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IEEE Xplore - New empirical unified dispersion model for shielded-, sus...

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IEEE Xplore - New empirical unified dispersion model for shielded-, sus...

http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=704967

Browse > Journals> Microwave Theory and Technique ...> Volume: 46 Issue: 8

New empirical unified dispersion model for shielded-, suspended-, and composite-substrate microstri line for microwave and mm-wave applications

Verma, A.K.; Kumar, R.; Dept. of Electron. Sci., Delhi Univ. This paper appears in: Microwave Theory and Techniques, IEEE Transactions on Issue Date: Aug 1998 Volume: 46 Issue:8 On page(s): 1187 - 1192 ISSN: 0018-9480 References Cited: 16 INSPEC Accession Number: 6002337 Digital Object Identifier: 10.1109/22.704967 Date of Current Version: 06 August 2002 Sponsored by: IEEE Microwave Theory and Techniques Society

ABSTRACT By introducing the concept of virtual relative permittivity, this paper reports several closed-form dispersion models for a multilayered shielded/unshielded microstrip line over 1<r&les;20, 0.1&les;(w/h)&les;10, (h3/h)&ges;2 in the frequency range up to 4 GHz.cm. The maximum deviation of the one model against the results of the spectral-domain analysis (SDA) is limited to 3%, while for the other three models, the maximum deviation is <2% and the root-mean-square (rms) deviation is <0.8%. This paper also reports improvement in the closed-form model of March for the determination of eff(O) of the shielded microstrip line

INDEX TERMS

INSPEC Controlled Indexing dispersion (wave) , electromagnetic shielding , microstrip lines , permittivity , spectral-domain analysis , substrates , transmission line theory

Non Controlled Indexing MM-wave application , composite substrate , dispersion model , microwave application , multilayered microstrip line , shielded substrate , spectral dom analysis , suspended substrate , virtual relative permittivity

REFERENCES

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"Accurate characterization and modeling of transmission lines for GaAs MMIC", IEEE Trans

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IEEE Xplore - New empirical unified dispersion model for shielded-, sus...

http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=704967

Theory Tech., vol. MTT-35, pp. 453 - 457, 1987. [Buy Via Ask*IEEE] 10. J. Svacina, "Analysis of multilayer lines by a conformal mapping method", IEEE Trans. Microwave Theory Tech., vol. 40, pp. 769 - 772, 1992.

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CITING DOCUMENTS

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