the
required data set. character for this position. You only need the right-
hand rotary knob to enter the numerical values in
All stored data are displayed for data sets which are FLAWLEN, X-POS and Y-POS.
already occupied.
If you have selected an empty data set, the field data

of the previously displayed data set are automatically
H Note: The function STO-INF is automatically reset to off at
the end of data storage.
You cannot edit the field SET-#. The number of the
current data set is displayed here. – If necessary, press one of the keys V, W or X to
go back to the A-scan without storing the data.
Storing additional information

PREVIEW (dataset preview)
– Use u and v to highlight the field STO-INF, and
then use the right-hand rotary knob to set this This function enables you to view the A-scans of all
function on. The currently displayed data of the stored data sets.
fields are now stored as follows:
Only the edited field data are stored for the previously Operation:
occupied data sets.
– Use v to select the PREVIEW function, and then
use the right-hand rotary knob to set the function to
A Attention: on. The A-scan and the name of the first data set
are displayed.
If you have edited already existing additional informa-
tion, all previous additional information is overwritten Viewing other data sets:
when the data are stored.
– Use v to to select the SET-# function, and then use
In the case of previously empty data sets, all instru- the right-hand rotary knob to select the number of the
ment settings and the current A-scan are stored simul- required data set.
taneously with the edited field data.

H Note: The function STO-INF is automatically reset to off at
the end of data storage.
You cannot edit the field SET-#. The number of the
current data set is displayed here. – If necessary, press one of the keys V, W or X to
go back to the A-scan without storing the data.
Storing additional information

PREVIEW (dataset preview)
– Use u and v to highlight the field STO-INF, and
then use the right-hand rotary knob to set this This function enables you to view the A-scans of all
function on. The currently displayed data of the stored data sets.
fields are now stored as follows:
Only the edited field data are stored for the previously Operation:
occupied data sets.
– Use v to select the PREVIEW function, and then
A Attention: on. The A-scan and the name of the first data set
are displayed.
If you have edited already existing additional informa-
tion, all previous additional information is overwritten Viewing other data sets:
when the data are stored.
– Use v to to select the SET-# function, and then use
In the case of previously empty data sets, all instru- the right-hand rotary knob to select the number of the
ment settings and the current A-scan are stored simul- required data set.
taneously with the edited field data.

Operation
– Use v to to select the RECALL function, and then – Turn the right-hand rotary knob to have other data
use the right-hand rotary knob to set the function to sets displayed. The list always advances by one line
on. The selected data set is displayed. each.
– If necessary, press one of the keys V, W or X to – If necessary, press one of the keys V, W or X to
go back to the currently active A-scan. go back to the currently active A-scan.
DIR (dataset directory) SETTING (function list)

This function enables you to get an overview of all This function provides you with an overview of all set
stored data sets, including their names and numbers. functions of the current data set.
Operation:
Operation:
– Use v to to select the SETTING function, and then
– Use v to to select the DIR function, and then use
the right-hand rotary knob to set the function to on.
on.
The directory list of the stored data sets is displayed
The list of the currently set functions is displayed.
(dataset numbers and names). The display shows 12
data sets at a time. An occupied data set is marked – Turn the right-hand rotary knob to have other lines
with an asterisk (*) before the data set number. displayed. The list is advanced by one line each.
– If necessary, press one of the keys V, W or X to

go back to the currently active A-scan.

Operation
– Use v to to select the RECALL function, and then – Turn the right-hand rotary knob to have other data
use the right-hand rotary knob to set the function to sets displayed. The list always advances by one line
on. The selected data set is displayed. each.
– If necessary, press one of the keys V, W or X to – If necessary, press one of the keys V, W or X to
go back to the currently active A-scan. go back to the currently active A-scan.
DIR (dataset directory) SETTING (function list)

This function enables you to get an overview of all This function provides you with an overview of all set
stored data sets, including their names and numbers. functions of the current data set.
Operation:
Operation:
– Use v to to select the SETTING function, and then
– Use v to to select the DIR function, and then use
the right-hand rotary knob to set the function to on.
on.
The directory list of the stored data sets is displayed
The list of the currently set functions is displayed.
(dataset numbers and names). The display shows 12
data sets at a time. An occupied data set is marked – Turn the right-hand rotary knob to have other lines
with an asterisk (*) before the data set number. displayed. The list is advanced by one line each.
– If necessary, press one of the keys V, W or X to

go back to the currently active A-scan.

Configuring the USM 25 for a test application Operation
5.13 Configuring the USM 25 for a – If necessary, use E to change the operating level.
test application – Use u to select the function group MEAS.
Besides the default settings for the instrument opera-

tion, you have to configure the USM 25 for calibration
and test tasks. You will find the corresponding func-
tions in the function groups MEAS, MSEL and LCD.
In addition, you have to check the current time and

date, and set them if required, so that they are correctly
stored together with the test results. Please look up the
function groups CFG1 and CFG2 for more functions for
the general instrument setup (please refer to chapter
5.14 General configuration).
5.13 Configuring the USM 25 for a – If necessary, use E to change the operating level.
test application – Use u to select the function group MEAS.
Besides the default settings for the instrument opera-

tion, you have to configure the USM 25 for calibration
and test tasks. You will find the corresponding func-
tions in the function groups MEAS, MSEL and LCD.
In addition, you have to check the current time and

date, and set them if required, so that they are correctly
stored together with the test results. Please look up the
function groups CFG1 and CFG2 for more functions for
the general instrument setup (please refer to chapter
5.14 General configuration).

Configuring the USM 25 for a test application
Operation
TOF (selecting the measuring point) S-DISP (zoomed display of reading)
The sound path measurement in the calibration process You can have a selected reading zoomed in the A-scan
or in the subsequent echo evaluation process depends on display. The following readings can be selected for the
the selected measuring point which can be adjusted zoomed display (in the second column the indication of
either to flank or to peak in the USM 25. In principle, the the readings in the measurement line, see. page 5-45):
peak measurement should be preferred because the
measured distances do not depend on the echo height in
H Note:
that case. However, there are application cases in which
the flank measurement is either specified, or it must be If you use the Data Logger option, values for the C gate
applied for technical reasons, e.g. in many tests using as well as a few special values for the Data Logger are
dual-element (TR) probes. added to the existing ones, see chapter Option Data
The point of measurement is marked by a small triangle Logger.
on the corresponding gate bar. Sa Sa Sound path for gate A
Sb Sb Sound path for gate B
A Attention: Sb-a S’ Difference of single measurements for
In any case, the adjustment of the measuring point for sound path gate B - gate A
calibration and for the subsequent test use must Ha % Ha Echo height gate A in % screen height
always be identical. Otherwise measurement errors Hb % Hb Echo height gate B in % screen height
may occur.
Ha dB ha Echo height gate A in dB
Operation: Hb dB hb Echo height gate B in dB
R-start Rs Range start
– Use v to select the TOF function, and then use the
R-end Re Range end
right-hand rotary knob to select the required setting.

Operation
TOF (selecting the measuring point) S-DISP (zoomed display of reading)
The sound path measurement in the calibration process You can have a selected reading zoomed in the A-scan
or in the subsequent echo evaluation process depends on display. The following readings can be selected for the
the selected measuring point which can be adjusted zoomed display (in the second column the indication of
either to flank or to peak in the USM 25. In principle, the the readings in the measurement line, see. page 5-45):
peak measurement should be preferred because the
measured distances do not depend on the echo height in
H Note:
that case. However, there are application cases in which
the flank measurement is either specified, or it must be If you use the Data Logger option, values for the C gate
applied for technical reasons, e.g. in many tests using as well as a few special values for the Data Logger are
dual-element (TR) probes. added to the existing ones, see chapter Option Data
The point of measurement is marked by a small triangle Logger.
on the corresponding gate bar. Sa Sa Sound path for gate A
Sb Sb Sound path for gate B
A Attention: Sb-a S’ Difference of single measurements for
In any case, the adjustment of the measuring point for sound path gate B - gate A
calibration and for the subsequent test use must Ha % Ha Echo height gate A in % screen height
always be identical. Otherwise measurement errors Hb % Hb Echo height gate B in % screen height
may occur.
Ha dB ha Echo height gate A in dB
Operation: Hb dB hb Echo height gate B in dB
R-start Rs Range start
– Use v to select the TOF function, and then use the
R-end Re Range end
La La Number of legs in gate A General:
Lb Lb Number of legs in gate B Alarm Al Choice of gates for alarm triggering:
Lc Lc Number of legs in gate C Gate A, B or A+B
Only for flaw position calculation:
Operation:
Da Da Depth for gate A
– Use v to select the function S-DISP, and then use
Db Db Depth for gate B
Pa Pa Projection distance for gate A value for the zoomed display.
Pb Pb Projection distance for gate B
Ra Ra Reduced projection distance for gate A H Note:
Rb Rb Reduced projection distance for gate B You can likewise configure all readings to be displayed
Only for DGS: below the A-scan at the four corresponding positions.
Please refer to Configuring the measurement line, page
ERS ER Equivalent reflector size 5-45, on this subject.
Gt dB Gt DGS test sensitivity
Only for DGS and DAC:
Ha %crv Ca Echo height gate A in % referred to curve
Hb %crv Cb Echo height gate B in % referred to curve
DGS-Crv Dc Diameter of the DGS curve

La La Number of legs in gate A General:
Lb Lb Number of legs in gate B Alarm Al Choice of gates for alarm triggering:
Lc Lc Number of legs in gate C Gate A, B or A+B
Only for flaw position calculation:
Operation:
Da Da Depth for gate A
– Use v to select the function S-DISP, and then use
Db Db Depth for gate B
Pa Pa Projection distance for gate A value for the zoomed display.
Pb Pb Projection distance for gate B
Ra Ra Reduced projection distance for gate A H Note:
Rb Rb Reduced projection distance for gate B You can likewise configure all readings to be displayed
Only for DGS: below the A-scan at the four corresponding positions.
Please refer to Configuring the measurement line, page
ERS ER Equivalent reflector size 5-45, on this subject.
Gt dB Gt DGS test sensitivity
Only for DGS and DAC:
Ha %crv Ca Echo height gate A in % referred to curve
Hb %crv Cb Echo height gate B in % referred to curve
DGS-Crv Dc Diameter of the DGS curve

Operation
MAGNIFY (gate spreading) • compare (A-scan comparison)
You can compare a current echo display with a
The setting of the MAGNIFY function causes a spreading stored one. The display last stored using W – either
of the gate over the entire display width. You can choose from the current application or from a stored data set
the gate to be used for the Magnify function. – is displayed in the background as a dotted line.
H Note:
Operation:
Read chapter 5.11 to learn how to load a saved data
– Use v to select the function MAGNIFY. set. As a restored data set is displayed with a frozen
A-scan, press the W key first.
– Use the right-hand rotary knob to set the function to
aGATE or bGATE if you want to spread the range of • envelop (echo dynamics)
gate A or B over the entire display range. The echo envelope is shown as a dotted line
additionally to the A-scan.
• peak b (maximum display)

A-Scan (setting the A-scan) You can use this function to record and document
(as well as to save if required) the peaked, maximum
This function offers you several options for setting your echo display.
A-scan. With the B gate active, the A-scan with the highest
echo amplitude (recording of maximum display) is
• stndard
shown as a dotted line additionally to the „live“ A-
Normal A-scan setting.
scan when peaking an echo display (in B gate).
The Y key effects a static freeze.
This A-scan becomes the statically frozen A-scan by
pressing the W key, and it can then be evaluated
accordingly.

Operation
MAGNIFY (gate spreading) • compare (A-scan comparison)
You can compare a current echo display with a
The setting of the MAGNIFY function causes a spreading stored one. The display last stored using W – either
of the gate over the entire display width. You can choose from the current application or from a stored data set
the gate to be used for the Magnify function. – is displayed in the background as a dotted line.
H Note:
Operation:
Read chapter 5.11 to learn how to load a saved data
– Use v to select the function MAGNIFY. set. As a restored data set is displayed with a frozen
A-scan, press the W key first.
aGATE or bGATE if you want to spread the range of • envelop (echo dynamics)
gate A or B over the entire display range. The echo envelope is shown as a dotted line
additionally to the A-scan.
• peak b (maximum display)

A-Scan (setting the A-scan) You can use this function to record and document
(as well as to save if required) the peaked, maximum
This function offers you several options for setting your echo display.
A-scan. With the B gate active, the A-scan with the highest
echo amplitude (recording of maximum display) is
• stndard
shown as a dotted line additionally to the „live“ A-
Normal A-scan setting.
scan when peaking an echo display (in B gate).
The Y key effects a static freeze.
This A-scan becomes the statically frozen A-scan by
pressing the W key, and it can then be evaluated
accordingly.

• afreeze / bfreeze (automatic freeze) Configuring the measurement line
Whenever you select this function, an echo display
connected with the A or B gate will automatically The configuration of your measurement line is carried
switch over to A-scan freeze (automatic freeze). This out in the function group MSEL, this means that you
setting is especially well suited e.g. for high- can choose the reading for one of the four possible
temperature measurements, for measurements positions of the measurement line for direct measured-
involving difficult coupling conditions, or for spot value display during the test.
weld testing.
– If necessary, use E to change the operating level.
H Note:
– Use u to select the function group MSEL.
If you are using a Data Logger option, you also have
the function cfreeze (for C gate) at your disposal.
Operation:
– Use v to select the function A-SCAN.
– Use the right-hand rotary knob to choose the required

setting.
– Pay attention to the additional information referring to

the corresponding setting options (see preceeding Functions of the function group MSEL:
page).
MEAS-P1 MEAS-P2 MEAS-P3 MEAS-P4
Measured values at positions 1 to 4

• afreeze / bfreeze (automatic freeze) Configuring the measurement line
Whenever you select this function, an echo display
connected with the A or B gate will automatically The configuration of your measurement line is carried
switch over to A-scan freeze (automatic freeze). This out in the function group MSEL, this means that you
setting is especially well suited e.g. for high- can choose the reading for one of the four possible
temperature measurements, for measurements positions of the measurement line for direct measured-
involving difficult coupling conditions, or for spot value display during the test.
weld testing.
H Note:
– Use u to select the function group MSEL.
If you are using a Data Logger option, you also have
the function cfreeze (for C gate) at your disposal.
Operation:
– Use v to select the function A-SCAN.

setting.
– Pay attention to the additional information referring to

the corresponding setting options (see preceeding Functions of the function group MSEL:
page).
MEAS-P1 MEAS-P2 MEAS-P3 MEAS-P4
Measured values at positions 1 to 4
Operation
All measured values which have also been described Setting the display
for the zoomed display of the function S-DISP (please
refer to page 5-42) are availabe to you at each position. In the function group LCD, you will find setting options
for the display screen itself and for the echo display.
Operation: – If necessary, use E to change the operating level.
– Use v to select the function MEAS-P1 to MEAS-P4. – Use u to select the function group LCD.
– Use the right-hand rotary knob to set the required
measured value for each position in the correspond-
ing function.
H Note:
As an alternative, you can display a scale in the
measurement line (ref. function SCALE).

Operation
All measured values which have also been described Setting the display
for the zoomed display of the function S-DISP (please
refer to page 5-42) are availabe to you at each position. In the function group LCD, you will find setting options
for the display screen itself and for the echo display.
Operation: – If necessary, use E to change the operating level.
– Use v to select the function MEAS-P1 to MEAS-P4. – Use u to select the function group LCD.
measured value for each position in the correspond-
ing function.
H Note:
As an alternative, you can display a scale in the
measurement line (ref. function SCALE).

FILLED (Echo display mode) LIGHT (LCD backlight)
The function FILLED toggles between the filled and the In this function you can switch the backlight for the
normal echo display mode. The filled echo display display on or off.
mode improves the echo perceptibility due to the strong
contrast, especially in cases where workpieces are
H Note:
scanned more quickly.
The operating time is reduced by 25 to 30 % with the
Operation: backlight switched on in battery operation! You should
therefore make sure that the light is always switched
– Use v to select the function FILLED. off when not needed.

Operation:
on or off.
– Use v to select the function LIGHT.
H Note:
– Use the right-hand rotary knob to set the backlight
With the setting FILLED = on the A-scan refresh rate to on or off.
is considerably reduced.
H Note:
In addition, the LCD backlight can be switched on and
off by simultaneously pressing the two function group
keys u + u on the left.

FILLED (Echo display mode) LIGHT (LCD backlight)
The function FILLED toggles between the filled and the In this function you can switch the backlight for the
normal echo display mode. The filled echo display display on or off.
mode improves the echo perceptibility due to the strong
contrast, especially in cases where workpieces are
H Note:
scanned more quickly.
The operating time is reduced by 25 to 30 % with the
Operation: backlight switched on in battery operation! You should
therefore make sure that the light is always switched
– Use v to select the function FILLED. off when not needed.

Operation:
on or off.
– Use v to select the function LIGHT.
H Note:
– Use the right-hand rotary knob to set the backlight
With the setting FILLED = on the A-scan refresh rate to on or off.
is considerably reduced.
H Note:
In addition, the LCD backlight can be switched on and
off by simultaneously pressing the two function group
keys u + u on the left.

Operation
CONTR (LCD contrast) SCALE
(configuring the measurement line)
You can adjust the LCD contrast in this function.
As an alternative to the measured values, the USM 25
An adjustment range from 0 to 100 is available; try and
enables to display a scale in the measurement line.
find out your favorite setting.
The scale gives you an overview of the position of
echoes. You have a choice between a dimensionless
Operation: ten-division scale and a scale showing the real position
of the echoes.
– Use v to select the function CONTR.
The following settings are possible:
– Use the right-hand rotary knob to adjust the required
contrast. • measval Display of measured values
• snd-pth Display of sound path scale

H Note:
The ambient temperature affects the contrast of the • div. Display of a dimensionless scale
LCD screen. It may therefore become necessary to
adjust the contrast in case of strong temperature Operation:
variations. In order to set the contrast to another value
directly during switch-on, press one of the five function – Use v to select the function SCALE.
group keys u while pressing the switch-on key U: – Use the right-hand rotary knob to set the required
CONTR = 10 30 5o 70 90 display mode.
u u u u u

Operation
CONTR (LCD contrast) SCALE
(configuring the measurement line)
You can adjust the LCD contrast in this function.
As an alternative to the measured values, the USM 25
An adjustment range from 0 to 100 is available; try and
enables to display a scale in the measurement line.
find out your favorite setting.
The scale gives you an overview of the position of
echoes. You have a choice between a dimensionless
Operation: ten-division scale and a scale showing the real position
of the echoes.
– Use v to select the function CONTR.
The following settings are possible:
– Use the right-hand rotary knob to adjust the required
contrast. • measval Display of measured values
• snd-pth Display of sound path scale

H Note:
The ambient temperature affects the contrast of the • div. Display of a dimensionless scale
LCD screen. It may therefore become necessary to
adjust the contrast in case of strong temperature Operation:
variations. In order to set the contrast to another value
directly during switch-on, press one of the five function – Use v to select the function SCALE.
group keys u while pressing the switch-on key U: – Use the right-hand rotary knob to set the required
CONTR = 10 30 5o 70 90 display mode.
u u u u u

General configuration Operation
5.14 General configuration H Note:

Double assignment of the function EVAMOD / ANAMOD.
More functions for the basic configuration of the USM 25 For operation (changeover), please see the operation
may be found in the function groups CFG1 and CFG2. of the corresponding function.
– Use u to select the function group CFG1 or CFG2.

UNIT (Selecting units of measurement)
You can choose the required units between mm or inch
in the function UNIT.
Operation:
– Use v to select the function UNIT.
– Use the right-hand rotary knob to select the required

unit.
Functions of CFG1 CFG2: A Attention:

Unit Time You should always make your decision on the units
Dialog language Date immediately when starting to work with the USM 25. If
Printer selection Horn you change the unit, all current settings are deleted,
Assignment of the Y key Evaluation mode/ and the basic setup is loaded.
analog output
5.14 General configuration H Note:

Double assignment of the function EVAMOD / ANAMOD.
More functions for the basic configuration of the USM 25 For operation (changeover), please see the operation
may be found in the function groups CFG1 and CFG2. of the corresponding function.
– Use u to select the function group CFG1 or CFG2.

UNIT (Selecting units of measurement)
You can choose the required units between mm or inch
in the function UNIT.
Operation:
– Use v to select the function UNIT.
– Use the right-hand rotary knob to select the required

unit.
Functions of CFG1 CFG2: A Attention:

Unit Time You should always make your decision on the units
Dialog language Date immediately when starting to work with the USM 25. If
Printer selection Horn you change the unit, all current settings are deleted,
Assignment of the Y key Evaluation mode/ and the basic setup is loaded.
analog output

General configuration
Operation
To avoid any accidental deleting of values, the mea- • Spanish • Danish
surement line will display a safety prompt: • Portuguese • Hungarian
• Dutch • Croatian
Change unit?
• Swedish • Russian
– If you are sure that you want to change the unit of • Slovakian • Norwegian
measurement, press the corresponding v key of • Polish
the function UNIT (any other key would abort the
process). H Note:
The unit of measurement is now changed; the current More dialog languages can be added on request.
data are deleted.
Operation:
– Use v to select the function DIALOG.

DIALOG (Selecting the language) – Use the right-hand rotary knob to select the required
language.
In this function you can select the language for dis-
playing the function names on the screen and for the
test report.
The following languages are available:

• German • Slovenian
• English (default setting) • Romanian
• French • Finnish
• Italian • Czech
Operation
To avoid any accidental deleting of values, the mea- • Spanish • Danish
surement line will display a safety prompt: • Portuguese • Hungarian
• Dutch • Croatian
Change unit?
• Swedish • Russian
– If you are sure that you want to change the unit of • Slovakian • Norwegian
measurement, press the corresponding v key of • Polish
the function UNIT (any other key would abort the
process). H Note:
The unit of measurement is now changed; the current More dialog languages can be added on request.
data are deleted.
Operation:
– Use v to select the function DIALOG.

DIALOG (Selecting the language) – Use the right-hand rotary knob to select the required
language.
In this function you can select the language for dis-
playing the function names on the screen and for the
test report.
The following languages are available:

• German • Slovenian
• English (default setting) • Romanian
• French • Finnish
• Italian • Czech

PRINTER (Printer for test report) COPYMOD (assignment of the Y key)
In this function you can select the connected printer for When the Y key is pressed, data are output to the
printing out your test report. RS232 interface and transferred to a printer or a PC.
You have a choice between the following printer types: You can use the function COPYMOD to choose the
data to be transferred when the Y key is pressed. You
• Epson have the following setting options:
• HP LaserJet • hardcpy
Hardcopy of the screen contents
• HP DeskJet
• report
• Seiko DPU-41x
Test report with A-scan, all relevant settings for the
inspection and space for hand-written remarks
Operation:
• meas P1
– Use v to select the function PRINTER and then use The measured value given at position 1 in the
the right-hand rotary knob to select the required measurement line
printer.
• pardump
H Note: All instrument functions with the current settings
For more details on the how to print out a test report, • PCX
please refer to chapter 6 Documentation. Screen contents as a PCX-format file. To transfer
the data to the PC, you will need a terminal program.

PRINTER (Printer for test report) COPYMOD (assignment of the Y key)
In this function you can select the connected printer for When the Y key is pressed, data are output to the
printing out your test report. RS232 interface and transferred to a printer or a PC.
You have a choice between the following printer types: You can use the function COPYMOD to choose the
data to be transferred when the Y key is pressed. You
• Epson have the following setting options:
• HP LaserJet • hardcpy
Hardcopy of the screen contents
• HP DeskJet
• report
• Seiko DPU-41x
Test report with A-scan, all relevant settings for the
inspection and space for hand-written remarks
Operation:
• meas P1
– Use v to select the function PRINTER and then use The measured value given at position 1 in the
the right-hand rotary knob to select the required measurement line
printer.
• pardump
H Note: All instrument functions with the current settings
For more details on the how to print out a test report, • PCX
please refer to chapter 6 Documentation. Screen contents as a PCX-format file. To transfer
the data to the PC, you will need a terminal program.

Operation
• store TIME / DATE (setting the time and date)
The current instrument setting is stored to the
selected (free) data set, and the data set number You have to check the current date and time and, if
(DAT-#) is automatically increased. required, set them so that these data are correctly
saved together with the test results.
• datalog (only with Data Logger option)
The selected job is printed out as a report including
all measured values.
A Attention:
Always make sure that you are using correctly set
• off time and date values. Otherwise test results might be
The Y key is deactivated. corrupted. Be aware that the USM 25 displays the year
• special as a two digit number!
as setting „hardopy“. After printout of the screen
contents no form feed, every press on the Y key Operation:
prints out the next hardcopy on the same page (three
– Use v to select the function TIME.
or four hardcopies depending on the printer).
– Use the left-hand rotary knob to highlight the value
H Note:
that you want to change, e.g. the hour.
Please also refer to chapter 6 Documentation.
– Use the right-hand rotary knob to change the
Operation: highlighted value.
– Use v to select the function COPYMOD. – Use v to select the function DATE, and then use the
assignment for the Y key.
Operation
• store TIME / DATE (setting the time and date)
The current instrument setting is stored to the
selected (free) data set, and the data set number You have to check the current date and time and, if
(DAT-#) is automatically increased. required, set them so that these data are correctly
saved together with the test results.
• datalog (only with Data Logger option)
The selected job is printed out as a report including
all measured values.
A Attention:
Always make sure that you are using correctly set
• off time and date values. Otherwise test results might be
The Y key is deactivated. corrupted. Be aware that the USM 25 displays the year
• special as a two digit number!
as setting „hardopy“. After printout of the screen
contents no form feed, every press on the Y key Operation:
prints out the next hardcopy on the same page (three
– Use v to select the function TIME.
or four hardcopies depending on the printer).
– Use the left-hand rotary knob to highlight the value
H Note:
that you want to change, e.g. the hour.
Please also refer to chapter 6 Documentation.
– Use the right-hand rotary knob to change the
Operation: highlighted value.
– Use v to select the function COPYMOD. – Use v to select the function DATE, and then use the
assignment for the Y key.
– Use the left-hand rotary knob to highlight the value in instrument operation occuring when the instrumet is
that you want to change, e.g. the day. used, i.e. when function parameters are changed.
– Use the right-hand rotary knob to change the tion (setting of functions) are to be ignored.
highlighted value.
ANAMOD
HORN
You can output results of measurements at the analog
In this function, you can decide whether or not an output for external further processing. Use the function
acoustic alarm should be given in addition to the visual ANAMOD to configure the analog output in case there
alarm (LED A). is no echo in the evaluation gate and the analog voltage
has been selected for the sound path at the output.
Operation:
You have the following setting options:
– Use v to select the function HORN.
• lo volt
– Use the left-hand rotary knob to set the horn to on or The analog output supplies 0 volt.
off.
• hi volt
The analog output supplies 5 volts.
H Note:

– Use the left-hand rotary knob to highlight the value in instrument operation occuring when the instrumet is
that you want to change, e.g. the day. used, i.e. when function parameters are changed.
– Use the right-hand rotary knob to change the tion (setting of functions) are to be ignored.
highlighted value.
ANAMOD
HORN
You can output results of measurements at the analog
In this function, you can decide whether or not an output for external further processing. Use the function
acoustic alarm should be given in addition to the visual ANAMOD to configure the analog output in case there
alarm (LED A). is no echo in the evaluation gate and the analog voltage
has been selected for the sound path at the output.
Operation:
You have the following setting options:
– Use v to select the function HORN.
• lo volt
– Use the left-hand rotary knob to set the horn to on or The analog output supplies 0 volt.
off.
• hi volt
The analog output supplies 5 volts.
H Note:

Operation
Operation: • DGS (only USM 25S)
Evaluation using the DGS method
– The function ANAMOD / EVAMOD has a double
Operation:
key v . – The function ANAMOD / EVAMOD has a double
– Use v to select the function ANAMOD. functions by repeatedly pressing the corresponding
key v .
– Use v to select the function EVAMOD.
value.
method.
EVAMOD (echo evaluation)

This is where you can choose a method for the evalua-
tion of the measured reflector echo. Depending on the
instrument version used, you have various methods to
choose from.
• REF (default setting)

Evaluation using the measurement of dB difference,
available for all instrument versions
• DAC (only USM 25 DAC and USM 25S)

Evaluation using the Distance-Amplitude Curve
Operation
Operation: • DGS (only USM 25S)
Evaluation using the DGS method
– The function ANAMOD / EVAMOD has a double
Operation:
key v . – The function ANAMOD / EVAMOD has a double
– Use v to select the function ANAMOD. functions by repeatedly pressing the corresponding
key v .
– Use v to select the function EVAMOD.
value.
method.
EVAMOD (echo evaluation)

This is where you can choose a method for the evalua-
tion of the measured reflector echo. Depending on the
instrument version used, you have various methods to
choose from.
• REF (default setting)

Evaluation using the measurement of dB difference,
available for all instrument versions
• DAC (only USM 25 DAC and USM 25S)

Evaluation using the Distance-Amplitude Curve

Other functions with special keys Operation
5.15 Other functions with X Enlarged echo display

special keys If you press X, the echo display is enlarged (zoom
function) and overlaps the function group.
H Note:
The functions are not accessible in this mode, except
You will find a description of the V key (setting of the for the gain which continues to be adjustable via the
dB incrementation for gain) on page 5-5; the Y key, left-hand rotary knob.
which you will need for printing out your test report, is
described in chapter 6 Documentation. – Press X again in order to return to normal mode.
W Freeze
The W key enables you to store (freeze) the displayed
image on the screen. Gate parameters may still be
changed in order to evaluate any signal being displayed
in the frozen screen. The measurement resolution is
only 0.5 % of the displayed range.
Operation:
– Press W if you want to store (“freeze”) a current

display.
– Press W again in order to return to normal mode.
Other functions with special keys Operation
5.15 Other functions with X Enlarged echo display

special keys If you press X, the echo display is enlarged (zoom
function) and overlaps the function group.
H Note:
The functions are not accessible in this mode, except
You will find a description of the V key (setting of the for the gain which continues to be adjustable via the
dB incrementation for gain) on page 5-5; the Y key, left-hand rotary knob.
which you will need for printing out your test report, is
described in chapter 6 Documentation. – Press X again in order to return to normal mode.
W Freeze
The W key enables you to store (freeze) the displayed
image on the screen. Gate parameters may still be
changed in order to evaluate any signal being displayed
in the frozen screen. The measurement resolution is
only 0.5 % of the displayed range.
Operation:
– Press W if you want to store (“freeze”) a current

display.
– Press W again in order to return to normal mode.

Status symbols and LEDs
Operation
5.16 Status symbols and LEDs T Function T-CORR is active.
R Reference echo has been recorded.
Status symbols can be displayed in the line below the
A Function ATT-OBJ / ATT-REF (sound
screen display to inform about certain settings and
attenuation) is active.
conditions of the USM 25. The LEDs above the display
give you further information.
LED
Status symbols Symbol Description
Symbol Description A Gate alarm.

* Display memory is enabled (freeze),
display is stored. R Function REJECT is active.
! Data transfer active, D Function DUAL (pulser-receiver separation)

(printing or remote control). is active.
B Battery indicator, an inverted blinking „B“
indicates that the batteries are empty and H Note:
must be charged.
F Function TOF is set to flank. stances. These are caused by intermediate conditions in
P Function TOF is set to peak. instrument operation occuring when the instrumet is
Status symbols and LEDs

Operation
5.16 Status symbols and LEDs T Function T-CORR is active.
R Reference echo has been recorded.
Status symbols can be displayed in the line below the
A Function ATT-OBJ / ATT-REF (sound
screen display to inform about certain settings and
attenuation) is active.
conditions of the USM 25. The LEDs above the display
give you further information.
LED
Status symbols Symbol Description
Symbol Description A Gate alarm.

* Display memory is enabled (freeze),
display is stored. R Function REJECT is active.
! Data transfer active, D Function DUAL (pulser-receiver separation)

(printing or remote control). is active.
B Battery indicator, an inverted blinking „B“
indicates that the batteries are empty and H Note:
must be charged.
F Function TOF is set to flank. stances. These are caused by intermediate conditions in
P Function TOF is set to peak. instrument operation occuring when the instrumet is

Status symbols and LEDs Operation
used, i.e. when function parameters are changed. Pos-
sible alarms occuring during instrument operation
(setting of functions) are to be ignored.
H Note:
If you are using the Data Logger option, you’ll find more
status symbols, see chapter Option Data Logger.
Status symbols and LEDs Operation

used, i.e. when function parameters are changed. Pos-
sible alarms occuring during instrument operation
(setting of functions) are to be ignored.
H Note:
If you are using the Data Logger option, you’ll find more
status symbols, see chapter Option Data Logger.

Distance-amplitude curve (only USM 25 DAC and USM 25S)
Operation
5.17 Distance-amplitude curve You will find the functions for the distance-amplitude
curve in the function group DAC.
(only USM 25 DAC and
USM 25S) – If necessary, use E to change the operating level.
– If necessary with the USM 25S, switch the function

H Note: EVA-MOD (function group CFG2) over to the setting
DAC using the right-hand rotary knob.
The DAC function is available as a fixed function in the
second operating level on the USM 25 DAC. With the – Use u to select the function group DAC.
USM 25S, the DAC function can be additionally
switched over to DGS evaluation mode.
Due to the angle of the sound beam spread and to the

sound attenuation in the material the echo height of
reflectors of equal size depends on the distance to the
probe.
A distance-amplitude curve, which is recorded with

defined reference reflectors, graphically displays these
influences.
If you use a reference block having artificial flaws when

recording a DAC you will be able to apply these echo H Note:
amplitudes for the evaluation of discontinuities without Double-allocation of the lower function T-CORR / OFFSET.
any further correction. The reference block should be For information on the operation (switchover), please
made of the same material as the test object. see following pages.

Operation
5.17 Distance-amplitude curve You will find the functions for the distance-amplitude
curve in the function group DAC.
(only USM 25 DAC and
USM 25S) – If necessary, use E to change the operating level.
– If necessary with the USM 25S, switch the function

H Note: EVA-MOD (function group CFG2) over to the setting
DAC using the right-hand rotary knob.
The DAC function is available as a fixed function in the
second operating level on the USM 25 DAC. With the – Use u to select the function group DAC.
USM 25S, the DAC function can be additionally
switched over to DGS evaluation mode.
Due to the angle of the sound beam spread and to the

sound attenuation in the material the echo height of
reflectors of equal size depends on the distance to the
probe.
A distance-amplitude curve, which is recorded with

defined reference reflectors, graphically displays these
influences.
If you use a reference block having artificial flaws when

recording a DAC you will be able to apply these echo H Note:
amplitudes for the evaluation of discontinuities without Double-allocation of the lower function T-CORR / OFFSET.
any further correction. The reference block should be For information on the operation (switchover), please
made of the same material as the test object. see following pages.

Distance-amplitude curve (only USM 25 DAC and USM 25S) Operation
DACMOD (activating DAC/TCG) reference echoes recorded are brought (lifted or low-
ered) to the same echo height.
You can use this function to activate the DAC. The
following settings are available:
H Note:
off No DAC is active. No reference echoes can be recorded with
DAC The already saved distance-amplitude DACMODE = TCG. TCG can only be activated if the
curve is displayed on the screen, or a new reference echoes recorded are situated within a dy-
DAC is recorded. namic range of 40 dB. Otherwise an error message is
output. If the TCG setting should be nevertheless be
TCG An existing DAC (at least 2 reference used in this case, then the DAC must be reduced (by
points) is displayed as a horizontal TCG deleting the last reference points) until TCG can be
line. switched on.
Operation:
– Use v to select the function DACMOD, and then use
– Use v to select the function DACMOD, and then use the right-hand rotary knob to select the setting off in
the right-hand rotary knob to select the DAC setting. order to deactivate the DAC again.
If there is a DAC stored, it will now be active.
– Use v to select the TCG setting.
The TCG function is activated so that the DAC be-

comes a horizontal recording threshold. This means: all

DACMOD (activating DAC/TCG) reference echoes recorded are brought (lifted or low-
ered) to the same echo height.
You can use this function to activate the DAC. The
following settings are available:
H Note:
off No DAC is active. No reference echoes can be recorded with
DAC The already saved distance-amplitude DACMODE = TCG. TCG can only be activated if the
curve is displayed on the screen, or a new reference echoes recorded are situated within a dy-
DAC is recorded. namic range of 40 dB. Otherwise an error message is
output. If the TCG setting should be nevertheless be
TCG An existing DAC (at least 2 reference used in this case, then the DAC must be reduced (by
points) is displayed as a horizontal TCG deleting the last reference points) until TCG can be
line. switched on.
Operation:
– Use v to select the function DACMOD, and then use
– Use v to select the function DACMOD, and then use the right-hand rotary knob to select the setting off in
the right-hand rotary knob to select the DAC setting. order to deactivate the DAC again.
If there is a DAC stored, it will now be active.
– Use v to select the TCG setting.
The TCG function is activated so that the DAC be-

comes a horizontal recording threshold. This means: all

Operation
DACECHO (recording reference curve) – Use v to select the function aSTART, and then
move the gate so that the selected echo is the
highest of the echo sequence within the gate range.
A Attention:
Before starting to record a reference curve, the instru- – Press Y to record the first reference echo.
ment must be correctly calibrated (ref. section – Peak the next reference echo, and repeat the
5.7 Calibrating the USM 25). recording process for other curve points. The number
The moment a new curve is recorded, a possibly in the function DACECHO is increased by 1 with
already existing curve must be deleted. If necessary, each recording.
make sure that the old curve has been stored in a free
data set before starting to record a new curve! H Note:
If the message „Echo is not valid“ appears, the
Operation: reference point could not be recorded. Check the gate
– Use v to select the function DACMOD, and then use position as well as the height of the reference echo and
the right-hand rotary knob to set the function to DAC. repeat the recording.
The function DACECHO is set to 0 since there is no As soon as you have recorded at least two curve
previously recorded echo. reference points. Your DAC is already acive (please
– Couple the probe to the reference block, and peak see previous section).
the first reference echo. Use the left-hand rotary You can record a maximum of 10 curve reference
knob to bring the echo to approx. 80% screen height. points; the more echoes you record, the more accurate
the DAC will be.

Operation
DACECHO (recording reference curve) – Use v to select the function aSTART, and then
move the gate so that the selected echo is the
highest of the echo sequence within the gate range.
A Attention:
Before starting to record a reference curve, the instru- – Press Y to record the first reference echo.
ment must be correctly calibrated (ref. section – Peak the next reference echo, and repeat the
5.7 Calibrating the USM 25). recording process for other curve points. The number
The moment a new curve is recorded, a possibly in the function DACECHO is increased by 1 with
already existing curve must be deleted. If necessary, each recording.
make sure that the old curve has been stored in a free
data set before starting to record a new curve! H Note:
If the message „Echo is not valid“ appears, the
Operation: reference point could not be recorded. Check the gate
– Use v to select the function DACMOD, and then use position as well as the height of the reference echo and
the right-hand rotary knob to set the function to DAC. repeat the recording.
The function DACECHO is set to 0 since there is no As soon as you have recorded at least two curve
previously recorded echo. reference points. Your DAC is already acive (please
– Couple the probe to the reference block, and peak see previous section).
the first reference echo. Use the left-hand rotary You can record a maximum of 10 curve reference
knob to bring the echo to approx. 80% screen height. points; the more echoes you record, the more accurate
the DAC will be.

Deleting reference points or the complete DAC T-CORR (sensitivity correction)
You can delete the reference point which was recorded This function enables you to compensate for the
last in each case, or the complete DAC. transfer losses in the material under test. This correc-
tion is necessary if test object and reference block
Operation: have different surface qualities.
– Use v to select the function DACECHO. You have to find out the adjustment value for the
compensation of transfer losses by experiments. The
– Turn the right-hand rotary knob downward (counter- gain is varied accordingly in this connection, the curve
clockwise). line remains the same.
The message „Do you want to delete the DAC echo?“ Adjustment range: -24 to +24 dB
appears in the measurement line.
– Press the v key for DACECHO now in order to Operation:

delete the last echo, or press another key in order to
– The function T-CORR / OFFSET has a double
cancel the process of deleting.
allocation (symbol >). You can toggle between the
In this way, you can record one or several new refer- two functions by repeatedly pressing the
ence points. corresponding v key.
In order to delete the complete DAC, all curve points – Use v to select the function T-CORR, and then use
are successively deleted one by one. the right-hand rotary knob to select the required
setting.

Deleting reference points or the complete DAC T-CORR (sensitivity correction)
You can delete the reference point which was recorded This function enables you to compensate for the
last in each case, or the complete DAC. transfer losses in the material under test. This correc-
tion is necessary if test object and reference block
Operation: have different surface qualities.
– Use v to select the function DACECHO. You have to find out the adjustment value for the
compensation of transfer losses by experiments. The
– Turn the right-hand rotary knob downward (counter- gain is varied accordingly in this connection, the curve
clockwise). line remains the same.
The message „Do you want to delete the DAC echo?“ Adjustment range: -24 to +24 dB
appears in the measurement line.
– Press the v key for DACECHO now in order to Operation:

delete the last echo, or press another key in order to
– The function T-CORR / OFFSET has a double
cancel the process of deleting.
allocation (symbol >). You can toggle between the
In this way, you can record one or several new refer- two functions by repeatedly pressing the
ence points. corresponding v key.
In order to delete the complete DAC, all curve points – Use v to select the function T-CORR, and then use
are successively deleted one by one. the right-hand rotary knob to select the required
setting.

Operation
OFFSET (distance of multiple DAC) Echo evaluation with DAC
You can activate a multiple DAC and at the same time In order to be able to evaluate a flaw indication by
determine the distance from the original curve. The means of the DAC, certain conditions must be met:
setting 0 dB doesn’t generate any multiple DAC, any
setting different from 0 dB generates four other curves • The distance-amplitude curve must already be
at a set distance from the original curve, two of the recorded.
additional curves being below the original curve and two
• It only applies to the same probe that was used
at an equal distance above it each.
when recording the curve. Not even another probe of
Adjustment range: 0 dB to 14 dB in steps of 0.5 dB the same type must be used!
• The DAC only apply to the material corresponding to

Operation: the material of the reference block.
– The function T-CORR / OFFSET has a double • All functions affecting the echo amplitude must be
allocation (symbol >). You can toggle between the set the same way as they were when the curve was
two functions by repeatedly pressing the recorded. This applies in particular to the following
corresponding v key. functions: POWER, FREQU, RECTIFY, MTLVEL
and REJECT.
– Use v to select the function OFFSET, and then use
the right-hand rotary knob to select the required • TOF is automatically set to peak.
setting.

Operation
OFFSET (distance of multiple DAC) Echo evaluation with DAC
You can activate a multiple DAC and at the same time In order to be able to evaluate a flaw indication by
determine the distance from the original curve. The means of the DAC, certain conditions must be met:
setting 0 dB doesn’t generate any multiple DAC, any
setting different from 0 dB generates four other curves • The distance-amplitude curve must already be
at a set distance from the original curve, two of the recorded.
additional curves being below the original curve and two
• It only applies to the same probe that was used
at an equal distance above it each.
when recording the curve. Not even another probe of
Adjustment range: 0 dB to 14 dB in steps of 0.5 dB the same type must be used!
• The DAC only apply to the material corresponding to

Operation: the material of the reference block.
– The function T-CORR / OFFSET has a double • All functions affecting the echo amplitude must be
allocation (symbol >). You can toggle between the set the same way as they were when the curve was
two functions by repeatedly pressing the recorded. This applies in particular to the following
corresponding v key. functions: POWER, FREQU, RECTIFY, MTLVEL
and REJECT.
– Use v to select the function OFFSET, and then use
the right-hand rotary knob to select the required • TOF is automatically set to peak.
setting.

Evaluation according to the DGS method (only USM 25S) Operation
5.18 Evaluation according to the • Distance D between the probe and circular disk-
shaped equivalent reflector.
DGS method (only USM 25S)
• Difference in gain G between various large circular
With the USM 25S, you can use both the DAC and the disk-shaped equivalent reflectors and an infinitely
DGS method of amplitude evaluation. large backwall.
• Size S of the circular disk-shaped equivalent

Measuring with DGS reflector.
The influencing variable S always remains constant
Using the DGS function (Distance-Gain-Size), you can
for one curve of the set of curves.
compare the reflecting power of a natural flaw in the
test object with that of a theoretical flaw (circular disk- The advantage of the DGS method lies in the fact that
shaped equivalent reflector) at the same depth. you can carry out reproducible evaluations of small
discontinuities. The reproducibility is most of all impor-
A Attention: tant, for example, whenever you aim to carry out an
acceptance test.
You are comparing the reflecting power of a natural flaw
with that of a theoretical flaw. No definite conclusions Apart from the influencing variables already mentioned,
may be drawn on the natural flaw (roughness, inclined there are other factors determining the curve shape:
position, etc.).
• sound attenuation
The so-called DGS diagram forms the basis for this
comparison of the reflecting power. This diagram • transfer losses
consists of a set of curves showing the correlation of
• amplitude correction value
three influencing variables:
• probe.
5.18 Evaluation according to the • Distance D between the probe and circular disk-
shaped equivalent reflector.
DGS method (only USM 25S)
• Difference in gain G between various large circular
With the USM 25S, you can use both the DAC and the disk-shaped equivalent reflectors and an infinitely
DGS method of amplitude evaluation. large backwall.
• Size S of the circular disk-shaped equivalent

Measuring with DGS reflector.
The influencing variable S always remains constant
Using the DGS function (Distance-Gain-Size), you can
for one curve of the set of curves.
compare the reflecting power of a natural flaw in the
test object with that of a theoretical flaw (circular disk- The advantage of the DGS method lies in the fact that
shaped equivalent reflector) at the same depth. you can carry out reproducible evaluations of small
discontinuities. The reproducibility is most of all impor-
A Attention: tant, for example, whenever you aim to carry out an
acceptance test.
You are comparing the reflecting power of a natural flaw
with that of a theoretical flaw. No definite conclusions Apart from the influencing variables already mentioned,
may be drawn on the natural flaw (roughness, inclined there are other factors determining the curve shape:
position, etc.).
• sound attenuation
The so-called DGS diagram forms the basis for this
comparison of the reflecting power. This diagram • transfer losses
consists of a set of curves showing the correlation of
• amplitude correction value
three influencing variables:
• probe.
Evaluation according to the DGS method (only USM 25S)
Operation
The following probe parameters affect the curve shape: Selecting the DGS mode
• element or crystal diameter – If necessary (if the function DAC is selected), set
the EVA-MOD function (function group CFG2) to
• frequency
DGS.
• delay length
The function group DGS now replaces the function
• delay velocity group DAC.
You can adjust these parameters on the USM 25S in

such a way that you can use the DGS method with
many different probes and on different materials.
H Note:
Before setting the DGS function, the instrument must
first be calibrated because all functions affecting the
DGS evaluation mode (MTLVEL, P-DELAY, DAMPING,
POWER, FINE G, FREQU, RECTIFY) can no longer be
changed after the reference echo has been recorded.
– Use the E key to change the operating level, and
Please also refer to chapter 5.7 Calibrating the USM 25 then use v to select the function group DGS.
on this subject.

Operation
The following probe parameters affect the curve shape: Selecting the DGS mode
• element or crystal diameter – If necessary (if the function DAC is selected), set
the EVA-MOD function (function group CFG2) to
• frequency
DGS.
• delay length
The function group DGS now replaces the function
• delay velocity group DAC.
You can adjust these parameters on the USM 25S in

such a way that you can use the DGS method with
many different probes and on different materials.
H Note:
Before setting the DGS function, the instrument must
first be calibrated because all functions affecting the
DGS evaluation mode (MTLVEL, P-DELAY, DAMPING,
POWER, FINE G, FREQU, RECTIFY) can no longer be
changed after the reference echo has been recorded.
– Use the E key to change the operating level, and
Please also refer to chapter 5.7 Calibrating the USM 25 then use v to select the function group DGS.
on this subject.

Double allocation of functions: – Define your settings:
DGSMEN> DGSMEN> • PROBE-#: probe number

Calling the DGS menu Switching on/off the Fixed-programmed probes with all settings
DGS evaluation mode (PRBNAME, DEL-VEL, D eff and PRBFREQ cannot
be changed in the case of these probes);
T-CORR> OFFSET> PROBE-# = 0 is user-programmable with reference
Setting the transfer Activating the multi-curve to all parameters.
correction display mode
• PRBNAME: probe name
The name belongs to the selected probe number and
cannot be changed; the individual probe name can
Default settings for the DGS measurement be entered only with PROBE-# = 0.
In the next step, the DGS menu is called enabling to • DGS-CRV: recording curve for DGS evaluation
select the corresponding probe and to set the other This enables you to select the circular disk-shaped
DGS parameters: equivalent reflector diameter to be used for displaying
– Use v to select the function DGSMEN> and then the DGS curve and used as recording threshold for
use the right-hand rotary knob to call the DGS menu. echo evaluations.
• DEL-VEL: delay material velocity of the probe;

predefined with programmed probes.
• D eff: effective element diameter of the probe used;


Double allocation of functions: – Define your settings:
DGSMEN> DGSMEN> • PROBE-#: probe number

Calling the DGS menu Switching on/off the Fixed-programmed probes with all settings
DGS evaluation mode (PRBNAME, DEL-VEL, D eff and PRBFREQ cannot
be changed in the case of these probes);
T-CORR> OFFSET> PROBE-# = 0 is user-programmable with reference
Setting the transfer Activating the multi-curve to all parameters.
correction display mode
• PRBNAME: probe name
The name belongs to the selected probe number and
cannot be changed; the individual probe name can
Default settings for the DGS measurement be entered only with PROBE-# = 0.
In the next step, the DGS menu is called enabling to • DGS-CRV: recording curve for DGS evaluation
select the corresponding probe and to set the other This enables you to select the circular disk-shaped
DGS parameters: equivalent reflector diameter to be used for displaying
– Use v to select the function DGSMEN> and then the DGS curve and used as recording threshold for
use the right-hand rotary knob to call the DGS menu. echo evaluations.
• DEL-VEL: delay material velocity of the probe;

• D eff: effective element diameter of the probe used;


Operation
• PRBFREQ: probe frequency Example
Frequency of the transducer; predefined with
programmed probes.
• REFECHO: type of the reference reflector used

BW: backwall
SDH: side drilled hole
FBH: flat bottom hole
• REFSIZE: size of the reference reflector
• ATT-REF: sound attenuation in the reference block
• ATT-OBJ: sound attenuation in the test object

In this example, the probe MB 4 S is selected. Refer-
• AMPLCOR: value for the amplitude correction. ence reflector = backwall, the 3mm circular disc is to
This is required whenever you are using an angle be displayed as curve. The sound attenuation correc-
probe and the quadrant echo from the calibration tions ATT-REF and ATT-OBJ and the amplitude correc-
standards K1 or K2 as a reference reflector. tion AMPLCOR (for angle probes and calibration
standard K1 / K2) remain at 0.
– To return to the A-scan, press one of the following

keys: en: E, V, W oder X.

Operation
• PRBFREQ: probe frequency Example
Frequency of the transducer; predefined with
programmed probes.
• REFECHO: type of the reference reflector used

BW: backwall
SDH: side drilled hole
FBH: flat bottom hole
• REFSIZE: size of the reference reflector
• ATT-REF: sound attenuation in the reference block
• ATT-OBJ: sound attenuation in the test object

In this example, the probe MB 4 S is selected. Refer-
• AMPLCOR: value for the amplitude correction. ence reflector = backwall, the 3mm circular disc is to
This is required whenever you are using an angle be displayed as curve. The sound attenuation correc-
probe and the quadrant echo from the calibration tions ATT-REF and ATT-OBJ and the amplitude correc-
standards K1 or K2 as a reference reflector. tion AMPLCOR (for angle probes and calibration
standard K1 / K2) remain at 0.
– To return to the A-scan, press one of the following

keys: en: E, V, W oder X.

Recording the reference echo and – Confirm by pressing v again.
displaying the DGS curve After the successful recording of the reference echo, a
To be able to display the required DGS curve, you have highlighted R will be displayed in the measurement line.
to first record the reference echo. – Switch the DGS curve on now by using v to select
– You have to start by optimizing the echo of the the function DGSMOD> and by using the right-hand
reference reflector, in this case the backwall echo rotary knob to set the function to on.
from the test object.
– Continue by positioning the gate on the reference echo.
– Then use v to select the function DGS-REF, and use

the right-hand rotary knob to switch the function on.
The message: „Do you want to change the DGS
reference echo?“ appears.
Taking the general DGS diagram as a basis, the

instrument calculates the required test sensitivity for
displaying the 3mm curve with its maximum at 80%
screen height, and sets this value. The current gain is
set to 0 during this. In the case of subsequent gain
variations, the curve is automatically adapted.

Recording the reference echo and – Confirm by pressing v again.
displaying the DGS curve After the successful recording of the reference echo, a
To be able to display the required DGS curve, you have highlighted R will be displayed in the measurement line.
to first record the reference echo. – Switch the DGS curve on now by using v to select
– You have to start by optimizing the echo of the the function DGSMOD> and by using the right-hand
reference reflector, in this case the backwall echo rotary knob to set the function to on.
from the test object.
– Continue by positioning the gate on the reference echo.
– Then use v to select the function DGS-REF, and use

the right-hand rotary knob to switch the function on.
The message: „Do you want to change the DGS
reference echo?“ appears.
Taking the general DGS diagram as a basis, the

instrument calculates the required test sensitivity for
displaying the 3mm curve with its maximum at 80%
screen height, and sets this value. The current gain is
set to 0 during this. In the case of subsequent gain
variations, the curve is automatically adapted.

Operation
Evaluation of reflectors
Every echo situated within the gate can be immediately
evaluated:
S-DISP = Ha%, i.e. echo height evaluation as a per-

centage.
At the same time, the multiple-curve display mode is

also active with a curve distance of OFFSET = 6 dB.
The measurement line has been configured in such a
way that the sound path S, the echo height in dB
referred to the DGS curve, the equivalent reflector
size (ERS) of the flaw echo and the calibration range
are displayed.
The measured value to be zoomed in the A-scan is

chosen by means of the function S-DISP in the func-
tion group MEAS. ERS was chosen in the above
example.
Also refer to Configuring the measurement line, p. 5-45.


Operation
Evaluation of reflectors
Every echo situated within the gate can be immediately
evaluated:
S-DISP = Ha%, i.e. echo height evaluation as a per-

centage.
At the same time, the multiple-curve display mode is

also active with a curve distance of OFFSET = 6 dB.
The measurement line has been configured in such a
way that the sound path S, the echo height in dB
referred to the DGS curve, the equivalent reflector
size (ERS) of the flaw echo and the calibration range
are displayed.
The measured value to be zoomed in the A-scan is

chosen by means of the function S-DISP in the func-
tion group MEAS. ERS was chosen in the above
example.
Also refer to Configuring the measurement line, p. 5-45.

S-DISP = Ha%Crv, the evaluation result is now the Transfer correction
value exceeding the curve in %.
The transfer correction is activated by means of the
function T-CORR. The test sensitivity is varied by this
value without recalculating the curve.
S-DISP = Gt is a special case: the value displayed is

the DGS test sensitivity with which the maximum of the
specified curve is at 80%.
This means that the test sensitivity is increased by
This value serves for the purpose of checking and 6 dB in the example in order to compensate for a
documenting. possibly existing surface roughness. The echo is
consequently drawn higher by 6 dB on the left, i.e.
evaluated with ERS 3.2. Status indicator in the mea-
surement line: a highlighted T.

S-DISP = Ha%Crv, the evaluation result is now the Transfer correction
value exceeding the curve in %.
The transfer correction is activated by means of the
function T-CORR. The test sensitivity is varied by this
value without recalculating the curve.
S-DISP = Gt is a special case: the value displayed is

the DGS test sensitivity with which the maximum of the
specified curve is at 80%.
This means that the test sensitivity is increased by
This value serves for the purpose of checking and 6 dB in the example in order to compensate for a
documenting. possibly existing surface roughness. The echo is
consequently drawn higher by 6 dB on the left, i.e.
evaluated with ERS 3.2. Status indicator in the mea-
surement line: a highlighted T.

Operation
Sound attenuation made to change the value because, in fact, a valid
reference echo already exists.
If necessary, the DGS curve can take the component’s
effective sound attenuation (ATT-OBJ) into account. In addition, a different reference reflector type has been
With the value set here, the curve shape is recalculated used in the DGS menu below: instead of a backwall, a
so that the effect of sound attenuation is now taken into circular disk (flat-bottom hole) having a diameter of 3
consideration when evaluating reflectors. mm has been set in this case. In this case, of course,
the reference echo has to be received from a 3mm
circular disk.
The DGS curve now includes the effect of sound

attenuation. An active sound attenuation correction is
indicated in the measurement line by a highlighted A.
The sound attenuation in the reference block can only

be set prior to recording the reference echo. Therefore,
an error message is displayed here if an attempt is

Operation
Sound attenuation made to change the value because, in fact, a valid
reference echo already exists.
If necessary, the DGS curve can take the component’s
effective sound attenuation (ATT-OBJ) into account. In addition, a different reference reflector type has been
With the value set here, the curve shape is recalculated used in the DGS menu below: instead of a backwall, a
so that the effect of sound attenuation is now taken into circular disk (flat-bottom hole) having a diameter of 3
consideration when evaluating reflectors. mm has been set in this case. In this case, of course,
the reference echo has to be received from a 3mm
circular disk.
The DGS curve now includes the effect of sound

attenuation. An active sound attenuation correction is
indicated in the measurement line by a highlighted A.
The sound attenuation in the reference block can only

be set prior to recording the reference echo. Therefore,
an error message is displayed here if an attempt is

After switching on the DGS curve, the reference echo Conditions for the use of side-drilled holes as reference
must therefore clearly touch the 3mm curve. reflectors in steel. For other materials, the values must
be converted accordingly.
A side-drilled hole can also be used as a further refer-

ence reflector with some limitations. It must have a
diameter corresponding to at least 1.5 times the wave-
length used, and the distance must be 1.5 times the
near-field length. The USM 25S will check these
conditions if you aim to use a side-drilled hole as
reference reflector, and will issue an error message if
required.
The table on the next page indicates these minimum

data for the existing probes in steel:

After switching on the DGS curve, the reference echo Conditions for the use of side-drilled holes as reference
must therefore clearly touch the 3mm curve. reflectors in steel. For other materials, the values must
be converted accordingly.
A side-drilled hole can also be used as a further refer-

ence reflector with some limitations. It must have a
diameter corresponding to at least 1.5 times the wave-
length used, and the distance must be 1.5 times the
near-field length. The USM 25S will check these
conditions if you aim to use a side-drilled hole as
reference reflector, and will issue an error message if
required.
The table on the next page indicates these minimum

data for the existing probes in steel:

Operation
Probe Wavelength Minimum Diameter Near Feld Length Minimum Distance
in steel in steel in steel
[mm] [mm] [mm] [mm]
B1S 6.0 9.0 23 35

B2S 3.0 4.5 45 68
B4S 1.5 2.3 90 135
MB 2 S 3.0 4.5 8 12
MB 4 S 1.5 2.3 15 23
MB 5 S 1.2 1.8 20 30
MWB ...-2 1.6 2.4 15 23
MWB ...-4 0.8 1.2 30 45
SWB ...-2 1.6 2.4 39 59
SWB ...-5 0.7 1.1 98 147
WB ...-1 3.3 5.0 45 68
WB ...-2 1.6 2.4 90 135

Operation
Probe Wavelength Minimum Diameter Near Feld Length Minimum Distance
in steel in steel in steel
[mm] [mm] [mm] [mm]
B1S 6.0 9.0 23 35

B2S 3.0 4.5 45 68
B4S 1.5 2.3 90 135
MB 2 S 3.0 4.5 8 12
MB 4 S 1.5 2.3 15 23
MB 5 S 1.2 1.8 20 30
MWB ...-2 1.6 2.4 15 23
MWB ...-4 0.8 1.2 30 45
SWB ...-2 1.6 2.4 39 59
SWB ...-5 0.7 1.1 98 147
WB ...-1 3.3 5.0 45 68
WB ...-2 1.6 2.4 90 135

Locks, error messages Validity of the DGS method
As long as a valid reference echo is stored, no func- Echo amplitude evaluations according to the DGS
tions can be changed which could cause an incorrect method are only reliable and reproducible in cases
DGS evaluation. If an attempt is made to change such when
a function, the corresponding error message will ap-
pear, e.g. • the reference echo is received from the test object if
possible. If this is not possible, it should be ensured
„P-DELAY locked by DGS-REF = on“ that the reference block is made of the same materi-
al as the test object.
The DGS evaluation must likewise be switched off and
the reference echo deleted in the case of selecting a • the evaluation is carried out using the same probe
new probe, e.g. for a new test application. which was also used for recording the reference
echo. Another probe of the same type can be used
after recording a new reference echo.

Locks, error messages Validity of the DGS method
As long as a valid reference echo is stored, no func- Echo amplitude evaluations according to the DGS
tions can be changed which could cause an incorrect method are only reliable and reproducible in cases
DGS evaluation. If an attempt is made to change such when
a function, the corresponding error message will ap-
pear, e.g. • the reference echo is received from the test object if
possible. If this is not possible, it should be ensured
„P-DELAY locked by DGS-REF = on“ that the reference block is made of the same materi-
al as the test object.
The DGS evaluation must likewise be switched off and
the reference echo deleted in the case of selecting a • the evaluation is carried out using the same probe
new probe, e.g. for a new test application. which was also used for recording the reference
echo. Another probe of the same type can be used
after recording a new reference echo.


Documentation 6
Documentation 6

Documentation Printing out the report
6.1 Printing data Preparing the printer

The transfer parameter settings are fixed in the USM 25
Direct printing of the following data via the RS232 and cannot be changed.
interface is possible using the USM 25:
• Baud rate 9600
• test report containing the A-scan and the adjustment
data • Word length 8 data bits
• A-scan • Parity none
• single reading (position 1 of the measurement line) In order to ensure a perfect communication, set the
printer to the parameters of the USM 25.
• function list (including all current settings)
• Data Logger (if the version is available) Preparing the USM 25

To do this, you need You decide on the type of printout by assigning the
Y key.
• a printer with serial interface RS 232
– If necessary, use the E key to change the operating
• a printer cable (please see chapter 2) level.
– Use u to select the function group CFG1.
– Use v to select the function PRINTER, and then

use the right-hand rotary knob to select the correct
printer driver.
Documentation Printing out the report
6.1 Printing data Preparing the printer

The transfer parameter settings are fixed in the USM 25
Direct printing of the following data via the RS232 and cannot be changed.
interface is possible using the USM 25:
• Baud rate 9600
• test report containing the A-scan and the adjustment
data • Word length 8 data bits
• A-scan • Parity none
• single reading (position 1 of the measurement line) In order to ensure a perfect communication, set the
printer to the parameters of the USM 25.
• function list (including all current settings)
• Data Logger (if the version is available) Preparing the USM 25

To do this, you need You decide on the type of printout by assigning the
Y key.
• a printer with serial interface RS 232
– If necessary, use the E key to change the operating
• a printer cable (please see chapter 2) level.
– Use u to select the function group CFG1.
– Use v to select the function PRINTER, and then

use the right-hand rotary knob to select the correct
printer driver.

Printing out the report Documentation
– Use v to select the function COPYMOD, and then

use the right-hand rotary knob to select the setting:
hardcpy, report, meas P1 (measured value at
position 1), pardump (function list), datalog (Data
Logger job including measured values), special (3 - 4
hardcopies on one page).
H Note:
The setting PCX generates a PCX-format file which you
can transfer to a PC by means of a suitable program
capable of receiving and storing data.
Printing
If you have connected, prepared and activated the
printer, just press the Y key.
The report is printed out.
If you have selected the setting special, press the Y

key again for each hardcopy that you want to print out.
Printing out the report Documentation
– Use v to select the function COPYMOD, and then

use the right-hand rotary knob to select the setting:
hardcpy, report, meas P1 (measured value at
position 1), pardump (function list), datalog (Data
Logger job including measured values), special (3 - 4
hardcopies on one page).
H Note:
The setting PCX generates a PCX-format file which you
can transfer to a PC by means of a suitable program
capable of receiving and storing data.
Printing
If you have connected, prepared and activated the
printer, just press the Y key.
The report is printed out.
If you have selected the setting special, press the Y

key again for each hardcopy that you want to print out.

Documentation
6.2 Documentation with UltraDOC

The special application program UltraDOC from
Krautkramer Ultrasonic Systems enables you to
remote-control the USM 25 and to include instrument
settings in ASCII format or screen contents in PCX or
IMG format in your test report.
All data can be further processed using commerical

word processing or DTP programs.
You will receive information about the reliable use of the

program in a detailed operating manual.
Documentation
6.2 Documentation with UltraDOC

The special application program UltraDOC from
Krautkramer Ultrasonic Systems enables you to
remote-control the USM 25 and to include instrument
settings in ASCII format or screen contents in PCX or
IMG format in your test report.
All data can be further processed using commerical

word processing or DTP programs.
You will receive information about the reliable use of the

program in a detailed operating manual.

Maintenance and care 7
Maintenance and care 7

Maintenance and care Care
7.1 Care Care of NiCd batteries

Capacity and life of batteries mainly depend on the
Care of the instrument correct handling. Please therefore observe the tips
below.
Clean the instrument and its accessories using a moist
cloth. Use water or a mild household cleaner. You should charge the NiCd batteries in the following
cases:
A Attention: • before the initial startup

Do not use any solvents! • after a storage time of 3 months or longer
The plastic parts can be damaged or embrittled by this.
• after frequent partial discharge
Charging the NiCd batteries

The quick charger recommended by us (order no.
18673) enables you to charge NiCds batteries.
Please observe the notes on the operation of the
battery charger for this.
Maintenance and care Care
7.1 Care Care of NiCd batteries

Capacity and life of batteries mainly depend on the
Care of the instrument correct handling. Please therefore observe the tips
below.
Clean the instrument and its accessories using a moist
cloth. Use water or a mild household cleaner. You should charge the NiCd batteries in the following
cases:
A Attention: • before the initial startup

Do not use any solvents! • after a storage time of 3 months or longer
The plastic parts can be damaged or embrittled by this.
• after frequent partial discharge
Charging the NiCd batteries

The quick charger recommended by us (order no.
18673) enables you to charge NiCds batteries.
Please observe the notes on the operation of the
battery charger for this.

Care Maintenance and care
Charging of partially discharged NiCd batteries
If NiCd batteries are only partially discharged (less than

50 % of operating time), the full capacity is not reached
by normal charging.
– Start by fully discharging the NiCd batteries.

You can use the discharging function of the charger
for this. For more details, please read the notes on
the operation of the battery charger.
– The NiCd batteries are automatically charged after

that.
Charging of exhausted NiCd batteries
If NiCd batteries are exhausted, e.g. after a prolonged

storage time in empty state, they often reach their full
capacity only after repeated discharge/charge cycles.
The charger identifies defective batteries. In that case,

replace the batteries by a new set. Otherwise there is
the danger that individual cells have different capacities
so that you will no longer obtain the normal operating
time with the instrument in battery operation.
Care Maintenance and care

Charging of partially discharged NiCd batteries
If NiCd batteries are only partially discharged (less than

50 % of operating time), the full capacity is not reached
by normal charging.
– Start by fully discharging the NiCd batteries.

You can use the discharging function of the charger
for this. For more details, please read the notes on
the operation of the battery charger.
– The NiCd batteries are automatically charged after

that.
Charging of exhausted NiCd batteries
If NiCd batteries are exhausted, e.g. after a prolonged

storage time in empty state, they often reach their full
capacity only after repeated discharge/charge cycles.
The charger identifies defective batteries. In that case,

replace the batteries by a new set. Otherwise there is
the danger that individual cells have different capacities
so that you will no longer obtain the normal operating
time with the instrument in battery operation.

Maintenance and care Maintenance
7.2 Maintenance
The USM 25 requires basically no maintenance.
A Attention:
Repair work may only be carried out by members of
authorized Service staff of Krautkramer Ultrasonic
Systems.
Maintenance and care Maintenance
7.2 Maintenance
The USM 25 requires basically no maintenance.
A Attention:
Repair work may only be carried out by members of
authorized Service staff of Krautkramer Ultrasonic
Systems.

Interface and peripherals 8
Interface and peripherals 8

Interface and Peripherals RS 232 interface
8.1 I/O interface

The USM 25 has an 8-way I/O interface (LEMO-1B
socket) for different input and output signals:
• SAP output (transmitter trigger pulse)
• Alarm output (TTL): switching delay approx. 50 ms,
hold time approx. 500 ms.
• TDR input (test data release)
View of the 8-way LEMO-1B socket
Contact assignment of the LEMO-1B socket

H Note:
Contact Description Signal direction Level
You are able to externally pro-
1 SAP Output TTL
cess the alarm condition with the
2 alarm gate a Output TTL alarm output, e.g. for sorting and
other control purposes. Error
3 alarm gate b – –
alarms can be triggered under
4 unassigned – – certain circumstances. These
5 unassigned – – are caused by intermediate con-
ditions in instrument operation
6 TDR Input TTL active high occuring when the instrumet is
7 Analog output, amplitude or time of flight Output 0-5V used, i.e. when function param-
eters are changed. Possible
(selectable via remote-control code, see alarms occuring during in-
chapter 8.4 Remote Control) strument operation (setting of
8 GND Ground – functions) are to be ignored.
Interface and Peripherals RS 232 interface
8.1 I/O interface

The USM 25 has an 8-way I/O interface (LEMO-1B
socket) for different input and output signals:
• SAP output (transmitter trigger pulse)
• Alarm output (TTL): switching delay approx. 50 ms,
hold time approx. 500 ms.
• TDR input (test data release)
View of the 8-way LEMO-1B socket
Contact assignment of the LEMO-1B socket

H Note:
Contact Description Signal direction Level
You are able to externally pro-
1 SAP Output TTL
cess the alarm condition with the
2 alarm gate a Output TTL alarm output, e.g. for sorting and
other control purposes. Error
3 alarm gate b – –
alarms can be triggered under
4 unassigned – – certain circumstances. These
5 unassigned – – are caused by intermediate con-
ditions in instrument operation
6 TDR Input TTL active high occuring when the instrumet is
7 Analog output, amplitude or time of flight Output 0-5V used, i.e. when function param-
eters are changed. Possible
(selectable via remote-control code, see alarms occuring during in-
chapter 8.4 Remote Control) strument operation (setting of
8 GND Ground – functions) are to be ignored.

Data exchange Interface and Peripherals
8.2 RS232 interface

The USM 25 has a RS232 interface for remote control
and documentation (report printout).
Contact assignment of the Sub-D socket

Contact Designation Signal direction View of the 9-way Sub-D socket
Level
1 unassigned – –
2 RXD Input RS 232
3 TXD Output RS 232
4 DTR Output RS 232
5 Ground – –
6 DSR Input RS 232
7 RTS Output RS 232
8 CTS Input RS 232
H Note:
Switch off the instrument before connecting a cable to

the RS232 socket or before withdrawing any plugs.
Data exchange Interface and Peripherals
8.2 RS232 interface

The USM 25 has a RS232 interface for remote control
and documentation (report printout).
Contact assignment of the Sub-D socket

Contact Designation Signal direction View of the 9-way Sub-D socket
Level
2 RXD Input RS 232
3 TXD Output RS 232
4 DTR Output RS 232
5 Ground – –
6 DSR Input RS 232
7 RTS Output RS 232
8 CTS Input RS 232
H Note:
Switch off the instrument before connecting a cable to

the RS232 socket or before withdrawing any plugs.
Interface and Peripherals Data exchange
8.3 Data exchange
Connecting a printer or a PC Printing data

You can connect the USM 25 to a printer or a PC using The USM 25 enables a direct printout of data, for
the special Krautkramer cables: example a report including the echo display and the
instrument settings.
PC: UD 20 (25-pin) or UD 31 (9-pin)
Printer: UD 31 (Seiko DPU) or UD 32 (Epson) To do this, select the printer driver in the function
PRINTER (function group CFG1) and just press the
Please refer to chapter 2. Y key after having initialized and activated the printer.
The data selected by you in the function COPYMOD
(function group CFG1) are printed.
The data transmission parameters are fixed in the
For more details on this, please refer to chapter 6.
USM 25 and cannot be changed:
Baud rate: 9600

Word length: 8 data bits
Parity: none
The settings on the USM 25 apply to most of the

printers and PCs. To ensure a perfect communication,
please check the settings of the connected peripherals
and adjust them to the parameters of the USM 25.
Interface and Peripherals Data exchange
8.3 Data exchange
Connecting a printer or a PC Printing data

You can connect the USM 25 to a printer or a PC using The USM 25 enables a direct printout of data, for
the special Krautkramer cables: example a report including the echo display and the
instrument settings.
PC: UD 20 (25-pin) or UD 31 (9-pin)
Printer: UD 31 (Seiko DPU) or UD 32 (Epson) To do this, select the printer driver in the function
PRINTER (function group CFG1) and just press the
Please refer to chapter 2. Y key after having initialized and activated the printer.
The data selected by you in the function COPYMOD
(function group CFG1) are printed.
The data transmission parameters are fixed in the
For more details on this, please refer to chapter 6.
USM 25 and cannot be changed:
Baud rate: 9600

Word length: 8 data bits
Parity: none
The settings on the USM 25 apply to most of the

printers and PCs. To ensure a perfect communication,
please check the settings of the connected peripherals
and adjust them to the parameters of the USM 25.

Remote control Interface and Peripherals
8.4 Remote control The USM 25 transmits the value of the current
setting.
You can use a connected PC for the remote control of
• Entry of a new value or state of a function using the
the USM 25.
command structure:
The data transfer is carried out by means of a remote
control program and the corresponding remote control <ESC> <COMMAND> <SPACE> <VALUE> <RE TURN>
commands. These commands represent instructions All values are entered or transmitted by the USM 25
referring to the individual functions of the USM 25. without a comma or a point. The resolution of the
The program Crosstalk can for example be used as function should therefore be observed with all values.
remote control program under DOS. In Windows based The resolution of a function applies to the entire value
systems it is possible to use e.g. the Terminal pro- range of that function.
gram. A resolution of 0.01 means:
After the remote control program has been started and The USM 25 transmits the value of a function multiplied
the program interface has been configured, the com- by the factor of 100. The entry of a value must be done
mands are input via the keyboard of the computer. In multiplied by the factor of 100.
this connection, please observe the following differen-
tiation: Examples
• Interrogation of a value or state of a USM 25 • Setting of the display delay to 72.39 mm:
function using the command structure:
<ESC>dd 7239 <RETURN>
<ESC><COMMAND> <RETURN>
8.4 Remote control The USM 25 transmits the value of the current
setting.
You can use a connected PC for the remote control of
• Entry of a new value or state of a function using the
the USM 25.
command structure:
control program and the corresponding remote control <ESC> <COMMAND> <SPACE> <VALUE> <RE TURN>
commands. These commands represent instructions All values are entered or transmitted by the USM 25
referring to the individual functions of the USM 25. without a comma or a point. The resolution of the
The program Crosstalk can for example be used as function should therefore be observed with all values.
remote control program under DOS. In Windows based The resolution of a function applies to the entire value
systems it is possible to use e.g. the Terminal pro- range of that function.
gram. A resolution of 0.01 means:
After the remote control program has been started and The USM 25 transmits the value of a function multiplied
the program interface has been configured, the com- by the factor of 100. The entry of a value must be done
mands are input via the keyboard of the computer. In multiplied by the factor of 100.
this connection, please observe the following differen-
tiation: Examples
• Interrogation of a value or state of a USM 25 • Setting of the display delay to 72.39 mm:
function using the command structure:
<ESC>dd 7239 <RETURN>
<ESC><COMMAND> <RETURN>

Interface and Peripherals Remote control
Example:
• Setting of the display width to 72.3 mm:
• Setting the response threshold of gate a to 41 %:
<ESC>dw 7230 <RETURN>
<ESC>at 41 <RETURN>
• Setting of the display width to 192 mm;
A resolution of 0.1 means: Functions and remote control codes

The USM 25 transmits the value of a function multiplied Presettings are in bold-face type. You will find a brief
by the factor of 10. The entry of a value must be done description of all functions in chapter 9.1 Function
multiplied by the factor of 10. directory.
Example: If not otherwise stated, all values refer to steel,
C = 5920 m/s.
• Setting of the gain to 51.5 dB
The functions marked with * are only available in the
<ESC>db 515 <RETURN>
USM 25 DAC and USM 25S (DAC evaluation), the
A resolution of 1 means: functions marked with ** are only available in the
USM 25S (DGS evaluation).
The USM 25 transmits the value of a function without
multiplication. The entry of a value must be done Functions which are only availabe in connection with
without any multiplication. the Data Logger option are marked with *** (please also
refer to the section Remote control in chapter Option
Data Logger on this subject).
Example:
• Setting of the display width to 72.3 mm:
• Setting the response threshold of gate a to 41 %:
<ESC>at 41 <RETURN>
• Setting of the display width to 192 mm;
A resolution of 0.1 means: Functions and remote control codes

The USM 25 transmits the value of a function multiplied Presettings are in bold-face type. You will find a brief
by the factor of 10. The entry of a value must be done description of all functions in chapter 9.1 Function
multiplied by the factor of 10. directory.
Example: If not otherwise stated, all values refer to steel,
C = 5920 m/s.
• Setting of the gain to 51.5 dB
The functions marked with * are only available in the
<ESC>db 515 <RETURN>
USM 25 DAC and USM 25S (DAC evaluation), the
A resolution of 1 means: functions marked with ** are only available in the
USM 25S (DGS evaluation).
The USM 25 transmits the value of a function without
multiplication. The entry of a value must be done Functions which are only availabe in connection with
without any multiplication. the Data Logger option are marked with *** (please also
refer to the section Remote control in chapter Option
Data Logger on this subject).

Function Code Range / Default Resolution Function Code Range / Default Resolution
aLOGIC M 0 = off 1 ATT-OBJ** AO 0 - 100 dB/m / 0 0.1

1 = pos
2 = neg aWIDTH AW 0.1 - 9999 mm / 40 0.01
0.004 - 250“ / 1.500 0.001
AMPLCOR** AC -25 to +25 dB / 0 0.1
bLOGIC 2L 0 = aus 1
ANAMODE AQ 0 = 0 volt 1 = pos
1 = 5 volts 2 = neg
3 = a trig
ANGLE PA 0 - 90 / 0 0.1
bSTART 2D 0 - 9999 mm / 85 0.01
A-SCAN AS 0 = stndard 1 0 - 250” / 3.500 0.001
1 = compare
2 = envelop bTHRSH 2T 10 - 90 % / 30 1
3 = peak b -90 - -10 % additionally with rf
4 = afreeze
5 = bfreeze bWIDTH 2W 0.1 - 9999 mm / 40 0.01
6 = cfreeze*** 0.004 - 250“ / 1.500 0.001
aSTART AD 0 - 9999 mm / 35 0.01 CAL CA read only

0 - 250“ / 1.500 0.001
COMMENT CO alphanumerical input
aTHRSH AT 10 - 90 % / 40 1
-90 - -10 % additionally with rf COMPARE CP 0 = off 1
1 = on
ATT-REF** AR 0 - 100 dB/m / 0 0.1
aLOGIC M 0 = off 1 ATT-OBJ** AO 0 - 100 dB/m / 0 0.1

1 = pos
2 = neg aWIDTH AW 0.1 - 9999 mm / 40 0.01
0.004 - 250“ / 1.500 0.001
AMPLCOR** AC -25 to +25 dB / 0 0.1
bLOGIC 2L 0 = aus 1
ANAMODE AQ 0 = 0 volt 1 = pos
1 = 5 volts 2 = neg
3 = a trig
ANGLE PA 0 - 90 / 0 0.1
bSTART 2D 0 - 9999 mm / 85 0.01
A-SCAN AS 0 = stndard 1 0 - 250” / 3.500 0.001
1 = compare
2 = envelop bTHRSH 2T 10 - 90 % / 30 1
3 = peak b -90 - -10 % additionally with rf
4 = afreeze
5 = bfreeze bWIDTH 2W 0.1 - 9999 mm / 40 0.01
6 = cfreeze*** 0.004 - 250“ / 1.500 0.001
aSTART AD 0 - 9999 mm / 35 0.01 CAL CA read only

0 - 250“ / 1.500 0.001
COMMENT CO alphanumerical input
aTHRSH AT 10 - 90 % / 40 1
-90 - -10 % additionally with rf COMPARE CP 0 = off 1
1 = on
ATT-REF** AR 0 - 100 dB/m / 0 0.1

CONTR LC 0 - 100 / 50 1 D eff** XD 3 - 35 mm / 9.7 0.01

only for probe-# 0 inch 0.120 - 1.400” / 0.380 0.001
COPYMOD CM 0 = hardcpy 1
1 = report D-DELAY DD -10 - 1024 mm / 0 0.01
2 = meas P1 -0.3 - 40“ / 0 0.001
3 = pardump
4 = PCX DELETE EA 0 = off 1
5 = store 1 = on
6 = datalog***
7 = off DEL-VEL** VV 1000 - 15000 m/s /2730 1
8 = special only for probe-# 0
DACMOD * TM 0 = off 1 DIAMET OD 10 - 2000 mm / 0.4 - 800” 0.1 / 0.01

1 = DAC 800.01” = flat
2 = TCG
DGS-CRV** DU 0.5 - 35 mm / 3.0 0.01
DACECHO * TE 0 - 10 / 0 1 0.02 - 1.400 / 0.1 0.001
DGSMOD** DS 0 = off 1
DAMPING PG 0 = low 1
1 = on
1 = high
DGS-REF** DR 0 = off 1
DATNAME DN alphanumerical input 1 = on
DATE DE numerical input

e.g. 26-01-99
DBSTEP ST 6.5 ... 20 dB 0.1
CONTR LC 0 - 100 / 50 1 D eff** XD 3 - 35 mm / 9.7 0.01

only for probe-# 0 inch 0.120 - 1.400” / 0.380 0.001
COPYMOD CM 0 = hardcpy 1
1 = report D-DELAY DD -10 - 1024 mm / 0 0.01
2 = meas P1 -0.3 - 40“ / 0 0.001
3 = pardump
4 = PCX DELETE EA 0 = off 1
5 = store 1 = on
6 = datalog***
7 = off DEL-VEL** VV 1000 - 15000 m/s /2730 1
8 = special only for probe-# 0
DACMOD * TM 0 = off 1 DIAMET OD 10 - 2000 mm / 0.4 - 800” 0.1 / 0.01

1 = DAC 800.01” = flat
2 = TCG
DGS-CRV** DU 0.5 - 35 mm / 3.0 0.01
DACECHO * TE 0 - 10 / 0 1 0.02 - 1.400 / 0.1 0.001
DGSMOD** DS 0 = off 1
DAMPING PG 0 = low 1
1 = on
1 = high
DGS-REF** DR 0 = off 1
DATNAME DN alphanumerical input 1 = on
DATE DE numerical input

e.g. 26-01-99
DBSTEP ST 6.5 ... 20 dB 0.1

DIALOG DG 0 = German 1 FILLED FI 0 = off 1

1 = English 1 = on
2 = French
3 = Italian FINE G FG –10 - +30 / 0 1
4 = Spanish
5 = Portuguese FLAWIND FB alphanumerical input
6 = Dutch
7 = Swedish FLAWLEN FL 0 - 999 mm / 0 0.01
8 = Slovenian 0 - 40“ / 0 0.001
9 = Romanian
10 = Finnish
FREQU FR 0 = 0.5 - 4 MHz 1
11 = Czech
1 = 2 - 20 MHz
12 = Danish
2 = 0.8 - 8 MHz
13 = Hungarian
3 = 0.2 - 1 MHz
14 = Croatian
15 = Russian
GAIN DB 0 - 110 dB / 30 0.1
16 = Slovakian
17 = Norwegian
19 = Polish HORN HO 0 = off 1
1 = on
DUAL DM 0 = off 1
1 = on LIGHT LT 0 = off 1
1 = on
EVA-MOD EM 0 = DAC 1
1 = DGS MAGNIFY MA 0 = off 1
2 = REF 1 = aGAT
2 = bGAT
DIALOG DG 0 = German 1 FILLED FI 0 = off 1

1 = English 1 = on
2 = French
3 = Italian FINE G FG –10 - +30 / 0 1
4 = Spanish
5 = Portuguese FLAWIND FB alphanumerical input
6 = Dutch
7 = Swedish FLAWLEN FL 0 - 999 mm / 0 0.01
8 = Slovenian 0 - 40“ / 0 0.001
9 = Romanian
10 = Finnish
FREQU FR 0 = 0.5 - 4 MHz 1
11 = Czech
1 = 2 - 20 MHz
12 = Danish
2 = 0.8 - 8 MHz
13 = Hungarian
3 = 0.2 - 1 MHz
14 = Croatian
15 = Russian
GAIN DB 0 - 110 dB / 30 0.1
16 = Slovakian
17 = Norwegian
19 = Polish HORN HO 0 = off 1
1 = on
DUAL DM 0 = off 1
1 = on LIGHT LT 0 = off 1
1 = on
EVA-MOD EM 0 = DAC 1
1 = DGS MAGNIFY MA 0 = off 1
2 = REF 1 = aGAT
2 = bGAT

MEAS-P1 M1 Setting range see S-DISP PRF-MOD PF 10 steps:

MEAS-P2 M2 0 = step 1 1
MEAS-P3 M3 1 = step 2
3 = step 4
MTLVEL SV 1000 - 15000 m/s / 5920 1 4 = step 5
40 - 600 “/ms / 233 0.1 5 = step 6
6 = step 7
OBJECT OB alphanumerical input 7 = step 8
8 = step 9
OFFSET * TO 0 - 14 dB / 0 0.5 9 = step 10
OPERAT PE alphanumerical input PROBE-#** PB 0 = variable / alphanumerical input

1 = B1-S 15 = SWB70-2
P-DELAY PD 0 - 199.99 µs / 0 0.01 2 = B2-S 16 = SWB45-5
3 = B4-s 17 = SWB60-5
4 = MB2-S 18 = SWB70-5
POWER PI 0 = low 1
5 = MB4-S 19 = WB45-1
1 = high
6 = MB5-S 20 = WB60-1
7 = MWB45-2 21 = WB70-1
PRBFREQ** XF 0.5 - 10.0 MHz 0.04
8 = MWB60-2 22 = WB45-2
9 = MWB70-2 23 = WB60-2
PRBNAME** PN alphanumerical input
10 = MWB45-4 24 = WB70-2
11 = MWB60-4
12 = MWB70-4
13 = SWB45-2
14 = SWB60-2
MEAS-P1 M1 Setting range see S-DISP PRF-MOD PF 10 steps:

MEAS-P2 M2 0 = step 1 1
3 = step 4
MTLVEL SV 1000 - 15000 m/s / 5920 1 4 = step 5
40 - 600 “/ms / 233 0.1 5 = step 6
6 = step 7
OBJECT OB alphanumerical input 7 = step 8
8 = step 9
OFFSET * TO 0 - 14 dB / 0 0.5 9 = step 10
OPERAT PE alphanumerical input PROBE-#** PB 0 = variable / alphanumerical input

1 = B1-S 15 = SWB70-2
P-DELAY PD 0 - 199.99 µs / 0 0.01 2 = B2-S 16 = SWB45-5
3 = B4-s 17 = SWB60-5
4 = MB2-S 18 = SWB70-5
POWER PI 0 = low 1
5 = MB4-S 19 = WB45-1
1 = high
6 = MB5-S 20 = WB60-1
7 = MWB45-2 21 = WB70-1
PRBFREQ** XF 0.5 - 10.0 MHz 0.04
8 = MWB60-2 22 = WB45-2
9 = MWB70-2 23 = WB60-2
PRBNAME** PN alphanumerical input
10 = MWB45-4 24 = WB70-2
11 = MWB60-4
12 = MWB70-4
13 = SWB45-2
14 = SWB60-2

PRINTER PR 0 = Epson 1 REFMODE RO 0 = off

1 = HP Laserjet 1 = on
2 = HP Deskjet
3 = DPU-41x REFSIZE** RS 0.5 - 10 mm / 3 0.01
RANGE DW 0.5 - 4 MHz / 0.2 - 1 MHz: REJECT RJ 0 - 80 % / 0 1

0.5 - 9999 mm / 250 0.01
0.02 - 390“ / 10 0.001 SCALE SE 0 = measval
1 = snd-pth.
2 - 20 / 0.8 - 8 MHz: 2 = div.
0.5 - 1420 mm / 250 0.01
0.02 - 56“ / 10 0.001 S-DISP VS 0 = off 1
1 = Sa
RECALL RD 0 = off 1 2 = Sb
1 = on 3 = Sc***
4 = Sc-a***
RECTIFY RF 0 = full-w 1 5 = Sc-b***
1= pos hw 6 = Sc-c***
2 = neg hw 7 = Ha %
3 = rf 8 = Hb %
9 = Hc %***
REFECHO RC 0 = no ref. 10 = Ha dB
1 = ref. stored 11 = Hb dB
12 = HC dB***
REFECHO** RE 0 = BW 1 13 = R-start
1 = SDH 14 = R-end
2 = FDH 15 = Da
PRINTER PR 0 = Epson 1 REFMODE RO 0 = off

1 = HP Laserjet 1 = on
2 = HP Deskjet
3 = DPU-41x REFSIZE** RS 0.5 - 10 mm / 3 0.01
RANGE DW 0.5 - 4 MHz / 0.2 - 1 MHz: REJECT RJ 0 - 80 % / 0 1

0.5 - 9999 mm / 250 0.01
0.02 - 390“ / 10 0.001 SCALE SE 0 = measval
1 = snd-pth.
2 - 20 / 0.8 - 8 MHz: 2 = div.
0.5 - 1420 mm / 250 0.01
0.02 - 56“ / 10 0.001 S-DISP VS 0 = off 1
1 = Sa
RECALL RD 0 = off 1 2 = Sb
1 = on 3 = Sc***
4 = Sc-a***
RECTIFY RF 0 = full-w 1 5 = Sc-b***
1= pos hw 6 = Sc-c***
2 = neg hw 7 = Ha %
3 = rf 8 = Hb %
9 = Hc %***
REFECHO RC 0 = no ref. 10 = Ha dB
1 = ref. stored 11 = Hb dB
12 = HC dB***
REFECHO** RE 0 = BW 1 13 = R-start
1 = SDH 14 = R-end
2 = FDH 15 = Da

16 = Db SET-# ND 1 - 200 / 1 1
17 = Dc***
18 = Pa S-REF1 R1 0 - 5000 mm / 50 0.01
19 = Pb 0 - 200” / 2.0 0.001
20 = Pc***
21 = Ra S-REF2 R2 0 - 5000 mm / 100 0.01
22 = Rb 0 - 200” / 4.0 0.001
23 = Rc***
24 = ERS STO-INF SC 0 = off 1
25 = Gt dB 1 = on
26 = Ha %Crv
27 = Hb % Crv STORE SD 0 = off 1
28 = Hc % Crv*** 1 = on
29 = alarm
30 = DGS-crv SURFACE SU alphanumerical input
31 = freeJob
32 = freeLoc
T-CORR * DC -24 - +24 dB / 0 0.5
33 = freeAsc
34 = freeLoJ
THICKNE TH 1 - 9999 mm / 25 0.01
35 = lastLoc
0.05 - 400“ / 1 0.001
36 = La
37 = Lb
38 = Lc TIME TI numerical input, e.g. 12:30:00
TOF AF 0 = flank 1
1 = peak
16 = Db SET-# ND 1 - 200 / 1 1
17 = Dc***
18 = Pa S-REF1 R1 0 - 5000 mm / 50 0.01
19 = Pb 0 - 200” / 2.0 0.001
20 = Pc***
21 = Ra S-REF2 R2 0 - 5000 mm / 100 0.01
22 = Rb 0 - 200” / 4.0 0.001
23 = Rc***
24 = ERS STO-INF SC 0 = off 1
25 = Gt dB 1 = on
26 = Ha %Crv
27 = Hb % Crv STORE SD 0 = off 1
28 = Hc % Crv*** 1 = on
29 = alarm
30 = DGS-crv SURFACE SU alphanumerical input
31 = freeJob
32 = freeLoc
T-CORR * DC -24 - +24 dB / 0 0.5
33 = freeAsc
34 = freeLoJ
THICKNE TH 1 - 9999 mm / 25 0.01
35 = lastLoc
0.05 - 400“ / 1 0.001
36 = La
37 = Lb
38 = Lc TIME TI numerical input, e.g. 12:30:00
TOF AF 0 = flank 1
1 = peak

Function Code Range / Default Resolution Other remote control codes

UNIT UN 0 = mm 1 Code Function/description
1 = inch
AP Analog output setting
X-POS XP 0 - 999 mm / 0 0.01 0 = amplitude
0 - 40“ / 0 0.001 1 = time of flight
X-VALUE XV 0 - 30 mm / 0 0.01 DA A-scan amplitudes transferred as binary data

0 - 40“ / 0 0.001
E1 Read value form measurement line (position 1)
Y-POS YP 0 - 999 mm / 0 0.01 E2 Read value form measurement line (position 2)
0 - 40“ / 0 0.001 E3 Read value form measurement line (position 3)
E5 Read value displayed in the A-scan
EV Read alarm LED status:

0 = no alarm
1 = alarm in A
2 = alarm in B
3 = alarm in A+B
HD Editable header data from report transferred as

ASCII-format data
I1 Set information line in the startup screen

(up to 39 characters)
Function Code Range / Default Resolution Other remote control codes

UNIT UN 0 = mm 1 Code Function/description
1 = inch
AP Analog output setting
X-POS XP 0 - 999 mm / 0 0.01 0 = amplitude
0 - 40“ / 0 0.001 1 = time of flight
X-VALUE XV 0 - 30 mm / 0 0.01 DA A-scan amplitudes transferred as binary data

0 - 40“ / 0 0.001
Y-POS YP 0 - 999 mm / 0 0.01 E2 Read value form measurement line (position 2)
0 - 40“ / 0 0.001 E3 Read value form measurement line (position 3)
E5 Read value displayed in the A-scan
EV Read alarm LED status:

0 = no alarm
1 = alarm in A
2 = alarm in B
3 = alarm in A+B
HD Editable header data from report transferred as

ASCII-format data

(up to 39 characters)

Code Function/description Control codes for the function keys

ID Read instrument software version Function Key Code Range
TF Freeze on/off:
0 = off
Left-hand rotary knob/ G+ increment
1 = on gain G- decrement
TZ Zoom on/off: Right-hand K+ increment

0 = off rotary knob K- decrement
1 = on
UD Send data set as binary data dB-STEP V DP 0 = 0.0

1 = 0.5
UR Read data set as binary data 2 = 1.0
3 = 2.0
SL “Scroll home”: selection of the first function in every
4 = 6.0
function group and of the left function group in every
function group line. 5 = 6.5 - 20
FREEZE W F off / on
ZOOM X Z off / on
MTLVEL Y C off / on
level E 10 1st/2nd operation level
Code Function/description Control codes for the function keys

ID Read instrument software version Function Key Code Range
TF Freeze on/off:
0 = off
Left-hand rotary knob/ G+ increment
1 = on gain G- decrement
TZ Zoom on/off: Right-hand K+ increment

0 = off rotary knob K- decrement
1 = on
UD Send data set as binary data dB-STEP V DP 0 = 0.0

1 = 0.5
UR Read data set as binary data 2 = 1.0
3 = 2.0
SL “Scroll home”: selection of the first function in every
4 = 6.0
function group and of the left function group in every
function group line. 5 = 6.5 - 20
FREEZE W F off / on
ZOOM X Z off / on
MTLVEL Y C off / on
level E 10 1st/2nd operation level

Function Key Code Function Key Code MSEL
BASE u 5 MSEL u 6
PULS u 6 LCD u 7
RECV u 7 CFG1 u 8
aGAT u 8 CFG2 u 9
bGAT u 9
Function Key Code
CAL u 5
first v 1
DAC/DGS u 6
second v 2
TRIG u 7
third v 3
MEM u 8
fourth v 4
DATA u 9
MEAS u 5
Function Key Code Function Key Code MSEL
BASE u 5 MSEL u 6
PULS u 6 LCD u 7
RECV u 7 CFG1 u 8
aGAT u 8 CFG2 u 9
bGAT u 9
Function Key Code
CAL u 5
first v 1
DAC/DGS u 6
second v 2
TRIG u 7
third v 3
MEM u 8
fourth v 4
DATA u 9
MEAS u 5

A Attention: In the interests of security, insert additional read

commands before reading the sound path, e.g.:
In rare cases concerning remote control sequences,
reading measurement values directly after changing a Command Answer Description
function value in the USM 25, there could be errors as
long as the instrument has not ended setting the value. In ...
such cases, additional commands must be inserted into <ESC>F<RETURN> „A-scan freeze“
<ESC>DB<RETURN> 580 „Read dB setting“
the remote control sequence before the measurement <ESC>DB<RETURN> 580 „Read dB setting“
values are read. <ESC>DB<RETURN> 580 „Read dB setting“
Example: <ESC>E3<RETURN> 50,74 „Read sound path“
<ESC>F<RETURN> „Disable A-scan freeze“
If you create a remote control sequence, by which the ...
sound path of an echo is read after freezing the A-scan,
the command chain would be as follows: With these measures you ensure that sufficient time
has passed in order to completely execute the previous
Command Answer Description
command (display freeze) before transferring the sound
path. Finally, check your remote control sequence to
<ESC>F<RETURN> „A-scan freeze“
<ESC>E3<RETURN> 50,74 „Read sound path“
see that the measurement values can be correctly
<ESC>F<RETURN> „Disable A-scan freeze“ read, and add further read commands if necessary.
...
A Attention: In the interests of security, insert additional read

commands before reading the sound path, e.g.:
In rare cases concerning remote control sequences,
reading measurement values directly after changing a Command Answer Description
function value in the USM 25, there could be errors as
long as the instrument has not ended setting the value. In ...
such cases, additional commands must be inserted into <ESC>F<RETURN> „A-scan freeze“
the remote control sequence before the measurement <ESC>DB<RETURN> 580 „Read dB setting“
values are read. <ESC>DB<RETURN> 580 „Read dB setting“
Example: <ESC>E3<RETURN> 50,74 „Read sound path“
<ESC>F<RETURN> „Disable A-scan freeze“
If you create a remote control sequence, by which the ...
sound path of an echo is read after freezing the A-scan,
the command chain would be as follows: With these measures you ensure that sufficient time
has passed in order to completely execute the previous
Command Answer Description
command (display freeze) before transferring the sound
path. Finally, check your remote control sequence to
<ESC>F<RETURN> „A-scan freeze“
<ESC>E3<RETURN> 50,74 „Read sound path“
see that the measurement values can be correctly
<ESC>F<RETURN> „Disable A-scan freeze“ read, and add further read commands if necessary.
...

Appendix 9
Appendix 9

Appendix Function directory
9.1 Function directory Function Function group Description
ATT-OBJ** DGS Sound attenuation in the

The functions marked with * are only available on the test object
USM 25 DAC / USM 25S (DAC evaluation mode),
those market with ** are exclusively available on the aWIDTH aGAT Width of the gate A
USM 25S (DGS evaluation mode). bLOGIC bGAT Evaluation logic in the gate B
Function Function group Description
bSTART bGAT Starting point of the gate B
aLOGIC aGAT Evaluation logic of the gate A
bTHRSH bGAT Starting point of the gate B
AMPLCOR** DGS Amplitude correction
bWIDTH bGAT Width of the gate B
ANAMOD CFG2 Setting of the analog output
CAL CAL Semiautomatic calibration
ANGLE TRIG Entry of the angle for calculating
the (reduced) projection CONTR LCD Setting the LCD contrast
distance (angle-beam probes)
COPYMOD CFG1 Assignment of the Y key
A-SCAN MEAS Settings of the A-scan
DACECHO * DAC Recording of a reference echo
aSTART aGAT Starting point of the gate A for the DAC
aTHRSH aGAT Threshold of the gate A DACMOD * DAC Activating/deactivating DAC
ATT-REF** DGS Sound attenuation in the DAMPING PULS Damping of the probe’s
reference block oscillating circuit
9.1 Function directory Function Function group Description
ATT-OBJ** DGS Sound attenuation in the

The functions marked with * are only available on the test object
USM 25 DAC / USM 25S (DAC evaluation mode),
those market with ** are exclusively available on the aWIDTH aGAT Width of the gate A
USM 25S (DGS evaluation mode). bLOGIC bGAT Evaluation logic in the gate B
Function Function group Description
bSTART bGAT Starting point of the gate B
aLOGIC aGAT Evaluation logic of the gate A
bTHRSH bGAT Starting point of the gate B
AMPLCOR** DGS Amplitude correction
bWIDTH bGAT Width of the gate B
ANAMOD CFG2 Setting of the analog output
CAL CAL Semiautomatic calibration
ANGLE TRIG Entry of the angle for calculating
the (reduced) projection CONTR LCD Setting the LCD contrast
distance (angle-beam probes)
COPYMOD CFG1 Assignment of the Y key
A-SCAN MEAS Settings of the A-scan
DACECHO * DAC Recording of a reference echo
aSTART aGAT Starting point of the gate A for the DAC
aTHRSH aGAT Threshold of the gate A DACMOD * DAC Activating/deactivating DAC
ATT-REF** DGS Sound attenuation in the DAMPING PULS Damping of the probe’s
reference block oscillating circuit

Function directory Appendix
Function Function group Description Function Function group Description
DATE CFG2 Current date DUAL PULS Separation of pulser and

receiver
dBSTEP RECV User-programmable gain step
EVA-MOD CFG2 Switchover REF – DAC – DGS
D-DELAY BASE Setting of the display start
FILLED LCD Selecting the echo display mode
D eff** DGS Effective element diameter of (filled or normal)
the probe used
FINE G RECV Fine adjustment of gain within a
DELETE MEM Deleting a stored data set range of approx. 4 dB in 40
steps
DEL-VEL** DGS Material velocity for prbe delay
FREQU RECV Selecting the frequency range
DGS-CRV** DGS Recording curve for DGS for the connected probe
evaluation mode
GAIN left-hand Setting of the gain
DGS-REF** DGS Recording of DGS reference rotary knob
echo
HORN CFG2 Switching the acoustic alarm
DIALOG CFG1 Selecting the language signal on/off
DIAMET TRIG Change between plane-parallel LIGHT LCD Switching the backlight on/off
and circular curved test
components MAGNIFY MEAS Gate spreading
DIR DATA Dataset directory

DATE CFG2 Current date DUAL PULS Separation of pulser and

receiver
dBSTEP RECV User-programmable gain step
EVA-MOD CFG2 Switchover REF – DAC – DGS
D-DELAY BASE Setting of the display start
FILLED LCD Selecting the echo display mode
D eff** DGS Effective element diameter of (filled or normal)
the probe used
FINE G RECV Fine adjustment of gain within a
DELETE MEM Deleting a stored data set range of approx. 4 dB in 40
steps
DEL-VEL** DGS Material velocity for prbe delay
FREQU RECV Selecting the frequency range
DGS-CRV** DGS Recording curve for DGS for the connected probe
evaluation mode
GAIN left-hand Setting of the gain
DGS-REF** DGS Recording of DGS reference rotary knob
echo
HORN CFG2 Switching the acoustic alarm
DIALOG CFG1 Selecting the language signal on/off
DIAMET TRIG Change between plane-parallel LIGHT LCD Switching the backlight on/off
and circular curved test
components MAGNIFY MEAS Gate spreading
DIR DATA Dataset directory

MEAS-P1 MSEL Selection of measured values RANGE BASE Setting of the range in which the
MEAS-P2 at four positions of the measurement is made.
MEAS-P3 measurment line
MEAS-P4 RECALL MEM Retrieving a stored data set
MTLVEL BASE Setting of the material sound RECTIFY RECV Selection of rectification
velocity
REFECHO REF For storing a reference echo
P-DELAY BASE Compensating for the probe for the measurement of
delay line dB difference
POWER PULS Setting the power of the initial REFECHO** DGS Type of the reference reflextor
pulse used
PRBFREQ** DGS Probe frequency REFMOD REF Activation of echo comparison
PREVIEW DATA Dataset preview with A-scan REFSIZE** DGS Size of the reference reflector
PRF-MOD PULS Setting the pulse repetition REJECT RECV Suppression of unwanted or
frequency spurious echo indications
PROBE-#** DGS Probe number SCALE LCD Choice of display mode

for the measurement line
PRINTER CFG1 Selecting the printer for the test
report S-DISP MEAS Zoomed display of a selected
parameter
MEAS-P1 MSEL Selection of measured values RANGE BASE Setting of the range in which the
MEAS-P2 at four positions of the measurement is made.
MEAS-P3 measurment line
MEAS-P4 RECALL MEM Retrieving a stored data set
MTLVEL BASE Setting of the material sound RECTIFY RECV Selection of rectification
velocity
REFECHO REF For storing a reference echo
P-DELAY BASE Compensating for the probe for the measurement of
delay line dB difference
POWER PULS Setting the power of the initial REFECHO** DGS Type of the reference reflextor
pulse used
PRBFREQ** DGS Probe frequency REFMOD REF Activation of echo comparison
PREVIEW DATA Dataset preview with A-scan REFSIZE** DGS Size of the reference reflector
PRF-MOD PULS Setting the pulse repetition REJECT RECV Suppression of unwanted or
frequency spurious echo indications
PROBE-#** DGS Probe number SCALE LCD Choice of display mode

for the measurement line
PRINTER CFG1 Selecting the printer for the test
report S-DISP MEAS Zoomed display of a selected
parameter

SET-# MEM Number of the data set UNIT CFG1 Selecting the unit of
measurement mm or inch
SETTING Data Display of a function list
X-VALUE TRIG Entry of the distance between
S-REF1 CAL Reference echo 1 for calibration probe index (sound exit point)
and leading face of the
S-REF2 CAL Reference echo 2 for calibration angle-beam probe
STORE MEM Saving the data set
T-CORR * DAC Sensitivity correction, e.g. to

compensate for transfer losses
TESTINF DATA Saving additional information
THICKNE TRIG Entry of workpiece thickness

for calculation of real flaw depth
TIME CFG2 Current time
TOF MEAS Selection of the measuring

point for the gate

SET-# MEM Number of the data set UNIT CFG1 Selecting the unit of
measurement mm or inch
SETTING Data Display of a function list
X-VALUE TRIG Entry of the distance between
S-REF1 CAL Reference echo 1 for calibration probe index (sound exit point)
and leading face of the
S-REF2 CAL Reference echo 2 for calibration angle-beam probe
STORE MEM Saving the data set
T-CORR * DAC Sensitivity correction, e.g. to

compensate for transfer losses
TESTINF DATA Saving additional information
THICKNE TRIG Entry of workpiece thickness

for calculation of real flaw depth
TIME CFG2 Current time
TOF MEAS Selection of the measuring

point for the gate

Appendix EC declaration of conformity
9.2 EC declaration of conformity

We declare that the USM 25 conforms to the following
European directives:
1. 89/336EEC -Electromagnetic compatibility-
2. 73/23/EEC, amended by the directive 93/68/EEC -

Low-voltage directive-
The conformity of the above-mentioned product with the

regulations of the directive 89/336EEC is proven by the
observance of the standard specifications
EN 55011 12/1998 Class A, Group 2 and
EN 50082-2 02/1996.

regulations of the directive 73/23/EEC, amended by the
directive 93/68/EEC, is proven by the observance of
the standard specifications
EN 61010 Part 1 03/1994 and
EN 61010-1/A2 05/1996.
Appendix EC declaration of conformity
9.2 EC declaration of conformity

We declare that the USM 25 conforms to the following
European directives:
1. 89/336EEC -Electromagnetic compatibility-
2. 73/23/EEC, amended by the directive 93/68/EEC -

Low-voltage directive-

regulations of the directive 89/336EEC is proven by the
observance of the standard specifications
EN 55011 12/1998 Class A, Group 2 and
EN 50082-2 02/1996.

regulations of the directive 73/23/EEC, amended by the
directive 93/68/EEC, is proven by the observance of
the standard specifications
EN 61010 Part 1 03/1994 and
EN 61010-1/A2 05/1996.

Manufacturer/Service addresses Appendix
9.3 Manufacturer/ If there is anything special that you would like to know
about the use, handling, operation and specifications of
Service addresses the instruments, please contact your nearest
Krautkramer Ultrasonic Systems representative or
The Krautkramer USM 25 is manufactured by: directly:
Agfa NDT GmbH Agfa NDT GmbH
Robert-Bosch-Str. 3
D – 50354 Hürth Krautkramer Ultrasonic Systems
Service-Center
Phone +49 (0) 22 33 - 601 111 Robert-Bosch-Str. 3
Fax +49 (0) 22 33 - 601 402 D – 50354 Hürth
The USM 25 is manufactured according to state-of-the- or:
art methods using high-quality components. Thorough
in-process inspections or intermediate tests and a Postfach 1363
quality management system certified to DIN EN ISO D – 50330 Hürth
9001 ensure an optimum quality of conformance of the
Phone +49 (0) 22 33 - 601 111
instrument.
Fax +49 (0) 22 33 - 601 402
Should you nevertheless detect an error on your E-Mail Hotline@AgfaNDT.de
instrument, switch the instrument off and remove the
batteries. Inform your local Krautkramer Ultrasonic
Systems Service indicating the error and describing it.
Keep the shipping container for any repairs possibly

required which cannot be made on the spot.
Manufacturer/Service addresses Appendix
9.3 Manufacturer/ If there is anything special that you would like to know
about the use, handling, operation and specifications of
Service addresses the instruments, please contact your nearest
Krautkramer Ultrasonic Systems representative or
The Krautkramer USM 25 is manufactured by: directly:
Agfa NDT GmbH Agfa NDT GmbH
Robert-Bosch-Str. 3
D – 50354 Hürth Krautkramer Ultrasonic Systems
Service-Center
Phone +49 (0) 22 33 - 601 111 Robert-Bosch-Str. 3
Fax +49 (0) 22 33 - 601 402 D – 50354 Hürth
The USM 25 is manufactured according to state-of-the- or:
art methods using high-quality components. Thorough
in-process inspections or intermediate tests and a Postfach 1363
quality management system certified to DIN EN ISO D – 50330 Hürth
9001 ensure an optimum quality of conformance of the
Phone +49 (0) 22 33 - 601 111
instrument.
Fax +49 (0) 22 33 - 601 402
Should you nevertheless detect an error on your E-Mail Hotline@AgfaNDT.de
instrument, switch the instrument off and remove the
batteries. Inform your local Krautkramer Ultrasonic
Systems Service indicating the error and describing it.
Keep the shipping container for any repairs possibly

required which cannot be made on the spot.

Appendix Manufacturer/Service addresses
France USA
Agfa NDT S.A. Agfa NDT Inc.

SAC Sans Souci 50 Industrial Park Road
68, Chemin des Ormeaux USA – Lewistown, PA 17044
F – 69760 Limonest
Phone +1 717 - 242 03 27
Phone +33 4 72 - 17 92 20 Fax +1 717 - 242 26 06
Fax +33 4 78 - 47 56 98
Great Britain
Agfa NDT Ltd.

Milburn Hill Road
University of Warwick Science Park
GB – Coventry CV4 7HS
Phone +44 24 - 7669 00 69

Fax +44 24 - 7669 30 32
Appendix Manufacturer/Service addresses
France USA
Agfa NDT S.A. Agfa NDT Inc.

SAC Sans Souci 50 Industrial Park Road
68, Chemin des Ormeaux USA – Lewistown, PA 17044
F – 69760 Limonest
Phone +1 717 - 242 03 27
Phone +33 4 72 - 17 92 20 Fax +1 717 - 242 26 06
Fax +33 4 78 - 47 56 98
Great Britain
Agfa NDT Ltd.

Milburn Hill Road
University of Warwick Science Park
GB – Coventry CV4 7HS
Phone +44 24 - 7669 00 69

Fax +44 24 - 7669 30 32

Changes 10
Changes 10

Changes
This chapter contains the latest changes or additions if

any.
Otherwise this chapter remains empty.
Changes
This chapter contains the latest changes or additions if

any.
Otherwise this chapter remains empty.

Index 11
Index 11

Index
A aSTART ................................................................. 5-27

starting point of gate A .......................................5-18
a trig
aTHRSH
triggering by an interface echo ............................5-17
Threshold of gate A ............................................ 5-18
A-Scan
aWIDTH
setting the A-scan ..............................................5-44
width of gate A ...................................................5-18
Accessories ............................................................ 2-5
Addresses............................................................... 9-7
B
Adjustment range
function directory ................................................. 9-2 Backlight ................................................................5-47
Adustment BASE (function group) ............................................ 5-6
coarse and fine .................................................... 4-7
Basic settings ......................................................... 4-9
aGAT (function group) ............................................5-16
Batteries ................................................................. 1-3
aLOGIC Care .................................................................... 7-2
evaluation logic gate A .......................................5-17 Charging the NiCd batteries ................................. 7-2
Inserting batteries ................................................ 3-3
Analog output ................................................. 5-54, 8-2
bGAT (function group) ............................................ 5-16
ANAMOD ...............................................................5-53
bLOGIC
ANGLE
evaluation logic gate B ....................................... 5-17
angle of incidence ..............................................5-31
bSTART
Anticoincidence .....................................................5-17
starting point of gate B .......................................5-18
Index
A aSTART ................................................................. 5-27

starting point of gate A .......................................5-18
a trig
aTHRSH
triggering by an interface echo ............................5-17
Threshold of gate A ............................................ 5-18
A-Scan
aWIDTH
setting the A-scan ..............................................5-44
width of gate A ...................................................5-18
Accessories ............................................................ 2-5
Addresses............................................................... 9-7
B
Adjustment range
function directory ................................................. 9-2 Backlight ................................................................5-47
Adustment BASE (function group) ............................................ 5-6
coarse and fine .................................................... 4-7
Basic settings ......................................................... 4-9
aGAT (function group) ............................................5-16
Batteries ................................................................. 1-3
aLOGIC Care .................................................................... 7-2
evaluation logic gate A .......................................5-17 Charging the NiCd batteries ................................. 7-2
Inserting batteries ................................................ 3-3
Analog output ................................................. 5-54, 8-2
bGAT (function group) ............................................ 5-16
ANAMOD ...............................................................5-53
bLOGIC
ANGLE
evaluation logic gate B ....................................... 5-17
angle of incidence ..............................................5-31
bSTART
Anticoincidence .....................................................5-17
starting point of gate B .......................................5-18
Index
bTHRSH Codes
Threshold of gate B ............................................ 5-18 Codes for function keys ...................................... 8-14
Function codes .................................................... 8-6
bWIDTH
Remote control .................................................... 8-5
width of gate B ...................................................5-18
Coincidence ........................................................... 5-17
Configuration ..........................................................5-49
C for test applications ............................................ 5-41
CAL Connecting a probe ................................................. 3-5
semiautomatic calibration ......................... 5-21, 5-24
CONTR ................................................................... 3-6
Calibration .............................................................. 5-19 LCD contrast ...................................................... 5-48
Dual-element (TR) probes ................................... 5-23
Straight-beam probes ......................................... 5-20 Controls .................................................................. 4-2
with unknown materials ...................................... 5-21 COPYMOD ...................................................... 6-3, 8-4
Care ........................................................................ 7-2 assignment of the COPY key ............................. 5-51
CFG1 (function group) ............................................ 5-49

CFG2 (function group) ............................................ 5-49 D
Changes ................................................................10-1 D-DELAY (Display starting point) ............................ 5-9
Charge indicator ...................................................... 3-3 DAC (function group) ..............................................5-58
Charging batteries ................................................... 3-3 DACECHO
recording reference curve ................................... 5-60
Index
bTHRSH Codes
Threshold of gate B ............................................ 5-18 Codes for function keys ...................................... 8-14
Function codes .................................................... 8-6
bWIDTH
Remote control .................................................... 8-5
width of gate B ...................................................5-18
Coincidence ........................................................... 5-17
Configuration ..........................................................5-49
C for test applications ............................................ 5-41
CAL Connecting a probe ................................................. 3-5
semiautomatic calibration ......................... 5-21, 5-24
CONTR ................................................................... 3-6
Calibration .............................................................. 5-19 LCD contrast ...................................................... 5-48
Dual-element (TR) probes ................................... 5-23
Straight-beam probes ......................................... 5-20 Controls .................................................................. 4-2
with unknown materials ...................................... 5-21 COPYMOD ...................................................... 6-3, 8-4
Care ........................................................................ 7-2 assignment of the COPY key ............................. 5-51
CFG1 (function group) ............................................ 5-49

CFG2 (function group) ............................................ 5-49 D
Changes ................................................................10-1 D-DELAY (Display starting point) ............................ 5-9
Charge indicator ...................................................... 3-3 DAC (function group) ..............................................5-58
Charging batteries ................................................... 3-3 DACECHO
recording reference curve ................................... 5-60

Index
DACMOD Deleting a reference echo ...................................... 5-29

activating DAC/TCG ...........................................5-59
Depth .....................................................................5-30
DACMOD (activating DAC) ....................................5-58
DGS evaluation (USM 25S) ....................................5-63
DAMPING (Probe matching) ..................................5-11
DIALOG
DATA (function group) ............................................5-36 selecting the language ......................................... 4-9
Data exchange ........................................................ 8-4 DIALOG (Selecting the language) .......................... 5-50
Data saving ............................................................5-33 DIR
directory of stored data sets ...............................5-36
Data set
Deleting ..............................................................5-34 DIR (dataset directory) ...........................................5-40
Management ......................................................5-36
Display .................................................................... 4-3
Storing ................................................................5-34
Backlight ............................................................ 4-10
Data transfer ........................................................... 6-4
Display range .......................................................... 5-6
DATE
Display starting point .............................................. 5-9
setting the gate ..................................................5-52
Distance-amplitude curve .......................................5-58
Date set
Recalling ............................................................5-35 DUAL
pulser-receiver separation ................................... 5-12
dBCORR (sensitivity correction) .............................5-61
DUAL (Pulser-receiver separation) .........................5-11
DBSTEP ................................................................5-14
Defects ................................................................... 1-3
Index
DACMOD Deleting a reference echo ...................................... 5-29

activating DAC/TCG ...........................................5-59
Depth .....................................................................5-30
DACMOD (activating DAC) ....................................5-58
DGS evaluation (USM 25S) ....................................5-63
DAMPING (Probe matching) ..................................5-11
DIALOG
DATA (function group) ............................................5-36 selecting the language ......................................... 4-9
Data exchange ........................................................ 8-4 DIALOG (Selecting the language) .......................... 5-50
Data saving ............................................................5-33 DIR
directory of stored data sets ...............................5-36
Data set
Deleting ..............................................................5-34 DIR (dataset directory) ...........................................5-40
Management ......................................................5-36
Display .................................................................... 4-3
Storing ................................................................5-34
Backlight ............................................................ 4-10
Data transfer ........................................................... 6-4
Display range .......................................................... 5-6
DATE
Display starting point .............................................. 5-9
setting the gate ..................................................5-52
Distance-amplitude curve .......................................5-58
Date set
Recalling ............................................................5-35 DUAL
pulser-receiver separation ................................... 5-12
dBCORR (sensitivity correction) .............................5-61
DUAL (Pulser-receiver separation) .........................5-11
DBSTEP ................................................................5-14
Defects ................................................................... 1-3

Index
E Freeze function ...................................................... 5-55

FREQU
EC declaration ........................................................ 9-6
Frequency range .................................................5-15
Echo display ..........................................................5-47
Frequency range ....................................................5-15
Enlarged echo display ........................................5-55
Zoom mode ......................................................... 4-3 Function directory ................................................... 9-2
Enlarged display Function groups ....................................... 4-4, 4-7, 5-3
of measurement value ......................................... 4-5
Functions ................................................................ 4-4
Errors ...................................................................... 1-3 Function directory ................................................ 9-2
Overview ............................................................. 5-2
Evaluation logic of the gates .................................. 5-17
Setting the functions ........................................... 4-7
EVAMOD ...............................................................5-54 Special keys ...................................................... 5-55
F G
FILLED Gain ........................................................................ 5-5
echo display .......................................................5-47 Fine adjustment .................................................. 5-13
FILLED (Echo display mode) .................................5-47 Incrementation ..................................................... 5-5
FINE G (fine adjustment of gain) ............................5-13 Gate setting ........................................................... 5-16
Flaw evaluation ....................................................... 1-7 Gates ..................................................................... 5-16

starting point ...................................................... 5-18
Flaw position calculation ........................................5-30 width ...................................................................5-18
Index
E Freeze function ...................................................... 5-55

FREQU
EC declaration ........................................................ 9-6
Frequency range .................................................5-15
Echo display ..........................................................5-47
Frequency range ....................................................5-15
Enlarged echo display ........................................5-55
Zoom mode ......................................................... 4-3 Function directory ................................................... 9-2
Enlarged display Function groups ....................................... 4-4, 4-7, 5-3
of measurement value ......................................... 4-5
Functions ................................................................ 4-4
Errors ...................................................................... 1-3 Function directory ................................................ 9-2
Overview ............................................................. 5-2
Evaluation logic of the gates .................................. 5-17
Setting the functions ........................................... 4-7
EVAMOD ...............................................................5-54 Special keys ...................................................... 5-55
F G
FILLED Gain ........................................................................ 5-5
echo display .......................................................5-47 Fine adjustment .................................................. 5-13
FILLED (Echo display mode) .................................5-47 Incrementation ..................................................... 5-5
FINE G (fine adjustment of gain) ............................5-13 Gate setting ........................................................... 5-16
Flaw evaluation ....................................................... 1-7 Gates ..................................................................... 5-16

starting point ...................................................... 5-18
Flaw position calculation ........................................5-30 width ...................................................................5-18

Index
H L
HORN Language ................................................................ 4-9
acoustic alarm ....................................................5-53
LCD (function group) ..............................................5-46
LCD contrast ........................................................... 3-6
I Lemo socket ........................................................... 8-2
Instrument versions ................................................ 1-9 LIGHT
Intefaces LCD backlight ..................................................... 5-47
RS232 interface ................................................... 8-3 switching the backlight .......................................4-10
Interface echo ........................................................5-17 Limits ...................................................................... 1-5
Interfaces
I/O interface ........................................................ 8-2 M
MAGNIFY
K gate spreading ....................................................5-44
Keys ....................................................................... 4-6 Maintenance ........................................................... 7-4

Special keys ......................................................5-55 Manufacturer ........................................................... 9-7
Material velocity ...................................................... 5-8
MEAS-P1 to P4 ...................................................... 4-5
Index
H L
HORN Language ................................................................ 4-9
acoustic alarm ....................................................5-53
LCD (function group) ..............................................5-46
LCD contrast ........................................................... 3-6
I Lemo socket ........................................................... 8-2
Instrument versions ................................................ 1-9 LIGHT
Intefaces LCD backlight ..................................................... 5-47
RS232 interface ................................................... 8-3 switching the backlight .......................................4-10
Interface echo ........................................................5-17 Limits ...................................................................... 1-5
Interfaces
I/O interface ........................................................ 8-2 M
MAGNIFY
K gate spreading ....................................................5-44
Keys ....................................................................... 4-6 Maintenance ........................................................... 7-4

Special keys ......................................................5-55 Manufacturer ........................................................... 9-7
Material velocity ...................................................... 5-8
MEAS-P1 to P4 ...................................................... 4-5

Index
Measurement line ........................................... 4-5, 5-42 P

configuration .......................................................5-45
P-DELAY (Probe delay) ......................................... 5-10
Measuring .............................................................. 5-26
POWER (Intensity) ................................................ 5-11
Measuring point ..................................................... 5-19
Power supply .......................................................... 3-2
MEM (function group) .............................................5-33
PREVIEW
MSEL (function group) ...........................................5-45
dataset preview ........................................ 5-36, 5-39
MTLVEL (Material velocity) ..................................... 5-8
PRF-MOD
Multiple DAC ..........................................................5-61 pulse repetition frequency ................................... 5-12
PRF-MOD (Pulse repetition frequency) .................. 5-12
O PRINTER
selecting the printer driver ..................................5-51
OFFSET
Printer
distance of multiple DAC ....................................5-62
preparing ............................................................. 6-2
OFFSET (distance of multiple DAC) ......................5-61
PRINTER (Printer for test report)............................5-47
Operating levels
Printer connection ................................................... 8-4
overview .............................................................. 5-2
Printing ................................................................... 8-4
Operator training ..................................................... 1-4
Printing data ............................................................ 6-2
Operator's controls .................................................. 4-2
Probe connection .................................................... 3-5
Index
Measurement line ........................................... 4-5, 5-42 P

configuration .......................................................5-45
P-DELAY (Probe delay) ......................................... 5-10
Measuring .............................................................. 5-26
POWER (Intensity) ................................................ 5-11
Measuring point ..................................................... 5-19
Power supply .......................................................... 3-2
MEM (function group) .............................................5-33
PREVIEW
MSEL (function group) ...........................................5-45
dataset preview ........................................ 5-36, 5-39
MTLVEL (Material velocity) ..................................... 5-8
PRF-MOD
Multiple DAC ..........................................................5-61 pulse repetition frequency ................................... 5-12
PRF-MOD (Pulse repetition frequency) .................. 5-12
O PRINTER
selecting the printer driver ..................................5-51
OFFSET
Printer
distance of multiple DAC ....................................5-62
preparing ............................................................. 6-2
OFFSET (distance of multiple DAC) ......................5-61
PRINTER (Printer for test report)............................5-47
Operating levels
Printer connection ................................................... 8-4
overview .............................................................. 5-2
Printing ................................................................... 8-4
Operator training ..................................................... 1-4
Printing data ............................................................ 6-2
Operator's controls .................................................. 4-2
Probe connection .................................................... 3-5

Index
Probe delay ............................................................5-10 REFECHO .............................................................5-27

Probe matching ......................................................5-11 REFMOD ...............................................................5-27
Projection distance ................................................5-30 REJECT ................................................................5-14
PULS (function group) ............................................5-10 Remote control ........................................................ 8-5
Pulse repetition frequency ......................................5-12 Reset ...................................................................... 3-6
Pulser adjustment ..................................................5-10 Rotary knobs........................................................... 4-8
Pulser-receiver separation ......................................5-12
S
R S-DISP ................................................................... 4-5
RANGE (Display range) .......................................... 5-7 S-DISP (zoomed display of reading) ......................5-42
Recalling a data set ...............................................5-35 Safety information ................................................... 1-2
Receiver adjustment ..............................................5-13 SCALE ...................................................................5-48
RECORD (recording reference curve) .....................5-59 Screen .................................................................... 4-3
RECTIFY ...............................................................5-15 Semiautomatic calibration ............................ 5-21, 5-24
RECTIFY (rectification) ..........................................5-15 Sensitivity correction .............................................5-61
RECV (function group) ...........................................5-13 Service ................................................................... 9-7
Reduced projection distance ..................................5-30
Index
Probe delay ............................................................5-10 REFECHO .............................................................5-27

Probe matching ......................................................5-11 REFMOD ...............................................................5-27
Projection distance ................................................5-30 REJECT ................................................................5-14
PULS (function group) ............................................5-10 Remote control ........................................................ 8-5
Pulse repetition frequency ......................................5-12 Reset ...................................................................... 3-6
Pulser adjustment ..................................................5-10 Rotary knobs........................................................... 4-8
Pulser-receiver separation ......................................5-12
S
R S-DISP ................................................................... 4-5
RANGE (Display range) .......................................... 5-7 S-DISP (zoomed display of reading) ......................5-42
Recalling a data set ...............................................5-35 Safety information ................................................... 1-2
Receiver adjustment ..............................................5-13 SCALE ...................................................................5-48
RECORD (recording reference curve) .....................5-59 Screen .................................................................... 4-3
RECTIFY ...............................................................5-15 Semiautomatic calibration ............................ 5-21, 5-24
RECTIFY (rectification) ..........................................5-15 Sensitivity correction .............................................5-61
RECV (function group) ...........................................5-13 Service ................................................................... 9-7
Reduced projection distance ..................................5-30

Index
SETTING T
function list .........................................................5-40
T-CORR
setting
sensitivity correction (DAC) ................................ 5-61
function list .........................................................5-36
transfer correction (DGS) .................................... 5-69
Sound attenuation (DGS) .......................................5-70
TCG ....................................................................... 5-59
Standard package ................................................... 2-3
Temperature ............................................................ 1-6
Start-up ................................................................... 3-6
Test report .............................................................. 6-3
Storing a data set ...................................................5-34
Test requirements ................................................... 1-5
Sub-D socket .......................................................... 8-3
TESTINF
SVEL1 (fixed sound velocity) .................................5-43 additional information for stored data sets ..........5-36
Switching on/off ...................................................... 3-6 THICKNE
material thickness ..............................................5-32
Symbols
in this manual ..................................................... 1-12 Threshold of the gates ........................................... 5-18
LED .................................................................... 5-56
TIME
Status symbols .......................................... 4-5, 5-56
setting the time .................................................. 5-52
TOF
selecting the measuring point ............................. 5-42
Transfer correction (DGS) ...................................... 5-69
TRIG (function group) ............................................. 5-30
Index
SETTING T
function list .........................................................5-40
T-CORR
setting
sensitivity correction (DAC) ................................ 5-61
function list .........................................................5-36
transfer correction (DGS) .................................... 5-69
Sound attenuation (DGS) .......................................5-70
TCG ....................................................................... 5-59
Standard package ................................................... 2-3
Temperature ............................................................ 1-6
Start-up ................................................................... 3-6
Test report .............................................................. 6-3
Storing a data set ...................................................5-34
Test requirements ................................................... 1-5
Sub-D socket .......................................................... 8-3
TESTINF
SVEL1 (fixed sound velocity) .................................5-43 additional information for stored data sets ..........5-36
Switching on/off ...................................................... 3-6 THICKNE
material thickness ..............................................5-32
Symbols
in this manual ..................................................... 1-12 Threshold of the gates ........................................... 5-18
LED .................................................................... 5-56
TIME
Status symbols .......................................... 4-5, 5-56
setting the time .................................................. 5-52
TOF
selecting the measuring point ............................. 5-42
Transfer correction (DGS) ...................................... 5-69
TRIG (function group) ............................................. 5-30

Index
U
Ultrasonic testing .................................................... 1-4
UNIT
Units of measurement ........................................5-49
Units ....................................................................... 4-9
W
Wall thickness ........................................................ 1-6
Width of the gates ..................................................5-18
X
X-position ...............................................................5-38
X-VALUE
of the probe ........................................................ 5-31
Z
Zoom mode ............................................................. 4-3
Index
U
Ultrasonic testing .................................................... 1-4
UNIT
Units of measurement ........................................5-49
Units ....................................................................... 4-9
W
Wall thickness ........................................................ 1-6
Width of the gates ..................................................5-18
X
X-position ...............................................................5-38
X-VALUE
of the probe ........................................................ 5-31
Z
Zoom mode ............................................................. 4-3

Option Data Logger
Krautkramer Option Data Logger (USM family) Issue 03, 06/2003 O-1
Option Data Logger
Contents
1 Introduction ...................................... O-5 2.2 Recording measured values (LOGG) .... O-16
Choosing a test job (JOB) ........................ O-16
1.1 The option Data Logger ........................... O-6
Choosing a location (LOCAT) ................... O-16
1.2 The Data Logger ....................................... O-6 Choosing a result (COMMENT) ................ O-16
1.3 Monitoring measured values ................... O-7 Saving a measured value (MEASVAL) ..... O-17
1.4 The third gate ........................................... O-7 2.3 Displaying measured values (VIEW) ..... O-20
1.5 Acoustic acknowledgement .................... O-7
1.6 Overview of the functions ........................ O-8 Reading the result (COMMENT) ............... O-21
Reading the measured value
2 Operating the Data Logger .............. O-9 (MEASVAL) ............................................. O-21
2.4 Clearing or deleting all jobs .................. O-21
2.1 Managing a test job (JOBS) ................... O-10
Clearing all jobs (CLR-ALL) ...................... O-21
The screen panel JOBEDIT ..................... O-10
Deleting all jobs (DEL-ALL) ...................... O-22
Setting up a test job ................................. O-12
Creating a test job .................................... O-13
3 Other functions ............................... O-23
Clearing a test job .................................... O-14
Deleting a test job .................................... O-15 3.1 Monitoring the measured values (TOL) O-24
Activating the Data Logger (DAT-LOG) ...... O-15 Defining the lower limit value (MIN-TOL) .. O-25
Defining the upper limit value (MAX-TOL) O-25
O-2 Issue 03, 06/2003 Krautkramer Option Data Logger (USM family)
Contents
1 Introduction ...................................... O-5 2.2 Recording measured values (LOGG) .... O-16
1.1 The option Data Logger ........................... O-6
1.2 The Data Logger ....................................... O-6 Choosing a result (COMMENT) ................ O-16
1.3 Monitoring measured values ................... O-7 Saving a measured value (MEASVAL) ..... O-17
1.4 The third gate ........................................... O-7 2.3 Displaying measured values (VIEW) ..... O-20
1.5 Acoustic acknowledgement .................... O-7
1.6 Overview of the functions ........................ O-8 Reading the result (COMMENT) ............... O-21
Reading the measured value
2 Operating the Data Logger .............. O-9 (MEASVAL) ............................................. O-21
2.4 Clearing or deleting all jobs .................. O-21
2.1 Managing a test job (JOBS) ................... O-10
Clearing all jobs (CLR-ALL) ...................... O-21
The screen panel JOBEDIT ..................... O-10
Deleting all jobs (DEL-ALL) ...................... O-22
Setting up a test job ................................. O-12
Creating a test job .................................... O-13
3 Other functions ............................... O-23
Clearing a test job .................................... O-14
Deleting a test job .................................... O-15 3.1 Monitoring the measured values (TOL) O-24
Activating the Data Logger (DAT-LOG) ...... O-15 Defining the lower limit value (MIN-TOL) .. O-25
Defining the upper limit value (MAX-TOL) O-25
Contents
Activating the tolerance monitor

(TOL-MON) .............................................. O-26
Activating the minimum reading
capture mode (MIN-CAP) ......................... O-27
3.2 Setting the gate (cGAT) .......................... O-28
Evaluation logic of the gate C (cLOGIC) .. O-28
Starting point of the gate (cSTART) ......... O-29
Width of the gate (cWIDTH) ..................... O-29
Response and measuring threshold
of the gate (cTHRSH) .............................. O-29
4 Documentation ............................... O-31

4.1 Printing out the test report .................... O-32
5 Remote control ............................... O-33

5.1 Remote control....................................... O-34
5.2 Functions and remote control codes .... O-34
Contents
Activating the tolerance monitor

(TOL-MON) .............................................. O-26
Activating the minimum reading
capture mode (MIN-CAP) ......................... O-27
3.2 Setting the gate (cGAT) .......................... O-28
Evaluation logic of the gate C (cLOGIC) .. O-28
Starting point of the gate (cSTART) ......... O-29
Width of the gate (cWIDTH) ..................... O-29
Response and measuring threshold
of the gate (cTHRSH) .............................. O-29
4 Documentation ............................... O-31

4.1 Printing out the test report .................... O-32
5 Remote control ............................... O-33

5.1 Remote control....................................... O-34
5.2 Functions and remote control codes .... O-34
Contents
Contents
Introduction 1
Introduction 1
Introduction The Data Logger
1.1 The option Data Logger 1.2 The Data Logger

The option Data Logger makes an additional operating The Data Logger gives you the possibility of easily
level available to you. It includes the five function managing test jobs as well as storing and documenting
groups JOBS, LOGG, VIEW, TOL and cGAT. The the test results. Using test jobs that you have clearly
groups JOBS, LOGG and VIEW serve for the operation and explicitly named and described, you can record,
of the Data Logger. The group TOL enables the monitor- display, and print out measured values. In this way,
ing of the measured values by means of a tolerance you can selectively access readings that your’re look-
monitor and minimum reading capture mode. The group ing for.
cGAT serves for the configuration of a third gate.
You can create up to 100 test jobs. The total storage
The option Data Logger can be added to all instrument capacity is 5000 measurement values plus 500
versions of the ultrasonic flaw detectors USM 25 (from A-scans. Further you can create an individual com-
serial number 1500 up), USM 23, USM 23Ex and ment list with 10 text lines (results) for each job.
USM 35. These results are linked to the measured values.
Introduction The Data Logger
1.1 The option Data Logger 1.2 The Data Logger

The option Data Logger makes an additional operating The Data Logger gives you the possibility of easily
level available to you. It includes the five function managing test jobs as well as storing and documenting
groups JOBS, LOGG, VIEW, TOL and cGAT. The the test results. Using test jobs that you have clearly
groups JOBS, LOGG and VIEW serve for the operation and explicitly named and described, you can record,
of the Data Logger. The group TOL enables the monitor- display, and print out measured values. In this way,
ing of the measured values by means of a tolerance you can selectively access readings that your’re look-
monitor and minimum reading capture mode. The group ing for.
cGAT serves for the configuration of a third gate.
You can create up to 100 test jobs. The total storage
The option Data Logger can be added to all instrument capacity is 5000 measurement values plus 500
versions of the ultrasonic flaw detectors USM 25 (from A-scans. Further you can create an individual com-
serial number 1500 up), USM 23, USM 23Ex and ment list with 10 text lines (results) for each job.
USM 35. These results are linked to the measured values.
Monitoring measured values Introduction
1.3 Monitoring measured values 1.4 The third gate

The Data Logger option provides you with an individu- The Data Logger option makes an additional third gate
ally configurable tolerance monitor and the minimum available to you. The gate C is configured and used
reading capture mode to monitor measured values. analogously to the two gates A and B that you already
know. You can use the gate C e.g. for measurements of
The tolerance monitor will help you to ensure that the sound path differences between the gates B and C if
measured values are within an individually variable the gate a is already occupied by another job (e.g.
tolerance range. If this is not the case, an alarm is monitoring of the interface echo).
triggered.
The minimum reading capture mode serves for the

storage of the smallest sound path or the smallest 1.5 Acoustic acknowledgement
sound path difference. The value remains stored until
an even smaller value occurs. This function is useful You can activate an acoustic acknowledgement for
with remaining wall thickness measurements on tubes. recording your measured values.
– Adjust the option beep in the function HORN.
Recording of measured values is now acknowledged

by a short acoustic acknowledgement signal. After
saving the measured value with A-scan, a long acous-
tic acknowledgement signal will sound.
Monitoring measured values Introduction
1.3 Monitoring measured values 1.4 The third gate

The Data Logger option provides you with an individu- The Data Logger option makes an additional third gate
ally configurable tolerance monitor and the minimum available to you. The gate C is configured and used
reading capture mode to monitor measured values. analogously to the two gates A and B that you already
know. You can use the gate C e.g. for measurements of
The tolerance monitor will help you to ensure that the sound path differences between the gates B and C if
measured values are within an individually variable the gate a is already occupied by another job (e.g.
tolerance range. If this is not the case, an alarm is monitoring of the interface echo).
triggered.
The minimum reading capture mode serves for the

storage of the smallest sound path or the smallest 1.5 Acoustic acknowledgement
sound path difference. The value remains stored until
an even smaller value occurs. This function is useful You can activate an acoustic acknowledgement for
with remaining wall thickness measurements on tubes. recording your measured values.
– Adjust the option beep in the function HORN.
Recording of measured values is now acknowledged

by a short acoustic acknowledgement signal. After
saving the measured value with A-scan, a long acous-
tic acknowledgement signal will sound.
Introduction Overview of the functions
1.6 Overview of the functions Function groups of the 4th operating level
JOBS This is where you’ll find functions required for

The functions of the Data Logger are located at the 4th
setting up and for editing your test jobs.
operating level. You will recognize the 4th operating
level by the small number 4 between the first and the LOGG This menu serves for the logging or recording
second function field. of measured values in a test job.
VIEW This menu serves for the representation of all

measured values of a test job, including
Besides the function groups of the Data Logger, there A-scan.
are two more function groups at the 4th operating level.
TOL Functions for monitoring the measured values.
The functions of the group TOL serve for the monitor-
ing of measured values by means of a tolenrance cGAT All functions for setting the gate C are to be
monitor and a minimum reading capture mode. You can found in this function group.
use the functions of the group cGAT to configure a
third gate.
Introduction Overview of the functions
1.6 Overview of the functions Function groups of the 4th operating level
JOBS This is where you’ll find functions required for

The functions of the Data Logger are located at the 4th
setting up and for editing your test jobs.
operating level. You will recognize the 4th operating
level by the small number 4 between the first and the LOGG This menu serves for the logging or recording
second function field. of measured values in a test job.
VIEW This menu serves for the representation of all

measured values of a test job, including
Besides the function groups of the Data Logger, there A-scan.
are two more function groups at the 4th operating level.
TOL Functions for monitoring the measured values.
The functions of the group TOL serve for the monitor-
ing of measured values by means of a tolenrance cGAT All functions for setting the gate C are to be
monitor and a minimum reading capture mode. You can found in this function group.
use the functions of the group cGAT to configure a
third gate.
Operating the Data Logger 2
Operating the Data Logger 2
Operating the Data Logger Managing a test job
2.1 Managing a test job (JOBS) The screen panel JOBEDIT
The functions of this group enable you to create, save, This section gives you an overview of the functions
and delete test jobs. Moreover, you can use this func- that you can operate using the screen panel JOBEDIT.
tion group to switch the Data Logger on or off. For information on how to create test jobs step by
step, please read the next section.
– Use the key to go to the 4th operating level.
– Select on in the function JOBEDIT. The screen
– Use to select the function group JOBS. panel JOBEDIT is displayed. The screen panel
shows the settings belonging to the current test job.
2.1 Managing a test job (JOBS) The screen panel JOBEDIT
The functions of this group enable you to create, save, This section gives you an overview of the functions
and delete test jobs. Moreover, you can use this func- that you can operate using the screen panel JOBEDIT.
tion group to switch the Data Logger on or off. For information on how to create test jobs step by
step, please read the next section.
– Select on in the function JOBEDIT. The screen
– Use to select the function group JOBS. panel JOBEDIT is displayed. The screen panel
shows the settings belonging to the current test job.
Managing a test job Operating the Data Logger
You can create and save the test jobs by means of the Use these functions to manage your test jobs:
JOBEDIT screen panel. You can provide the test jobs
with additional information in order to selectively ac- DELETE Deletes the test job having the current job
cess individual test jobs at a later date. This will offer number
you an easy way of data management. You have 9 data
CLEAR Clears all readings in the current test job,
input fields at your disposal for creating test jobs.
the test job itself is maintained
Enter numerical values in these fields: CREATE Creates the test job with the current job
JOB-# Number of the current test job number and the current settings
ROW Number of rows

H Note:
COLUMN Number of columns Detailed information about entering charactes into field
is given in chapter 5.11 or 5.12 in the operating manual
You can enter a maximum of 24 alphanumerical char-
of your ultrasonic flaw detector USM.
acters each in the following fields:
JOB-NAM Name of the current test job
LOC-NAM Name of the test location
COM-NAM The result text belonging to the result

number
You can create and save the test jobs by means of the Use these functions to manage your test jobs:
JOBEDIT screen panel. You can provide the test jobs
with additional information in order to selectively ac- DELETE Deletes the test job having the current job
cess individual test jobs at a later date. This will offer number
you an easy way of data management. You have 9 data
CLEAR Clears all readings in the current test job,
input fields at your disposal for creating test jobs.
the test job itself is maintained
Enter numerical values in these fields: CREATE Creates the test job with the current job
JOB-# Number of the current test job number and the current settings
ROW Number of rows

H Note:
COLUMN Number of columns Detailed information about entering charactes into field
is given in chapter 5.11 or 5.12 in the operating manual
You can enter a maximum of 24 alphanumerical char-
of your ultrasonic flaw detector USM.
acters each in the following fields:
JOB-NAM Name of the current test job
LOC-NAM Name of the test location
COM-NAM The result text belonging to the result

number
Setting up a test job You can file a maximum of 10 result texts at the result
numbers 1 ... 10 for every test job. Every measured
You can use the JOB-MEN screen to define a new test value can be linked to one of the result texts existing
job. As an option, you can identify the test job with a for this job.
name (24 characters) and link it to a stored instrument
setting (data set). The job number is required for the Proceed as follows in order to define a new test job:
job management. Job numbers that have already been
assigned to a job are indicated by an asterisk. The H Note:
new test job uses either no fixed instrument setting
(DATA-# = 0) or the instrument settings of the data set Please check that the job number is not occupied.
assigned to it. Data sets that have already been cre- Occupied jobs cannot be overwritten with new test
ated are indicated by an asterisk. Data sets used in jobs. If necessary, choose another job number.
test jobs are identified by a # sign.
– Adjust the required job number in the field JOB-#.
All data form an integral part of the test report. The
– Adjust the required job name in the field JOB-NAM.
name serves for an easy identification of the test job
during the further course of work with the Data Logger. – Choose the number of rows for the present test job
You should therefore choose a name which is as clear in the field ROW.
and definite as possible for the test job.
– Choose the number of columns for the present test
You have to assign the number of the corresponding job in the field COLUMN.
test locations, i.e. rows and columns, to every test job.
In addition, you can give every test location a name.
These data likewise form an integral part of the test
report and facilitate the access to the measurement
data.
Setting up a test job You can file a maximum of 10 result texts at the result
numbers 1 ... 10 for every test job. Every measured
You can use the JOB-MEN screen to define a new test value can be linked to one of the result texts existing
job. As an option, you can identify the test job with a for this job.
name (24 characters) and link it to a stored instrument
setting (data set). The job number is required for the Proceed as follows in order to define a new test job:
job management. Job numbers that have already been
assigned to a job are indicated by an asterisk. The H Note:
new test job uses either no fixed instrument setting
(DATA-# = 0) or the instrument settings of the data set Please check that the job number is not occupied.
assigned to it. Data sets that have already been cre- Occupied jobs cannot be overwritten with new test
ated are indicated by an asterisk. Data sets used in jobs. If necessary, choose another job number.
test jobs are identified by a # sign.
– Adjust the required job number in the field JOB-#.
All data form an integral part of the test report. The
– Adjust the required job name in the field JOB-NAM.
name serves for an easy identification of the test job
during the further course of work with the Data Logger. – Choose the number of rows for the present test job
You should therefore choose a name which is as clear in the field ROW.
and definite as possible for the test job.
– Choose the number of columns for the present test
You have to assign the number of the corresponding job in the field COLUMN.
test locations, i.e. rows and columns, to every test job.
In addition, you can give every test location a name.
These data likewise form an integral part of the test
report and facilitate the access to the measurement
data.
H Note: H Note:
The maximum number of rows is 5,000 if no test job The new test job uses the instrument settings saved
exists as yet and if the number of columns is set to to the data set (DATA-# not 0). Data sets that have
A (= 1 column). The maximum number of columns is already been created are indicated with an asterisk. If
26 (COLUMN = Z) with the product from the number of required, create a corresponding data set assigned to
rows and the number of columns not being larger than the test job you are about to generate.
the remaining free memory space. All inputs are
checked immediately, and if the memory capacity is If you are recording measured values on the Data
exceeded, there is a warning message No more free Logger, the default result number indicated is 1 for the
locations. result. You should therefore store the text for a positive
result at the result number 1.
– Select a result number in the field COM-#.
– Enter the result text for the result number previously

Creating a test job
selected in the field COM-NAM. After you have set all parameters for the new test job,
– Type in the texts for other result numbers if neces- you can create the test job. Only the test job whose job
sary. number is currently indicated in the field JOB-# is cre-
ated in each case.
– Select the data set that you want to assign to this
job in the field DATA-#. Keep DATA-# = 0 if you don’t – Choose the option on in the field CREATE to create
want to have any linking. the new test job.
The creation of the test job is confirmed by the follow-

ing display message: Job is created
H Note: H Note:
The maximum number of rows is 5,000 if no test job The new test job uses the instrument settings saved
exists as yet and if the number of columns is set to to the data set (DATA-# not 0). Data sets that have
A (= 1 column). The maximum number of columns is already been created are indicated with an asterisk. If
26 (COLUMN = Z) with the product from the number of required, create a corresponding data set assigned to
rows and the number of columns not being larger than the test job you are about to generate.
the remaining free memory space. All inputs are
checked immediately, and if the memory capacity is If you are recording measured values on the Data
exceeded, there is a warning message No more free Logger, the default result number indicated is 1 for the
locations. result. You should therefore store the text for a positive
result at the result number 1.
– Select a result number in the field COM-#.
– Enter the result text for the result number previously

Creating a test job
selected in the field COM-NAM. After you have set all parameters for the new test job,
– Type in the texts for other result numbers if neces- you can create the test job. Only the test job whose job
sary. number is currently indicated in the field JOB-# is cre-
ated in each case.
– Select the data set that you want to assign to this
job in the field DATA-#. Keep DATA-# = 0 if you don’t – Choose the option on in the field CREATE to create
want to have any linking. the new test job.
The creation of the test job is confirmed by the follow-

ing display message: Job is created
H Note: No more free locations

After the test job has been created, the names of test This message indicates that the memory capacity
locations are automatically generated according to the would be exceeded with the specified values for ROW
following pattern: and COLUMN. Change the values or delete single or all
jobs in order to obtain more free memory space.
LOC-# 1, 2, 3, 4, ...
LOC-NAM A1, A2, A3, ... B1, B2, B3, ... Xn Clearing a test job
You can now edit the names of the test locations as You have the possibility of clearing the current test job.
required. In this process, all readings are deleted from the test
job. The test job itself is maintained.
If one of the following error messages is shown, the
test job could not be successfully created.
H Note:
CREATE blocked by JOB-# = *n
After clearing a job, you will not obtain any new
This message indicates that a test job is already memory location. This will continue to be reserved for
stored at the selected job number. Assign a free job the job. The reserved memory location will not be en-
number to the current test job, and create the test job. abled again until after deleting the test job.
CREATE blocked by DAT-LOG = row (column) – Choose the option on in the field CLEAR in order to
delete all readings from the test job. Clear job? is
This message indicates that you can not create a new displayed.
test job when the data logger is active. Switch off the
data logger at first (DAT-LOG = off). – Confirm by pressing the corresponding function key
once again.
H Note: No more free locations

After the test job has been created, the names of test This message indicates that the memory capacity
locations are automatically generated according to the would be exceeded with the specified values for ROW
following pattern: and COLUMN. Change the values or delete single or all
jobs in order to obtain more free memory space.
LOC-# 1, 2, 3, 4, ...
LOC-NAM A1, A2, A3, ... B1, B2, B3, ... Xn Clearing a test job
You can now edit the names of the test locations as You have the possibility of clearing the current test job.
required. In this process, all readings are deleted from the test
job. The test job itself is maintained.
If one of the following error messages is shown, the
test job could not be successfully created.
H Note:
CREATE blocked by JOB-# = *n
After clearing a job, you will not obtain any new
This message indicates that a test job is already memory location. This will continue to be reserved for
stored at the selected job number. Assign a free job the job. The reserved memory location will not be en-
number to the current test job, and create the test job. abled again until after deleting the test job.
CREATE blocked by DAT-LOG = row (column) – Choose the option on in the field CLEAR in order to
delete all readings from the test job. Clear job? is
This message indicates that you can not create a new displayed.
test job when the data logger is active. Switch off the
data logger at first (DAT-LOG = off). – Confirm by pressing the corresponding function key
once again.
Deleting a test job If the Data Logger is on and a test job with a data set
linked to it has been selected, many instrument func-
The field DELETE serves for the deletion of the current tions will be blocked so that you can no longer operate
test job. The complete test job is deleted. them (interlocking).
– Choose the option on in the field DELETE in order In the case of test jobs without data sets linked to
to delete the current test job. Delete job? is dis- them (DATA-# = 0) you can operate all instrument func-
played. tions during the recording of measured values.
– Confirm by pressing the corresponding function key
once again. H Note:
The moment the Data Logger is activated, the test job
Activating the Data Logger (DAT-LOG) currently selected in the menu LOGG is also activated.
If applicable, the corresponding data set is loaded and
You have to switch on the Data Logger in order to work the A-scan is displayed in the FREEZE mode.
with the test jobs.
Release the A-scan using the key in order to start
The recording mode Row means that the location in with the recording of measured values.
the next row of the same column is selected after
saving a measured value. The recording mode Column
means that the location in the next column of the same
row is selected after saving a measured value.
– Select Row or Column in the function DAT-LOG.
Deleting a test job If the Data Logger is on and a test job with a data set
linked to it has been selected, many instrument func-
The field DELETE serves for the deletion of the current tions will be blocked so that you can no longer operate
test job. The complete test job is deleted. them (interlocking).
– Choose the option on in the field DELETE in order In the case of test jobs without data sets linked to
to delete the current test job. Delete job? is dis- them (DATA-# = 0) you can operate all instrument func-
played. tions during the recording of measured values.
once again. H Note:
The moment the Data Logger is activated, the test job
Activating the Data Logger (DAT-LOG) currently selected in the menu LOGG is also activated.
If applicable, the corresponding data set is loaded and
You have to switch on the Data Logger in order to work the A-scan is displayed in the FREEZE mode.
with the test jobs.
Release the A-scan using the key in order to start
The recording mode Row means that the location in with the recording of measured values.
the next row of the same column is selected after
saving a measured value. The recording mode Column
means that the location in the next column of the same
row is selected after saving a measured value.
– Select Row or Column in the function DAT-LOG.
Operating the Data Logger Recording measured values
2.2 Recording measured values Choosing a test job (JOB)

(LOGG) This is where you can choose the name of the test job
for which you want to record measured values.
This function group serves for the recording of mea-
sured values in previously created test jobs. – Choose the required test job in the function JOB.

Choosing a location (LOCAT)
– Use to select the function group LOGG.
This is where you can choose a test location within the
current test job.
– Choose the required test location in the function

LOCAT.
Choosing a result (COMMENT)

This is where you can choose a result for the current
measurement.
– Choose the required result in the function

COMMENT.
2.2 Recording measured values Choosing a test job (JOB)

(LOGG) This is where you can choose the name of the test job
for which you want to record measured values.
This function group serves for the recording of mea-
sured values in previously created test jobs. – Choose the required test job in the function JOB.

Choosing a location (LOCAT)
This is where you can choose a test location within the
current test job.
– Choose the required test location in the function

LOCAT.
Choosing a result (COMMENT)

This is where you can choose a result for the current
measurement.
– Choose the required result in the function

COMMENT.
Recording measured values Operating the Data Logger
Saving a measured value (MEASVAL) Ha % Echo height in the gate a in percentage of

screen height
You can display and save a selected measured value.
The measured value to be stored must already be se- Hb % Echo height in the gate B in percentage of
lected in the data set assigned to the test job. In the screen height
case of test jobs with no data set linked to them, you
Hc % Echo height in the gate C in percentage of
can freely choose the type of measured value to be
screen height
stored – even during the recording of measured values.
The selected type of measured value is stored together Ha dB Echo height in the gate A in dB
with each measured value.
Hb dB Echo height in the gate B in dB
You can choose between the following measured val-
ues in the function S-DISP (menu MEAS in the third Hc dB Echo height in the gate C in dB
operating level):
R-start Start of calibration range
Sa Sound path in the gate A
R-end End of calibration range
Sb Sound path in the gate B
Da Depth in gate A
Sc Sound path in the gate C
Db Depth in gate B
Sc-a Sound path difference between the gates
C and A Dc Depth in gate C
Sc-b Sound path difference between the gates Pa Projection distance in gate A
C and B Pb Projection distance in gate B
Sb-a Sound path difference between the gates Pc Projection distance in gate C
B and A
Saving a measured value (MEASVAL) Ha % Echo height in the gate a in percentage of

screen height
You can display and save a selected measured value.
The measured value to be stored must already be se- Hb % Echo height in the gate B in percentage of
lected in the data set assigned to the test job. In the screen height
case of test jobs with no data set linked to them, you
Hc % Echo height in the gate C in percentage of
can freely choose the type of measured value to be
screen height
stored – even during the recording of measured values.
The selected type of measured value is stored together Ha dB Echo height in the gate A in dB
with each measured value.
Hb dB Echo height in the gate B in dB
You can choose between the following measured val-
ues in the function S-DISP (menu MEAS in the third Hc dB Echo height in the gate C in dB
operating level):
R-start Start of calibration range
Sa Sound path in the gate A
R-end End of calibration range
Sb Sound path in the gate B
Da Depth in gate A
Sc Sound path in the gate C
Db Depth in gate B
Sc-a Sound path difference between the gates
C and A Dc Depth in gate C
Sc-b Sound path difference between the gates Pa Projection distance in gate A
C and B Pb Projection distance in gate B
Sb-a Sound path difference between the gates Pc Projection distance in gate C
B and A
Ra Reduced projection distance in gate A freeLoJ Number of free locations in the current
test job
Rb Reduced projection distance in gate B
LastLoc Last stored measurement value
Rc Reduced projection distance in gate C
La Number of legs in gate A
ERS Equivalent reflector size in gate C
Lb Number of legs in gate B
Gt dB DGS reference gain
Lc Number of legs in gate C
Ha %CRV Echo height in gate A in percentage
referred to the DAC/DGS curve
A Attention!
Hb %CRV Echo height in gate B in percentage
When saving measured values, already stored values
of the same location are overwritten after previous
Hc %CRV Echo height in gate C in percentage warning and confirmation with the storage key.
H Note:
Alarm Gate alarms
After storing a measured value, the next test location
DGS-crv Diameter of the represented DGS curve is selected automatically. When reaching the last loca-
tion of a test job this location will remain selected. You
freeJob Remaining memory capacity for free jobs
can store additional measured values by selecting new
freeLoc Remaining memory capacity for free test test locations with the function LOCAT coming from
locations the last test location.
freeAsc Remaining memory capacity for free – Activate the function DAT-LOG in the function group
A-scans JOBS.
Ra Reduced projection distance in gate A freeLoJ Number of free locations in the current
test job
Rb Reduced projection distance in gate B
LastLoc Last stored measurement value
Rc Reduced projection distance in gate C
La Number of legs in gate A
ERS Equivalent reflector size in gate C
Lb Number of legs in gate B
Gt dB DGS reference gain
Lc Number of legs in gate C
Ha %CRV Echo height in gate A in percentage
A Attention!
Hb %CRV Echo height in gate B in percentage
When saving measured values, already stored values
of the same location are overwritten after previous
Hc %CRV Echo height in gate C in percentage warning and confirmation with the storage key.
H Note:
Alarm Gate alarms
After storing a measured value, the next test location
DGS-crv Diameter of the represented DGS curve is selected automatically. When reaching the last loca-
tion of a test job this location will remain selected. You
freeJob Remaining memory capacity for free jobs
can store additional measured values by selecting new
freeLoc Remaining memory capacity for free test test locations with the function LOCAT coming from
locations the last test location.
freeAsc Remaining memory capacity for free – Activate the function DAT-LOG in the function group
A-scans JOBS.
– Use to select the function group LOGG H Note:
– Select the desired test job in the function JOB. Due to the characteristics of the membrane key pad, it
may be possible that one single press on a key may
– If necessary choose the test location for saving the lead to a double or even multiple contact. Subse-
measured value in the function LOCAT. quently multiple storage of readings may occur, espe-
cially when a key is pressed not centrally.
– Carry out the measuring.
– If necessary choose the result saved with the

measured value in the function COMMENT.
– To save the measured value only press the storage

key (key at USM 25 and USM 23, key in at
USM 35).
or
– Keep the storage key pressed down for more than

1 second in order to save the measured value and
the A-scan (key at USM 25 and USM 23, key
in at USM 35).
– Use to select the function group LOGG H Note:
– Select the desired test job in the function JOB. Due to the characteristics of the membrane key pad, it
may be possible that one single press on a key may
– If necessary choose the test location for saving the lead to a double or even multiple contact. Subse-
measured value in the function LOCAT. quently multiple storage of readings may occur, espe-
cially when a key is pressed not centrally.
– Carry out the measuring.
– If necessary choose the result saved with the

measured value in the function COMMENT.
– To save the measured value only press the storage

key (key at USM 25 and USM 23, key in at
USM 35).
or
– Keep the storage key pressed down for more than

1 second in order to save the measured value and
the A-scan (key at USM 25 and USM 23, key
in at USM 35).
Operating the Data Logger Displaying measured values
2.3 Displaying measured values Choosing a test job (JOB)

(VIEW) This is where you can choose a test job in order to
display the corresponding measured values.
This function group serves for displaying previously
stored measured values. When you go to this menu, – Choose the required test job in the function JOB.
the screen display changes over to the preview mode.
The A-scan (without gates) is shown on the left-hand Choosing a location (LOCAT)
side, when it has been stored with the selected mea-
surement value. The functions of the current group are This is where you can choose a location in order to
shown on the right-hand side. display its measured values.
– Use the key to go to the 4th operating level. – Choose the required test location in the function
LOCAT.
– Use to select the function group VIEW.
Operating the Data Logger Displaying measured values
2.3 Displaying measured values Choosing a test job (JOB)

(VIEW) This is where you can choose a test job in order to
display the corresponding measured values.
This function group serves for displaying previously
stored measured values. When you go to this menu, – Choose the required test job in the function JOB.
the screen display changes over to the preview mode.
The A-scan (without gates) is shown on the left-hand Choosing a location (LOCAT)
side, when it has been stored with the selected mea-
surement value. The functions of the current group are This is where you can choose a location in order to
shown on the right-hand side. display its measured values.
– Use the key to go to the 4th operating level. – Choose the required test location in the function
LOCAT.
– Use to select the function group VIEW.
Displaying measured values Operating the Data Logger
Reading the result (COMMENT) 2.4 Clearing or deleting all jobs

Read the result for the current test location here.
Clearing all jobs (CLR-ALL)
H Note: You have the possibility of clearing all test jobs. In this
You can only read the result in this menu, but not process, all measured values are removed from all test
edit it. jobs. The test jobs themselves are maintained.
Reading the measured value (MEASVAL) A Attention!
Read the currently measured value here. If you use the function CLR-ALL, you’ll delete all
measured values from all test jobs.
H Note: – Use the key to go to the 4th operating level.

You can only read the measured values in this menu, – Use the key to select the function group JOBS.
but not record any new measured values.
– Choose the option on in the function CLR-ALL in
order to delete all measured values. Clear all jobs?
is displayed.

once again.
Displaying measured values Operating the Data Logger
Reading the result (COMMENT) 2.4 Clearing or deleting all jobs

Read the result for the current test location here.
Clearing all jobs (CLR-ALL)
H Note: You have the possibility of clearing all test jobs. In this
You can only read the result in this menu, but not process, all measured values are removed from all test
edit it. jobs. The test jobs themselves are maintained.
Reading the measured value (MEASVAL) A Attention!
Read the currently measured value here. If you use the function CLR-ALL, you’ll delete all
measured values from all test jobs.
H Note: – Use the key to go to the 4th operating level.

You can only read the measured values in this menu, – Use the key to select the function group JOBS.
but not record any new measured values.
– Choose the option on in the function CLR-ALL in
order to delete all measured values. Clear all jobs?
is displayed.

once again.
Operating the Data Logger Clearing or deleting all jobs
Deleting all jobs (DEL-ALL)

The function DEL-ALL serves for the deletion of all
test jobs. All test jobs are completely deleted and are
no longer available to you for subsequent tests. Use
this function only if you are sure that all test jobs
should be deleted.
A Attention!
If you use the function DEL-ALL, you’ll irrevocably
delete the test jobs. Before deleting, you should there-
fore check if all test jobs really should be deleted.
– Use the key to select the function group JOBS.
– Choose the option on in the function DEL-ALL in

order to delete all test jobs. Delete all jobs? is
displayed.

once again.
Operating the Data Logger Clearing or deleting all jobs
Deleting all jobs (DEL-ALL)

The function DEL-ALL serves for the deletion of all
test jobs. All test jobs are completely deleted and are
no longer available to you for subsequent tests. Use
this function only if you are sure that all test jobs
should be deleted.
A Attention!
If you use the function DEL-ALL, you’ll irrevocably
delete the test jobs. Before deleting, you should there-
fore check if all test jobs really should be deleted.
– Use the key to select the function group JOBS.
– Choose the option on in the function DEL-ALL in

order to delete all test jobs. Delete all jobs? is
displayed.

once again.
Other functions 3
Other functions 3
Other functions Monitoring the measured values
3.1 Monitoring the measured

values (TOL)
Once the option Data Logger has been installed, you’ll – Use the key to go to the 4th operating level.
have the function group TOL at your disposal for moni-
toring the measured values. You can set an upper and – Use to select the function group TOL.
a lower tolerance limit, and in this way define a toler-
ance range for the measured value. If the measured
value is outside this tolerance range, an alarm is trig-
gered.
The functions of this group enable you to monitor the

following measured values.
Sa Sound path in gate A
Sb Sound path in gate B
Sc Sound path in gate C
Sc-a Sound path difference between gate C and

gate A
Sc-b Sound path difference between gate C and

gate B
Sb-a Sound path difference between gate B and

gate A
3.1 Monitoring the measured

values (TOL)
Once the option Data Logger has been installed, you’ll – Use the key to go to the 4th operating level.
have the function group TOL at your disposal for moni-
toring the measured values. You can set an upper and – Use to select the function group TOL.
a lower tolerance limit, and in this way define a toler-
ance range for the measured value. If the measured
value is outside this tolerance range, an alarm is trig-
gered.
The functions of this group enable you to monitor the

following measured values.
Sa Sound path in gate A
Sb Sound path in gate B
Sc Sound path in gate C
Sc-a Sound path difference between gate C and

gate A
Sc-b Sound path difference between gate C and

gate B
Sb-a Sound path difference between gate B and

gate A
Monitoring the measured values Other functions
Defining the lower limit value (MIN-TOL) Defining the upper limit value (MAX-TOL)
You have the possibility of entering a value for the You have the possibility of entering a value for the up-
lower limit of the tolerance monitor. If a measured value per limit of the tolerance monitor. If a measured value
falls below this limit, an alarm is triggered. exceeds this limit, an alarm is triggered.
H Note: H Note:
You can only change the values of the functions You can only change the values of the functions
MIN-TOL and MAX-TOL, if the selected job is not MIN-TOL and MAX-TOL, if the selected job is not
linked to a data set. linked to a data set.
– Adjust the required value in the function MIN-TOL. – Adjust the required value in the function MAX-TOL.
Defining the lower limit value (MIN-TOL) Defining the upper limit value (MAX-TOL)
You have the possibility of entering a value for the You have the possibility of entering a value for the up-
lower limit of the tolerance monitor. If a measured value per limit of the tolerance monitor. If a measured value
falls below this limit, an alarm is triggered. exceeds this limit, an alarm is triggered.
H Note: H Note:
You can only change the values of the functions You can only change the values of the functions
MIN-TOL and MAX-TOL, if the selected job is not MIN-TOL and MAX-TOL, if the selected job is not
linked to a data set. linked to a data set.
– Adjust the required value in the function MIN-TOL. – Adjust the required value in the function MAX-TOL.
Activating the tolerance monitor The choice of the option Alarm in the function S-DISP
(TOL-MON) or MEAS-Px additionally enables the display of the
undertolerance (Al = L) or overtolerance (Al = H)
You can use this function to activate the tolerance values.
monitor. The tolerance range is displayed as a line be-
low the gate threshold. In this way, you can see – Set the required option in the function TOL-MON.
whether the measured value is within the tolerance
limits.
H Note:
The tolerance monitor may be blocked if the function
FREEZE is switched on. Press the key in order to
remove the blocking.
If the tolerance monitor should be used in a test job

that has a data set linked to it, the corresponding set-
tings must be saved to the linked data set.
The monitor alarm (LED A) now refers to the under-

tolerance or overtolerance values. That means that
the alarm is only triggered if the measured value is
outside the tolerance limits. If the measured value is
within the tolerance limits, no alarm is triggered.
Activating the tolerance monitor The choice of the option Alarm in the function S-DISP
(TOL-MON) or MEAS-Px additionally enables the display of the
undertolerance (Al = L) or overtolerance (Al = H)
You can use this function to activate the tolerance values.
monitor. The tolerance range is displayed as a line be-
low the gate threshold. In this way, you can see – Set the required option in the function TOL-MON.
whether the measured value is within the tolerance
limits.
H Note:
The tolerance monitor may be blocked if the function
FREEZE is switched on. Press the key in order to
remove the blocking.
If the tolerance monitor should be used in a test job

that has a data set linked to it, the corresponding set-
tings must be saved to the linked data set.
The monitor alarm (LED A) now refers to the under-

tolerance or overtolerance values. That means that
the alarm is only triggered if the measured value is
outside the tolerance limits. If the measured value is
within the tolerance limits, no alarm is triggered.
Activating the minimum reading capture If the minimum reading capture mode should be used
mode (MIN-CAP) in a test job that has a data set linked to it, the corres-
ponding settings must be saved to the linked data set.
You can use this function to activate the minimum
reading capture mode. The smallest sound path or the – Set the required option in the function MIN-CAP.
smallest sound path difference of a measurement is The activated minimum value capture is indicated
stored in the minimum reading capture mode. The mini- by the status indicator M (inverted) to the right in the
mum reading is overwritten as soon as an even smaller measurement row.
value is measured. After the probe has been un-
coupled, the minimum reading capture mode remains
active for another 3 seconds. If you couple the probe
back to the test object during this time and measure a
smaller value, the previous minimum reading is auto-
matically overwritten by the smaller value. If you do
not couple the probe back again, the actual minimum
readings is displayed inverted. With new coupling of
the probe a new minimum value will be determined. The
function MIN-CAP always stores the smallest mea-
sured value of a measurement, which is useful e.g. in
the case of remaining wall thickness measurements on
tubes.
H Note:
The minimum reading capture mode may be blocked if
the function FREEZE is switched on. Press the key
in order to remove the blocking.
Activating the minimum reading capture If the minimum reading capture mode should be used
mode (MIN-CAP) in a test job that has a data set linked to it, the corres-
ponding settings must be saved to the linked data set.
You can use this function to activate the minimum
reading capture mode. The smallest sound path or the – Set the required option in the function MIN-CAP.
smallest sound path difference of a measurement is The activated minimum value capture is indicated
stored in the minimum reading capture mode. The mini- by the status indicator M (inverted) to the right in the
mum reading is overwritten as soon as an even smaller measurement row.
value is measured. After the probe has been un-
coupled, the minimum reading capture mode remains
active for another 3 seconds. If you couple the probe
back to the test object during this time and measure a
smaller value, the previous minimum reading is auto-
matically overwritten by the smaller value. If you do
not couple the probe back again, the actual minimum
readings is displayed inverted. With new coupling of
the probe a new minimum value will be determined. The
function MIN-CAP always stores the smallest mea-
sured value of a measurement, which is useful e.g. in
the case of remaining wall thickness measurements on
tubes.
H Note:
The minimum reading capture mode may be blocked if
the function FREEZE is switched on. Press the key
in order to remove the blocking.
Other functions Setting the gate
3.2 Setting the gate (cGAT) Evaluation logic of the gate C (cLOGIC)
Once you have installed the option Data Logger, you In this function, you can choose the mode for trigger-
will have a third gate at your disposal. You will find all ing the gate alarm. The alarm is output via LED A on
functions for the setting of the third gate in the function the front panel of the instrument.
group cGAT. The five available setting options are:
– Use the key to go to the 4th operating level. • off – Evaluation logic is off
– Use to select the function group cGAT. Alarm option and measurement functions are
switched off; the gate is no longer visible.
• +koi – Coincidence
If the preset response threshold of the gate on the
screen is exceeded, the alarm is output.
• -koi – Anticoincidence
screen is not reached, the alarm is output.
• a trig – Triggered by gate A

The gate C is attached to the event in gate A.
• b trig – Triggered by gate B

The gate C is attached to the event in gate B.
– Select the required setting in the function cLOGIC.
Other functions Setting the gate
3.2 Setting the gate (cGAT) Evaluation logic of the gate C (cLOGIC)
Once you have installed the option Data Logger, you In this function, you can choose the mode for trigger-
will have a third gate at your disposal. You will find all ing the gate alarm. The alarm is output via LED A on
functions for the setting of the third gate in the function the front panel of the instrument.
group cGAT. The five available setting options are:
– Use the key to go to the 4th operating level. • off – Evaluation logic is off
– Use to select the function group cGAT. Alarm option and measurement functions are
switched off; the gate is no longer visible.
• +koi – Coincidence
screen is exceeded, the alarm is output.
• -koi – Anticoincidence
screen is not reached, the alarm is output.
• a trig – Triggered by gate A

The gate C is attached to the event in gate A.
• b trig – Triggered by gate B

The gate C is attached to the event in gate B.
– Select the required setting in the function cLOGIC.
Setting the gate Other functions
Determine the position of the gate at this point. The Response and measuring threshold of the
position is defined by means of three parameters: gate (cTHRSH)
start, width and threshold.
You can determine the threshold value of the gate C
Starting point of the gate (cSTART) which triggers the LED alarm when exceeded or not
reached, depending on the setting of the function
You can determine the starting point of the gate C cLOGIC, viz. within the range from 10 to 90 % screen
within the adjustment range from 0 to 9999 mm. height.
– Adjust the required value in the function cSTART. – Adjust the required value in the function cTHRSH.
Width of the gate (cWIDTH)

You can determine the width of the gate C within the
range from 0.02 to 9999 mm.
– Adjust the required value in the function cWIDTH.
Setting the gate Other functions
Determine the position of the gate at this point. The Response and measuring threshold of the
position is defined by means of three parameters: gate (cTHRSH)
start, width and threshold.
You can determine the threshold value of the gate C
Starting point of the gate (cSTART) which triggers the LED alarm when exceeded or not
reached, depending on the setting of the function
You can determine the starting point of the gate C cLOGIC, viz. within the range from 10 to 90 % screen
within the adjustment range from 0 to 9999 mm. height.
– Adjust the required value in the function cSTART. – Adjust the required value in the function cTHRSH.
Width of the gate (cWIDTH)

You can determine the width of the gate C within the
range from 0.02 to 9999 mm.
– Adjust the required value in the function cWIDTH.
Documentation 4
Documentation 4
Documentation Printing out the test report
4.1 Printing out the test report – Press the key to print out the test job.
– If necessary, select other test jobs, as described

The ultrasonic flaw detector USM enables you to di-
above, in order to print them out.
rectly print out the currently selected test jobs from the
Data Logger, or to send them to a PC. To do this, you
have to set the value of the function COPYMOD to
datalog and deactivate the function DAT-LOG. After
that, you can choose a test job from the Data Logger
in order to print it out.
– Use the key to go to the 3rd operating level.
– Use to select the function group CFG1.
– Select datalog in the function COPYMOD.
– Use to select the function group JOBS.
– Deactivate the function DAT-LOG in the function

group JOBS.
– Select the test job that you want to print out in the
function JOB.
Documentation Printing out the test report
4.1 Printing out the test report – Press the key to print out the test job.
– If necessary, select other test jobs, as described

The ultrasonic flaw detector USM enables you to di-
above, in order to print them out.
rectly print out the currently selected test jobs from the
Data Logger, or to send them to a PC. To do this, you
have to set the value of the function COPYMOD to
datalog and deactivate the function DAT-LOG. After
that, you can choose a test job from the Data Logger
in order to print it out.
– Use the key to go to the 3rd operating level.
– Use to select the function group CFG1.
– Select datalog in the function COPYMOD.
– Use to select the function group JOBS.
– Deactivate the function DAT-LOG in the function

group JOBS.
– Select the test job that you want to print out in the
function JOB.
Funktionen und Ferbediencodes Fernbedienung
Remote control 5
Funktionen und Ferbediencodes Fernbedienung
Remote control 5
Remote control Functions and remote control codes
5.1 Remote control 5.2 Functions and remote control

codes
You can operate the functions of the option Data Log-
ger in remote control mode via a connected PC. Default settings are printed in bold type.
control program and corresponding remote control com- A Attention!
mands. These commands represent instructions refer-
Some functions use the same names. You should
ring to the individual functions of the instrument.
therefore make sure that you enter the correct codes.
You will find more details on the remote control of the
You should pay special attention to the correct entry of
instrument in chapter 8 in the operation manual of your
the codes for the following functions:
ultrasonic flaw detector.
LJ for clearing the current test job
(screen panel JOBEDIT)
DJ for deleting the current test job

JC for clearing all test jobs

(function group JOBS)
JD for deleting all test jobs

5.1 Remote control 5.2 Functions and remote control

codes
You can operate the functions of the option Data Log-
ger in remote control mode via a connected PC. Default settings are printed in bold type.
control program and corresponding remote control com- A Attention!
mands. These commands represent instructions refer-
Some functions use the same names. You should
ring to the individual functions of the instrument.
therefore make sure that you enter the correct codes.
You will find more details on the remote control of the
You should pay special attention to the correct entry of
instrument in chapter 8 in the operation manual of your
the codes for the following functions:
ultrasonic flaw detector.
LJ for clearing the current test job
DJ for deleting the current test job

JC for clearing all test jobs

JD for deleting all test jobs

Functions and remote control codes Remote control
Function Code Settings/Description Resolution Function Code Settings/Description Resolution
A-scan D$ A-scan in menu VIEW (binary) cLOGIC 3L 0 = off 1

1 = pos
CLR-ALL JC 0 = off 2 = neg
1 = on 3 = A trig
4 = B trig
CLEAR LJ 0 = off
1 = on cSTART 3D 0 ... 9999 mm 0.01
COLUMN CL number of columns in menu 1 cTHRSH 3T 10 - 90 % / 30 1

EDIT 1 (JOBEDIT)
cWIDTH 3W 0.02 ... 9999 mm 0.01
COM-# R# 1 ... 10 1
result no. in menu EDIT 2 DATA-# D# 1 ... 200 1
(JOBEDIT)
DAT-LOG DL 0 = off
COMMENT R$ 1 ... 10 1 1 = row
result no. in menu VIEW 2 = column
COMMENT R_ 1 ... 10 1 DEL-ALL JD 0 = off

result no. in menu LOGG 1 = on
COM-NAM RN alphanumerical entry DELETE DJ 0 = off

in menu EDIT 2 (JOBEDIT) 1 = on
CREATE CJ 0 = off JOB J$ job no. in menu VIEW 1

1 = on
JOB J_ job no. in menu LOGG 1
Functions and remote control codes Remote control
A-scan D$ A-scan in menu VIEW (binary) cLOGIC 3L 0 = off 1

1 = pos
CLR-ALL JC 0 = off 2 = neg
1 = on 3 = A trig
4 = B trig
CLEAR LJ 0 = off
1 = on cSTART 3D 0 ... 9999 mm 0.01
COLUMN CL number of columns in menu 1 cTHRSH 3T 10 - 90 % / 30 1

EDIT 1 (JOBEDIT)
cWIDTH 3W 0.02 ... 9999 mm 0.01
COM-# R# 1 ... 10 1
result no. in menu EDIT 2 DATA-# D# 1 ... 200 1
(JOBEDIT)
DAT-LOG DL 0 = off
COMMENT R$ 1 ... 10 1 1 = row
result no. in menu VIEW 2 = column
COMMENT R_ 1 ... 10 1 DEL-ALL JD 0 = off

result no. in menu LOGG 1 = on
COM-NAM RN alphanumerical entry DELETE DJ 0 = off

in menu EDIT 2 (JOBEDIT) 1 = on
CREATE CJ 0 = off JOB J$ job no. in menu VIEW 1

1 = on
JOB J_ job no. in menu LOGG 1
JOB-# J# job no. in menu EDIT 1 1 MIN-CAP MC 1 = off

(JOBEDIT) 2 = Sa
3 = Sb
JOBEDIT T6 0 = off 4 = Sc
1 = on 5 = Sc-a
6 = Sc-b
JOB-NAM JN alphanumerical entry 7 = Sb-a
in menu EDIT 1 (JOBEDIT)
ROW RW number of rows in menu 1
LOC-# L# location no. in menu EDIT 2 1 EDIT 1 (JOBEDIT)
(JOBEDIT)
TOL-MON TN 1 = off
LOC-NAM LN alphanumerical entry 2 = Sa
in menu EDIT 2 (JOBEDIT) 3 = Sb
4 = Sc
LOCAT L$ location no. in menu VIEW 1 5 = Sc-a
6 = Sc-b
LOCAT L_ location no. in menu LOGG 1 7 = Sb-a
LOCAT JV reading in measured value (menu LOGG)
MAX-TOL T+ 0 ... 5000 mm
MEASVAL E$ reading out measured value (menu VIEW)
MIN-TOL T– 0 ... 5000 mm
JOB-# J# job no. in menu EDIT 1 1 MIN-CAP MC 1 = off

(JOBEDIT) 2 = Sa
3 = Sb
JOBEDIT T6 0 = off 4 = Sc
1 = on 5 = Sc-a
6 = Sc-b
JOB-NAM JN alphanumerical entry 7 = Sb-a
in menu EDIT 1 (JOBEDIT)
ROW RW number of rows in menu 1
LOC-# L# location no. in menu EDIT 2 1 EDIT 1 (JOBEDIT)
(JOBEDIT)
TOL-MON TN 1 = off
LOC-NAM LN alphanumerical entry 2 = Sa
in menu EDIT 2 (JOBEDIT) 3 = Sb
4 = Sc
LOCAT L$ location no. in menu VIEW 1 5 = Sc-a
6 = Sc-b
LOCAT L_ location no. in menu LOGG 1 7 = Sb-a
LOCAT JV reading in measured value (menu LOGG)
MAX-TOL T+ 0 ... 5000 mm
MEASVAL E$ reading out measured value (menu VIEW)
MIN-TOL T– 0 ... 5000 mm
Technical specifications according to EN 12668-1
USM 25
USM 25DAC
USM 25S
Krautkramer USM 25S_TM035041005_D - 1
USM 25
USM 25DAC
USM 25S
Krautkramer USM 25S_TM035041005_D - 1

Description Symbol Dimension Min Average Max Comment
Transmitter
» Shape - - - Spike pulse
» Spectrum Picture: 1
» Damping Ý - - DUAL = off
342 DAMPING = low
45 DAMPING = high
DUAL = on
1000 DAMPING = low
50 DAMPING = high
» Capacity pF - 220 - POWER = low
1000 POWER = high
» Pulse Repetition Frequency Hz 20% 4-1000 20%
»» PRF Mode - - - Manual,
automatically linked
to range in 10 steps
»» PRF step Hz - 4 - >1,5m
100 <1,5m
» Operating Modes - - - Single-,
dual mode
» Characteristics of Transmitter Pulse - - -
»» Pulse voltage Ó V -288 -261 -235 1000 Hz
DAMPING = low
POWER = high
USM 25S_TM035041005_D-2 Krautkramer

Transmitter
» Shape - - - Spike pulse
» Damping Ý - - DUAL = off
342 DAMPING = low
45 DAMPING = high
DUAL = on
1000 DAMPING = low
50 DAMPING = high
» Capacity pF - 220 - POWER = low
1000 POWER = high
» Pulse Repetition Frequency Hz 20% 4-1000 20%
»» PRF Mode - - - Manual,
automatically linked
to range in 10 steps
»» PRF step Hz - 4 - >1,5m
100 <1,5m
» Operating Modes - - - Single-,
dual mode
» Characteristics of Transmitter Pulse - - -
DAMPING = low
POWER = high

»» Pulse rise time Ç ns 13,86 15,40 16,93
»» Pulse duration Æ ns 141 156 172
»» Effective output impedance Í Ý 36 44 50
DAMPING = high
POWER = high
DAMPING = low
POWER = low
DAMPING = high
POWER = low
Krautkramer USM 25S_TM035041005_D-3

DAMPING = high
POWER = high
DAMPING = low
POWER = low
DAMPING = high
POWER = low

Receiver
» Amplifier - - -
» Setting Range dB - 110 -
»» Increments dB - 0,5 -
1
2
6
12
»» Attenuator uncal. range dB - 4 -
»» Accuracy of calibrated attenuator dB -0,6 0 0,6
»» Uncalibrated increments dB - ~0,1 -
» Amplifier Frequency - - -
»» Frequency spectrum (-3dB) MHz - 0,2 - 20 - (-3dB)
»» Frequency ranges MHz - - - 0,2 - 1 MHz Filter 4
»» Lower frequency range ¢ MHz 0,177 0,197 0,216
»» Upper frequency range ¡ MHz 1,128 1,253 1,378
»» Center frequency ¤ MHz 0,471 0,496 0,521
»» Bandwidth Ú MHz 0,951 1,057 1,162
»» Maximum frequency £ MHz 0,437 0,514 0,592
»» Dynamic range dB - >110 -
»» Noise level Ù nVÛ 1 - 80
»» Gain for 80% SH dB 24,0 25,0 26,0
»» Minimum input voltage µ áVæ 60 90 120

Receiver
» Amplifier - - -
» Setting Range dB - 110 -
»» Increments dB - 0,5 -
1
2
6
12
»» Attenuator uncal. range dB - 4 -
»» Accuracy of calibrated attenuator dB -0,6 0 0,6
»» Uncalibrated increments dB - ~0,1 -
» Amplifier Frequency - - -
»» Frequency spectrum (-3dB) MHz - 0,2 - 20 - (-3dB)
»» Bandwidth Ú MHz 0,951 1,057 1,162
»» Gain for 80% SH dB 24,0 25,0 26,0

»» Maximum input voltage ¥ Væ - - 40
»» Bandwidth Ú MHz 3,560 3,956 4,351
»» Gain for 80% SH dB 23,5 24,5 25,5
»» Bandwidth Ú MHz 9,037 10,042 11,046
»» Gain for 80% SH dB 24,0 25,0 26,0

»» Bandwidth Ú MHz 3,560 3,956 4,351
»» Gain for 80% SH dB 23,5 24,5 25,5
»» Bandwidth Ú MHz 9,037 10,042 11,046
»» Gain for 80% SH dB 24,0 25,0 26,0

»» Frequency ranges MHz - - - 2 - 20 MHz Filter 2
»» Bandwidth Ú MHz 17,159 19,065 20,972
»» Gain for 80% SH dB 24,5 25,5 26,5
»» Deadtime after transmitter pulse ás - <5 us - 1nF,125 Ohm,0,5-4MHz
»» Receiver input impedance
»»» Single probe (combined transmitter and receiver) Single mode
»»» Rmax ¦ Ý - 343 -
»»» Rmin ¸ Ý - 343 -
»»» Cmax ã pf - 36 -
»»» Cmin â pf - 36 -
»»» Dual-probe (separate transmitter and receiver) Dual mode
¦ Ý - 516 -
¸ Ý - 516 -

»» Frequency ranges MHz - - - 2 - 20 MHz Filter 2
»» Bandwidth Ú MHz 17,159 19,065 20,972
»» Gain for 80% SH dB 24,5 25,5 26,5
»» Deadtime after transmitter pulse ás - <5 us - 1nF,125 Ohm,0,5-4MHz
»» Receiver input impedance
»»» Single probe (combined transmitter and receiver) Single mode
»»» Rmax ¦ Ý - 343 -
»»» Rmin ¸ Ý - 343 -
»»» Cmax ã pf - 36 -
»»» Cmin â pf - 36 -
»»» Dual-probe (separate transmitter and receiver) Dual mode
¦ Ý - 516 -
¸ Ý - 516 -

ã pf - 21 -
â pf - 21 -
» Signal Mode - - -
»» Full Wave - Yes
»» Negative Halfwave - Yes -
»» Positive Halfwave - Yes -
»» RF Yes To 50 mm steel
» Suppression - Yes -
»» Adjustable % - 1 - 80 -

ã pf - 21 -
â pf - 21 -
» Signal Mode - - -
»» Full Wave - Yes
»» Negative Halfwave - Yes -
»» Positive Halfwave - Yes -
»» RF Yes To 50 mm steel
» Suppression - Yes -
»» Adjustable % - 1 - 80 -

Monitor
» Number of Gates - 2 -
» Alarm logic - off, -
pos,
neg,
trigger
» Start mm - 0 -
to
9999
» Width mm - 0,2 -
to
9999
» Threshold % - 10 - 90 -
» Measurement points - flank, -
peak
» Magnifier - Yes - Display of A-scan
on full screen width
» Alarm - LED, - Horn
horn switchable
» Interface echo start - Yes - Control of
Gate B by Gate A
» Switch output - Yes - See interface

Monitor
» Number of Gates - 2 -
» Alarm logic - off, -
pos,
neg,
trigger
» Start mm - 0 -
to
9999
» Width mm - 0,2 -
to
9999
» Threshold % - 10 - 90 -
» Measurement points - flank, -
peak
» Magnifier - Yes - Display of A-scan
on full screen width
» Alarm - LED, - Horn
horn switchable
» Interface echo start - Yes - Control of
Gate B by Gate A
» Switch output - Yes - See interface

Display
» Type - acitve LCD
-
» Dimensions of the Display mm - 72 x 96 - (HxW)
» Resolution - 240 x 320- Number of pixels
» Backlight - Yes - Switchable
» A-scan display
»» Linearity of time base % -0,5 0,5
»» Sampling error % -5 0 5 At 2 MHz
»» Display jitter - - -
»»» Amplitude % -2 0 2
»»» Position % -1 0 1
» Measurement resolution - - -
»» Sound path mm 0,01 - 1 0,01:
0 to 99 mm
0,1:
100 mm to 999 mm
1:
From 1000 mm
»» Amplitude % - 0,5 -
ç, è
»»» ç ns - 100 -
»»» è ns - 250 - Following an
interface echo

Display
» Type - acitve LCD
-
» Dimensions of the Display mm - 72 x 96 - (HxW)
» Resolution - 240 x 320- Number of pixels
» Backlight - Yes - Switchable
» A-scan display
»» Linearity of time base % -0,5 0,5
»» Sampling error % -5 0 5 At 2 MHz
»» Display jitter - - -
»»» Amplitude % -2 0 2
»»» Position % -1 0 1
» Measurement resolution - - -
»» Sound path mm 0,01 - 1 0,01:
0 to 99 mm
0,1:
100 mm to 999 mm
1:
From 1000 mm
»» Amplitude % - 0,5 -
ç, è
»»» ç ns - 100 -
»»» è ns - 250 - Following an
interface echo

» Display width mm - 0,5 -
to
9999
»» Fixed ranges mm - 55 -
»» Display start mm - -10 - Display start
to
900
»» Probe delay ás - 0 -
to
199,99
»» Automatic Calibration - Yes - 2 step
calibration
» Material velocity m/s - 1000 - Resolution 1m/s
to
15000
» Unit of measurement - mm, -
inch
» Linearity of time base % 0,5 0 0,5
» Trigonometry - - -
»» Angle of incidence ° - 0 - 90 - Resolution 0,1
»»» Increments ° - 0,1 -
»» X-value mm - 0 - 100 - Distance:
index point to
probe front edge
»» Object thickness mm - 1 - 9999 - To calculate
Sound Reflection

» Display width mm - 0,5 -
to
9999
»» Fixed ranges mm - 55 -
»» Display start mm - -10 - Display start
to
900
»» Probe delay ás - 0 -
to
199,99
»» Automatic Calibration - Yes - 2 step
calibration
» Material velocity m/s - 1000 - Resolution 1m/s
to
15000
» Unit of measurement - mm, -
inch
» Linearity of time base % 0,5 0 0,5
» Trigonometry - - -
»» Angle of incidence ° - 0 - 90 - Resolution 0,1
»»» Increments ° - 0,1 -
»» X-value mm - 0 - 100 - Distance:
index point to
probe front edge
»» Object thickness mm - 1 - 9999 - To calculate
Sound Reflection

»» Diameter mm/inch 10 - 2000 flat mm
0,40 - 800 flat inch
» Image processing - - -
»» Readings to be displayed - 5 -
»»» Time of flight - Yes - For Gate A,B
»»» Sound path difference - B-A - For Gate A,B
»»» Surface distance - Yes - For Gate A,B
»»» Red. surface distance - Yes - For Gate A,B
»»» Depth position - Yes - For Gate A,B
»»» Amplitude in % - Yes - For Gate A,B
»»» Amplitude in dB - Yes -- to gate threshold
to reference (REF)
for USM 25 DAC/S
to reference curve
»»» Amplitude in % curve - Yes - * Only USM 25 DAC
and S
for gate A,B
to reference curve
»»» Amplitude as ERS - Yes - * Only USM 25 S
for gate A
»»» Alarm - Yes - For Gate A,B
»»» Evaluation curve (DGS) - Yes - * only for USM 25 S
»»» Test sensitivity - Yes - * only for USM 25 S
»»» Number of legs Yes Number of legs

»» Diameter mm/inch 10 - 2000 flat mm
0,40 - 800 flat inch
» Image processing - - -
»» Readings to be displayed - 5 -
»»» Time of flight - Yes - For Gate A,B
»»» Sound path difference - B-A - For Gate A,B
»»» Surface distance - Yes - For Gate A,B
»»» Red. surface distance - Yes - For Gate A,B
»»» Depth position - Yes - For Gate A,B
»»» Amplitude in % - Yes - For Gate A,B
»»» Amplitude in dB - Yes -- to gate threshold
to reference (REF)
for USM 25 DAC/S
to reference curve
»»» Amplitude in % curve - Yes - * Only USM 25 DAC
and S
for gate A,B
to reference curve
»»» Amplitude as ERS - Yes - * Only USM 25 S
for gate A
»»» Alarm - Yes - For Gate A,B
»»» Evaluation curve (DGS) - Yes - * only for USM 25 S
»»» Test sensitivity - Yes - * only for USM 25 S
»»» Number of legs Yes Number of legs

» Signal display mode - standard,-
filled
» Signal processing - - -
»» Screen freeze - Yes - Freeze
»» Auto freeze - Yes - Auto freeze
»» A-scan Compare - Yes -
»» Envelope mode - Yes - Echo envelope
»» Peak Freeze - Yes - For Gate B
» Zoom - -Yes - A-scan on full
screen width
» Status information - Yes -
» Dialog languages - 19 -
» Function lock - Yes - In zoom mode

» Signal display mode - standard,-
filled
» Signal processing - - -
»» Screen freeze - Yes - Freeze
»» Auto freeze - Yes - Auto freeze
»» A-scan Compare - Yes -
»» Envelope mode - Yes - Echo envelope
»» Peak Freeze - Yes - For Gate B
» Zoom - -Yes - A-scan on full
screen width
» Status information - Yes -
» Dialog languages - 19 -
» Function lock - Yes - In zoom mode

Amplitude evaluation
» DAC Yes - * Only USM 25 DAC
and S
Distance amplitude curve
»» Number of reference echoes - 10 - Reference echoes
»» Dynamic range dB - 40 - For TCG
»» Slope maximum dB/ás 6 - For TCG
» DGS - Yes - * Only USM 25 S
»» Number of probes - 24 - In memory
»» Free programmable probe - Yes - One probe for data set
»» Reference reflectors - SDH -
BE
FBH
»» Attenuation correction - 0,1 - 14 -
»» Transfer correction - 0,1 - 14 -
»» Quadrant correction - 0,1 - 14 -
» DAC Mode - 0,1 - 14 - * Only USM 25 DAC
and S
display of curve
»» Curve - 0,1 - 14 - Evaluation curve
»» TCG - 0,1 - 14 - Depth compasation
»» Additional curves - 4 -
»» Curve offset dB - 0,1 - 14 - Multicurve

Amplitude evaluation
» DAC Yes - * Only USM 25 DAC
and S
Distance amplitude curve
»» Number of reference echoes - 10 - Reference echoes
»» Dynamic range dB - 40 - For TCG
»» Slope maximum dB/ás 6 - For TCG
» DGS - Yes - * Only USM 25 S
»» Number of probes - 24 - In memory
»» Free programmable probe - Yes - One probe for data set
»» Reference reflectors - SDH -
BE
FBH
»» Attenuation correction - 0,1 - 14 -
»» Transfer correction - 0,1 - 14 -
»» Quadrant correction - 0,1 - 14 -
» DAC Mode - 0,1 - 14 - * Only USM 25 DAC
and S
display of curve
»» Curve - 0,1 - 14 - Evaluation curve
»» TCG - 0,1 - 14 - Depth compasation
»» Additional curves - 4 -
»» Curve offset dB - 0,1 - 14 - Multicurve

Data processing
» Analog-to-Digital Conversion - - -
»» Sample frequency MHz 30 - 240
» Storage of data - ja - From internal memory
»» Number of datasets - 200 -
»» Contents of datasets - - - A-scan + instrument
setup
»» Dataset description - - - Numerical and alpha-
numerical
»» String Length (Dataset name) - 24 -
»» Notes, No. of fields - 9 - 6 alphanumerical +
3 numerical
»» Memo, No. of characters - 24 -
»» Date and time - Yes -
» Measurement results
»» Sound path (TOF) - Yes - For Gate A and B
»» Trigiometric values - selectable-
»» Amplidute - selectable-
»» Hardcopy - Yes - Format PCX
»» Function list - Yes -
»» Test Report - Yes -

Data processing
» Analog-to-Digital Conversion - - -
»» Sample frequency MHz 30 - 240
» Storage of data - ja - From internal memory
»» Number of datasets - 200 -
»» Contents of datasets - - - A-scan + instrument
setup
»» Dataset description - - - Numerical and alpha-
numerical
»» String Length (Dataset name) - 24 -
»» Notes, No. of fields - 9 - 6 alphanumerical +
3 numerical
»» Memo, No. of characters - 24 -
»» Date and time - Yes -
» Measurement results
»» Sound path (TOF) - Yes - For Gate A and B
»» Trigiometric values - selectable-
»» Amplidute - selectable-
»» Hardcopy - Yes - Format PCX
»» Function list - Yes -
»» Test Report - Yes -

Interfaces
» Outputs - - -
»» Alarms - TTL -
»» Horn - Yes -
»» Alarm gate A/B - Yes - Logical OR
»»» Switching voltage U V= - 3 - HCT level with 100 Ohm
serial
»»» Max. switching current I mA 6 -
»»» Hysteresis % 0,5 0 0,5
»»» Accuracy of the threshold % 2 - 2 Correspondig to actual
threshold
»»» Hold time t ms 20% 500 20% Hold time
»» Analog output
»»» Amplitude Gate A or B U V= - 0-5 - Corresponding to
100% SH
»»» Time of flight Gate A or B U V= - 0-5 - Corresponding to
gate width
»»» Max. switch current mA - 0,5 -
»»» Output impedance Ý - 100 -
»»» Linearity % 0,5 0 0,5 8 Bit +/- 1/2 LSB
»»» Rise time V/ás - 2,5 -
»»» Fall time V/ás - 2,5 -
»»» Hold time ms - 8 - 250 - Depending on PRF
» Digital input

Interfaces
» Outputs - - -
»» Alarms - TTL -
»» Horn - Yes -
»» Alarm gate A/B - Yes - Logical OR
»»» Switching voltage U V= - 3 - HCT level with 100 Ohm
serial
»»» Max. switching current I mA 6 -
»»» Hysteresis % 0,5 0 0,5
»»» Accuracy of the threshold % 2 - 2 Correspondig to actual
threshold
»»» Hold time t ms 20% 500 20% Hold time
»» Analog output
»»» Amplitude Gate A or B U V= - 0-5 - Corresponding to
100% SH
»»» Time of flight Gate A or B U V= - 0-5 - Corresponding to
gate width
»»» Max. switch current mA - 0,5 -
»»» Output impedance Ý - 100 -
»»» Linearity % 0,5 0 0,5 8 Bit +/- 1/2 LSB
»»» Rise time V/ás - 2,5 -
»»» Fall time V/ás - 2,5 -
»»» Hold time ms - 8 - 250 - Depending on PRF
» Digital input

»» Control
»»» Test data release - Yes - TTL
» Digital interface
»» Types
»»» RS-232 - Yes -
»» Printer
»»» Output/type - - - RS 232
»»» Driver - - - Epson
HP
Seiko
»» Data Redable about
RS232
»»» Time of flight - Yes -
»»» Amplitude - Yes -
»»» Alarms - Yes -
»»» A-Scan ja A-Scan
»» Trigger - TTL -
» Remote control - - - RS 232

»» Control
»»» Test data release - Yes - TTL
» Digital interface
»» Types
»»» RS-232 - Yes -
»» Printer
»»» Output/type - - - RS 232
»»» Driver - - - Epson
HP
Seiko
»» Data Redable about
RS232
»»» Time of flight - Yes -
»»» Amplitude - Yes -
»»» Alarms - Yes -
»»» A-Scan ja A-Scan
»» Trigger - TTL -
» Remote control - - - RS 232

General
» Instrument - - -
»» Size (HxWxD) mm - 176 x 255- x 65
»» Weight kg - 1,6 - incl. Batteries
»» Storage temperature °C -20 +60
»» Temperate range for mains operation °C 0 50
»» Temperature range for battery operation °C 0 50
»» Warm-up period h - - - 10 minutes at 25° C
»» Possible power supplies - - - Battery, mains
(external power supply)
»» Voltage range for battery operation V= 4,2 6
»» Voltage range with power supply V= 8 12
»» Power consumption VA 2,5 - 4,5 Min(without lights)
Max(with lights)
»» Low battery warning - Yes - Status display
»» Environmental Protection - IP 54 --
»» Shock resistivity - - - Shock resistance
according to DIN
IEC 68, 6 ms, 60g
shocks per axis
»» Vibration Vibration resistance
according to DIN IEC 68,
1-150 Hz, 2g, 20 cycles
per axis
» Stability against temperature change - - -

General
» Instrument - - -
»» Size (HxWxD) mm - 176 x 255- x 65
»» Weight kg - 1,6 - incl. Batteries
»» Storage temperature °C -20 +60
»» Temperate range for mains operation °C 0 50
»» Temperature range for battery operation °C 0 50
»» Warm-up period h - - - 10 minutes at 25° C
»» Possible power supplies - - - Battery, mains
(external power supply)
»» Voltage range for battery operation V= 4,2 6
»» Voltage range with power supply V= 8 12
»» Power consumption VA 2,5 - 4,5 Min(without lights)
Max(with lights)
»» Low battery warning - Yes - Status display
»» Environmental Protection - IP 54 --
»» Shock resistivity - - - Shock resistance
according to DIN
IEC 68, 6 ms, 60g
shocks per axis
»» Vibration Vibration resistance
according to DIN IEC 68,
1-150 Hz, 2g, 20 cycles
per axis
» Stability against temperature change - - -

»» Amplitude %/10° C -5 0 5
»» Echo position %/10° C -1 0 1
» Stability against voltage change - - -
»» Amplitude % -2 0 2
»» Time of flight % -1 0 1
» Power supply - - -
»» Battery operation time h - 6 - Battery NiMH 3/Ah
» Stability after warm-up time - - - After 30 minutes
»» Low battery display - - - Status symbol
»» Amplitude %/10° C -2 0 2 +/-0,5%
»» Time of flight % -1 0 1 +/- 0,5mm
»» Change in amplitude over time base position % - - -
with battery c
» Types of Sockets
»» Probe connection - Lemo, - Selectable
BNC
»» I/O interface - Lemo - 8-pin
»» RS-232 - DSUB - 9-pin
»» External power supply - DIN 45323
-
» Case - Plastic
» Documentation - - - Technical reference manual

»» Amplitude %/10° C -5 0 5
»» Echo position %/10° C -1 0 1
» Stability against voltage change - - -
»» Amplitude % -2 0 2
»» Time of flight % -1 0 1
» Power supply - - -
»» Battery operation time h - 6 - Battery NiMH 3/Ah
» Stability after warm-up time - - - After 30 minutes
»» Low battery display - - - Status symbol
»» Amplitude %/10° C -2 0 2 +/-0,5%
»» Time of flight % -1 0 1 +/- 0,5mm
»» Change in amplitude over time base position % - - -
with battery c
» Types of Sockets
»» Probe connection - Lemo, - Selectable
BNC
»» I/O interface - Lemo - 8-pin
»» RS-232 - DSUB - 9-pin
»» External power supply - DIN 45323
-
» Case - Plastic
» Documentation - - - Technical reference manual

Other
» Software update procedure - - - Download via RS 232
» Options - - - Data logger

Other
» Software update procedure - - - Download via RS 232
» Options - - - Data logger

Picture: 1

Picture: 1

Picture: 2

Picture: 2

Picture: 3

Picture: 3

Picture: 4

Picture: 4

Assembly Instructions, Spate Parts List 13
Krautkrämer USM 25 Issue 04.09/03 13-1
Assembly Instructions, Spate Parts List 13
Krautkrämer USM 25 Issue 04.09/03 13-1

Assembly Instructions, Spare Parts List
13-2 Issue 04, 09/03 Krautkrämer USM 25

Krautkrämer USM 25 Issue 04, 09/03 13-3



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Contents

1 Introduction ....................................... 1-1 1.3 The USM 25 family ................................... 1-9

Krautkramer USM 25 Issue 07, 07/2003 0-1

1 Introduction ....................................... 1-1 1.3 The USM 25 family ................................... 1-9

Krautkramer USM 25 Issue 07, 07/2003 0-1

3 Initial start-up ..................................... 3-1 4.4 Operational concept ................................ 4-7

0-2 Issue 07, 07/2003 Krautkramer USM 25

3 Initial start-up ..................................... 3-1 4.4 Operational concept ................................ 4-7

0-2 Issue 07, 07/2003 Krautkramer USM 25

D-DELAY (Display starting point) ............... 5-9 aSTART / bSTART

Krautkramer USM 25 Issue 07, 07/2003 0-3

D-DELAY (Display starting point) ............... 5-9 aSTART / bSTART

Krautkramer USM 25 Issue 07, 07/2003 0-3

0-4 Issue 07, 07/2003 Krautkramer USM 25

0-4 Issue 07, 07/2003 Krautkramer USM 25

HORN .......................................................5-53 5.18Evaluation according to the

6.2 Documentation with UltraDOC ................. 6-4

Krautkramer USM 25 Issue 07, 07/2003 0-5

HORN .......................................................5-53 5.18Evaluation according to the

6.2 Documentation with UltraDOC ................. 6-4

Krautkramer USM 25 Issue 07, 07/2003 0-5

7.2 Maintenance ............................................. 7-4 9.2 EC declaration of conformity .................. 9-6

9.3 Manufacturer/Service addresses ............. 9-7

8.3 Data exchange .......................................... 8-4 Technical Specifications according

8.4 Remote control ......................................... 8-5 Assembly Instructions,

0-6 Issue 07, 07/2003 Krautkramer USM 25

7.2 Maintenance ............................................. 7-4 9.2 EC declaration of conformity .................. 9-6

9.3 Manufacturer/Service addresses ............. 9-7

8.3 Data exchange .......................................... 8-4 Technical Specifications according

8.4 Remote control ......................................... 8-5 Assembly Instructions,

0-6 Issue 07, 07/2003 Krautkramer USM 25

Krautkramer USM 25 Issue 07, 07/2003 1-1

Krautkramer USM 25 Issue 07, 07/2003 1-1

1.1 Safety information

In order to maintain this condition and to ensure a safe

The USM 25 may only be used in industrial environ-

1-2 Issue 07, 07/2003 Krautkramer USM 25

Introduction Safety information

1.1 Safety information

In order to maintain this condition and to ensure a safe

The USM 25 may only be used in industrial environ-

1-2 Issue 07, 07/2003 Krautkramer USM 25

Batteries Defects/errors and exceptional stresses

Before using any software-controlled test equipment,

If you have any questions about the use of your

Krautkramer USM 25 Issue 07, 07/2003 1-3

Safety information Introduction

Batteries Defects/errors and exceptional stresses

Before using any software-controlled test equipment,

If you have any questions about the use of your

Krautkramer USM 25 Issue 07, 07/2003 1-3

1.2 Important information on Operator training

1-4 Issue 07, 07/2003 Krautkramer USM 25

Introduction Important information on ultrasonic testing

1.2 Important information on Operator training

1-4 Issue 07, 07/2003 Krautkramer USM 25

Technical test requirements Limits of testing

The scheduled dates for these courses will be given to

Krautkramer USM 25 Issue 07, 07/2003 1-5

Important information on ultrasonic testing Introduction

Technical test requirements Limits of testing

The scheduled dates for these courses will be given to

Krautkramer USM 25 Issue 07, 07/2003 1-5