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Reading:
Jaeger 3.4-3.14, 13.4, Notes
id
+
vs RLoad VLoad
vd
-
vs-vLoad=vd
+
Id=-Io
vLoad = -Io RLoad
t
-
Georgia Tech ECE 3040 - Dr. Alan Doolittle
Diode Applications: Peak Detector
id
+
vs CLoad VLoad
vd
-
vs-vLoad=vd
+
-
Georgia Tech ECE 3040 - Dr. Alan Doolittle
Diode Applications: 1/2 Wave Rectifier with an RC Load
id
+
vs CLoad RLoad VLoad
-
-
Georgia Tech ECE 3040 - Dr. Alan Doolittle
Diode Applications: LED or a Laser Diode
VA
V=9V
Intersection of the
two curves gives
the DC operational
voltage and
VA=0V -> I=9V/1000 ohms currents
ID Load Line
I V1=IR
R=1000 ohms
VD
VA
I=0 -> VA=9V
V=9V
+
Von
0.6V V
-
Diode Biased in
For small AC voltage Forward Bias: Tiny
“swings”, vd, about a fixed
DC voltage, VD the diode IV
small signal
curve can be approximated as resistance, rd.
a resistor (I.e. linear current-
voltage relationship). The
fixed DC operating point, iD=ID+id
(VD-ID), is called the bias ID 1 3
point or the quiescent or Q-
2
point. 2
2 vD=VD+vd
V1D
Diode Biased in
For small AC voltage Forward Bias: Tiny
“swings”, vd, about a fixed
DC voltage, VD the diode IV
small signal
curve can be approximated as resistance, rd.
a resistor (I.e. linear current- 3
3
voltage relationship). The
fixed DC operating point, iD=ID+id
(VD-ID), is called the bias ID 1 3
point or the quiescent or Q-
2
point. 2
2 vD=VD+vd
V1D
Diode Biased in
For small AC voltage Forward Bias: Tiny
“swings”, vd, about a fixed
DC voltage, VD the diode IV
“small signal”
curve can be approximated as resistance, rd.
a resistor (I.e. linear current- 3
3
voltage relationship). The
fixed DC operating point, iD=ID+id
(VD-ID), is called the bias ID 1 3
point or the quiescent or Q-
2
point. 2
2 vD=VD+vd
V1D
0.615 0.0184
(approximately) a
sine wave. 0.605 0.0144
Voltage
Current
Some distortion is 0.6 0.0124
observed because in
this example we have 0.595 0.0104
exceeded the
mathematical limits 0.59 0.0084
valid for small signal
analysis (0.025 is not Voltage 0.6V+0.025sin(wt) I=f(V)
0.585 0.0064
<< kT/q). In most 0 10 20 30 40 50 60 70
Current
0 0
0 10 20 30 40 50 60 70
-0.002
-0.2
-0.004
-0.4
-0.006
-0.6
-0.008
-0.8 -0.01
Time
Georgia Tech ECE 3040 - Dr. Alan Doolittle
The transition from valid small signal limits to Large Signal
conditions is a matter of what is acceptable for your requirements
0.6015
i D (t) = 1e - 12(e v D (t)/0.0259 - 1) 0.0122 0.01
FFT
0.012
0.601
0.008
0.0118 0.007
Magnitude of Signal
0.6005
0.006
0.0116
“No”
Voltage
Current
0.005
0.6
0.0114 0.004
0.5995
0.0112
0.003 Distortion
0.002
0.599
0.011 0.001
0.12
FFT
Magnitude of Signal
0.08
0.605 0.0144
Slight
Voltage
Current
0.06
0.6 0.0124
0.595 0.0104
0.04
Distortion
0.02
0.59 0.0084
0.75
v D (t) = 0.6 + 0.1sin(wt) 0.6 5
4.5
FFT
0.7
0.4
4
0.65 3.5
Magnitude of Signal
0.2
3
Major
0.6
Voltage
Current
2.5
0
0.55
distortion
2
-0.2 1.5
0.5
1
-0.4
0.45 0.5
V A VT kT
I D = I o e − 1 where VT =
q
iD = I D + g d vd
ID + IS
gd = in General
VT
VA
ID kT
VA >> 0 → I D ≈ I o e VT
where VT =
gd ≈ in Forward Bias q
VT
− IS + IS VA
gd ≈ ≈ 0 in Re verse Bias VA << 0 → e VT
→0
VT
Diode Biased in
Reverse Bias: Huge
“small signal”
resistance, rd=1/gd
VD
iD=ID+id
vD=VD+vd
rd
R
C large
enough to be
vs an AC short
vout
IDC
rd
R
C large enough R rd
to be an AC
short
vs
vout
vout
ID
C
rd
R
vout
rd
vout = vin
rd + R
1 1
vout = vin = vin or at room temperature
1+
R (I DC + I S )R
1+
rd VT
1
vout ≈ vin
1 + 40(I DC + I S )R
Georgia Tech ECE 3040 - Dr. Alan Doolittle
Actual voltage drop
across the diode Completing the Large signal model of a diode
including resistive
losses from quasi-
neutral regions.
vD iD=IS(exp(v’D/(ηVT)) - 1) where η accounts
for previously neglected recombination-
v’D generation in the depletion region
Depletion-
CJunction region
ppo n no
p-region --+ -+ +- - n-region
+
-+--+ +- +-
+- +-
-+-+ +- +-
+ +
npo
CDiffusion pno
x=0 x=0
dQ
C= '
= Change in ch arg e resulting from a change in voltage
Georgia Tech
dv D ECE 3040 - Dr. Alan Doolittle
Completing the Large signal model of a diode
K sε o A
C junction =
W
but...
2K S ε o (N A + N D )
W = x p + xn = (Vbi − V A )
q NAND
qK S ε o N A N D 1
C junction =A
2 ( N A + N D ) (Vbi − V A )
Thus,
qK S ε o N A N D 1 C Jo
C Jo = C junction =A and CJ =
2 ( N A + N D ) (Vbi )
VA =0
VA
1−
Vbi
= e [ ]
− 1 p no L p + n po Ln qA
1 vD VT
'
dQD
dt
=
VT
e [ ]
p no L p + n po Ln qA dt
dv D'
vD' V
IS e T
− 1 + 1
dQD
dt
=
1
VT IS
[
]
p no L p + n po Ln qA
dv D'
dt
Diffusion capacitance due to “excess injected” minority carrier charge at the depletion
region edges. Since this charge results from minority carriers, this capacitance is
negligible at zero or reverse biases.
Georgia Tech ECE 3040 - Dr. Alan Doolittle
Completing the Large signal model of a diode
1 iD + I S
dQD
dt
=
VT I S
[
pno L p + n po Ln qA
dvD'
dt
]
[
dQD iD + I S pno L p + n po Ln qA dvD'
=
]
dt VT IS dt
iD=ID+id dQD
= gd
[ ]
pno L p + n po Ln qA dvD'
dt IS dt
iD~ID
C Diffusion =
dQD dt
= gd
[
]
pno L p + n po Ln qA dvD' dt
'
dt dvD' IS dt dv D
Unit
[ ]
pno L p + n po Ln qA cm cm q cm
−3 2
analysis
C Diffusion = g d = gd
q = g d [sec]
IS
sec
C Diffusion = g dτ t where τ t =
[p no ]
L p + n po Ln qA
is the transit time or how quickly a carrier can respond
IS
to a change in voltage (physically the carriers have to move across the junction, requiring a finite time to do so)
∂i
or in SPICE , C Diffusion = D τ t
∂vD
Diffusion capacitance due to “excess injected” minority carrier charge at the depletion
region edges.
Georgia Tech ECE 3040 - Dr. Alan Doolittle
Summary of the Large signal model of a diode (SPICE Model)
( v D - i D R Series )
ηVT
i D = I S (e - 1)
RSeries
AK S ε o
C Jo = C junction VA =0 = 1
(m + 2)K S ε o (m+ 2 )
(V )
bi
qb
CJunction
C Jo
and CJ = 1
⇒ f (V A )
VA (m+ 2 )
1 −
Vbi
Significant
minority
carrier
concentration
at the
depletion
region edges
No significant minority carrier in large-
concentration at the depletion forward bias
region edges in reverse or small- => CD>>CJ
forward bias => CD<<CJ
rd = 1/g d ⇒ f (I D )
RSeries
AK S ε o
C Jo = C junction VA =0 = 1
(m + 2)K S ε o (m+ 2 )
(V )
bi
CJunction qb
C Jo
and CJ = 1
⇒ f (V A )
VA (m+ 2 )
1 −
Vbi
C Diffusion = g d τ t ⇒ f (I D )
Georgia Tech ECE 3040 - Dr. Alan Doolittle
Things we have added to account for “Non-ideal” behavior
•Series resistance to account for finite resistance of the quasi-neutral
regions and metal contact resistance's.
•Diode “ideality factor”, η, to account for thermal recombination-
generation in the depletion region.
•Junction capacitance due to majority carrier charges displaced by
the depletion width (I.e. similar to a parallel plate capacitor).
•Diffusion capacitance due to “excess injected” minority carrier
charge at the depletion region edges. Since this charge results from
minority carriers, this capacitance is negligible at zero or reverse
biases.
Zener Breakdown:
Excess current flows due to bonding electrons “tunneling” into empty
conduction band states. The “tunneling barrier” must be sufficiently thin.
This current rapidly increases with increasing reverse bias.
I
VBR almost
R constant can act
V>VBR as a high
voltage (~1V -
100 V) DC
reference
Georgia Tech ECE 3040 - Dr. Alan Doolittle