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C) 85 80 85 80 75 70 50
T
J
Max 125C
Max V
F
@ I
FM
= I
O
Fig 20.6 Characteristics curves for Hewlett-Packard 5082-
2300 series of general-purpose Schottky barrier diodes.
.1
0.1
1
10
100
T = 100C
T = 25C
T = -50C
0 100 200 300 400 700 600 500
I
F
Temperature Coeffiecient
10A -2.3mV/C
100A -1.8mV/C
1.0mA -1.3mV/C
10mA -0.7mV/C
100mA -0.2mV/C
Forward voltage (mV)
F
o
r
w
a
r
d
c
u
r
r
e
n
t
(
m
A
)
I-V Curve Showing Typical Temperature Variation for 5082-2300 Series Schottky Diodes
(a)
50
10
100
500
100
0 5 15 10
Reverse voltage (V)
R
e
v
e
r
s
e
c
u
r
r
e
n
t
(
n
A
)
5082-2300 Series Typical Reverse Current vs. Reverse Voltage at T
A
= 25C
(b)
2900
2303
2301
2302
2305
C
a
p
a
c
i
t
a
n
c
e
(
p
F
)
V
R
-Reverse voltage (V)
5082-2300 Series Typical Capacitance vs. Reverse Voltage at T
A
= 25C
(c)
0 8 16 12 4 20
0.2
0.3
0.6
0.8
1.0
1.2
2900
2303
2301
2302
2305
Schottky diode I-V characteristics
Schottky diode is a metal-semiconductor (MS) diode
Historically, Schottky diodes are the oldest diodes
MS diode electrostatics and the general shape of the MS diode I-
V characteristics are similar to p
+
n diodes, but the details of
current flow are different.
Dominant currents in a p
+
n diode
arise from recombination in the depletion layer under small
forward bias.
arise from hole injection from p
+
side under larger forward
bias.
Dominant currents in a MS Schottky diodes
Electron injection from the semiconductor to the metal.
Current components in a p
+
n and MS Schottky diodes
I
R-G
negligible
dominant
p
+
n
u
B
dominant
I
r-g
negligible
M n-Si
I-V characteristics
kT
*
kT
qV
T A I I I
B A
e where 1 e
2
s s
u
=
|
|
|
.
|
\
|
= A
where u
B
is Schottky barrier height, V
A
is applied voltage, A is
area, and A
*
is Richardsons constant.
The reverse leakage current for a Schottky diode is generally
much larger than that for a p
+
n diode.
Since MS Schottky diode is a majority carrier devices, the
frequency response of the device is much higher than that of
equivalent p
+
n diode.